Patents Assigned to Nanotechnologies, Inc.
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Publication number: 20140057179Abstract: A battery electrode composition is provided comprising composite particles, with each composite particle comprising active material and a scaffolding matrix. The active material is provided to store and release ions during battery operation. For certain active materials of interest, the storing and releasing of the ions causes a substantial change in volume of the active material. The scaffolding matrix is provided as a porous, electrically-conductive scaffolding matrix within which the active material is disposed. In this way, the scaffolding matrix structurally supports the active material, electrically interconnects the active material, and accommodates the changes in volume of the active material.Type: ApplicationFiled: August 22, 2013Publication date: February 27, 2014Applicant: Sila Nanotechnologies Inc.Inventors: Gleb Nikolayevich Yushin, Bogdan Zdyrko, Addison Newcomb Shelton, Eugene Michael Berdichevsky, Igor Luzinov, Alexander Thomas Jacobs, Eerik Torm Hantsoo, George Pius Gomes
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Publication number: 20140039125Abstract: A drug delivery system for delivering a drug payload to a specific tissue or cell type is disclosed. The system includes a polymalic acid molecular scaffold which can be used for attaching a plurality of molecular modules. Molecular modules include targeting antibodies for promoting cellular uptake by a target cell, and pro-drugs for altering cellular metabolism, for example, a pro-drug that alters expression of protein kinase CK2.Type: ApplicationFiled: September 19, 2013Publication date: February 6, 2014Applicants: Arrogene Nanotechnology, Inc., Cedars-Sinai Medical CenterInventors: Julia Y. Ljubimova, Keith L. Black, Eggehard Holler
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Patent number: 8642958Abstract: There is provided a composite charged particle beam apparatus, in which a first rotation axis of a rotatable stage intersects a beam irradiation axis of a FIB column and a beam irradiation axis of an SEM so as to be substantially perpendicular thereto, respectively, at a sample observing position, the rotatable stage is provided with a supporting member which can be rotated with respect to the first rotation axis, and the supporting member is connected to a movement mechanism which can dispose the sample at the sample observing position.Type: GrantFiled: March 17, 2011Date of Patent: February 4, 2014Assignee: SII NanoTechnology Inc.Inventors: Haruo Takahashi, Masakatsu Hasuda
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Publication number: 20130344391Abstract: Battery electrode compositions are provided comprising core-shell composites. Each of the composites may comprise, for example, an active material, a collapsible core, and a shell. The active material may be provided to store and release metal ions during battery operation, whereby the storing and releasing of the metal ions causes a substantial change in volume of the active material. The collapsible core may be disposed in combination with the active material to accommodate the changes in volume. The shell may at least partially encase the active material and the core, the shell being formed from a material that is substantially permeable to the metal ions stored and released by the active material.Type: ApplicationFiled: June 17, 2013Publication date: December 26, 2013Applicant: Sila Nanotechnologies Inc.Inventors: Gleb Nikolayevich Yushin, Bogdan Zdyrko, Alexander Thomas Jacobs, Eerik Torm Hantsoo, Addison Newcomb Shelton, Eugene Michael Berdichevsky
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Patent number: 8615811Abstract: A method of measuring vibration characteristics of a cantilever in a scanning probe microscope (SPM). An excitation signal is generated by a forward and backward frequency sweep signal in a frequency range including a resonance frequency of the cantilever. The cantilever is vibrated by supplying the excitation signal to a vibrating portion of the cantilever. The largest amplitude of a displacement of the cantilever in a forward path and in a backward path is directly measured, and an intermediate value of a frequency between frequencies measured on the basis of the directly measured largest amplitude of the displacement of the cantilever is detected as the resonance frequency of the cantilever.Type: GrantFiled: March 23, 2012Date of Patent: December 24, 2013Assignee: SII NanoTechnology Inc.Inventors: Masatsugu Shigeno, Yoshiteru Shikakura
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Patent number: 8608373Abstract: In a local softening point measuring apparatus and thermal conductivity measuring apparatus using a probe microscope as a base, environment of the prob˜ and a sample surface is set to 1/100 atmospheric pressure (103 Pa) or lower. Otherwise, a side surface of the probe is coated with a thermal insulation material having a thickness that enables thermal dissipation to be reduced to 1/100 or lower, to thereby reduce the thermal dissipation from the side surface of the probe, and exchange heat substantially only at the contacting portion between the probe and the sample surface.Type: GrantFiled: August 11, 2010Date of Patent: December 17, 2013Assignee: SII NanoTechnology Inc.Inventors: Kazunori Ando, Masayuki Iwasa, Masatsugu Shigeno, Hiroumi Momota, Kazutoshi Watanabe
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Patent number: 8611493Abstract: The X-ray fluorescence analyzer (100) includes: an enclosure (10); a door (20) for putting the sample into and out of the enclosure; a height measurement mechanism (7) capable of measuring a height at the irradiation point; a moving mechanism control unit (9) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit (7) for irradiating the irradiation point with a visible light laser beam; a laser start control unit (9) for irradiating the visible light laser beam by the laser unit (7) when the door is open state; and a height measurement mechanism start control unit (9) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.Type: GrantFiled: June 30, 2011Date of Patent: December 17, 2013Assignee: SII Nanotechnology Inc.Inventors: Kiyoshi Hasegawa, Yutaka Ikku, Hideki Takiguchi
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Patent number: 8601608Abstract: A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope.Type: GrantFiled: March 30, 2006Date of Patent: December 3, 2013Assignees: Japan Science and Technology Agency, SII Nanotechnology Inc.Inventors: Kenichi Maruyama, Koji Suzuki, Masato Iyoki
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Patent number: 8601609Abstract: Provided is a friction force microscope that can measure a friction force by a cantilever in a quantitative manner. The friction force microscope includes a friction force calculating mechanism that calculates an effective probe height and a torsional spring constant of the cantilever from bending sensitivity determined from displacement information in a bending direction of the cantilever and torsional sensitivity determined from displacement information in a torsional direction of the cantilever, respectively, so as to use the calculated values for calculating the friction force.Type: GrantFiled: March 1, 2012Date of Patent: December 3, 2013Assignee: SII NanoTechnology Inc.Inventors: Masatoshi Yasutake, Masafumi Watanabe
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Patent number: 8596866Abstract: To prevent erroneous detection in detecting a foreign matter, which is caused by a change in distance between a sample and an X-ray detector, provided is an X-ray transmission inspection apparatus including an X-ray tube (11) that irradiates an inspection sample element with an X-ray, an X-ray detector (13) that detects a transmission X-ray when the X-ray is transmitted through a sample, an operation portion (17) that obtains a contrast image from a transmission image of a transmission X-ray, a sensor that calculates a distance between the sample and the detector, and a mechanism that adjusts the position of the X-ray detector, in which an X-ray transmission image is picked up while the distance between the sample and the X-ray detector is kept constant.Type: GrantFiled: February 17, 2011Date of Patent: December 3, 2013Assignee: SII NanoTechnology Inc.Inventor: Yoshiki Matoba
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Patent number: 8584261Abstract: In a cantilever which is used in a scanning probe microscope or the like and has a trapezoidal cross-sectional shape formed through anisotropic etching in a silicon process, a cantilever spring constant is determined without measuring a thickness directly. A cantilever thickness is determined based on upper base and lower base lengths of the trapezoidal cross-sectional shape and geometric regularity of a surface generated by the anisotropic etching. Then, the cantilever spring constant is determined based on the cantilever thickness, a cantilever length, and a Young's modulus.Type: GrantFiled: July 10, 2012Date of Patent: November 12, 2013Assignee: SII Nanotechnology Inc.Inventors: Masafumi Watanabe, Hiroumi Momota
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Patent number: 8581206Abstract: A focused ion beam system includes a sample holder having a fixing plane for fixing a sample, a sample base on which the sample holder is provided, a focused ion beam irradiating mechanism that irradiates a focused ion beam to the sample, microtweezers that hold the sample and have the axial direction at a predetermined angle to a surface of the sample base, an opening/closing mechanism that opens and closes the microtweezers, a rotating mechanism that rotates the microtweezers about the axial direction, and a moving mechanism that moves the position of the microtweezers.Type: GrantFiled: February 17, 2010Date of Patent: November 12, 2013Assignee: SII Nanotechnology Inc.Inventors: Xin Man, Kouji Iwasaki, Junichi Tashiro
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Patent number: 8562964Abstract: A structured drug system that is useful for delivering a drug payload to a specific tissue or cell type is disclosed. The system is based on purified polymalic acid. This polymer isolated from natural sources is biocompatible, biodegradable and of very low toxicity. The polymer is extremely water soluble and contains a large number of free carboxyl groups which can used to attach a number of different active molecules. In the examples disclosed N-hydroxysuccinimide esters of the carboxyl groups are used to attach such molecules. The active molecules include monoclonal antibodies to promote specific cellular uptake and specific pro-drugs such as antisense nucleic acids designed to modify the cellular metabolism of a target cell. The pro-drugs are advantageously linked by a somewhat labile bond so that they will be released under specific conditions. In addition, the system contains amide-linked valine to encourage membrane disruption under lysosomal conditions.Type: GrantFiled: April 29, 2011Date of Patent: October 22, 2013Assignees: Cedars-Sinai Medical Center, Arrogene Nanotechnology, Inc.Inventors: Julia Y. Ljubimova, Keith Black, Eggehard Holler
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Publication number: 20130273242Abstract: The invention provides optical elements having a substrate with a textured surface, and a coating disposed on the textured surface. The coating is a multi-layer optical coating that provides desirable optical properties for the optical element. The coating is conformally disposed on the textured surface of the substrate. The invention also provides methods for making and methods for using such optical elements.Type: ApplicationFiled: April 11, 2013Publication date: October 17, 2013Applicant: Svaya Nanotechnologies, Inc.Inventors: Kevin Krogman, Thomas Hood, Siglinde Schmid, Benjamin Wang
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Patent number: 8542275Abstract: A cross-section processing and observation method includes: forming a first cross section in a sample by etching processing using a focused ion beam; obtaining image information of the first cross section by irradiating the focused ion beam to the first cross section; forming a second cross section by performing etching processing on the first cross section; obtaining image information of the second cross section by irradiating the focused ion beam to an irradiation region including the second cross section; displaying image information of a part of a display region of the irradiation region from the image information of the second cross section; displaying the image information of the first cross section by superimposing it on the image information being displayed; and moving the display region within the irradiation region. Observation images in which display regions are aligned can be obtained while reducing damage to the sample.Type: GrantFiled: September 13, 2010Date of Patent: September 24, 2013Assignee: SII Nanotechnology Inc.Inventors: Masahiro Kiyohara, Makoto Sato, Haruo Takahashi, Junichi Tashiro
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Patent number: 8513602Abstract: The crystal structure of the emitter can be accurately grasped from a FIM image without being influenced by disturbances, such as contamination, and even if the rearrangement of atoms has been performed, whether or not the crystal structure of the emitter has returned to the original state can also be accurately determined. There is a provided a focused ion beam apparatus including an emitter 10, a gas source 11 which supplies gas G2, a cooling unit 12 which cools the emitter, a heating unit 13 which heats the tip of the emitter, an extraction power source unit 15 which applies an extraction voltage to ionize the gas into gas ions at the tip of the emitter, and then extract the gas ions, a beam optical system 16 which makes the extracted gas ions into a focused ion beam (FIB), and then radiates the focused ion beam onto a sample S, an image acquiring mechanism 17 which acquires a FIM image of the tip of the emitter, and a control unit 7 having a display unit and a storage unit 7b.Type: GrantFiled: February 25, 2010Date of Patent: August 20, 2013Assignee: SII Nanotechnology Inc.Inventors: Takashi Ogawa, Kenichi Nishinaka, Yoshihiro Koyama
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Patent number: 8513627Abstract: An assist gas having a very small amount and a uniform concentration is fed by a charged particle beam apparatus, in which a supply amount of gas is intermittently fed by a massflow controller, and gas is passed through a diffusion mechanism connected to the massflow controller, whereby an assist gas having a very small amount and a uniform concentration.Type: GrantFiled: February 11, 2009Date of Patent: August 20, 2013Assignee: SII NanoTechnology Inc.Inventor: Masayuki Maruo
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Patent number: 8495759Abstract: Provided is an aligning method capable of setting a sample observation unit such as an optical microscope to a probe microscope observation position at high precision. A sample having a known structure is used in advance. A surface of the sample and a shape of a cantilever provided with a probe are observed using the sample observation unit such as the optical microscope. A sample observation position and a probe position which are obtained using the sample observation unit are verified, and a relative positional relationship therebetween is recorded. Then, a first mark indicating a position of the cantilever and a second mark which is displayed in conjunction with the first mark and has the relative positional relationship with the first mark are produced to align the sample relative to the second mark.Type: GrantFiled: July 28, 2009Date of Patent: July 23, 2013Assignee: SII NanoTechnology Inc.Inventors: Shigeru Wakiyama, Hiroyoshi Yamamoto, Yoshiteru Shikakura, Itaru Kitajima
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Patent number: 8460842Abstract: A defect repair apparatus for an EUV mask has an ion beam column that scans and irradiates the EUV mask with a focused hydrogen ion beam such that no region of the EUV mask receives an amount of beam irradiation exceeding 4×1016 ions/cm2. The ion beam column comprises a gas field ion source having an emitter with a pointed tip end that emits hydrogen ions that form the hydrogen ion beam, and an ion optical system that focuses and scans the hydrogen ion beam onto the EUV mask. A detector detects secondary charged particles generated from the EUV mask when irradiated with the hydrogen ion beam, and an image forming section forms and displays an observation image of the EUV mask on the basis of an output signal from the detector so that a defect in the EUV mask and the progress of the defect repair can be observed.Type: GrantFiled: January 28, 2011Date of Patent: June 11, 2013Assignee: SII NanoTechnology Inc.Inventors: Takashi Ogawa, Hiroshi Oba, Fumio Aramaki, Anto Yasaka
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Patent number: 8422630Abstract: In order to prevent misdetection and erroneous detection by clearly determining only a contrast caused by a foreign matter, there are provided an X-ray inspection method and an X-ray inspection device including: an X-ray tube (11) for irradiating a measurement sample with a characteristic X-ray having energy lower than an X-ray absorption edge of one element contained in the measurement sample and having energy higher than an X-ray absorption edge of a detection element; an X-ray detector (13) for receiving a transmission X-ray obtained when the X-ray passes through the sample; and an operation portion (15) for obtaining a contrast image from a transmission image of the transmission X-ray.Type: GrantFiled: June 7, 2010Date of Patent: April 16, 2013Assignee: SII NanoTechnology Inc.Inventor: Yoshiki Matoba