Abstract: An apparatus comprising: a processing unit configured to execute a plurality of threads; a profiling unit configured to: profile the operation of the processing unit over a time period to generate an activity profile indicating when each of the plurality of threads is executed by the processing unit over the time period; analyse the generated activity profile to determine whether a signature of the processing unit's thread execution for the time period matches a signature indicating a baseline of thread execution for the processing unit; output an alert signal if the signature of the processing unit's thread execution for the time period does not match the signature indicating a baseline of thread execution for the processing unit.

Abstract: Systems and methods for a deterministic automatic test generation (ATPG) process including Timing Exception ATPG (TEA). A method includes performing an automated test pattern generation (ATPG) process that uses timing exception information to generate a test pattern for a targeted fault of a circuit design with at least one timing exception path. The method includes testing the targeted fault of the circuit design using the test pattern to produce a test result for the targeted fault.

Abstract: A scan cell comprises: a state element and selection and combination circuitry. The selection and combination circuitry comprises first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal, second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.

Abstract: Disclosed are representative embodiments of methods, apparatus, and systems for test scheduling and test access in a test compression environment. Clusters of test patterns for testing a plurality of cores in a circuit are formed based on test information that includes compressed test data, corresponding tester channel requirements and correlated cores. The formation of test pattern clusters is followed by tester channel allocation. A best-fit scheme or a balanced-fit scheme may be employed to generate channel allocation information. A test access circuit for dynamic channel allocation can be designed based on the channel allocation information.

Abstract: This application discloses a memory device to retain stored data when receiving a voltage supply having at least a retention voltage level. The retention voltage level varies based on a supply voltage and a temperature of an environment around the memory device. A sensitive circuit can adjust the voltage supply received by the memory device based on the supply voltage and the temperature. The sensitive circuit can alter a memory bias supply voltage for the memory device to adjust the voltage supply towards the retention voltage level. The sensitive circuit can include a temperature dependent circuit to generate a bias voltage based on the supply voltage and the temperature, and an adjustment circuit to alter the memory bias supply voltage based on the bias voltage. The adjustment circuit also can include high temperature circuitry to adjust the memory bias supply voltage based on a leakage current from the memory device.

Abstract: Circuits may be designed using computer aided design tools and may comprise a plurality of different possible variants of individual components. These multi-variant component circuits may be validated to identify potential problems by generating an aggregate parametric model for the multi-variant components and then using the aggregate parametric model in applying tests to different connection networks of the circuit definition.

Abstract: Techniques and mechanisms for the use of layout-versus-schematic (LVS) design tools to validate photonic integrated circuit designs. Various implementations employ alternate analysis techniques with LVS analysis tools to perform one or more LVS analysis processes on photonic integrated circuits. These analysis processes may include curvilinear design validation and the associated flow implementations.

Abstract: Systems and methods for systems and methods for generating the complete set of IC design layout clips, or any part of the complete set, satisfying usefulness criteria and of a prespecified size. A method includes generating an initial set of integrated circuit (IC) design layout clips as a current set of IC design layout clips. The method includes removing any of IC design layout clips from the current set of IC design layout clips that do not meet the one or more usefulness criteria. The method includes, while a size of the IC design layout clips is less than a desired clip size, generating a new set of IC design layout clips from the current set of IC design layout clips according to every combination of pairs of the design layout clips in the current set of IC design layout clips, and repeating the removing process.

Abstract: Systems and methods for multi-patterning in layout design data. A method includes receiving a coloring rule by a computer system. The method includes applying the coloring rule to the layout design data to identify a unique uncolored geometric element corresponding to the rule, by the computer system. The method includes, when the applied rule did not identify the unique uncolored geometric element corresponding to the rule, repeat the receiving and applying processes with a different coloring rule. The method includes, when the applied rule did identify the unique uncolored geometric element corresponding to the rule, assigning a patterning color to the unique uncolored geometric element, by the computer system.

Abstract: A thermal transient response simulation is performed to determine a total thermal resistance value for a structure having a plurality of thermal model elements. A plurality of thermal transient response simulations are also performed for the structure to determine changed total thermal resistance values by varying one of thermal resistance values of the thermal model elements. Thermal resistance values for the thermal model elements are then determined based on the total thermal resistance value and the changed total thermal resistance values. The structure function is divided into portions associated with the thermal model elements based on the thermal resistance values for the thermal model elements.

Abstract: Disclosed systems and methods may support fabric-independent multi-patterning. A system may include a coloring constraint access engine and a fabric-independent multi-patterning engine. The coloring constraint access engine may be configured to access a set of coloring constraints to apply to geometric elements of a circuit design without accessing a fabric layer that defines a layout of the geometric elements of the circuit design, the set of coloring constraints applicable to multi-patterning the geometric elements of the circuit design to support manufacture of circuit layers using multiple manufacturing steps (e.g., via complementary lithographic masks). The fabric-independent multi-patterning engine may be configured to perform, independent of the fabric layer, a pattern coloring process according to the set of coloring constraints to determine a color assignment for the geometric elements, respectively.

Abstract: A device for electrical energy management of a vehicle system of a motor vehicle includes a power supply for supplying energy to the vehicle system of the motor vehicle. The power supply has a normal operation mode and a stand-by operation mode. A distributing device has voltage levels on the output side for supplying electrical energy to vehicle system components of the vehicle system. A state-monitoring device monitors the electrical energy supply of the power supply and controls the distributing device. A computer device has an operating system device and a volatile computer data memory that is designed to be kept energized even in the stand-by operation mode of the device for energy management, in such a way that the volatile computer data memory does not lose the data stored therein. A method and a motor vehicle corresponding to the device are also provided.

Abstract: A system may include an image clustering engine and a cluster provision engine. The image clustering image may be configured to access a set of circuit images and cluster the circuit images into different groups via an unsupervised learning process, wherein clustering by the unsupervised learning process is invariant to each invariant property of an invariant property set. A given invariant property in the invariant property set may correspond to a given image transformation, the invariant properties in the invariant property set may be discrete, and the total number of invariant properties in the invariant property set may be finite. The cluster provision engine may be configured to provide the clustered circuit images for further processing or analysis by an electronic design automation (EDA) application.

Abstract: Disclosed herein are embodiments of tools and techniques for computing the electric coupling in terms of parasitic admittance and capacitance values between a through silicon via (TSV) and surrounding interconnect of an integrated circuit layout design. In particular embodiments, a computation of one or more admittance and capacitance values between a through-silicon-via (TSV) structure and an interconnect structure of the three-dimensional integrated circuit layout design using two or more field solvers or rule-based engines that are different from one another is performed. In addition, electrical connectivity for the coupling parasitic between a TSV and an interconnect is established. Then, a parasitic netlist representation of the three-dimensional integrated circuit layout design that includes the above parasitic element values is generated.

Abstract: A system may include a quantum model engine configured to generate (e.g., load or instantiate) a quantum computing model to represent an electronic design automation (EDA) process for a circuit design. The EDA process may be a multi-patterning process to assign colors to geometric elements of the circuit design. The quantum computing model may include quantum particle types that may be defined to prohibit non-physical states in the quantum computing model from occurring. The quantum model engine may also be configured to generate a color assignment for the geometric elements of the circuit design through the quantum computing model. The system may also include a manufacture support engine configured to use the color assignment to support manufacture of circuit layers of the circuit design through multiple manufacturing steps.

Abstract: A first score and a second score for each scan cell are first determined based on numbers of test cubes in a set of test cubes having a specified value of “1” and a specified value of “0” for the each scan cell, respectively. A ranking score for each test cube in the set of test cubes is then determined based on combining the first scores and the second scores corresponding to specified bits of the each test cube in the set of test cubes. Test cubes in the set of test cubes are merged according to a sequence based on the ranking scores in a test pattern generation process.

Abstract: This application discloses a computing system to implement sensor event detection and fusion system in an assisted or automated driving system of a vehicle. The computing system can monitor an environmental model to identify spatial locations in the environmental model populated with temporally-aligned measurement data. The computing system can analyze, on a per-sensor basis, the temporally-aligned measurement data at the spatial locations in the environmental model to detect one or more sensor measurement events. The computing system can utilize the sensor measurement events to identify at least one detection event indicative of an object proximate to the vehicle. The computing system can combine the detection event with at least one of another detection event, a sensor measurement event, or other measurement data to generate a fused detection event. A control system for the vehicle can control operation of the vehicle based, at least in part, on the detection event.

Abstract: One or more binary turning function signatures for each of the layout patterns are determined. The one or more binary turning function signatures comprise binary turning function signatures for polygons in each of the layout patterns, and may further comprise binary turning function signatures for secondary polygons A binary turning function signature of a polygon is derived based on deriving a minimum binary number or a maximum binary number among variants of a binary turning function sequence number for the polygon. The variants are generated by circular bit shifting and bit sequence reversing. Similar layout patterns in the layout patterns are determined based on the one or more binary turning function signatures.

Abstract: Various aspects of the disclosed technology relate to techniques of logic diagnosis based on cell-aware diagnostic pattern generation. A first diagnosis process is performed on a failed integrated circuit based on a first fail log to generate a first set of defect suspects. The first fail log is generated by applying the first set of test patterns to the failed integrated circuit in a first scan-based test. A second set of test patterns are generated using fault models for internal defects in one or more cells included in the first set of defect suspects. The second set of test patterns are applied to the failure integrated circuit to generate a second fail log. A second diagnosis process is performed on the failure integrated circuit based on the second fail log.

Abstract: Systems and methods for re-ordering test patterns for circuit design or testing. A method includes receiving a set of scan chains and associated test patterns, and computing a penalty score for each test pattern in the set of test patterns. The method includes selecting a first pattern of the set of test patterns that has a lowest computed penalty score in the set of test patterns, and removing the first pattern from the set of test patterns and adding the first pattern to a set of ordered patterns. The method includes, for each remaining test pattern, computing an accumulated penalty score for each remaining pattern, selecting a next pattern of the set of test patterns that has a lowest accumulated penalty score in the set of test patterns, removing the next pattern from the set of test patterns, and adding the next pattern to the set of ordered patterns.