Patents Assigned to Otsuka Electronics Co., Ltd.
  • Patent number: 7483550
    Abstract: A test pattern is moved on a screen 5 subject to measurement with the field of view of an image sensor pursuing the motion of the test pattern so as to observe BEW. Subsequently, the field of view 33 of the image sensor is moved at the same velocity vc as in the foregoing observation to capture an image of a static pattern PE, and a blur width W along the scrolling direction that appears in a distribution profile of the captured image is observed. Based upon the blur width W and the exposure time of the image sensor for capturing the image of the static pattern PE, the moving velocity of the test pattern at the time of observation of the BEW is estimated, and by using the moving velocity, the BEW is normalized. Evaluation of the moving image quality of the screen is carried out by using the normalized N BEW. The moving velocity of the original test pattern can thus be estimated easily and accurately, and accordingly, the moving image quality of the screen can be evaluated accurately.
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: January 27, 2009
    Assignee: Otsuka Electronics Co., Ltd
    Inventors: Koichi Oka, Yoshi Enami
  • Publication number: 20080283723
    Abstract: An observation light generated by an observation-purpose light source has a beam cross section where the light intensity (light quantity) is substantially uniform. A mask portion masks a part of the observation light so that the light intensity of a region corresponding to a reticle image at the beam cross section is substantially zero. The observation light including a shadow region formed corresponding to the reticle image is reflected from a beam splitter and applied to an object to be measured. Based on the contrast (difference between light and dark parts) of a reflected image corresponding to the reticle image projected on the object to be measured, the focus state of the measurement light on the object to be measured is determined.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 20, 2008
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Tadayoshi FUJIMORI, Yoshimi Sawamura, Keiji Yamasaki
  • Publication number: 20080285026
    Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 20, 2008
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Makoto OKAWAUCHI, Tsutomu Mizuguchi, Shiro Kawaguchi
  • Patent number: 7449097
    Abstract: The present invention provides an electrophoretic mobility measuring apparatus capable of conducting measurement with high sensitivity with optical attenuation reduced by incidence of light through the electrode face. This apparatus comprises a transparent electrode 63 forming a part of a cell wall of a cell 6 capable of confining a sample, and the other electrode 62 opposite to the transparent electrode 63. A voltage is applied across these electrodes 62, 63, and light is incident upon the inside of the cell 6 through the transparent electrode 63. The scattering light which scatters from a sample S at a predetermined angle ? with respect to the incident angle, is received through the transparent electrode 63. The Doppler displacement is then measured based on the difference in frequency between the incident light and the outgoing light.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: November 11, 2008
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Mitsunao Sekiwa, Kazunori Tsutsui, Katsuhiro Morisawa, Takashi Fujimoto, Atsushi Toyoshima
  • Patent number: 7394483
    Abstract: A measurement pattern is moved on a display, and an image of the measurement pattern is captured by making a visual field of an image sensor follow the scroll of the measurement pattern. On the basis of the captured image, a motion picture response curve is obtained. Then, the motion picture response curve is transformed into an MTF (modulation transfer function). A normalized spatial frequency value N_Sf(a %) at which an MTF value starts declining by a predetermined percentage from a highest luminance portion of the MTF is determined. Then, the motion image quality of the display is evaluated on the basis of the normalized spatial frequency value N_Sf(a %). Thus, the evaluation of the motion image quality of the display can be achieved on the basis of an intuitively understandable motion image quality evaluation index.
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: July 1, 2008
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Koichi Oka
  • Patent number: 7251035
    Abstract: An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M1) which reflects the light emitted from the light source (S), a long light path gas cell (1) to which the light reflected on the first mirror (M1) is introduced, a second mirror (M2) which reflects light outputted from the long light path gas cell (1), a sensor (D) which detects the light reflected on the second mirror (M2), and optical elements (21, 22) disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X, Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors (6, 7) disposed in the gas cell (1) is corrected, thereby preventing reduction of the transmittance of the gas cell (1).
    Type: Grant
    Filed: May 23, 2005
    Date of Patent: July 31, 2007
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Koichi Oka, Satoshi Nitta
  • Patent number: 7236250
    Abstract: A dynamic light scattering measurement apparatus using a phase modulation type interference method includes an optical coupler for dividing light from a low coherent light source, a converging lens for irradiating one of the divided lights to a sample 9, phase modulators for modulating the phase of the other divided lights, a spectrum measurement means for measuring a spectrum of the interference light of the phase-modulated reference light and the scattered light outgoing from the sample, and an analyzing means for measuring the dynamic light scattering of particles of the sample based on the first order spectrum corresponding to the basic frequency of the phase-modulating signal or a higher order spectrum corresponding to a frequency equal to two, three or the like times the basic frequency appearing in the interference light spectrum measured by the spectrum measurement means.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: June 26, 2007
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Toshiaki Iwai, Katsuhiro Ishii
  • Patent number: 7230713
    Abstract: The polarization angle ?1 of a polarizer (14) is set, and the reflection intensity S1 in a cross Nicol state and the reference reflection intensity Ref1 of a liquid crystal cell (15) are measured. A different polarization angle ?2 is then set, and the reflection intensity S2 in a cross Nicol state and the reference reflection intensity Ref2 of the liquid crystal cell are measured. The rations S1/Ref1, S2/Ref2 of measured intensities and the ratio S1·Ref2/S2·Ref1 is determined in order to cancel the background components of the reference reflection intensities Ref1, Ref2 thus determining the value of cell gap accurately.
    Type: Grant
    Filed: February 9, 2001
    Date of Patent: June 12, 2007
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Tomohiro Akada, Masaya Takizawa
  • Patent number: 7176464
    Abstract: Impurity is removed from gas, the resultant gas is introduced into a cell 15, and the intensity of light transmitted through the cell 15 is measured as a reference. Gas containing impurity of which concentration is known, is introduced into the cell 15, and the intensity of light transmitted through the cell 15 is measured with the temperature and pressure maintained at those used at the measurement of the reference light intensity. Then, the absorbance of the impurity is obtained according to the ratio of the two light intensity data obtained by the two measurements above-mentioned. The impurity absorbance thus obtained is stored, in a memory 20a, as a function of an impurity concentration. Gas containing impurity of which concentration is unknown, is introduced into the cell 15, and the intensity of light transmitted through the cell 15 is measured with the temperature and pressure maintained at those used at the measurements above-mentioned.
    Type: Grant
    Filed: July 15, 2005
    Date of Patent: February 13, 2007
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Koichi Oka, Satoshi Nitta
  • Patent number: 6922247
    Abstract: In an automatic optical measurement method according to the invention, with a movable reflection plate 6 moved to place under an optical axis, light projected from a light projecting portion 3a is received by a light receiving portion 3b via the movable reflection plate 6, a stationary reflection plate 11 and the movable reflection plate 6, whereas with the movable reflection plate 6 moved away from the optical axis and a reference 8 set on a sample stage 10, light projected from the light projecting portion 3a is received by the light receiving portion 3b via the reference 8 whereby a ratio between the intensities of the received lights is determined.
    Type: Grant
    Filed: July 26, 2001
    Date of Patent: July 26, 2005
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Naoki Inamoto, Yoshimi Sawamura, Shinji Fujimura, Kunikazu Taguchi
  • Patent number: 6885448
    Abstract: A photon correlator comprises a plurality of sampling gates 11a-11e which are open during different periods of time; a plurality of memories 12a-12e each provided corresponding to each of the plurality of sampling gates 11a-11e for storing data corresponding to the number of photons; and a data processing control section for reading out the data stored in the memories 12a-12e, and performing a correlation calculation by means of software. The mechanism of the hardware comprising the sampling gates 11a-11e and memories 12a-12e enables high-speed writing of data in the memories and real-time read out of the data. In addition, the software performs correlation calculations in parallel with the above processing. Accordingly, the particle sizes and diffusion coefficient of particles in a fluid can be obtained at high speed under various conditions.
    Type: Grant
    Filed: March 26, 2002
    Date of Patent: April 26, 2005
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazunori Tsutsui, Motonobu Akagi, Yasushi Zasu, Katsuhiro Morisawa
  • Patent number: 6879395
    Abstract: In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.
    Type: Grant
    Filed: June 19, 2001
    Date of Patent: April 12, 2005
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kouichi Oka, Makoto Okawauchi
  • Patent number: 6859274
    Abstract: A light spectrum detecting apparatus according to the present invention comprises a photodetector (13) and a light transmitting plate (13b) covering a light receiving surface (13a) of the photodetector (13), and in the apparatus, a front surface S of the light transmitting plate 13b is inclined and, among incidents lights, any light once reflected by a back surface T of the light transmitting plate (13b) travels thereafter, with being totally reflected by the front surface S and the back surface T of the light transmitting plate (13b), to a side surface 13d of the light transmitting plate (13b). Any stray light can be prevented from entering the photodetector (13).
    Type: Grant
    Filed: July 5, 2001
    Date of Patent: February 22, 2005
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Naoki Inamoto
  • Patent number: 6750967
    Abstract: The constitution of a probe for measuring light scattering according to this invention is as follows: a light input optical fiber 4 and a scattered light measuring optical fiber 6 for collecting and transmitting scattered light are inserted into a main body of the probe 3; the optical fiber 4 is passed through a hole provided in the probe 3 for measuring light scattering to extend outward; an end portion of each of the optical fibers 4, 6 is covered with a ferrule 66 or 67; an end of each of the ferrules 66, 67 is cut into the shape of a truncated cone such that a part of or the entire end face of the optical fiber 4 or 6 remains; and the ferrules 66, 67 are held by a support body 70 and the like in such a manner that the end faces of the optical fibers 4, 6 are disposed to be adjacent to each other at a predetermined angle with a predetermined distance in between. Accordingly, the end portions of the optical fibers can be reinforced and protected by the ferrules even when they have poor strength.
    Type: Grant
    Filed: October 30, 2002
    Date of Patent: June 15, 2004
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazunori Tsutsui, Tsutomu Mizuguchi
  • Patent number: 6636308
    Abstract: The present invention relates to a light scattering intensity measuring apparatus capable of measuring, as a function of the scattering angle, the intensity of the light scattered from a sample. This apparatus comprises an ellipsoidal mirror 24 for reflecting and condensing the scattered light from a sample 23; an image-forming lens 25 disposed at the condensing point of light reflected by the ellipsoidal mirror 24 for forming, on a camera face, the image formed on the surface of the reflection mirror 24; and a camera 26 for recording the image formed by the image-forming lens 25. The scattered light in a wide angle range can be detected in a very short period of time (FIG. 1).
    Type: Grant
    Filed: May 18, 2000
    Date of Patent: October 21, 2003
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazunori Tsutsui, Koichi Oka, Masayoshi Funato, Akira Kawaguchi, Tetsuo Hamada, Michio Tsujio
  • Patent number: 6628389
    Abstract: Light is directed to a VA (Vertical Alignment) liquid crystal panel whose optical axis is in a direction perpendicular to the panel surface in such a manner that the light is incident obliquely on the VA liquid crystal panel surface, by which birefringence that results only from the liquid crystal layer is artificially generated so that measurement of the thickness (cell gap) of the VA liquid crystal is accurately performed.
    Type: Grant
    Filed: May 9, 2001
    Date of Patent: September 30, 2003
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Tomohiro Akada, Kenji Murano, Koichi Kuraue
  • Patent number: 5638167
    Abstract: A display screen inspecting method wherein, a plurality of display picture elements are selected, as markers, from a display screen and light receiving picture elements corresponding to the display picture elements are selected. The light amounts of the display picture elements are measured using the light receiving picture elements and each of the light amounts thus measured is fitted to a predetermined function form symmetric with respect to the center thereof such that the center of each display position is obtained. The difference in position between each of the center positions and each of the specified corresponding light receiving picture elements is obtained and based on such positional differences, a strain of the display screen or a positional shift between the display screen and an inspection screen, in terms of a positional function, is obtained.
    Type: Grant
    Filed: September 5, 1995
    Date of Patent: June 10, 1997
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Takashi Nakamura
  • Patent number: 5333610
    Abstract: Using optical measurement data obtained from a light-diffusive object the percentage absorption %ABS of the object is calculated, and using one constant or a multiple constant n.sub.i (.sub.i =1,2, . . .) the spectrum waveform is calculated according the equation as follows:S(.lambda.)=exp [n.multidot.%ABS (.multidot.)]or the equation as follows:S(.lambda.)=.SIGMA.exp [n.sub.i .multidot.%ABS (.multidot.)]whereby a spectrum waveform nearly equal to the spectrum waveform of the inherent percentage absorption of the light-diffusive object can be obtained. By carrying out a spectrum analysis of a light-diffusive object by means the spectrum waveform S(.lambda.), the components of the object can be analyzed with high reproducibility and reliability without slicing or shattering the object.
    Type: Grant
    Filed: March 26, 1992
    Date of Patent: August 2, 1994
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Konomu Hirao
  • Patent number: 5239365
    Abstract: A thickness of a liquid crystal cell is measured by placing a liquid crystal cell having a twist angle of .theta. between a polarizer and an analyzer, by measuring the strength of transmitted light through the analyzer with the polarizing angle of the polarizer tilted by 45.degree. from the orientation of the liquid crystal cell at its entry surface, and the polarizing angle of the analyzer tilted by further 45.degree. from the orientation of the liquid crystal at its output surface, by calculating retardation d.DELTA.n from the measured light strength, and by deriving a cell thickness d from both the retardation d.DELTA.n and a known birefringence .DELTA.n of the liquid crystal cell. Since this method provides the distribution of thickness data of liquid crystal cells, good quality liquid cells with uniform construction and thus without color shade can be selected.
    Type: Grant
    Filed: March 27, 1992
    Date of Patent: August 24, 1993
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Tomokuni Inoue
  • Patent number: 5183045
    Abstract: There is carried out an NMR measurement in which a receiver coil (7) for receiving an NMR free induction signal comes in contact with or in close vicinity to one side of tissue of a living body (1) immersed in a perfusion solution (4), while a portion or whole body of the receiver coil (7) is so held as not to come in contact with the perfusion solution (4). According to this measuring method, since a portion or whole body of the receiver coil (7) does not come in contact with the perfusion solution (4), the receiver coil (7) is hardly subject to the electromagnetic influence of changes in the perfusion solution (4). This prevents the free induction signal from being embedded in noise, assuring measurement with high sensitivity. Even for a large-size internal organ, only a signal from an area presenting a uniform magnetic field may be acquired, since the measurement is carried out with the receiver coil (7) coming in contact with or in close vicinity to one side of the internal organ.
    Type: Grant
    Filed: April 16, 1990
    Date of Patent: February 2, 1993
    Assignee: Otsuka Electronic Co., Ltd.
    Inventors: Susumu Takamura, Takashi Nakamura, Makoto Okawauchi, Harumi Toda, Ichiro Kanki, Minoru Yoshida, Toshiyuki Imoto, Naomi Negayama, Koichi Oka