Abstract: A method (400) for microscopic examination of a sample (1) includes applying (410) the sample (1) to a sample holder (10) having a transparent carrier material, capturing (420) a first image (210, 220) of the sample (1) applied to the sample holder (10) using a first light-microscopy method, cryofixing, freeze-substituting, and subsequently infiltrating and embedding (430) the sample (1) together with the sample holder (10) with an embedding medium (20) in an embedding mold (90, 100), curing (440) the embedding medium (20), removing the sample (1) from the embedding mold (90, 100) together with the embedding medium (20) and the sample holder (10), capturing (450) a second image (230) of the sample (1) embedded in the cured embedding medium (20) using a second light-microscopy method, wherein at least partially identical regions of the sample (1) are captured in the first and second images, and identifying (460) at least one portion of the first image (210, 220) and one portion of the second image (230) which

Abstract: A method including one or more steps of a procedure for preparing a microscopic sample for a high-pressure freezing process is provided, wherein the sample is provided using an arrangement comprising a middle plate of a high-pressure freezing cartridge and an incubation chamber, wherein the middle plate is attached to a lower surface of a bottom of the incubation chamber by an adhesive and detachable from the incubation chamber by effecting a relative movement between the middle plate and the incubation chamber, wherein the sample is provided on an enclosing element which is fitted into an opening of the middle plate, and wherein, when the sample is to be subjected to the high-pressure freezing process, the relative movement between the middle plate and the incubation chamber is effected, thereby detaching the middle plate with the sample from the incubation chamber. Means to implement the method are also part of the present disclosure.

Abstract: A device for preparing a microscopic sample for a high-pressure freezing process in which the sample is provided using an arrangement having a middle plate of a high-pressure freezing cartridge and an incubation chamber, the middle plate being attached to and detachable from the incubation chamber by effecting a relative movement between the middle plate and the incubation chamber, and the sample being provided on an enclosing element which is fitted into an opening of the middle plate, wherein the device includes an engagement structure adapted to engage with the middle plate and to restrict a movement of the middle plate while the incubation chamber is moved, such as to effect the relative movement between the middle plate and the incubation chamber and to thereby detach the middle plate from the incubation chamber.

Abstract: The present invention concerns a method and a system for imaging at least a part of a specimen by means of two microscopy imaging methods, where a surface (11) of the specimen (10) is imaged by means of a first microscopy imaging method, where a replica (25) of the surface (11) to be imaged by means of the first microscopy imaging method is produced and this replica (25) is simultaneously imaged by means of a second microscopy imaging method, where the images produced by means of the first and the second microscopy imaging methods are overlaid at the correct scale.

Abstract: A high pressure freezing cartridge (300, 400, 500) for use in vitrification of a biological sample (10) is provided, the cartridge (300, 400, 500) being adapted to fixedly hold a sample chamber (216, 218, 220) at a sample chamber position (320, 420, 520) in the cartridge (300, 400, 500), a refrigerant channel arrangement comprising at least one refrigerant channel (208, 308, 408, 462, 464, 466, 468, 508, 562, 564, 566, 569) being provided in the cartridge (300, 400, 500) and extending from a surface of the cartridge (300, 400, 500) to the sample chamber position, and the cartridge (300, 400, 500) comprising a baffle structure (350, 450, 550, 571) at a baffle position being adapted to interact with a refrigerant stream in the refrigerant channel arrangement before the refrigerant of the refrigerant stream reaches the sample chamber position in the cartridge (300, 400, 500). A corresponding method in which the high pressure freezing cartridge (300, 400, 500) is used is also part of the present disclosure.

Abstract: A modular specimen holder (10?) for high pressure freezing and/or X-ray crystallography of a specimen has a specimen holding element (100?) and an extension element (200?) connectable with and separable from each other; the specimen holding element (100?) including a tubule (120?) adapted to hold the specimen and a base element (110?) adapted to hold the tubule (120?), wherein a distance from a bottom of the base element (110?) to a top of the tubule (120?) is a first distance (d1); the extension element (200?) being connectable with the base element (110?), wherein, when the extension element (200?) and the base element (110?) are connected with each other, a second distance (d2) from a bottom of the extension element (200?) to the top of the tubule (120?) is larger than the first distance (d1).

Abstract: The invention relates to a sample transfer device (10) for reception of a sample, having a transfer rod (4) that is configured for reception of a sample holder, the sample holder to be arranged in a chamber (1) of the sample transfer device (10) for the purpose of transferring the sample to a processing unit or analytical unit (200), at least one measurement device (3, 8) for measuring a physical variable being arranged inside the sample transfer device (10).

Abstract: The invention relates to a freezing machine (150) for freezing samples, encompassing: a freezing device (140) for freezing a sample received in the freezing machine (150); a container (100) for receiving the frozen sample, having a reservoir (105) for liquid nitrogen; and a transfer apparatus for transferring the frozen sample from the freezing device (140) into the container (100), the container (100) comprising at least two receiving devices (104), separated from one another, each for at least one frozen sample; a selection apparatus being provided for selecting one of the receiving devices (104) for a frozen sample that is to be transferred into the container (100), the freezing machine (150) being configured to carry out the transfer of the frozen sample, by means of the transfer apparatus, into the respectively selected receiving device (104) of the container (100); and to a method for transferring frozen samples into a container provided therefor.

Abstract: A microtome system has a cryomicrotome with a sectioning device in which is provided a preparation holder and a knife edge that are guided past one another inside a working space during a sectioning operation, in order to produce thin sections of a preparation retained in the preparation holder. A micromanipulator is operable outside the working space. With the micromanipulator, a tool for retention of a specimen support is positioned proximate the knife edge during a sectioning operation in order to receive the sections that are produced, preferably for substantially stationary retention of the specimen support.

Abstract: A loading station (100, 200) for translocating a frozen sample for electron microscopy, encompassing a chamber (104, 204), open toward the top, that is fillable at least partly with a coolant, the chamber (104, 204) comprising in its side wall at least two ports (101a, 102a, 103a) each for different sample transfer devices (101, 102, 103), the ports (101a, 102a, 103a) permitting introduction of a frozen sample into the chamber (104, 204) via a selected sample transfer device and withdrawal of a frozen sample from the chamber via a respective different sample transfer device; and wherein a receptacle (108, 208) for at least two differently configured sample holders (109, 110) is arranged in the chamber (104, 204), the at least two sample holders (109, 110) being detachably fastenable to at least one of the sample transfer devices (101) for introduction of the frozen sample into the chamber (104, 204) and for withdrawal of the frozen sample from the chamber (104, 204).

Abstract: In a manipulation container (1) for cryomicroscopy, having at least one holder (9) for a sample carrier mount (7) and at least one manipulation opening (2) for manipulating sample carriers or sample carrier mounts (7), the holder (9) for a sample carrier mount (7) is movable into a displacement path (11), passing completely through the manipulation container (1), of a displacement apparatus (3) for the sample carrier mount (7).

Abstract: A freeze fracture machine (100) comprises a vacuum chamber (110); a sample receptacle (160) for receiving a sample to be processed and a knife receptacle (150) for receiving a knife (110) for processing of the sample arranged in the vacuum chamber (155); a transfer lock (130) on the vacuum chamber (110) through which a sample and a knife (155) are introducible into the vacuum chamber (155) and positionable in the vacuum chamber (110) by means of a positioning apparatus (135); the sample and the sample receptacle (160) being positionable with respect to one another such that the sample is mountable on the sample receptacle (160) by means of the positioning apparatus (135); and the knife (155) and the knife receptacle (150) being positionable with respect to one another such that the knife (155) is mountable on the knife receptacle (150) by means of the positioning apparatus (135).

Abstract: In a light microscope (1) for cryomicroscopy, encompassing at least an objective (2) and a sample stage (3) having a cutout (7) for a coolable holder (8) for a sample carrier mount, the cutout (7) being covered by a cover (6), the sample stage (3) is displaceable in two horizontal directions (4). The cover (6) rests floatingly on the sample stage (3), and the objective (2) passes through a cutout (12), corresponding to the objective (2), in the cover (6). The method for cooling a holder (8) for a sample carrier mount in a light microscope (1) for cryomicroscopes, by means of a flow of liquid nitrogen through a cooling conduit (15), open at at least one end, in the holder (8), is notable for the fact that the quantity of liquid nitrogen is dimensioned so that all of the nitrogen is present in gaseous form at at least one open end (16) of the cooling conduit (15).

Abstract: The invention relates to a cooling apparatus (101) for a sample in an ion beam etching process, including, a sample stage (102) for arranging the sample, a coolant receptacle (120) containing a coolant, at least one thermal conduction element (106a, 106b) that connects the sample stage (102) to the coolant, a cooling finger (105) connected to the thermal conduction element (106a, 106b), the cooling finger (105) comprising a conduit (130, 131) through which coolant can flow and which is connectable to the coolant receptacle (120). The invention further relates to a method of adjusting the temperature of a sample in an ion beam etching process, including mounting a sample on a coolable sample stage (102), aligning the sample on the sample stage (102), and cooling the sample by coolant directed through a conduit (130, 131) of a cooling finger.

Abstract: An apparatus for staining sample sections, comprising: a chamber that is adapted for fastening sample sections therein; and a pump that is adapted for pumping liquids through the chamber. The chamber has an inlet and an outlet. The inlet can be connected to at least one reservoir of a staining liquid via inlet lines that are controllable by valves. The inlet lines are formed at least in the region of the associated valves by means of elastic hose lines, and the valves are formed as hose pinch valves. This apparatus minimizes or eliminates contaminations arising from staining processes for thin sections that are in particular prepared for examination in an electron microscope.

Abstract: The present invention relates to a method for positioning a cutting knife of a microtome or ultramicrotome equipped with motors for moving the cutting knife. The method may include determining/defining at least two segments of the cutting knife according to a division of the previously defined width of the cutting knife, selecting a segment of the cutting knife, and positioning the cutting knife in an operational position by motorized movement of the cutting knife, the selected segment of the cutting knife being positioned to cut the specimen.

Abstract: The present invention relates to a cryopreparation chamber (100) for preparing and manipulating a sample for electron microscopy, the cryopreparation chamber (100) being cooled by a primary cryogen, the cryopreparation chamber (100) including a first and a second chamber portion (101,102), the second chamber portion (102) being detachably placeable (101) on the first chamber portion (101), and moreover, the second chamber portion (102) being provided, in its outer wall (106), with an access port (107) through which a specimen holder (108) for an electron microscope can be inserted into the cryopreparation chamber (100). The present invention also relates to a cryopreparation device (200) which is suitable for cryopreparing a sample for an electron microscope and includes such a cryopreparation chamber (100).

Abstract: A method for preparing a hydrous, cryopreserved sample that is enclosed in a sample container (1, 1a, 1b, 1c), in the case of which, at least sample material is introduced into the sample container; this is then sealed pressure-tight and subsequently cooled by a cryogen (8) in a temporal and spatial sequence, a sacrificial region (4) of the container contents (2) initially solidifying and, only subsequently thereto, the entire container contents solidifying. A sample container (1a) that may be preferably used in this case is designed to be tubular, sealed at both ends thereof, and to essentially have a U-shaped form.

Abstract: A sample stage for processing a sample in an ion beam etching apparatus has positioning arrangements each having a receiving apparatus and a mask, a sample being mountable in the receiving apparatus with reference to an ion beam and positionable relative to the mask. The sample stage includes a mechanism that enables a switchover between respective positioning arrangements so a selected positioning arrangement is respectively orientable toward the ion beam. The sample in the selected positioning arrangement is exposed to the ion beam while the remaining positioning arrangements face away from the ion beam. The positioning arrangements are arranged in one common vessel. A method for sequential preparation of at least two samples in an ion beam etching unit using the sample stage is also disclosed.