Abstract: The invented method addresses two important issues concerning don't cares in formal system or circuit synthesis verification. First, it is shown how to represent explicit don't cares in linear space in a flattened hierarchy. Many circuits need this information for verification, but the classical calculation can be exponential. Second, three interpretations of verification on incompletely specified circuits are explored and it is shown how the invented method makes it easy to test each interpretation. The invented method involves transforming each cell within an original circuit that implements an incompletely specified function into set of plural cells that implement the upper and lower bound of the interval of the function. The method thus constructs networks for the endpoints of the intervals and, rather than constructing traditional miters, connects the outputs of the interval circuits with the logic appropriate for the property, e.g. equality or consistency, that is to be verified.

Abstract: A method and system for the quick placement of electronic circuits using orthogonal one dimensional placements. All circuits of a design may be placed in a linear dimension to obtain a first placement. Next, those same circuits may be placed in a second linear dimension, orthogonal to the first dimension, in order to obtain a second placement. Finally, a two dimensional placement for the circuits may be created by selecting for each circuit element a first coordinate from the first placement and a second coordinate from the second placement.

Abstract: A computer implemented process for automatic creation of integrated circuit (IC) geometry using a computer. The present invention includes a general unconstrained non-linear optimization method to generate coarse placement of cells on a 2-dimensional silicon chip or circuit board. In one embodiment, the coarse placer can also be used to automatically size cells, insert and size buffers, and aid in timing driven structuring of the placed circuit. The coarse placer is used in conjunction with other automatic design tools such as a detailed placer and an automatic wire router. A master objective function (MOF) is defined which evaluates a particular cell placement. A non-linear optimization process finds an assignment of values to the function variables which minimizes the MOF. The MOF is a weighted sum of functions which evaluate various metrics. An important metric for consideration is the density metric, which measures how well, spread out the cells are in the placement.

Abstract: In a computer implemented synthesis system, a method of generating a test pattern for use in testing device with ATE (automated test equipment). The computer implemented steps of receiving a netlist specification representing a design to be realized in physical form and storing the netlist specification in a computer memory unit, and simulating the netlist using the computer implemented synthesis system. Using the simulation instantiated within the synthesis system, deterministic test pattern generation is performed to obtain a first portion (partial) of a test pattern. The test pattern is operable to detect a fault in the circuit netlist once speculative test pattern generation is performed to obtain a remaining portion of the test pattern. The first portion and the remaining portion of the test pattern comprise a test vector operable to detect the fault when used with automated test equipment for testing a device resulting from the design.

Abstract: A method estimates the capacitance effects of an interconnect prior to routing of an integrated circuit (IC) design, as follows. The design is divided into areas. Capacitance effects for each area are estimated based on the congestion ratios within the area. The congestion ratios for each area are derived from estimations of the demand for routing resources in each area for each net in the net-list included in the IC design. Coupling vectors are derived for each area from the congestion ratios. Capacitance effects for each area are then estimated by looking up a database using the coupling vectors. The resulting per-area capacitance effects are then used to estimate capacitance in an interconnect traversing the area. The total capacitance effects due to an interconnect traversing multiple areas is determined by applying the per-area capacitance effects for the areas to the dimensions of portions of the interconnect traversing each of the areas.

Abstract: According to the present invention, during scan conversion, non-scan memory cells of a circuit design are replaced with scan cells to form a scan chain. The scan chain is transformed by the test synthesis tool of the present invention into dynamic scan chains with the addition of reconfiguration circuitry. The reconfiguration circuitry partitions the scan chain into multiple segments and enables each segment to be selectively “bypassed” (or deactivated) during test application. Shorter test patterns that are only pertinent to one or more segments are necessary, resulting in a reduction in overall test data volume and test application time. The present invention also provides a modified ATPG technique for generating test patterns for the dynamic scan chains.

Abstract: An approach for representing integrated circuit device characteristics using polynomial equations involves analyzing integrated circuit device characterization data in a lookup table form and using an order incremental scheme to determine a polynomial equation of a relatively low-order that satisfies specified accuracy criteria. In situations where a polynomial equation that has an order less than a maximum allowable order cannot be determined, the integrated circuit device characterization data is partitioned into sub-domains and polynomial equations are determined separately for each sub-domain. The separate polynomial equations are then combined to generate a piecewise polynomial equation that represents all of the integrated circuit device characterization data.

Abstract: Adding a layer of abstraction to the generation of a runset for DRC rules, by defining a meta language hides from the user the language of a specific verification tool (also called “native language”). The meta language can be used directly by the user to express in a file (also called “meta runset”) the DRC rules to be used to create an input for the verification tool in the native language (also called simply “runset”). A runset generator uses DRC rules supplied by a user to generate a runset in a native language (that is identified by the user). The runset generator can use templates to generate a runset. Each template (also called “DRC template”) contains code (can be in source form or in object form) for implementation of a DRC rule or derived layer in the native language of a specific verification tool (such as HERCULES). Thus implementation of DRC rules is hidden from the novice user.

Abstract: A method automatically specifies a unique number of an error layer for each DRC rule in a runset. Therefore, all errors related to a given DRC rule are reported by a layout verification tool in the uniquely specified error layer. Furthermore, the method also automatically specifies a unique number of a filter layer that has the same extent as a quality assurance (QA) cell for testing the DRC rule. The filter layer is logically operated (e.g. ANDed) with the error layer to uniquely identify a failure related to the DRC rule (i.e. errors from all other QA cells are filtered out). The QA cells are generated automatically by use of a library of templates. During regression testing, the first time a DRC runset is run against a test design or QA cell library the results are manually verified and stored as “expected” results.

Abstract: An HDL-based ASIC design is translated from a first RTL description to a second RTL description. The first RTL description describes the HDL-based ASIC design through a first set of modules arranged in a hierarchical manner. Translation includes: creating a reference gate-level netlist by synthesizing the HDL-based ASIC design described using the first RTL description; creating a second set of modules by translating the first RTL description of the first set of modules to the second RTL description module by module; and creating a combined RTL and gate-level design by integrating at least one module from the second set of modules within the reference gate-level netlist. Each module translated into the second RTL description may be also checked for compilation warning or error messages. If any warning or error messages are generated, the offending module(s) is modified to eliminate the warning or error messages.

Abstract: A tightloop method of timing driven placement. The present invention interleaves timing analyses and updates net weight based on the timing analyses as part of the cell location refinement processes of a placement algorithm. Thereby, the placement algorithm is augmented to factor in timing information such that the final placement is effective from overlap, net length, and timing perspectives.

Abstract: A genetic algorithm (GA) based approach to optimize integrated circuit designs for power dissipation. The genetic algorithm optimization process efficiently generates tight lower bounds of the peak power dissipation for a given integrated circuit design. In this approach, the power within a given integrated circuit design circuit is viewed as a function in terms of a set of stimuli to primary inputs of the integrated circuit design. Maximization of the function, and hence, the power dissipation is guided by the genetic algorithm. By repeatedly stimulating the integrated circuit design and measuring the corresponding response, the genetic algorithm process efficiently explores the solution space to obtain a maximization of the function. The genetic algorithm process is implemented within a computer-based EDA (electronic design automation) synthesis system.

Abstract: The present invention adds capabilities to a Hardware Verification Language (HVL) which facilitate the generation of random test data. Sources of random numbers are easily produced by simply adding a randomness attribute to a variable declaration of a class definition. Such variables are called random variables. A “randomize” method call may be made to an instance of the class definition to produce random values for each random variable. The values assigned to random variables are controlled using constraint blocks, which are part of the class definition. A constraint block is comprised of constraint expressions. The constraint expressions may impose a linear ordering in which random variable values must be assigned and this dependency is expressed by directed acyclic graphs (DAGs). The constraint expressions constraining each random variable are converted into ranges of permissible values from which a value is chosen at random.

Abstract: A non-linear, gain-based modeling of circuit delay within an electronic design automation system. The present invention provides a scalable cell model for use in early logic structuring and mapping for the design of integrated circuits. The scalable cell model includes a four dimensional delay model accepting input slew and gain and providing delay and output slew. By eliminating output loading as a requirement for delay computations, the scalable model of the present invention can effectively be used to provide accurate delay information for early logic synthesis processes, e.g., that precede technology dependent optimizations where the actual load of a cell is unknown. This scalable cell model considers: the impact of transition times on delay; complex gates having different input capacitances for different input pins; the impact of limited discrete cell sizes in the technology library; and design rules, e.g., maximum capacitance and maximum transition associated with gates.

Abstract: A computer implemented process and system for electronic design automation (EDA) using groups of multiple cells having loop-back connections for modeling port electrical characteristics. Multi-bit cells have multiple gates of the same function implemented within a same cell. Multi-bit components have multiple multi-bit cells implemented within a same component. Scannable multi-bit cells and components are similar to multi-bit cells and components but contain scannable sequential elements with scan chains installed. Multi-bit cells may or may not have each sequential cells' input and each sequential cells' output available externally. The scannable sequential elements of a multi-bit component are ordered into a predefined scan chain which is defined by the library containing the multi-bit component or multi-bit cell. During scan replacement processes of the EDA compile process, multi-bit cells and components of the netlist are replaced with scannable multi-bit cells and components.

Abstract: In simulating a physical circuit or system including analog and mixed signal digital-analog components, a physical circuit or system includes components defined as instances of models. There can be multiple instances of any model in the physical circuit or system. For each model, a sub-system of simultaneous equations is determined. The variables in the sub-systems of simultaneous equations are classified as input, output, intermediate, or system variables. Equations are associated with each variable, and the sub-systems of simultaneous equations are reduced by eliminating all equations not associated with system variables. The system of simultaneous equations describing the physical circuit or system is assembled from the sub-systems of simultaneous equations. For each instance of a model, a copy of the sub-system of simultaneous equations for that model is added to the system of simultaneous equations.

Abstract: The present invention adds capabilities to a Hardware Verification Language (HVL) which facilitate the generation of random test data. Sources of random numbers are easily produced by simply adding a randomness attribute to a variable declaration of a class definition. Such variables are called random variables. A “randomize” method call may be made to an instance of the class definition to produce random values for each random variable. The values assigned to random variables are controlled using constraint blocks, which are part of the class definition. A constraint block is comprised of constraint expressions, where each constraint expression limits the values that can be assigned to a random variable on the left-hand-side (lhs) of the constraint expression. If a constraint block of an instance is active or ON, then all the constraint expressions in the block will act to constrain their lhs random variable.

Abstract: A method and an apparatus for coupling the results of behavioral synthesis with those of logic synthesis. It uses a timing verifier to precalculate the timing characteristics of a circuit for use by behavioral synthesis. Timing for control chaining is included in the precalculated timing characteristics. Once behavioral synthesis is complete, logic synthesis is informed of timing constraints introduced by behavioral synthesis.

Abstract: The present invention adds capabilities to a Hardware Verification Language (HVL) which facilitate the generation of random test data. Sources of random numbers are easily produced by simply adding a randomness attribute to a variable declaration of a class definition. Such variables are called random variables. A “randomize” method call may be made to an instance of the class definition to produce random values for each random variable. The values assigned to random variables are controlled using constraint blocks, which are part of the class definition. A constraint block is comprised of constraint expressions, where each constraint expression limits the values that can be assigned to a random variable on the left-hand-side (lhs) of the constraint expression. A constraint_expression can constrain any random variable which has been declared at its level in the class hierarchy, or at any higher level.

Abstract: In a computer-implemented synthesis system, a method of optimizing a design of an integrated circuit device. The optimization process includes the computer-implemented steps of accessing a circuit netlist representing an integrated circuit design to be realized in physical form, wherein the circuit netlist includes a top-level block and at least a first and a second circuit block. The top-level block includes glue logic for coupling the first and second circuit blocks. The process creates a first model of the first circuit block and a second model of the second circuit block, the first model and the second model each operable for independently abstracting embodying circuitry of the first and second circuit blocks, respectively. The circuit netlist is optimized by independently optimizing the first circuit block and the second circuit block, and the top-level block to yield a fully optimized circuit netlist. The first and second circuit blocks are both independently optimized.