Patents Assigned to Renishaw, PLC
  • Patent number: 8756973
    Abstract: A method of operating a coordinate positioning apparatus having a surface sensor that is rotatable about at least a first axis. The method comprises obtaining a first measurement with the surface sensor at a first angular orientation and obtaining a at least a second measurement with the surface sensor at a second angular orientation. The first and second angular orientations are different to each other such that any offset of the surface sensor from an expected position will have at least a partially opposing affect on the first and second measurements. The method then compensates and/or establishes for the offset using the first and second measurements.
    Type: Grant
    Filed: July 11, 2008
    Date of Patent: June 24, 2014
    Assignee: Renishaw PLC
    Inventors: David Sven Wallace, Jean-Louis Grzesiak
  • Publication number: 20140157861
    Abstract: A series of nominally identical production workpieces is measured on a measuring apparatus. To correct for temperature variations, one of the workpieces forms a master artefact, the dimensions of which are known. The artefact is measured on the measuring apparatus at two or more temperatures, producing two or more corresponding sets of measured dimensional values of the master artefact at the respective temperatures. One or more error maps, look-up tables, or functions are generated which relate the measured dimensional values of the artefact to the known dimensions of the artefact. The error map(s), look-up table(s) or function(s) are dependent on the respective temperatures at which the artefact was measured. Correction values derived from the error map(s), look-up table(s) or function(s) are used to correct the measurements of production workpieces in the series. These correction values are determined in dependence upon the temperature at which the workpiece measurements were obtained.
    Type: Application
    Filed: August 9, 2012
    Publication date: June 12, 2014
    Applicant: RENISHAW PLC
    Inventors: Kevyn Barry Jonas, Leo Christopher Somerville
  • Patent number: 8747371
    Abstract: Fluid delivery apparatus is described for the delivery of fluids to regions of the body, especially for delivery to regions of the brain. The apparatus includes a first length of implantable tubing having a first end and a first fluid connector portion attached to the first end of the first length of implantable tubing. The first fluid connector portion is releaseably connectable to a complementary second fluid connector portion. An implantable housing is also provided for enclosing and protecting the first fluid connector portion. The implantable housing is openable to provide access to the first fluid connector portion. For example, the housing may have a hinged lid or cover portion. A corresponding method is also described.
    Type: Grant
    Filed: March 12, 2007
    Date of Patent: June 10, 2014
    Assignee: Renishaw PLC
    Inventor: Steven Streatfield Gill
  • Patent number: 8739425
    Abstract: A coordinate positioning apparatus is described. The coordinate positioning apparatus comprises a mounting surface, a motion guide mountable on the mounting surface, a first member comprising a sensor for sensing scale markings, the first member being mountable on the motion guide, and an encoder scale member comprising a first set of scale markings which are, in use, sensable by the sensor. At least part of the encoder scale member is retained between the mounting surface and the motion guide such that the encoder scale member is supported by the mounting surface at least in the vicinity of the first set of scale markings. The motion guide may be a guide rail or a bearing, for example. En encoder scale member for use with such a coordinate positioning apparatus is also described.
    Type: Grant
    Filed: February 16, 2010
    Date of Patent: June 3, 2014
    Assignee: Renishaw PLC
    Inventor: James Reynolds Henshaw
  • Patent number: 8742956
    Abstract: A position encoder kit, including: a scale comprising a series of position features; and a readhead. The readhead includes a detector for receiving configuration information from a configuration item. The readhead is configured to operate in accordance with the configuration information. The readhead also includes a receiver interface via which the readhead can supply position information to a receiver.
    Type: Grant
    Filed: April 8, 2010
    Date of Patent: June 3, 2014
    Assignee: Renishaw PLC
    Inventors: Iain R. Gordon-Ingram, Andrew P. Gribble, Simon E. McAdam
  • Publication number: 20140144033
    Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.
    Type: Application
    Filed: January 31, 2014
    Publication date: May 29, 2014
    Applicant: Renishaw PLC
    Inventors: Michael John WOOLDRIDGE, Peter Kenneth HELLIER, Robert Charles D'Olier UMFREVILLE
  • Publication number: 20140123458
    Abstract: A method of manufacturing at least one component in at least one component area on a substrate using a machine that has a substrate processing part relatively moveable with respect to the substrate. The method includes, at least when the substrate processing part and substrate are in a positional relationship in which the substrate processing part can process the at least one component area on said substrate, measuring the position of the substrate processing part relative to the substrate, by reading at least a first metro logical scale provided by the substrate.
    Type: Application
    Filed: July 5, 2012
    Publication date: May 8, 2014
    Applicant: RENISHAW PLC
    Inventors: Corrie W. M. Fearon, Geoffrey McFarland
  • Patent number: 8700351
    Abstract: Measurement apparatus is described that comprises a measurement portion for acquiring object measurements and an output portion for outputting measurement data relating to the acquired object measurements. A deactivation portion is provided for inhibiting normal operation of the measurement apparatus such that output of the measurement data is prevented. The deactivation portion, in use, reads apparatus usage information from an apparatus usage module and inhibits normal operation of the measurement apparatus if said apparatus usage information fails to meet one or more predetermined criteria. The apparatus usage module may be provided as an integral part of the measurement apparatus or as a separate activation button. The measurement apparatus may comprise a measurement probe such as a touch trigger measurement probe.
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: April 15, 2014
    Assignee: Renishaw PLC
    Inventors: Tim Prestidge, Jonathan Paul Fuge, Stuart Kersten Campbell
  • Publication number: 20140085630
    Abstract: This invention concerns a spectroscopic method, apparatus for determining whether a component is present in a sample. In one aspect, the method includes resolving a model of the spectral data separately for candidates from a set of predetermined component reference spectra, and determining whether a component is present in the sample based upon a figure of merit quantifying an effect of including the candidate reference spectrum corresponding to that component in the model.
    Type: Application
    Filed: May 16, 2012
    Publication date: March 27, 2014
    Applicant: RENISHAW PLC
    Inventors: Ian Mac Bell, Thomas James Thurston, Brian John Edward Smith, Jacob Filik
  • Patent number: 8672575
    Abstract: A pivot joint has a first member having a ball located at one end, a fixed member having one or more bearing surface, which locates on the ball of the first member and a second member having one or more bearing surface located at one end which locates onto the ball of the first member. The first and second members are rotatable about the center of the ball. This type of pivot joint is suitable for use in a machine such as a Stewart platform.
    Type: Grant
    Filed: June 11, 2007
    Date of Patent: March 18, 2014
    Assignee: Renishaw PLC
    Inventor: David Roberts McMurtry
  • Patent number: 8676533
    Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.
    Type: Grant
    Filed: March 9, 2009
    Date of Patent: March 18, 2014
    Assignee: Renishaw PLC
    Inventors: Michael John Wooldridge, Peter Kenneth Hellier, Robert Charles D'Olier Umfreville
  • Patent number: 8674258
    Abstract: A method of making metrological scale for scale reading apparatus includes directing a laser beam onto a scale substrate (12). The laser parameters are such that the local area of the scale substrate (12) on which the laser beam is incident is caused to be displaced, thus creating scale markings (16, 20, 22).
    Type: Grant
    Filed: May 10, 2006
    Date of Patent: March 18, 2014
    Assignee: Renishaw PLC
    Inventors: Alexander David Scott Ellin, James Reynolds Henshaw
  • Publication number: 20140046630
    Abstract: A method of estimating background radiation in spectral data. The method may comprise, iteratively, fitting an analytical curve, such as a spline curve, to reference data, determining an allowable deviation of the reference data from the analytical curve and clipping data points of the reference data or the spectral data that are more than the allowable deviation above the analytical curve to provide the reference data for the next iteration until termination criterion is met. The reference data is initially based upon the spectral data. The method may comprise generating estimates of background radiation of the spectral data, each estimate based upon fitting a different order polynomial to the spectral data, and selecting an order of polynomial to use for estimating background radiation and/or one of the estimates of the background radiation. The method may further comprise estimating the noise in the spectral data from the reference data.
    Type: Application
    Filed: October 17, 2013
    Publication date: February 13, 2014
    Applicant: RENISHAW PLC
    Inventor: Brian John Edward SMITH
  • Publication number: 20140012409
    Abstract: A coordinate positioning apparatus including: a coordinate positioning machine having a measuring probe for interacting with an artefact to obtain measurement data regarding the artefact. The measuring probe and artefact are moveable relative to each other in at least one machine degree of freedom. The apparatus further includes a hand-held device, moveable in free-space in a plurality of device degrees of freedom, for controlling movement of the measurement probe relative to the artefact. The hand-held device includes at least one motion sensor for sensing movement of the hand-held device in free-space. The apparatus is configured such that the relative movement of the measurement probe and artefact is controlled by said movement of the hand-held device in free-space.
    Type: Application
    Filed: March 26, 2012
    Publication date: January 9, 2014
    Applicant: RENISHAW PLC
    Inventors: David Roberts McMurtry, Geoffrey McFarland, Matthew James Breckon
  • Publication number: 20130335071
    Abstract: The present invention relates to a method for producing a magnetic substrate for an encoder scale. The method comprising the step of mechanically working the substrate, wherein the substrate is cooled prior to the mechanical working step. In one embodiment, a stainless steel substrate is used. The stainless steel may comprise an austenite (non-magnetic) phase and a martensite (magnetic) phase. Mechanically working and cooling in this manner increases the amount of magnetic (martensite) phase material that is formed, thereby improving the magnetic contrast when non-magnetic (austenite) marking are subsequently formed on the substrate by laser marking.
    Type: Application
    Filed: March 5, 2012
    Publication date: December 19, 2013
    Applicants: RENISHAW PLC, RLS MERILNA TEHNIKA D.O.O.
    Inventors: Peter Kogej, Vojteh Leskovsek
  • Patent number: 8601701
    Abstract: A method and apparatus for controlling or programming a measurement path for a probe mounted on a coordinate positioning apparatus (e.g. an articulating probe head mounted on a CMM) which enables both the position of the probe tip and the orientation of the probe to be varied. In a first mode, the position of the probe tip is adjusted. In a second mode the orientation of the probe is adjusted, while keeping the location of the probe tip unchanged. This may be achieved either online on the coordinate positioning apparatus or offline in software.
    Type: Grant
    Filed: April 22, 2008
    Date of Patent: December 10, 2013
    Assignee: Renishaw PLC
    Inventor: David Sven Wallace
  • Patent number: 8605983
    Abstract: A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyzer configured to analyze at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyzer is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: December 10, 2013
    Assignee: Renishaw PLC
    Inventors: Nicholas John Weston, Yvonne Ruth Huddart
  • Publication number: 20130320200
    Abstract: A tool setting or tool analysis device for a machine tool includes a light source for producing a light beam. A light receiver receives the light beam and produces a signal indicative of the amount of light received. This is analysed by a main analysis circuit to generate a trigger signal to a machine controller when the beam is at least partially occluded. To provide fail-safe operation should the main circuit not recognise the tool, a back-up trigger signal is produced after a delay by a delay circuit. In one preferred form, the back-up trigger signal may oscillate, providing repeated edges which can ensure fail-safe operation even if the machine controller suffers from a blind window and therefore misses the initial trigger signal.
    Type: Application
    Filed: August 6, 2013
    Publication date: December 5, 2013
    Applicant: RENISHAW PLC
    Inventors: Edward Benjamin EGGLESTONE, Derek MARSHALL, Benjamin Jason MERRIFIELD
  • Publication number: 20130298416
    Abstract: An analogue probe for a machine tool apparatus, which includes a probe body, a stylus member movably secured to the probe body and a sensor that measures the extent of displacement of the stylus member relative to the probe body, in which the sensor is contained within a chamber in the probe body. The analogue probe further includes a vent between the chamber and the outside of the probe body, configured such that, when the vent is open, the pressure within the chamber can equalise with the analogue probe's operating environment's pressure, and is further configured such that the vent's opening to the outside of the probe body can be closed so as to seal the chamber and the sensor from external contaminants during operation of the analogue probe.
    Type: Application
    Filed: January 19, 2012
    Publication date: November 14, 2013
    Applicant: RENISHAW PLC
    Inventors: David Collingwood, Robert John Bragg
  • Publication number: 20130304250
    Abstract: An analogue probe for a machine tool apparatus, including a probe body and a stylus member movably secured to the probe body in a suspended rest position via a suspension mechanism. A sensor is provided for measuring the extent of displacement of the stylus member relative to the probe body from a rest position. The analogue probe further includes a first compliant sealing member extending between the probe body and stylus member such that the sensor is contained within a chamber sealed from external contaminants. The analogue probe also has for a suppressor for suppressing movement of the stylus member away from its suspended rest position induced by changes in the chamber's internal pressure and/or changes in the analogue probe's operating environment.
    Type: Application
    Filed: January 19, 2012
    Publication date: November 14, 2013
    Applicant: RENISHAW PLC
    Inventors: David Roberts McMurtry, David Collingwood