Patents Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
  • Patent number: 11346963
    Abstract: Disclosed herein is an X-ray detector comprises: an X-ray absorption layer configured to absorb X-ray photons; an electronics layer comprising an electronics system configured to process or interpret signals generated by the X-ray photons incident on the X-ray absorption layer; and a temperature driver in the X-ray absorption layer or the electronics layer.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: May 31, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11339493
    Abstract: Disclosed herein is a system, comprising: a detector configured to determine a number of photons of one or more characteristic X-rays emitted by a chemical element in the electrolyte and received by the detector, within a period of time; a processor configured to determine a concentration of the chemical element in the electrolyte based on the number; a controller configured to replenish the chemical element into the electrolyte or configured to stop electroplating with the electrolyte, based on the concentration.
    Type: Grant
    Filed: February 16, 2021
    Date of Patent: May 24, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11322642
    Abstract: Disclosed herein are a radiation detector and a method of making it. The radiation detector is configured to absorb radiation particles incident on a semiconductor single crystal of the radiation detector and to generate charge carriers. The semiconductor single crystal may be a CdZnTe single crystal or a CdTe single crystal. The method may comprise forming a recess into a substrate of semiconductor; forming a semiconductor single crystal in the recess; and forming a heavily doped semiconductor region in the substrate. The semiconductor single crystal has a different composition from the substrate. The heavily doped region is in electrical contact with the semiconductor single crystal and embedded in a portion of intrinsic semiconductor of the substrate.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: May 3, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11300694
    Abstract: An apparatus suitable for detecting radiation, comprising: a radiation absorption layer comprising a semiconductor, a first electrical contact and a second electrical contact, the first electrical contact positioned across the semiconductor from the second electrical contact; a DC-to-DC converter configured to apply a DC voltage between the first electrical contact and the second electrical contact, the DC-to-DC converter comprising micro-electromechanical switches.
    Type: Grant
    Filed: April 21, 2020
    Date of Patent: April 12, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventor: Peiyan Cao
  • Patent number: 11294082
    Abstract: Disclosed herein is a detector, comprising: a plurality of pixels; a first guard ring comprising a plurality of segments, wherein the detector is configured to detect charge carriers collected by the segments; a controller configured to detect charge sharing between at least one pixel of the plurality of pixels and at least one segment of the first guard ring.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: April 5, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11291420
    Abstract: Disclosed herein is a method for image tracking using an X-ray imaging system during an interventional radiology procedure on a human or an animal. The method may comprise acquiring a first image of an object inside a human or an animal with a first X-ray detector of the X-ray imaging system; acquiring a second image of the object with the X-ray imaging system during the interventional radiology procedure, at a time later than acquiring the first image; determining a displacement of the first X-ray detector based on the first image and the second image; moving the first X-ray detector by the displacement, with an actuator of the X-ray imaging system. The X-ray imaging system comprises the first X-ray detector, the second X-ray detector and the actuator. A spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: April 5, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11294081
    Abstract: Disclosed herein is a method of recovering performance of a radiation detector, the radiation detector comprising: a radiation absorption layer configured to absorb radiation particles incident thereon and generate an electrical signal based on the radiation particles; an electronic system configured to process the electrical signal, the electronic system comprising a transistor, the transistor comprising a gate insulator with positive charge carriers accumulated therein due to exposure of the gate insulator to radiation; the method comprising: removing the positive charge carriers from the gate insulator by establishing an electric field across the gate insulator.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: April 5, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11294080
    Abstract: Disclosed herein is a method for forming a radiation detector. The method comprises forming a radiation absorption layer and bonding an electronics layer to the radiation absorption layer. The electronics layer comprises an electronic system configured to process electrical signals generated in the radiation absorption layer upon absorbing radiation photons. The method for forming the radiation absorption layer comprises forming a trench into a first surface of a semiconductor substrate; doping a sidewall of the trench; forming a first electrical contact on the first surface; forming a second electrical contact on a second surface of the semiconductor substrate. The second surface is opposite the first surface. The method further comprises dicing the semiconductor substrate along the trench.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: April 5, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11289300
    Abstract: Disclosed herein is an X-ray source, comprising: a cathode in a recess of a first substrate; a counter electrode on a sidewall of the recess, configured to cause field emission of electrons from the cathode; and a metal anode configured to receive the electrons emitted from the cathode and to emit X-ray from impact by the electrons on the metal anode.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: March 29, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11224388
    Abstract: Disclosed herein is an image sensor comprising: a plurality of X-ray detectors; an actuator configured to move the plurality of X-ray detectors to a plurality of positions, wherein the image sensor is configured to capture, by using the detectors, images of portions of a scene at the positions, respectively, and configured to form an image of the scene by stitching the images of the portions.
    Type: Grant
    Filed: November 1, 2018
    Date of Patent: January 18, 2022
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11204433
    Abstract: Disclosed herein is a detector, comprising: a plurality of strip pixels, wherein each of the strip pixel is configured to count numbers of radiation photons incident thereon whose energy falls in a plurality of bins, within a period of time.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: December 21, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11204431
    Abstract: Disclosed herein is a system suitable for X-ray detection. The system comprises a detector and cooling system configured to control temperature of the detector and prevent condensation of water vapor on the detector. The detector comprises an X-ray absorption layer and electronics layer. The X-ray absorption layer comprises a plurality of pixels, each pixel configured to count numbers of X-ray photons incident thereon whose energy falls in a plurality of bins, within a period of time. The electronics layer comprises an electronic system configured to add the numbers of X-ray photons for the bins of the same energy range counted by all the pixels. The cooling system comprises a chiller configured to lower temperature and moisture level of air, and a fan configured to blow the air that is cooled and dried to the detector.
    Type: Grant
    Filed: April 20, 2020
    Date of Patent: December 21, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11199634
    Abstract: Disclosed herein is an image sensor comprising: a plurality of packages arranged in a plurality of layers; wherein each of the packages comprises an X-ray detector mounted on a printed circuit board (PCB); wherein the packages are mounted on one or more system PCBs; wherein within an area encompassing a plurality of the X-ray detectors in the plurality of packages, a dead zone of the packages in each of the plurality of layers is shadowed by the packages in the other layers.
    Type: Grant
    Filed: May 5, 2020
    Date of Patent: December 14, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11199633
    Abstract: Disclosed herein is radiation detector comprising: a radiation absorption layer configured to generate electric signals by absorbing radiation particles; an electronics layer comprising an electronic system configured to process or interpret the signals; a flexible PCB configured to receive output from the electronic system; wherein the radiation absorption layer and the flexible PCB are mounted on a same side of the electronics layer.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: December 14, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu, Chongshen Song
  • Patent number: 11201000
    Abstract: The present teaching relates to methods, systems, and apparatus for X-ray imaging with a detector capable of resolving photon energy. In one example, an X-ray microscope is disclosed. The X-ray microscope comprises an X-ray source and a detector. The X-ray source is configured for irradiating X-ray to a sample. The detector is configured for: detecting X-ray photons from the irradiated X-ray, determining energy of each of the detected X-ray photons, and generating an image of the sample based on detected X-ray photons that have energies in a predetermined range.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: December 14, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11202360
    Abstract: Disclosed herein is a system, comprising: a first X-ray source comprising a plurality of X-ray generators configured to respectively emit a plurality of X-rays toward an object; and a first X-ray detector configured to detect images of the object formed respectively by the plurality of X-rays from the first X-ray source.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: December 14, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11187819
    Abstract: Disclosed herein is an apparatus suitable for radiation detection. The apparatus may comprise a radiation absorption layer and a first electrode on the radiation absorption layer. The radiation absorption layer may be configured to generate charge carriers therein from a radiation particle absorbed by the radiation absorption layer. The first electrode may be configured to generate an electric field in the radiation absorption layer. The first electrode may have a geometry shaping the electric field so that the electric field in an amplification region of the radiation absorption layer has a field strength sufficient to cause an avalanche of the charge carriers in the amplification region.
    Type: Grant
    Filed: April 21, 2020
    Date of Patent: November 30, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11171171
    Abstract: Disclosed herein is an apparatus suitable for detecting X-ray. The apparatus may comprise an X-ray absorption layer, an electronics layer and a distribution layer. The X-ray absorption layer may comprise a first plurality of electric contacts and configured to generate electrical signals on the first plurality of electric contacts from X-ray incident on the X-ray absorption layer. The electronics layer may comprise a second plurality of electric contacts and an electronic system, wherein the electric system electrically connects to the second plurality of electric contacts and is configured to process or interpret the electrical signals. The first plurality of electric contacts and the second plurality of electric contacts have different spatial distributions. The distribution layer is configured to electrically connect the first plurality of electric contacts to the second plurality of electric contacts.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: November 9, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11156726
    Abstract: Disclosed herein are methods of making and using an absorption-unit array suitable for X-ray detection and a detector comprising such an absorption-unit array. The methods of making the absorption-unit array may include forming the absorption-unit array on a substrate and forming a guard ring encompassing more than one absorption units of the absorption-unit array after separating the absorption-unit array from the substrate; or may include forming a plurality of absorption units and a guard ring encompassing more than one of the absorption units on a portion of a substrate after separating the portion from the substrate. The method of using an absorption-unit array may include using some of the absorption units of the absorption-unit array as a guard ring by applying an electrical voltage. A detector suitable for X-ray detection comprises an absorption layer and an electronics layer, wherein the absorption layer comprises an absorption-unit array.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: October 26, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu
  • Patent number: 11154271
    Abstract: Disclosed herein is a method comprising: obtaining a third image from a first X-ray detector when the first X-ray detector and a second X-ray detector are misaligned; determining, based on a shift between a first image and the third image, a misalignment between the first X-ray detector and the second X-ray detector when the first and second detectors are misaligned; wherein the first image is an image the first X-ray detector should capture if the first and the second detectors are aligned.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: October 26, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Yurun Liu