Abstract: In one embodiment, a modular memory device is presented comprising a substrate, a memory array fabricated above the substrate, and first and second circuitry fabricated on the substrate and under the memory array. The first and second circuitry allow the modular memory device to interface with first and second varieties of host devices, respectively. In another embodiment, a modular memory device is presented comprising a substrate, a memory array fabricated above the substrate, memory array support circuitry fabricated on the substrate, and logic circuitry fabricated on the substrate and under the memory array.

Abstract: The present invention is a multibit nonvolatile memory and its method of fabrication. According to the present invention a silicon channel body having a first and second channel surface is formed. A charge storage medium is formed adjacent to the first channel surface and a second charge storage medium is formed adjacent to the second channel surface. A first control gate is formed adjacent to the first charge storage medium adjacent to the first channel surface and a second control gate is formed adjacent to the second charge storage medium adjacent to the second surface.

Abstract: There is provided a semiconductor device, such as a TFT, with a vertical drain offset region. The device contains a substrate having an upper first surface, a semiconductor channel region of a first conductivity type over the first surface, a gate electrode and a gate insulating layer between the gate electrode and the channel region. The device also contains a heavily doped semiconductor source region of a second conductivity type, a heavily doped semiconductor drain region of a second conductivity type. An intrinsic or lightly doped semiconductor drain offset region is located between the drain region and the channel region, such that the drain region is offset from the channel region at least partially in a direction perpendicular to the first surface.

Abstract: A three-dimensional memory array and method for storing data bits and ECC bits therein is provided. A three-dimensional memory array of the type that includes multiple vertically-stacked layers of memory cells is described. The three-dimensional memory array comprises a plurality of memory cells arranged in a plurality of physically-independent sub-arrays, and data bits and error checking and correcting (ECC) bits of a word are stored in respective ones of the physically-independent sub-arrays. By spatially diffusing data bits and ECC bits from a word, the likelihood of multiple-bit errors within the word is reduced. This is advantageous since most ECC circuitry is capable of correcting only single-bit errors within a given word.

Abstract: The preferred embodiments described herein provide a memory device and methods for use therewith. In one preferred embodiment, a method is presented for using a file system to dynamically respond to variability in an indicated minimum number of memory cells of first and second write-once memory devices. In another preferred embodiment, a method for overwriting data in a memory device is described in which an error code is disregarded after a destructive pattern is written. In yet another preferred embodiment, a method is presented in which, after a block of memory has been allocated for a file to be stored in a memory device, available lines in that block are determined. Another preferred embodiment relates to reserving at least one memory cell in a memory device for file structures or file system structures. A memory device is also provided in which file system structures of at least two file systems are stored in the same memory partition.

Abstract: An acquisition/playback device and a memory device including a solid-state write-once memory array are used to acquire and display digital information such as digital images, voice, music, or the like. Prior to display or other presentation, the digital information is stored in a re-writable memory. After the digital information has been displayed or otherwise presented to the user for review, the user then elects whether to store the digital information in the write-once memory array. Depending upon the user election, the digital information is either stored in the write-once memory array, or erased from the re-writable memory without being stored in the write-once memory array. In this way the limited storage capacity of the write-once memory array is preserved for digital information that is of long-term interest to the user.

Abstract: The present invention is a multibit nonvolatile memory and its method of fabrication. According to the present invention a silicon channel body having a first and second channel surface is formed. A charge storage medium is formed adjacent to the first channel surface and a second charge storage medium is formed adjacent to the second channel surface. A first control gate is formed adjacent to the first charge storage medium adjacent to the first channel surface and a second control gate is formed adjacent to the second charge storage medium adjacent to the second surface.

Abstract: The preferred embodiments described herein provide a memory device and method for sensing while programming a non-volatile memory cell. In one preferred embodiment, a memory device is provided with a memory cell and a detection circuit. While the memory cell is being programmed, the detection circuit determines whether the memory cell is in a programmed state. If the memory cell is in a programmed state, the programming of the memory cell is terminated. As compared with prior programming approaches, this preferred embodiment reduces programming time and power while increasing programming bandwidth (the number of memory cells that can be programmed per unit time). In another preferred embodiment, a plurality of memory cells along a wordline are programmed simultaneously. Other preferred embodiments are provided, and each of the preferred embodiments can be used alone or in combination with one another.

Abstract: The preferred embodiments described herein provide a memory device with row and column decoder circuits arranged in a checkerboard pattern under a plurality of memory arrays. In one preferred embodiment, a memory device is provided with its row decoder circuits and column decoder circuits arranged in a checkerboard pattern under a plurality of memory arrays. Because each of the row decoder and column decoder circuits is associated with the memory array above its location and an adjacent array, a denser support circuit arrangement is provided as compared to prior approaches. Other preferred embodiments are provided, and each of the preferred embodiments described herein can be used alone or in combination with one another.

Abstract: The preferred embodiments described herein provide a memory device and method for reliably reading multi-bit data from a write-many memory cell. In one preferred embodiment, a non-volatile, write-many memory cell operative to store multiple bits is provided, and the number of program/erase cycles to the write-many memory cell is limited. Limiting the number of program/erase cycles increases the probability that multi-bit data will be correctly read from the memory cell. Other preferred embodiments are provided, and each of the preferred embodiments can be used alone or in combination with one another.

Abstract: A memory device and method for storing bits in a memory array is provided. In one preferred embodiment, a memory device is provided comprising a plurality of memory cells that are in a first digital state and can be switched to a second digital state. A plurality of bits to be stored in the memory array are provided, and if the plurality of bits comprise more bits in the second digital state than in the first digital state, the plurality of bits are inverted before being stored in the memory array. In another preferred embodiment, a memory device is provided comprising a memory array and bit inversion circuitry. In yet another preferred embodiment, a plurality of bits are inverted before being stored in a memory array if the plurality of bits comprise more bits in a non-preferred digital state than in a preferred digital state.

Abstract: A 3-dimensional read only memory includes vertically stacked layers of memory cells. Each of the memory cells includes a mask programmed insulating layer, a pair of diode components, and a pair of crossing-conductors. The conductors (other than those at the top and the bottom of the array) each connect to both overlying conductors via overlying memory cells and to underlying conductors via underlying memory cells.

Abstract: A memory array is subdivided into many sub-arrays which are separately selectable in groups, with each group containing one or more sub-arrays. The various data bits of a data set are physically spread out and mapped into a large number of associated sub-array groups. All the associated sub-array groups are preferably selected during a read cycle to simultaneously read the various bits of the data set, but when writing the data set, a smaller number of sub-array groups are activated during each of several write cycles to simultaneously write only a portion of the data set. Consequently, the read bandwidth remains high and is driven by the number of bits simultaneously read, but the write power is reduced since during each write cycle fewer bits are written. Such a memory array is particularly advantageous with passive element memory cells, such as those having antifuses.

Abstract: A modular memory device includes a support element, a memory unit comprising a three-dimensional memory array carried by the support element, a device interface unit carried by the support element and coupled with the memory unit, and an electrical connector carried by the support element and coupled with the device interface unit. The memory array is well suited for use as a digital medium storage device for digital media such as digital text, digital music, digital image or images, and digital video. The device interface unit is not required in all cases.

Abstract: The present invention is directed to novel antifuse arrays and their methods of fabrication. According to an embodiment of the present invention an array comprises a plurality of first spaced apart rail-stacks having a top semiconductor material. A fill dielectric is located between the first plurality of spaced apart rail-stacks wherein the fill dielectric extends above the top surface of the semiconductor material. An antifuse material is formed on the top of the semiconductor material of the first plurality of spaced apart rail-stacks. A second plurality of spaced apart rail-stacks having a lower semiconductor material is formed on the antifuse material. In the second embodiment of the present invention the array comprises a first plurality of spaced apart rail-stacks having a top semiconductor material. A fill dielectric is located between the first plurality of spaced apart rail-stacks wherein the fill dielectric is recessed below the top surface of the semiconductor material.

Abstract: There is provided a semiconductor device, such as a TFT, with a vertical drain offset region. The device contains a substrate having an upper first surface, a semiconductor channel region of a first conductivity type over the first surface, a gate electrode and a gate insulating layer between the gate electrode and the channel region. The device also contains a heavily doped semiconductor source region of a second conductivity type, a heavily doped semiconductor drain region of a second conductivity type. An intrinsic or lightly doped semiconductor drain offset region is located between the drain region and the channel region, such that the drain region is offset from the channel region at least partially in a direction perpendicular to the first surface.

Abstract: The preferred embodiments described herein provide a memory device and method for selectable sub-array activation. In one preferred embodiment, a memory array is provided comprising a plurality of groups of sub-arrays and circuitry operative to simultaneously write data into and/or read data from a selected number of groups of sub-arrays. By selecting the number of groups of sub-arrays into which data is written and/or from which data is read, the write and/or read data rate is varied. Such varying can be used to prevent thermal run-away of the memory array. Other preferred embodiments are provided, and each of the preferred embodiments can be used alone or in combination with one another.

Abstract: The preferred embodiments described herein provide a memory device and method for temperature-based control over write and/or read operations. In one preferred embodiment, the temperature of a memory array is monitored, and a write operation to the memory array is prevented in response to the monitored temperature reaching a threshold temperature. In another preferred embodiment, the temperature of a memory array is monitored, and a read operation from the memory array is prevented in response to the monitored temperature reaching a threshold temperature. Other preferred embodiments are provided, and each of the preferred embodiments can be used alone or in combination with one another.

Abstract: A charge pump circuit includes, in a preferred embodiment, a plurality of serially-connected pump stages, each of which is driven by one or more associated clock signals for the stage. The amplitude of the clock signals associated with a respective one of the pump stages differ in amplitude from that of the clock signals associated with at least one other pump stage. As a result, the additional voltage achieved by each successive pump stage may be progressively larger for each successive pump stage. An exemplary charge pump circuit provides clock signals which increase in amplitude with each successive pump stage, and provides with each successive pump stage an output voltage having a magnitude that is a multiplicative factor of the magnitude of the input voltage for the stage. Consequently, the output voltage achieved by the exemplary charge pump circuit is an exponential function of the number of pump stages within the charge pump circuit.

Abstract: A three-dimensional, field-programmable, non-volatile memory includes multiple layers of first and second crossing conductors. Pillars are self-aligned at the intersection of adjacent first and second crossing conductors, and each pillar includes at least an anti-fuse layer. The pillars form memory cells with the adjacent conductors, and each memory cell includes first and second diode components separated by the anti-fuse layer. The diode components form a diode only after the anti-fuse layer is disrupted.