Abstract: Methods and systems for improving delayed read handling in a loop of delayed commands among a larger set of commands in a queue of commands are disclosed. In general, when commands in a delayed loop are completed out of order, “holes” are left in the command queue. Skipping over such “holes” consumes multiple clock cycles before another command can be issued, as each “hole” must be examined first in order to determine that it no longer contains a valid read command. A loop of delayed read commands can thus be created from among a larger set of commands in a queue of commands with each command entry having a pointer to the next valid command. Valid delayed read commands in the loop of commands can then be processed by automatically advancing between any two valid delayed read commands among the loop of commands. In this manner, the time to advance between any two commands in the delayed read loop is constant and PCI read performance thereof can be dramatically improved.

Abstract: A methodology for generating scan based transition patterns (i.e., ATPG pattern generation for transition delay faults (“TDF”)) wherein when either a slow-to-rise (STR) or a slow-to-fall (STE) transition fault is detected, that specific fault is removed from a fault universe as well as its companion TDF, wherein the companion fault is a fault on the same node as the detected fault but has the opposite transition. In other words, if a slow-to-rise (STR) transition fault is detected, the slow-to-rise (STR) transition fault is removed from the fault universe as well as its corresponding slow-to-fall (STF) transition fault (and vise versa). By removing companion faults as well as those which are specifically detected, pattern generation run time is reduced as well as the total pattern count for the final delay test pattern.

Abstract: Base platforms customizable into ICs are designed by identifying a plurality of macros for placement on the platform, each macro being defined in part by a plurality of elements that perform respective functions of the macro. Identical elements in a plurality of macros are identified, and a common element is placed on the platform for an identical element of at least two macros. All other elements of the macros are placed at locations on the platform relative to the common element as to satisfy macro placement rules for each macro. Identical elements can be identified by identifying similar elements in a plurality of macros, and creating a common element generic to the similar elements. The user designs a metalization layer to select macros and configure common elements to the selected macros.

Abstract: An integrated circuit, where a hard macro is resident within the integrated circuit. The hard macro receives a clock signal at a frequency that is below the operational frequency of the integrated circuit, and produces a clock signal having a frequency that is at least equal to the operational frequency of the integrated circuit. The hard macro has a first input that receives a first signal from the tester. A second input receives a second signal from the tester, offset by substantially ninety degrees from the phase of the first signal. A speed select input receives a signal, where the signal is selectively set at one of a logical high indicating a first multiplier to be applied in the hard macro, and a logical low indicating a second multiplier to be applied in the hard macro. A clock multiplication circuit receives the first signal, selectively receives the second signal, and receives the speed select signal, and produces the clock signal.

Abstract: A method for calibrating read data strobe gating including the steps of: (A) performing a coarse timing adjustment configured to determine a coarse delay setting that produces invalid data, (B) performing a medium timing adjustment configured to adjust a medium delay setting and the coarse delay setting until valid data is detected, (C) performing a fine timing adjustment configured to adjust the medium delay setting and a fine delay setting until valid data is detected and (D) adding one-half cycle to a gating delay determined by the coarse, the medium and the fine delay settings.

Abstract: An apparatus includes a first semiconductor die and at least one further semiconductor die. A substrate is attached to the first die and the further die and has an electrical interconnect pattern that interconnects contacts on the first die with respective contacts on the further die. Features of the interconnect pattern have positions on the substrate with smaller tolerances relative to positions of the contacts on the first die than to positions of the contacts on the further die.

Abstract: A method and computer readable storage medium for estimating total path delay in an integrated circuit design include of receiving as input a number of stage delays and stage delay variations constituting a path in an integrated circuit design. A sum of the stage delays, a worst case sum of the stage delay variations, and a root-sum-square of the stage delay variations are calculated. A a value of a weighting function is calculated as a function of the number of stage delays. A a weighted sum of the worst case sum of the stage delay variations and the root-sum-square of the stage delay variations is calculated from the weighting function. The weighted sum is generated as output to estimate total path delay.

Abstract: The present invention is directed to a customizable development and demonstration platform for structured ASICs. In an exemplary aspect of the present invention, the present platform may include a structured ASIC which is built on a slice and which may be flexible enough for a number of possible application developments. This flexibility may be achieved by incorporating a programmable processor in the structured ASIC and by defining interfaces and the use of an external FPGA in the present platform. The structured ASIC may include a complete ARM processor subsystem and a plurality of high speed SERDES ports. The processor subsystem may include a bus interface to the external FPGA, allowing custom gate development and test in the FPGA, prior to incorporating it into the customer product. Through the SERDES ports, the test block may be used to show the electrical characteristics of the SERDES IP. In addition, some SERDES ports may be driven from a link layer realized in the FPGA.

Abstract: A fixed-point arithmetic unit comprises a plurality of full-adders and half-adders arranged in at least an input row and an output row. A plurality of inputs to the input row is arranged to receive bits comprising a sparse-redundant representation of the integer. A converter converts 1-redundant representations of the integer to the space (1/K)-redundant representations. A process is described to design rows of a multiplier by identifying a distribution of multiplication product groups, and transforming the distribution of multiplication product groups to adders to occupy a highest unoccupied row of the multiplier.

Abstract: A method for prototyping an integrated circuit may include selecting at least one daughter card for connection to a motherboard. The daughter card is selected having an ability to provide functionality corresponding to a specific integrated circuit device. The at least one daughter card is connected to the motherboard so that the daughter card is communicatively connected to common memory provided on the motherboard. The motherboard is connected to an information handling system utilizing a prototyping interface device, the information handling system providing a virtual software modeling environment for an integrated circuit. The at least one daughter card, information handling system, prototyping interface device and motherboard emulate an integrated circuit design. At least one of software and system integration of the integrated circuit emulated by the motherboard, information handling system, prototyping interface device and the at least one daughter card is tested.

Abstract: An apparatus comprising a first processing circuit and a second processing circuit. The first processing circuit may be configured to generate (i) one or more prediction samples and (ii) a plurality of macroblocks, in response to each frame of an input video signal. The second processing circuit may be configured to (i) select one or more reference indices for each of the macroblocks from one or more sets of reference indices and (ii) generate said one or more prediction samples in response to said selected reference indices. Each of the selected reference indices is generally determined based upon minimum and maximum values for each of the one or more sets of reference indices.

Abstract: The present disclosure is directed to a method and apparatus for dividing an integrated circuit design field into a plurality of congestion rectangles having user-selectable sizes. A routing congestion value is estimated for each congestion rectangle prior to routing interconnections within the design field. The congestion values are stored in machine-readable memory and are updated in response to wire changes within the design field.

Abstract: Cells are placed into an integrated circuit floorplan by creating clusters of cells in modules, each cluster being composed of cells in a path connected to at least one flip-flop in the module, or of cells that are not in a path connected to any flip-flop. Regions are defined in the floorplan for placement of modules, and the clusters are placed into optimal locations in modules and placing the modules into optimal locations in the regions. The coordinates for the wires, modules and clusters are selectively recalculated. The clusters are moved in the floorplan for more uniform density, and the modules are assigned to regions based on module coordinates.

Abstract: The present invention provides a system and method for implementing postponed quasi-masking test output compression in an integrated circuit. The system includes a compressor for compressing a test response from N scan chains of an integrated circuit into M outputs. The test response may indicate faults in the integrated circuit. M and N are positive integers. The system further includes a correctable multiple input signature register with a size of M, which is communicatively coupled to the compressor. The correctable multiple input signature register is suitable for receiving the M outputs from the compressor as data inputs (s[0], . . . , s[M?1]) and receiving M correction bits (c[0], . . . , c[M?1]) and L address bits (a[0], . . . , a[L?1]) as correction inputs, L being a positive integer, 2L>=M. The correctable multiple input signature register is suitable for detecting faults when there is no or at least one unknown value (i.e., X-value) in the test response.

Abstract: The invention may relate to a method of programming a programmable non-volatile device. The programmable non-volatile device may be programmed while coupled to a circuit in which the programmable non-volatile device is to be used. The method may include establishing a connection and communicating information. The connection may be established from an external device to a test interface of the circuit. The information may be communicated from the external device through the test interface, for programming the programmable non-volatile device.

Abstract: Improved methods and structures for testing of SAS components, in situ, in a SAS domain. A first SAS component is adapted to generate stimuli such as error conditions to elicit a response to the error condition from a second SAS component coupled to the first in the intended SAS domain configuration. In one aspect, a SAS device controller generates stimuli applied to a SAS expander coupled thereto and verifies proper response from the SAS expander. In another aspect, a SAS expander generates stimuli applied to a SAS device controller coupled thereto and verifies proper response from the SAS device controller. Stimuli may be generated by custom circuits or firmware/software within the first component. Vendor specific SAS SMP transactions may be used to cause the first component to enter the special verification mode.

Abstract: A memory controller system is provided, which includes a plurality of system buses, a multi-port memory controller and a plurality of error correcting code (ECC) encoders. The memory controller has a plurality of system bus ports and a memory port. Each ECC encoder is coupled between a respective system bus and a respective system bus port of the memory controller.

Abstract: A method and system for validating host bus adapters uses two processing passes. In the first pass, a snapshot of all configuration values of selected peripheral devices is taken. Then, the host bus adapter is powered down for a predefined period of time and powered up again. In the second pass, all the configuration values of the selected peripheral devices are reinitialized in a recursive manner.

Abstract: A contact ring for use in electroplating of a substrate material is constructed such that fluid (e.g., electrolyte) is allowed to flow radially away from the axis of a toroidal support ring, thus preventing the trapping of fluids between the substrate and the toroidal support ring. The contact ring is constructed with a series of openings arranged about the circumference of the ring and wherein an electrical contact is placed in the path of each opening so any fluid passing through the opening also passes around the associated electrical contact. Further, the electrical contacts are also placed such that a substrate (e.g., a semiconductor wafer) can be placed inside the support ring so as to electrically contact the electrical contacts. The toroidal support ring has an aerodynamically streamlined cross-section at the openings, such that fluid flows through the openings with reduced aerodynamic drag.

Abstract: A method of tiling a customer memory design to configurable memory blocks within a standardized memory matrix. A customer memory capacity and a customer memory width is determined for the customer memory design, and a standardized memory capacity and a standardized memory width is determined for the configurable memory blocks. The customer memory capacity and the customer memory width are selectively transformed by inverse factors based at least in part on a comparison of the customer memory capacity and the standardized memory capacity. Case independent blocks are formed within the configurable memory blocks, where the case independent blocks include gate structures formed in a standardized array in a substrate in which the customer memory design is to be implemented.