Abstract: A POP (Package-On-Package) semiconductor device with encapsulating protection of soldered joints between the external leads, primarily comprises a plurality of stacked semiconductor packages and dielectric coating. Each semiconductor package includes at least a chip, a plurality of external leads of leadframe, and an encapsulant where the external leads are exposed and extended from a plurality of sides of the encapsulant. Terminals of a plurality external leads of a top semiconductor package are soldered to the soldered regions of the corresponding external leads of a bottom semiconductor package. The dielectric coating is disposed along the sides of the encapsulant of the bottom semiconductor package to connect the soldered points between the external leads and to partially or completely encapsulate the soldering materials so that the stresses between the soldered joints can be dispersed and no electrical shorts happen.

Abstract: A mold array process (MAP) for manufacturing a plurality of semiconductor packages is revealed. Firstly, a substrate strip including a plurality of substrate units arranged in an array within a molding area is provided. A plurality of chips are disposed on the substrate units. An encapsulant by molding is formed on the molding area of the substrate strip to continuously encapsulate the chips. During the molding process, an adjustable top mold is implemented where a cavity width between two opposing sidewalls inside a top mold chest can be adjusted to make the mold flow speeds at the center and at the side rails of the molding area the same.

Abstract: An IC package mainly includes a substrate having slot(s), a chip, a protective encapsulant, a stiffening encapsulant, and a plurality of external terminals. The Young's modulus of the stiffening encapsulant is greater than the one of the protective encapsulant and the curing shrinkage of the stiffening encapsulant is smaller than the one of the protective encapsulant. The protective encapsulant is formed on one of the surfaces of the substrate for encapsulating the chip. The stiffening encapsulant protrudes from the other surface of the substrate where the external terminals are disposed. Moreover, the stiffening encapsulant is formed inside the slot and is contacted with the chip. Since the stiffening encapsulant is embedded and formed inside the slot, therefore, the contact area of the stiffening encapsulant with the substrate is increased to enhance the warpage resistance of the IC package.

Abstract: A leadframe-based semiconductor package is revealed, primarily comprising a chip, a plurality of leads of a leadframe, a multi-layer tape, and an encapsulant. The multi-layer tape is attached to the chip and includes an adhesive layer disposed on a dielectric core layer. The internal leads of the leads are partially embedded in the adhesive layer in a manner not to directly contact the dielectric core layer. A bonding interface with a U-shaped profile is formed between the adhesive layer and each internal lead to increase the adhesions of the leads so that the internal leads will not be shifted nor delaminated during molding processes. The concentrated stresses exerted on the internal leads disposed at the corners of the packages will be released and reduced.

Abstract: A substrate for multi-chip stacking and a multi-chip stack package utilizing the substrate and its applications are disclosed. The substrate comprises a first wire-bonding finger, a second wire-bonding finger, a trace configured for electrical transmission and a loop wiring on a same surface. The first wire-bonding finger and the second wire-bonding finger are adjacent each other and to a die-attaching area of the substrate. The loop wiring connects the first wire-bonding finger with the second wire-bonding finger in series and connected to the trace. The loop wiring can be selectively broken or not when at least two chips are stacked on the die-attaching area and electrically connected to the first and second wire-bonding fingers respectively. Accordingly, the chips can operate respectively and independently without mutual interference if one of the chips is fail.

Abstract: The present invention discloses a method for cutting a large-size wafer and an apparatus for the same. The method of the present invention decreases the frequency of wafer transmission to reduce wafer damages, wherein a wafer is always carried by an identical working susceptor, and the working susceptor is moved to the related devices performing corresponding works, or wherein a wafer is always carried by an identical working susceptor, and the related devices are moved to the working susceptor to perform corresponding works.

Abstract: A window-type semiconductor package is disclosed to avoid peeling at the moldflow entrance, primarily comprising a substrate, a chip with the active surface attached to the substrate, a die-attaching layer bonding the active surface of the chip to a substrate core of the substrate, a plurality of bonding wires, and an encapsulant. The substrate core has a slot. One end of the slot outside the chip is formed as a moldflow entrance with two or more moldflow blocking lumps protrusively disposed on the substrate core and located at the intersections between one edge of the chip and the two opposing sides of the slot adjacent to the moldflow entrance. Accordingly, the moldflow pressures exerting at the die-attaching layer are blocked to avoid the peeling of the die-attaching layer at the moldflow entrance and to keep a constant die-attaching gap.

Abstract: A semiconductor package with multiple chips side-by-side disposed on a leadframe is revealed, primarily comprising a plurality of leads of a leadframe, a first chip, a second chip, and an encapsulant to encapsulate the chips where the chip thickness of the second chip is larger than the one of the first chip. The first chip and the second chip are individually disposed on a first die-attaching area and on a second die-attaching area of the leads or a die pad of the leadframe. The second die-attaching area is downset relative to the first die-attaching area in a manner that a bottom surface of the encapsulant is closer to the second die-attaching areas than to the first die-attaching areas. Therefore, when chips with different thicknesses are side-by-side disposed, there is no unbalanced mold flow nor package warpage issue.

Abstract: The present invention discloses a method for fabricating semiconductor elements, which comprises steps: providing a substrate having a wiring pattern on the upper surface thereon electrically connecting a wafer to the substrate for signal input and output; filling a resin into between the wafer and tire substrate to fix the wafer to the substrate; and singulating the combination of the wafer and the substrate into a plurality of semiconductor elements. Therefore, the present can simplify the fabrication process or semiconductor elements.

Abstract: The present invention discloses a lead frame and chip package structure, which comprises a plurality of leads including a plurality of inner leads and a plurality of outer leads; a plurality of chips arranged on a portion of the inner leads; a plurality of connecting wires electrically connecting the chips to the other inner leads; a support member arranged on the lower surface of the inner leads and having a fillister with an opening, wherein the backside of the opening faces the inner leads; and a resin encapsulant covering the leads, the chips, the connecting wires and the support member, and filling up the fillister with a portion of the outer leads and a portion of the surface of the support member being revealed. Further, the present invention also discloses a method for fabricating a lead frame and chip package structure, whereby the quality of a chip package is promoted.

Abstract: A Chip-On-Lead (COL) multi-chip package is revealed, primarily comprising a plurality of leads, a first chip disposed on the first leads, one or more second chips stacked on the first chip, and an encapsulant. The leads have a plurality of internal leads encapsulated inside the encapsulant where the internal leads are fully formed on a downset plane toward and parallel to a bottom surface of the encapsulant. The height between the internal leads to a top surface of the encapsulant is three times or more greater than the height between the internal leads and the bottom surface. Since the number and the thickness of the second chips is under controlled, the thickness between the top surface of the encapsulant and the most adjacent one of the second chips is about the same as the one between the internal leads and the bottom surface of the encapsulant.

Abstract: A stacked semiconductor device primarily comprises semiconductor packages with a plurality of micro contacts and solder paste to soldering the micro contacts. Each semiconductor package comprises a substrate and a chip disposed on the substrate. The micro contacts of the bottom semiconductor package are a plurality of top bumps located on the upper surface of the substrate. The micro contacts of the top semiconductor package are a plurality of bottom bumps located on the lower surface of the substrate. The bottom bumps are aligned with the top bumps and are electrically connected each other by the solder paste. Therefore, the top bumps and the bottom bumps have the same soldering shapes and dimensions for evenly soldering to avoid breakages of the micro bumps during stacking.

Abstract: A leadframe-based semiconductor package and a leadframe for the package are revealed. The semiconductor package primarily includes parts of the leadframe including one or more first leads, one or more second leads, and a supporting bar disposed between the first leads and the second leads and further includes a chip attached to the first leads, the second leads and the supporting bar, a plurality of bonding wires and an encapsulant. The supporting bar has an extended portion projecting from the first bonding finger and the second bonding finger and connected to a non-lead side of the encapsulant wherein the extended portion has an arched bend to absorb the pulling stresses and to block stress transmission. Cracks caused by delamination of the supporting bar will not be created during trimming the supporting bar along the non-lead side of the encapsulant. Moisture penetration along the cracks of the supporting bar to the die-bonding plane under the chip is desirably prevented.

Abstract: A universal substrate includes a plurality of inner pads and a plurality of outer pads. A plurality of bifurcate wirings and a plurality of fuses are formed on a surface of the substrate. The fuses are connected with the bifurcate wirings in series. By the bifurcate wirings and the fuses, each of the inner pads is electrically connected to all of the outer pads to provide optional electrical disconnections therebetween. Accordingly, the universal substrate can provide for various chips with different serial arrangements of bonding pads without replacing or manufacturing another kind of substrate.

Abstract: Disclosed is a method for forming a die-attach layer during semiconductor packaging processes. A chip carrier includes a substrate core and a stiffener. Top surface of the substrate core includes a plurality of die-attaching units and a peripheral area enclosed by the stiffener. A non-planar printing stencil is also provided. When the non-planar printing stencil is pressed against the chip carrier, the non-planar printing stencil is compliantly in contact with the substrate core and the stiffener and a plurality of printing openings of the non-planar printing stencil exposes the substrate core within the die-attaching units. During stencil printing, die-attach material fills in the printing openings to directly adhere to the substrate core. Therefore, the warpage of the substrate core is restrained to avoid bleeding of die-attach material so that die-attach materials can be formed as a die-attach layer with a uniform thickness on core-exposed chip carrier with lower costs.

Abstract: The present invention utilizes a panel substrate as the packaging substrate carried by a working susceptor. Packaging devices are hung in the nearby of the working susceptor and moved by robot arms to the working susceptor, whereby the problems of substrate warpage and substrate transportation are overcome. Further, identical or different packaging steps can be simultaneously performed in different areas of a panel substrate, whereby the cost is reduced and the product yield is promoted.

Abstract: A pillar-to-pillar flip-chip assembly primarily comprises a substrate, a chip disposed on the substrate, a plurality of first copper pillars on the bonding pads of the chip, a plurality of second copper pillars on the bump pads of the substrate, and a soldering material. A first height of the first copper pillars protruding from the active surface of the chip is the same as a second height of the second copper pillars from the solder mask on the substrate. When the soldering material electrically and mechanically connects the first copper pillars to the second copper pillars, a plurality of central points of the soldering material are formed on an equal-dividing plane between the chip and the substrate to reduce the direct stresses exerted at the soldering material to avoid peeling or breaks from the bump pads. Moreover, each of conventional solder balls is replaced with two soldered copper pillars to meet the lead-free requirements with higher reliability and lower costs.

Abstract: A stacked assembly of semiconductor packages primarily comprises a plurality of stacked semiconductor packages. Each semiconductor package includes an encapsulant, at least a chip, and a plurality of external leads of a leadframe, where the external leads are exposed and extended from a plurality of sides of the encapsulant. Each external lead of an upper semiconductor package has a U-shaped cut end when package singulation. The U-shaped cut ends are configured for locking to the soldered portion of a corresponding external lead of a lower semiconductor package where the U-shaped cut ends and the soldered portions by soldering materials. Therefore, the stacked assembly has a larger soldering area and stronger lead reliability to enhance the soldering points to against the effects of impacts, thermal shocks, and thermal cycles.

Abstract: A semiconductor package primarily comprises a plurality of leadframe's leads, a chip, a paddle, an adhesive and an encapsulant encapsulating the components mentioned above. The paddle has a carrying surface and an exposed external surface. The first chip is attached to one surface of the leads. The paddle is attached to an opposing surface of the leads by the adhesive bonding the carrying surface to the leads. Furthermore, the adhesive further encapsulates the gaps between the leads without contaminating the exposed external surface and with the exposed external surface exposed from the encapsulant. Therefore, the leads obtain a better support so that the encapsulated portions of the leads will not shift nor expose from the encapsulant during molding processes without encapsulated bubbles between the leads and the paddle. The heat dissipation is also enhanced.

Abstract: A method of forming an identification code for wire bonders is revealed. Firstly, a chip with a plurality of bonding pads is provided and is disposed on a chip carrier with a plurality of bonding fingers. A binary-code baseline is defined on the chip carrier to divide each of the bonding fingers into a first coding area adjacent the bonding pads and a second coding area far away from the bonding pads. Then, a plurality of bonding wires are formed by wire bonding to electrically connect the bonding pads to the bonding fingers and an ID code for wire bonders is formed at the same time where each bonding wire has an end selectively bonded to either the first coding area or the second coding area of the corresponding bonding finger to form an ID code for wire bonders. Since the ID code for wire bonders is constituted by the selected locations of the ends of the bonding wires, the ID code do not get lost or damaged during packaging processes nor contaminate the packages.