Abstract: A method for designing and making an integrated circuit is described. That method utilizes statistical models of wire segments to accurately estimate the expected length of minimum-length, orthogonal wire segments within a block. From these estimates, the method accurately estimates an ratio between the horizontal and vertical routing resources required, termed the “H/V Demand Ratio.” From the H/V Demand Ratio, an accurate estimate of the height and width of the block may be determined. Thereafter, placement and routing may be performed quickly and accurately, thereby allowing the block to be designed and manufactured quickly and cost effectively. A method for designing an integrated circuit with efficient metal-1 resource utilization is also described.

Abstract: A computer-implemented method is disclosed for speeding up database access of electronic design automation (EDA) tool which utilizes a database manager for file access. The EDA tool accesses a plurality of design files, and each of the plurality of design files is associated with one of a plurality of design units for an integrated circuit (IC). The plurality of design files are encapsulated into an archive file which comprises a plurality of data units, wherein each of the data units corresponds to a design file. A request to access a design file will be redirected to access the archive file. The design file is then accessed by accessing the corresponding data unit in the archive file.

Abstract: A method for designing and making an integrated circuit is described. That method utilizes statistical models of wire segments to accurately estimate the expected length of minimum-length, orthogonal wire segments within a block. From these estimates, the method accurately estimates an ratio between the horizontal and vertical routing resources required, termed the “H/V Demand Ratio.” From the H/V Demand Ratio, an accurate estimate of the height and width of the block may be determined. Thereafter, placement and routing may be performed quickly and accurately, thereby allowing the block to be designed and manufactured quickly and cost effectively. A method for designing an integrated circuit with efficient metal-1 resource utilization is also described.

Abstract: User's RTL design is analyzed and instrumented so that signals of interest are preserved and can be located in the net list after synthesis. Then, the user's original flow of RTL synthesis and design partition is performed. The output is analyzed to locate the signals of interest. Latches are selectively inserted to the net list to ensure that signal values can be accessed at runtime. After that, a P&R process is performed, and the outputs are analyzed to correlate signal names to registers (flip-flops and latches) or memory blocks locations in FPGAs. A correlation database is built and kept for runtime use. During runtime, a software component may be provided on a workstation for the user to query signal values corresponding to RTL hierarchical signal names.

Abstract: Methods and systems for viewing and debugging HDL designs having SystemVerilog interface constructs are provided. An HDL design code is received, wherein the design code comprises a first module, a second module and a SystemVerilog interface construct. A first object corresponding to the first module, a second object corresponding to the second module and an interface object corresponding to the interface construct are displayed in a schematic view. The interface object is disposed between the first and second objects, and a shape of the interface object is different from that of the first and second objects. The interface signals from the first object to the second object and the interface signals from the second object to the first object pass through the interface object.

Abstract: Methods for debugging designs are provided. First, signal correlation information for signals of a design at least two design level is obtained. Then, design descriptions corresponding to the design at the at least two design levels are loaded and presented in at least two sets of windows or at least two debugging processes which controls the respective set of windows. A selection of a first signal in a first set of windows or a first debugging process is received. In response to the selection, a second signal corresponding to the first signal is queried according to the signal correlation information, and the second signal in a second set of windows or a second debugging process is automatically selected.

Abstract: Methods and systems for evaluating checker quality of a verification environment are provided. In some embodiments, an overall sensitivity for the verification environment and an individual sensitivity for a respective checker are calculated. The overall sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to a checker system including at least one checker, can be detected by the verification environment. The individual sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to at least one specific probe among a plurality of probes of a design, can be detected by the checker corresponding to the specific probe. The overall checker sensitivity numbers can show the robustness of the check system. The individual checker sensitivity can guide the user which individual checker or checkers to improve.

Abstract: A method and apparatus for manufacturing an integrated circuit (IC), the method including, generating, by a graphical construction unit, a first graph corresponding to a first net of the IC, the first graph representing a pin of the first net as a vertex, and a connection between two pins of the first net as an edge, the first graph further corresponding to a first IC layout; identifying a first and a second pair of unconnected vertices in the first graph for inserting a first and a second redundant edge, respectively, the first redundant edge and the second redundant edge forming a first connected loop and a second connected loop, respectively, each loop further including at least two edges of the first graph; calculating a tolerance ratio for the first redundant edge and the second redundant edge; sorting the first and second redundant edge based on their tolerance ratio; calculating a yield rate change of the first IC layout associated with inserting one of the first or second redundant edge with a highest

Abstract: A method of fast analog layout migration from an original layout is disclosed. Various placement constraints, including topology, matching and symmetry are extracted from the schematic or netlist as well as the original layout. In addition, relative placement patterns are extracted from the original layout for matching and symmetry constraints. A constraint hierarchy tree can be built according to the constraints, and relative placement patterns are attached accordingly. By using the constraint hierarchy tree, multiple new placement results are efficiently explored that preserve the relative placement patterns for matching and symmetry constraints.

Abstract: Disclosed is a computer-implemented method to generate a placement for a plurality of device modules within an analog integrated circuit (IC) subject to a set of constraints. By building a constraint hierarchy tree according to the constraints, conflicts of constraints can be identified and resolved. Furthermore, placements can be generated based on the hierarchy tree through a bottom-to-top dimension optimization process and a top-down wire length optimization process. Furthermore, a graphical user interface can be used to display the tree, and the user can edit the tree visually and interactively.

Abstract: Methods and systems for testing a design under verification (DUV), the method including receiving, at an interface, configured Field Programmable Gate Array (FPGA) images and runtime control information, wherein each of the FPGA images contains a respective portion of the DUV, and a respective verification module associated with a respective FPGA device. The method further includes, sending, by the interface, each of the FPGA images to each of the respective FPGA devices associated with each of the respective FPGA images. The method also includes, sending, by the interface, timing and control information to each of the respective verification modules based on runtime control information received from the host workstation. In response to receiving timing and control information, each of the respective verification modules, controls each of the respective portions of the DUV in each of the respective FPGA devices.

Abstract: What-if simulation methods and systems are provided. A design coding in HDL (Hardware Description Language) and a simulation result corresponding to the design are provided. A what-if design scope and a what-if time window are received. A portion of the design is extracted from the design according to the what-if design scope, and primary input signals are determined during the extraction of the sub-design. Then, what-if simulation data is extracted from the simulation result according to the primary input signals and the what-if time window. A what-if test bench is generated according to the what-if simulation data, wherein the what-if simulation data is read, and the signal values are fed to a simulator according to the what-if test bench.

Abstract: A placer produces a global placement plan specifying positions of cell instances and orientations of macros within an integrated circuit (IC) by initially clusterizing cell instances and macros to form a pyramidal hierarchy of blocks. Then the placer iteratively repeats the declusterization and routability improvement process from the highest level to the lowest level of the hierarchy. An objective function is provided in Cartesian coordinate for representing the position of each movable instance and in polar coordinate for representing the orientation of a macro relative to its the center. For each movable instance and each rotatable macro, its position or orientation is determined by conjugate gradient method to minimize total wire length. Finally, the placer uses a look-ahead legalization technique to rotate rotatable macros to legal orientations and move cell instances to legal positions in the end of global placement.

Abstract: An apparatus for circuit emulation may include a first circuit board, one or more circuit emulation resource on the first circuit board, a first interconnection interface on the first circuit board, and a second interconnection interface on the first circuit board. The first circuit board may include conductive wiring paths. The circuit emulation resource is on the first circuit board and coupled with a portion of the conductive wiring paths, with each circuit emulation resource being configured to emulate a portion of an electronic circuit by receiving input signals and producing output signals in response to the input signals. The first interconnection interface is on the first circuit board and coupled with at least a first portion of the circuit emulation resource, The first interconnection interface may be configured to couple with an interconnection interface of a second circuit board having a second group of conductive wiring paths and having a second group of circuit emulation resources.

Abstract: A computer-implemented method to perform context-sensitive incremental design rule checking (DRC) for an integrated circuit (IC). An incremental DRC engine checks design rule violations between a set of environment shapes and a set of active shapes. If no design rule violations are found, the set of active shapes will be added into the set of environment shapes. Furthermore, the incremental DRC engine can be embedded into placement tools, routing tools, or interactive layout editing tools to check design rule violations and help generate DRC error free layouts.

Abstract: Multiple level spine routing is disclosed. In some embodiments, in response to receiving a specification of a plurality of nets and a specification of a set of routing tracks available for main spines, a main spine routing track is assigned to each of the plurality of nets based at least in part on a cost function and main spine wires are generated on the assigned main spine routing tracks for each of the plurality of nets.

Abstract: Multiple level spine routing is disclosed. In some embodiments, in response to receiving a specification of a net comprising a set of pins, a first wire for routing the net is generated, the set of pins comprising the net is partitioned into one or more groups based at least in part on a cost function, a second wire that connects to the first wire is generated for each group of the net, and a third wire that connects each pin to the second wire of its group is generated for each pin of each group of the net.

Abstract: Methods for debugging designs are provided. First, signal correlation information for signals of a design at least two design level is obtained. Then, design descriptions corresponding to the design at the at least two design levels are loaded and presented in at least two sets of windows or at least two debugging processes which controls the respective set of windows. A selection of a first signal in a first set of windows or a first debugging process is received. In response to the selection, a second signal corresponding to the first signal is queried according to the signal correlation information, and the second signal in a second set of windows or a second debugging process is automatically selected.

Abstract: Methods for generating a device layout are provided. First, design rules corresponding to a specific technology are received. A selection of at least one element and a parameter value corresponding to at least one parameter on the selected element are received. A draft device layout corresponding to the selected element is generated by a device generator by referencing the parameter value and the design rules. A script is then executed to modify the draft device layout to generate an updated device layout. The script includes at least one command, and when the script is executed, the at least one command is performed to modify the parameter value of the at least one parameter of the selected element and cause the device generator to delete the old draft device layout and generate a new draft device layout by referencing the modified parameter value and the design rules.

Abstract: A computer-implemented method for debugging the power aspect of an IC design by integrating the power specification expressed in certain power specification format and its corresponding circuit design within a power schematic diagram called power map. Power map is created by using a power data base generated by regrouping the original circuit design hierarchy to new hierarchies defined by the power specification. Power map contains power cell symbols (such as isolation cells, level shifters, power switches) and signal nets, and can show the relationship between power domains. Power map can also display mismatches or errors between the power specification and the circuit design for those signals connecting the power domains. Furthermore, power map can be used in conjunction with simulation result.