Abstract: A test and measurement instrument includes an input configured to accept an input signal from a Device Under Test, an acquisition memory handler structured to store the input signal as a series of digital samples in an acquisition memory, and a rasterizer structured to generate a histogram of the values of the digital samples prior to or simultaneously with the values being stored in the acquisition memory. Methods of generating a raster display from a series of digital samples from an input display are also described.

Abstract: A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.

Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a shunt configured to be placed in series with the current-carrying conductor, and a Rogowski coil including at least one conductor segment. The shunt and the Rogowski coil are coupled to produce an output signal representing the current in the current-carrying conductor.

Abstract: A test and measurement instrument has one or more ports configured to receive a signal one or more devices under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform, perform linear response extraction on the pattern waveform, present one or more data representations including a data representation of the extracted linear response to a machine learning system, and receive a prediction for a measurement from the machine learning system. A method of performing a measurement on a waveform includes acquiring the waveform at a test and measurement device, deriving a pattern waveform from the waveform, performing linear response extraction on the pattern waveform, presenting one or more data representations including a data representation of the extracted linear response to a machine learning system, and receiving a prediction of the measurement from the machine learning system.

Abstract: A system includes an input for accepting a dataset including at least two sets of data in a dataset domain and one or more processors configured to derive at least two principal components from the dataset using principal component analysis, the at least two principal components being orthogonal to one another, map the dataset to a principal component domain derived from the at least two principal components, generate additional data in the principal component domain, and remap the additional data in the principal component domain back to the dataset domain as a newly generated dataset. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

Abstract: A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms and generate a noise representation of the noise removed, create one or more images using the waveform pattern and the one or more filtered waveforms, add the noise representation to the one or more images to produce at least one combined image, input the at least one combined image to one or more deep learning networks, and receive one or more predicted values for the DUT.

Abstract: A system includes an input for accepting an input signal from a Device Under Test (DUT), a measurement unit for generating first measurement data and second measurement data from the input signal, and one or more processors configured to derive at least one principal component from the first and second measurement data using principal component analysis, and remap the first measurement data and the second measurement data to a principal component domain derived from the at least one principal component. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.

Abstract: A test and measurement instrument includes one or more ports to connect to one or more devices under test (DUT) having tuning screws, and to a robot, one or more processors to configured to: send commands to the robot to position the tuning screws on the one or more DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the one or more DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, send commands to the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the one or more DUTs, and validate operation of the one or more DUTs.

Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.

Abstract: A test and measurement instrument has one or more input ports to connect the instrument to a device under test (DUT), one or more processors configured to execute code to cause the one or more processors to: receive an equalized waveform and an un-equalized waveform through the input port from the DUT, without any knowledge of a digital pattern that corresponds to the waveforms and without extracting the digital pattern from the waveforms, align the un-equalized waveform and the equalized waveform in time to produce an aligned un-equalized waveform and an aligned equalized waveform, and use the aligned equalized waveform and the aligned un-equalized waveform to determine equalizer tap values.

Abstract: A test and measurement instrument includes an acquisition memory and a processor structured to store a stream of sampled incoming data samples in the acquisition memory. As the memory fills, the instrument automatically decimates either the data samples already stored in the acquisition memory, the incoming data samples, or both. The instrument may also store two copies of the incoming data samples, one at an increased decimation rate. The two copies are tied together with a timestamp or using other methods. The more highly decimated copy may be used to produce a video output of the stored data samples, saving the instrument from generating the video output from the larger sized sample.

Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.

Abstract: An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.

Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.

Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

Abstract: An abstracted digital memory acquisition circuit, including an analog input configured to receive an analog signal, an analog-to-digital converter configured to receive the analog signal and convert the analog signal to a first digital signal, a digital input configured to receive a second digital signal, a controller configured to receive the first digital signal and the second digital signal and output a stream of bits, the stream of bits including the first digital signal and the second digital signal, and a control signal, and an output configured to electrically connect to a digital input of a test and measurement instrument and output the stream of bits and the control signal.

Abstract: A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.