Abstract: Disclosed herein is a method of performing a password challenge in an embedded system. The method includes receiving a password, scrambling the sub-words of the password pursuant to scramble control codes, retrieving a verification word, scrambling the sub-words of the verification word pursuant to the scramble control codes, and comparing the scrambled sub-words of the password to the scrambled sub-words of the verification word. Access to a secure resource is granted if the scrambled sub-words of the password match the scrambled sub-words of the verification word. The scramble control codes cause random reordering of the sub-words of the password and sub-words of the verification word in a same fashion, and insertion of random delays between the comparison of different sub-words of the password to corresponding sub-words of the verification word.

Abstract: A system on a chip (SoC) includes a plurality of processing cores and a stream switch coupled to two or more of the plurality of processing cores. The stream switch includes a plurality of N multibit input ports, wherein N is a first integer, a plurality of M multibit output ports, wherein M is a second integer, and a plurality of M multibit stream links dedicated to respective output ports of the plurality of M multibit output ports. The M multibit stream links are reconfigurably coupleable at run time to a selectable number of the N multibit input ports, wherein the selectable number is an integer between zero and N.

Abstract: An input signal having a logic low level at a first voltage and a logic high level at a second voltage is received by a Schmitt trigger. A voltage generator outputs a reference voltage generated from a third voltage that is higher than the second voltage. A first transistor coupled between the third voltage and a power supply node of the Schmitt trigger is biased by the reference voltage to apply a fourth voltage to the power supply node of the Schmitt trigger that is dependent on the reference voltage. The reference voltage has a value which causes the fourth voltage to be less than or equal to the second voltage. A second transistor coupled between the input signal and the input of the Schmitt trigger circuit is also biased by the reference voltage to control the logic high level voltage of the input signal at the Schmitt trigger.

Abstract: Low-voltage differential signaling (LVDS) receiver circuits, electronic devices, and methods are provided. A LVDS receiver includes an input differential pair of transistors that receive a differential input signal. The input differential pair includes a first NMOS transistor that receives a first input signal and a second NMOS transistor that receives a second input signal. A third NMOS transistor has source and drain terminals respectively coupled to source and drain terminals of the first NMOS transistor, and a fourth NMOS transistor has source and drain terminals respectively coupled to source and drain terminals of the second NMOS transistor. A first level shifter is coupled to a gate of the third NMOS transistor, and a second level shifter is coupled to a gate of the fourth NMOS transistor.

Abstract: An integrated circuit includes a successive approximation register (SAR) analog-to-digital converter (ADC). The ADC includes a bit step selector. During testing of the ADC, the bit step selector selects a number of bits to be tested for a next analog test voltage based on digital values that are within an integer delta value of most recent digital value for a most recent analog test voltage.

Abstract: In an embodiment, a method includes: receiving, with a first buffer of a first error compactor unit (ECU), a first memory error packet associated with a first memory; receiving, with the first buffer, a second memory error packet associated with a second memory; transmitting a first reading request for reading the first memory error packet; receiving the first reading request with an arbiter of an error aggregator unit (EAU) of a central memory error management unit (MEMU); in response to receiving the first reading request, reading the first memory error packet from the first buffer, transmitting the first memory error packet to a controller of the central MEMU, and transmitting a first acknowledgement to the first ECU; receiving the first acknowledgement with the first ECU; and in response to receiving the first acknowledgement, transmitting a second reading request for reading the second memory error packet.

Abstract: A reference current generator circuit generating a reference current that is proportional to absolute temperature as a function of a difference between bias voltages of first and second transistors. A voltage generator generates an input voltage from the reference current by applying the reference current that is proportional to absolute temperature through a plurality of transistors coupled in series between the bias voltage of the second transistor and ground, with the input voltage being generated at a node between given adjacent ones of the plurality of transistors. The input voltage is complementary to absolute temperature. A differential amplifier is biased by a current derived from the reference current and generates a temperature insensitive output reference voltage from the input voltage and a voltage proportional to absolute temperature.

Abstract: A time-interleaved analog to digital converter (TI-ADC) includes a first sub-ADC configured to sample and convert an input analog signal to generate a first digital signal and a second sub-ADC configured to sample and convert said input analog signal to generate a second digital signal. Sampling by the second sub-ADC occurs with a time skew mismatch. A multiplexor interleaves the first and second digital signals to generate a third digital signal. A time skew mismatch error determination circuit processes the first and second digital signals to generate a time error corresponding to the time skew mismatch. A slope value of said third digital signal is determined and multiplied by the time error to generate a signal error. The signal error is summed with the third digital signal to generate a digital output signal which eliminates the error due to the time skew mismatch. This correction is performed in real time.

Abstract: A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.

Abstract: Disclosed herein is a voltage gain amplifier for use in an automotive radar receiver chain. The voltage gain amplifier utilizes pole-zero cancelation to yield a desired transfer function without gain peaking at a bandwidth in which attenuation is desired, and utilizes a low pass filter effectively formed by a feedback loop including a high pass filter and a differential amplifier to ensure the desired level of attenuation at the desired bandwidth. In some instances, a chopper may be utilized in the feedback loop prior to the high pass filter, and after the differential amplifier, so as to reduce the bandwidth of the differential amplifier in the feedback loop.

Abstract: A read signal generator generates read signals to control read operations of a memory array. The read signal generator can be selectively controlled to generate an oscillating signal having a period that corresponds to a feature one of the read signals. The oscillating signal is passed to a frequency divider that divides the oscillating signal and provides the divided oscillating signal to an output pad. The frequency of the oscillating signal can be measured at the output pad. The frequency of the oscillating signal, and the duration of the read signal feature can be calculated from the frequency of the oscillating signal. The read signal feature can then be adjusted if needed.

Abstract: Disclosed herein is a method including sinking current from a pair of input transistors of a differential amplifier while sourcing more current to the pair of input transistors than is sunk. The method further includes generating a pair of input differential signals using a pair of input voltage regulators, and amplifying a difference between the pair of input differential signals to produce a pair of differential output voltages, using the differential amplifier. The method also includes amplifying the pair of differential output voltages using at least one voltage gain amplifier, and generating control signals for current sources that source the current to the pair of input transistors of the differential amplifier, from the pair of differential output voltages after at least amplification.

Abstract: An input signal having a logic low level at a first voltage and a logic high level at a second voltage is received by a Schmitt trigger. A voltage generator outputs a reference voltage generated from a third voltage that is higher than the second voltage. A first transistor coupled between the third voltage and a power supply node of the Schmitt trigger is biased by the reference voltage to apply a fourth voltage to the power supply node of the Schmitt trigger that is dependent on the reference voltage. The reference voltage has a value which causes the fourth voltage to be less than or equal to the second voltage. A second transistor coupled between the input signal and the input of the Schmitt trigger circuit is also biased by the reference voltage to control the logic high level voltage of the input signal at the Schmitt trigger.

Abstract: A sense amplifier enable signal and a tracking signal are generated in response to an indication that a sufficient voltage difference has developed across bit lines of a memory. The sense amplifier enable signal has a pulse width between a leading edge and a trailing edge. The sense amplifier enable signal is propagated along a first U-turn signal line that extends parallel to rows of the memory array and is coupled to sense amplifiers arranged in a row to generate a sense amplifier enable return signal. The tracking signal is propagated along a second U-turn signal line extending parallel to columns of the memory array to generate a tracking return signal. The sense amplifier enable return signal and the tracking return signal are logically combined to generate a reset signal. Timing of the trailing edge of the pulse width is controlled by the reset signal.

Abstract: The present disclosure is directed to arranging user data memory cells and test memory cells in a configurable memory array that can perform both differential and single ended read operations during memory start-up and normal memory use, respectively. Different arrangements of the user data memory cells and the test memory cells in the memory array result in increased effectiveness of memory array, in terms of area optimization, memory read accuracy and encryption for data security.

Abstract: The present disclosure is directed to a lead frame design that includes a copper alloy base material coated with an electroplated copper layer, a precious metal, and an adhesion promotion compound. The layers compensate for scratches or surface irregularities in the base material while promoting adhesion from the lead frame to the conductive connectors, and to the encapsulant by coupling them to different layers of a multilayer coating on the lead frame. The first layer of the multilayer coating is a soft electroplated copper to smooth the surface of the base material. The second layer of the multilayer coating is a thin precious metal to facilitate a mechanical coupling between leads of the lead frame and conductive connectors. The third layer of the multilayer coating is the adhesion promotion compound for facilitating a mechanical coupling to an encapsulant around the lead frame.

Abstract: A method of operating an electronic device includes generating scramble control codes. The scramble codes are generated by generating a random number, shifting the random number to produce a shifted random number, generating control signals by selecting different subsets of the shifted random number, and generating scramble control words by selecting different subsets of the random number based upon the control signals. The method further includes receiving a password comprised of sub-words and scrambling those sub-words according to the scramble control codes, retrieving a verification word comprised of sub-words and scrambling those sub-words according to the scramble control codes, and comparing the scrambled sub-words of the password to the scrambled sub-words of the verification word to thereby authenticate an external device that provided the password.

Abstract: A voltage doubler circuit supports operation in both a positive voltage boosting mode to positively boost voltage from a first node to a second node and a negative voltage boosting mode to negatively boost voltage from the second node to the first node. The voltage doubler circuit is formed by transistors of a same conductivity type that share a common bulk that is not tied to a source of any of the voltage doubler circuit transistors. A bias generator circuit is coupled to receive a first voltage from the first node and second voltage from the second node. The bias generator circuit operates to apply a lower one of the first and second voltages to the common bulk.

Abstract: An amplifier receives an input and a feedback. A first transistor controlled by the amplifier output is coupled between a supply node and the feedback. A second transistor controlled by the amplifier output is coupled to the supply node and generates a bias current. A trimmed resistor coupled between the feedback and ground includes, for trimming resolution of N-bits, where X+Y=N: M resistors, where M=2X?1, each having a resistance equal to R*(2Y)*i, i being an index having a value ranging from 1 to 2X?1, a first of the M resistors having a resistance of R*2Y, a last of the M resistors having a resistance of R*2Y*(2X?1); and M switches associated with the M resistors. Each of the M resistors is between a first node and its associated one of the M switches. Each of the M switches couples its associated one of the M resistors to a second node.

Abstract: A debounce circuit and a method for masking or filtering a glitch from an input signal are provided. The debounce circuit includes a reset synchronizer circuit and a logic circuit. The reset synchronizer circuit receives the input signal, detects a glitch in the input signal and outputs one or more reset synchronizer output signals having a first reset synchronizer state indicating detection of the glitch. The logic circuit receives the one or more reset synchronizer output signals, determines that the one or more reset synchronizer output signals are in the first reset synchronizer state indicating detection of the glitch and in response to determining that the one or more reset synchronizer output signals are in the first reset synchronizer state, keeps an output signal of the debounce circuit in a present state of the output signal of the debounce circuit.