Abstract: An adjustable timer circuit capable of producing accurate pulse outputs having a wide range of periods. The timer circuit includes a timing capacitor and an associated current source for producing a reference current having a magnitude which is derived from a reference voltage. A current divider is used to divide the reference current down to a smaller current used for charging the timing capacitor. A comparator circuit is provided for comparing the voltage produced across the timing capacitor with a comparison voltage also derived from the reference voltage. The timing capacitor is discharged in response to the comparator output so that subsequent output pulses can be produced. The current divider is adjustable in response to a mode control signal so that different magnitude charging currents can be produced which results in different magnitude pulse width outputs.

Abstract: A parallel processing redundancy memory circuit. The circuit includes parallel data paths for regular memory columns and redundant columns. An input/output buffer is coupled to the parallel paths and receives I/O selection bits. In operation, address drivers simultaneously access both the regular memory and the redundant columns. The input/output buffer then selects the appropriate data path, as determined by the I/O selection bits, for writing or reading data.

Abstract: A memory system capable of being configured for optimum operation after fabrication and method of controlling same. The system includes an array of memory cells arranged in a multiplicity of rows and a multiplicity of columns, with each cell located in one of the rows being coupled to a common word line and with each cell located in one of the columns being coupled to a common bit line. Control circuitry is included for controlling memory operations, with the memory operations including programming the memory cells; reading the memory cells and preferably programming the cells. A plurality of non-volatile data storage units are provided for storing control parameter data used by the control means for controlling the memory operations. Such control parameters may can include, for example, parameters for adjusting the magnitude and duration of voltage pulses applied to the memory for carrying out programming and erasing operations.

Abstract: An asymmetric switch which minimizes transistor exposure to high voltage includes one pair of P-channel transistors with both N-wells coupled back to the programming voltage source and one, pair of P-channel transistors with independent N-wells. Two pairs of N-channel transistors and an inverting circuit are also included to provide complementary input voltages to the switch. The P-channel and N-channel transistors used as guard devices may be biased by the same voltage or separate voltages.

Abstract: A memory system having a test mode which can be used to access signals internally generated by the system during its operation. The signals accessible in the test mode are not available to a standard user of the system, but can be used by a memory chip designer to determine the cause of a device failure. The memory system includes a test signal switch which is used to route one of a multitude of internal signals to an input/output (I/O) pad where the information can be accessed by a chip designer. In order to access the internal signals, the memory system is first placed into a test mode, which acts to shut off the data paths used for reading the output of the sense amplifier included as part of the data read path or for reading the contents of the status register. A signal specifying a particular test signal of interest is then input. Decode logic is used to verify the coded input signal and control the multiplexer to route a specified internal signal through the switch to the I/O pad.

Abstract: A non-volatile memory system having means for altering the sequence of operations carried out under the control of an internal state machine which controls the data processing operations performed on the memory system. A flow control register is used to bypass an operation that would be carried out during the normal functioning of the memory system, where the register contains data bits which can be set to alter the operation of the internal state machine. The memory system is first placed into a test mode which is not accessible under the normal operating conditions. After entering the test mode, data can be written to or read from the flow control register. The data in the flow control register is used to alter the process flow of the memory system, thereby allowing a system designer to monitor how changes in the process flow improve the operation of the system.

Abstract: A memory system (preferably implemented as an integrated circuit) including an array of memory cells, a control unit for controlling operations of the system (such as programming, reading, and erasing the cells), at least one data storage unit which stores control parameter data determining at least one control parameter for the system, and default parameter circuitry for asserting at desired times one or both of: default control parameter data (regardless of the control parameter data stored in each data storage unit); and at least one default voltage level (in place of an otherwise asserted voltage level). In preferred embodiments, the default control parameter data (or voltage levels) are asserted during a test initialize mode in response to an initialization signal generated by the control unit, for use in initializing internal control registers (and voltage levels) of the system so that an external program for controlling the system during the test mode can start from a known condition.

Abstract: An integrated circuit operable in a test mode and a normal operating mode, which includes an improved test mode switch. In the test mode of preferred embodiments in which the circuit is an integrated memory chip, the test mode switch is closed so as to connect an input/output (I/O) pad directly with a selected memory cell (so a current/voltage characterization of the cell can be obtained). In the normal operating mode of these embodiments, the test mode switch is open and it isolates the I/O pad from direct connection with the selected cell even under the condition that a transistor of the test mode switch undesirably becomes conductive (e.g., due to low voltage on the I/O pad, inductive coupling, or the like).

Abstract: An address transition detection (ATD) circuit for use in a memory generates a first pulse in a first node in response to a change in state of an address signal and generates a second pulse in a second node in response to a change in state of the address signal. A load circuit accelerates assertion of the first pulse in response to assertion of the second pulse and accelerates deassertion of the first pulse in response to deassertion of the second pulse.

Abstract: A level detection circuit for monitoring the level of a power supply voltage and producing an output signal at power on for resetting various system elements powered by the supply voltage when the supply voltage reaches a predetermined level. The detection circuit, which is powered by the supply voltage includes a voltage reference circuit which produces a reference voltage having a magnitude which is relatively independent of the power supply voltage. A translator circuit functions to produce a translated voltage indicative of the supply voltage magnitude and which is comparable in magnitude to the reference voltage when the supply voltage is at a suitable level such that the system will accept a power on reset pulse. A comparator circuit functions to compare the reference voltage with the translated voltage and cause an associated output circuit to issue the reset pulse. The reset circuit typically includes a one shot circuit, the output of which is logically ORed with the amplified comparator output.

Abstract: A timer circuit for providing output pulses of an adjustable duration based upon stored decode parameters. The circuit has a timer element which generates a periodic timing signal. Preferably the frequency of the periodic timing signal is also adjustable. A frequency divider is clocked by the timing signal and provides a plurality of frequency divided outputs. A decode circuit combines selected ones of the frequency divided outputs based upon decode parameters and generates a timer circuit output pulse having a duration determined by the frequency divided outputs selected by the decode parameters. The decode parameters are stored in a non-volatile data storage unit so that the timer output pulse will remain the same after power interruption.

Abstract: A method for verifying the status of selected nonvolatile memory cells of an integrated memory circuit, such as during a memory erase or programming operation, and an integrated nonvolatile memory circuit including circuitry for performing this verification method. Preferably, the invention employs simple logic circuitry including a flip-flop to assert successful verification data only in response to a continuous validity of a verification signal throughout a sampling period, thereby avoiding false assertion of successful verification data. The sampling period is preferably longer than the expected duration of fluctuations due to noise in the verification signal. During the sampling period of a verification operation, the logic circuitry receives a raw verification signal indicative of the instantaneous relation between a measured threshold voltage of a selected memory cell and a reference voltage.

Abstract: A memory chip and method for operating a memory chip, in which one or more nodes are monitored to identify an illegal condition, and a halt signal is asserted in response to the illegal condition. If an illegal condition is identified during a high voltage mode in which high voltage is applied across transistors of the chip, assertion of the halt signal is delayed until the end of the high voltage mode. In response to the halt signal, the chip halts an operation such as a memory cell erase operation. By avoiding halt signal assertion during a high voltage mode, the invention avoids problems (e.g., due to the snap back bipolar effect) which could otherwise result due to switching of transistors of the chip during the process of halting chip operation in the high voltage mode.

Abstract: A circuit for generating test-mode signals for memory which uses both hardware and software protection schemes. The circuit enters a test code by receiving a high voltage at two terminals. The high voltage must remain on at least one of the terminals during the test code process. Otherwise, the circuit is reset. The test code contains test code bits and format code bits. The format code bits are the same for all test codes and distinguish the test codes from commands.

Abstract: A circuit which responds to an external standby command (a transition in a chip enable signal from an external device) by generating a delayed internal standby signal. The internal standby signal functions by switching selected components of the circuit (such as address buffers) from an active mode to a standby mode. In preferred embodiments, the circuit is a memory circuit implemented as an integrated circuit. The amount of the delay in generating the delayed internal standby signal is selected to achieve a desired decreased average response time to a sequence of commands (such as memory access commands) without excessive power consumption. In embodiments in which the circuit is a memory chip (such as a flash memory chip) having address access time in the range from 60 ns to 80 ns, the delay typically is from about 100 ns to about 200 ns.