Abstract: A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time.

Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.

Abstract: A chemotherapy agent or a pharmaceutical composition including chemotherapy agent and artificial cerebrospinal fluid, wherein the chemotherapy agent at a concentration of between 0.01 mg/ml and 0.

Abstract: A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.

Abstract: A method of operating coordinate positioning apparatus having a measurement probe includes taking a first part in a series of parts, at least a first reference geometrical property associated with one or more features of the first part being known and using the coordinate positioning apparatus to measure the one or more features of the first part and determining a first measured geometrical property corresponding to the first reference geometrical property. A first property correction value is then determined describing a difference between the first reference and the first measured geometrical properties. The coordinate positioning apparatus is then used to measure the one or more features of one or more further parts in the series of parts and, for each further part, a further measured geometrical property is determined corresponding to the first reference geometrical property. The first property correction value is then applied to each further measured geometrical property.

Abstract: A tunable narrow linewidth laser is provided, wherein an adjustable etalon structure is employed to simultaneously tune the wavelength of the laser transmission and the length of the laser cavity. The etalon structure is an effective, relatively thick shear plate comprised of transparent matched wedge-shaped substrates and a pair of parallel, partially transmissive mirrors with a space therebetween. Rotation of the etalon structure relative to the laser input changes the angle of incidence to the first substrate and the etalon angle, thereby changing the wavelength of the laser light and also changing the length of the external laser cavity. Thus, reliable frequency tuning is achieved, without mode hopping.

Abstract: An analogue probe for use with a coordinate positioning machine. The analogue probe comprises a temperature actuator which can be modulated so as maintain the temperature of at least a part of the analogue probe at a substantially constant predetermined temperature.

Abstract: A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.

Abstract: A method of determining the dimensions and location of a surface feature, for example a valve seat. The surface of the feature is measured, for example using a spiral scan path with a tactile probe and the multiple data points acquired from the scan are used to create a digitized image. The digitized image is fitted to a nominal image (e.g. CAD data) of the surface feature. The deviation of the digitized image from the nominal image is used to determine at least one of the dimensions, location and form deviation of the surface feature.

Abstract: An apparatus for digitizing an impedance is provided that comprises a first impedance element having a first impedance that varies with a property to be measured and a second impedance element having a second impedance. The apparatus also includes a drive signal generator for applying a first alternating drive signal to the first impedance element and a second alternating drive signal to the second impedance element. An analog-to-digital converter, ADC, receives a resultant signal comprising the combination of the signals produced by the application of the first and second alternating drive signals to the first and second impedance elements. The first alternating drive signal is phase shifted relative to the second alternating drive signal such that the resultant signal received and sampled by the ADC sequentially relates to the sum of, and the difference between, the first and second impedances.

Abstract: Methods are described for calibrating a turning machine having a first rotatable portion or chuck for holding a workpiece. The first rotatable portion has a first feature associated therewith. The method comprises the steps of using a measurement probe to determine the position of the first feature, rotating the first rotatable portion through an angle, and using said measurement probe to determine the new position of the first feature. The extension of the technique to swivel head mill-turn machines is also described.

Abstract: A magnetic scale includes a scale member having a plurality of grooves. The scale member defines a passive magnetic scale track. The plurality of grooves include grooves of at least a first groove type and a second groove type, the magnetic properties of the scale member in the locality of grooves of the first groove type being different than the magnetic properties of the scale member in the locality of grooves of the second groove type. The scale member is arranged to carry or encode absolute position information in the form of at least one codeword comprising a sequence of data bits, wherein each of the data bits is provided by a groove of the scale member, the data bit taking a first value if the groove is of the first groove type and a second value if the groove is of the second groove type.

Abstract: A computer-implemented method for determining a course of motion between an artifact (10) and device (28) for interacting with the artifact (10) that are moveable relative to each other in at least one linear (X, Y, Z) and one rotational (A1, A2) degree of freedom, the method comprising: receiving geometric data representing the artifact (10); receiving geometric data representing the device; and determining, from the geometric data, how the device (28) and artifact (10) can be oriented relative to each other along an interaction path so as to comply with one or more optimization criteria.

Abstract: A temperature sensor is described that comprises a temperature sensing element, a substantially thermally insulating substrate having a first side and a second side and at least one layer of substantially thermally conductive material coated on the first side of the substrate. A first hole is provided on the second side of the substrate and the temperature sensing element is arranged to sense temperature within the first hole. A plurality of additional holes may also be provided on the second side of the substrate, these holes may be coated to aid thermal transfer. The temperature sensing element may be a thermocouple. The temperature sensor may be included in a temperature measurement probe for use in measuring the temperature of workpieces produced using a machine tool.

Abstract: A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.

Abstract: A method of locating a feature of an object in which the method includes bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object. Each which the measurements gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length. The at least first and second measurements are used to reduce the extent of said uncertainty which includes using stylus orientation related information associated with the at least first and second measurements.

Abstract: A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.

Abstract: A computer-implemented method for determining a course of motion between an artifact (10) and device (28) for interacting with the artifact (10) that are moveable relative to each other in at least one linear (X, Y, Z) and one rotational (A1, A2) degree of freedom, the method comprising: receiving geometric data representing the artifact (10); receiving geometric data representing the device; and determining, from the geometric data, how the device (28) and artifact (10) can be oriented relative to each other along an interaction path so as to comply with one or more optimization criteria.

Abstract: A method and apparatus are described for forming a pattern including one or more markings on a substrate. The method includes the step of forming each marking by locally heating the substrate, for example using a fibre laser. A step is also performed of monitoring the temperature of the substrate, e.g. using a temperature sensor, whilst each marking is being formed. The method may be used to form a magnetic encoder scale on a stainless steel substrate having a high content of martensitic material. The local heating causes the martensitic material to be transformed into austenitic material. An encoder scale made using the method is also described.

Abstract: A surface sensing device for use in position determining apparatus has an elongate stylus (74) with a tip (82) for scanning the surface of a workpiece to be measured. Lateral displacements of the stylus tip are detected by a light beam which passes along the stylus from a light source (66) to a retroreflector (78). This reflects the beam back via a beamsplitter (70) to a position sensitive detector (76). The stylus is mounted for longitudinal displacement on a carriage (72). The longitudinal displacement is measured by another light beam projected by the beamsplitter (70) onto a second position sensitive detector (84).