Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

Abstract: A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation to produce a modified power spectral density, and using the modified power spectral density to determine a dynamic oscilloscope noise characteristic. A test and measurement instrument has one or more inputs to acquire waveforms from a device under test (DUT), one or more processors to retrieve a power spectral density (PSD) model of noise from a database, generate a representation of any filtering being applied to a waveform generated by the DUT, use the PSD and the representation to produce a modified PSD, and use the modified PSD to determine a dynamic instrument noise characteristic.

Abstract: A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

Abstract: A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.

Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.

Abstract: A method of equalizing a communication link includes setting a number of coefficients to a required number, determining a number of pulse responses for a waveform, setting all values in a set of values to zero, repeating, until all values have been assigned, determining a current lowest parameter, using a position of the current lowest parameter as an index, determining a minimum value between a first term multiplied by a main pulse response minus a summation of each parameter multiplied by each value, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value having a position equal to the position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value with the sign of a corresponding pulse response; defining an equalizer having a number of taps having a value based on the corresponding coefficient; and applying the equalizer to a waveform.

Abstract: A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.

Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a Rogowski coil having plurality of conductor segments. The plurality of conductor segments are positionable to form a substantially complete loop. A first conductor segment of the plurality of conductor segments is electrically isolated from a second conductor segment of the plurality of conductor segments.

Abstract: A test and measurement instrument includes a first channel input for accepting a first input signal, a second channel input for accepting a second input signal, a spectrogram processor for producing a first spectrogram from the first input signal and for producing a second spectrogram from the second input signal, and a display for simultaneously showing the first spectrogram and the second spectrogram. Methods are also described.

Abstract: A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.

Abstract: A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

Abstract: A test and measurement system has one or more inputs connectable to a device under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: gather a set of training waveforms by acquiring one or more waveforms from one or more DUTs or from simulated waveforms, remove noise from the set of training waveforms to produce a set of noiseless training waveforms, and use the set of noiseless training waveforms as a training set to train a neural network to predict a measurement value for a DUT, producing a trained neural network.

Abstract: A structure has a flexible thermally conductive material having an adhesive surface and a non-adhesive surface, and a thermally conductive adhesive adhered to the adhesive surface of the flexible thermally conductive material leaving the non-adhesive surface exposed to an atmosphere in which the structure resides. A structure has a substrate having one or more conductive paths, and a flexible, thermally conductive material attached to at least a portion of the substrate to draw heat away from the conductive paths. An apparatus has a substrate having one or more conductive paths, a probe tip at one end of the substrate configured to electronically connect with a device under test, and a flexible, thermally conductive material attached to at least a portion of the substrate to draw heat away from the probe tip and conductive paths.

Abstract: A system to develop and test machine learning models has a waveform emulator machine learning system, a user interface to allow a user to input one or more design parameters for the waveform emulator machine learning system, one or more processors configured to execute code to cause the one or more processors to: send the one or more design parameters to the waveform emulator machine learning system; receive one or more data sets from the waveform emulator machine learning system, the one or more data sets based on the one or more design parameters; train a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model; validate the trained machine learning model using a previously unused one of the one or more data sets; adjust the trained machine learning model as needed; and repeat the training, validating, and adjusting until an optimal machine learning model is trained.

Abstract: A test and measurement device includes an input port to receive an input signal, a sampling circuit structured to generate a sample from the input signal, in which generating the sample from the input signal produces an amount of kickout energy, and an energy reducing circuit coupled between the sampling circuit and one or more other components of the test and measurement device, the energy reducing circuit structured to decrease the amount of kickout energy from the sampling circuit. The energy reducing circuit may include or be combined with a pick-off circuit. Methods are also described.

Abstract: A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit. The RTWM is configured to determine a propagation delay of the cable, capture a first waveform, including an incident waveform and a reflection waveform at a first test point between the signal generator and the DUT, capture a second waveform including at least the incident waveform at a second test point between the signal generator and the DUT, determine a reflection waveform and the incident waveform based on the first waveform and the second waveform, and determine a DUT waveform based on the incident waveform, the reflection waveform, and the propagation delay. The DUT waveform represents the waveform generated by the signal generator as received by the DUT.

Abstract: A test and measurement instrument including a display and one or more processors configured to display on the display a waveform viewing area with a vertical dimension and an adjustable horizontal dimension, the test and measurement instrument configured to display one or more waveforms in the waveform viewing area, a global settings readout bar located vertically adjacent to the waveform viewing area, the global settings readout bar including a first selectable information badge, wherein when the first selectable information badge is selected, displaying a first menu originating from the first selectable information badge to modify a setting of the test and measurement instrument related to the first selectable information badge. The first selectable information badge including a warning indicator when an error or safety condition occurs.

Abstract: A test and measurement device has a port to receive a signal from a device under test (DUT), one or more analog-to-digital converters (ADC) to digitize the signal to create one or more waveforms, a display, and one or more processors configured to execute code that causes the one or more processors to: generate a histogram from the waveform, the histogram having one or more dimensions; and calculate one or more entropy values for each of the one or more dimensions. A method includes receiving a signal from a device under test (DUT) at a test and measurement device, digitizing the signal using one or more analog-to-digital converters (ADC) to produce a waveform, generating a histogram from the waveform, the histogram having one or more dimensions, and calculating one or more entropy values for each of the one or more dimensions,.

Abstract: Methods and devices for digitizing an analog repetitive signal using waveform averaging are described. An example method includes generating a discrete set of analog dither offset voltages, wherein at least two of the discrete set of analog dither offset voltages are different from each other, receiving the analog repetitive signal comprising multiple instances of a waveform, wherein the waveform has a waveform duration, generate a timing alignment to align each waveform of the analog repetitive signal and the corresponding analog dither offset voltage over the waveform duration, combining, based on the timing alignment, each waveform and the corresponding analog dither offset voltage over the waveform duration to produce an analog output signal, converting the analog output signal to a digital output signal, and producing, based on the timing alignment, a digital averaged signal based on averaging the multiple instances of the waveform in the analog output signal.