Abstract: A composition of matter includes an ultraviolet (UV) and thermally curable, non-epoxy acrylic adhesive having a concentration in the range of 5 to 30 weight percent of the composition and conductive metal particles having a concentration in the range of 70 to 95 weight percent of the composition.

Abstract: An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.

Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: An electronic switch includes a substrate and a rotator assembly. The rotator assembly is configured to prevent rotation between a first rotational configuration and a second rotational configuration in a first translational position of the rotator assembly, while the rotator assembly is configured to rotate between the first rotational configuration and the second rotational configuration in a second translational position of the rotator assembly. The second translational position of the rotator assembly is translationally offset from the first translational position of the rotator assembly.

Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.

Abstract: Embodiments of the invention provide a capability of determining an input impedance of a connected Device Under Test based on Waveform Monitoring of an output signal of a waveform generator. Using embodiments of the invention, the input impedance of DUT is determined from the waveform monitoring results. The impedance information of the DUT together with the actual waveform provided to the DUT allows systems according to embodiments of the invention capable of characterizing circuit behavior for performance optimizing and issue debugging for the DUT.

Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.

Abstract: Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide for increased flexibility when de-embedding device under test (DUT) link attenuation at higher frequencies. Further, the filters are adjustable, via a controller, to obtain an increased signal to noise ratio (SNR) relative to a signal channel lacking the combination of filters. Additional embodiments may be disclosed and/or claimed herein.

Abstract: An apparatus for coupling a test and measurement instrument to a device under test comprises a clip structured to be attached between two conductive portions of the device under test, and an insert structured to be removably installed in the clip. The insert is configured to provide a current path between the two conductive portions of the device under test. In embodiments, the insert comprises a resistive element, which may be a round rod resistor. Additional embodiments may be described and/or claimed herein.

Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.

Abstract: A test and measurement instrument including an input port configured to receive an input signal. One or more divider circuits, coupled to the input port, employ a plurality of divide ratios such that each divide ratio scales an event signal indicating events in the input signal by a predetermined integer value. A control system is also included. The control system is configured to iteratively determine an estimated signal frequency of the event signal, and automatically select a divide ratio for the event signal based on the estimated signal frequency. The instrument may also include one or more counters to count triggers in the event signal subsequent to application of the divide ratio. The instrument may also employ frequency hysteresis to prevent chatter in divide ratio selection.

Abstract: A signal lead structured to be attached to an electrical device that comprises a signal pad, a spring housing, a spring, and a flexible conduit. The spring is carried in the spring housing, and a portion of the spring extends beyond a surface of the spring housing when the spring is unsprung. The spring is structured to touch the electrical device and carry an electrical signal between the electrical device and the signal pad when the signal lead is attached to the electrical device. The flexible conduit is coupled to the signal pad at an end of the flexible electrical conduit and extends away from the spring housing.

Abstract: A test and measurement instrument may include a video test and measurement system that delineates or otherwise indicates various components of an electronic image to enable a user to discern the various components that make up a picture display. The device may delineate an image into those regions having High Dynamic Range (HDR) region and those regions having SDR range. The delineated display mode may be a new mode on a video waveform monitor.

Abstract: Disclosed is a mechanism for limiting Intersymbol Interference (ISI) when measuring uncorrelated jitter in a test and measurement system. A waveform is obtained that describes a signal. Such waveform may be obtained from memory. A processor then extracts a signal impulse response from the waveform. The processor selects a window function based on a shape of the signal impulse response. Further, the processor applies the window function to the signal impulse response to remove ISI outside a window of the window function while measuring waveform jitter. The window function may be applied by applying the window function to the signal impulse response to obtain a target impulse response. A linear equalizer is then generated that results in the target impulse response when convolved with the signal impulse response. The linear equalizer is then applied to the waveform to limit ISI for jitter measurement.

Abstract: A method is disclosed for triggering upon signal events occurring in frequency domain signals. The method includes repeatedly sampling a time-varying signal and generating a plurality of digital frequency domain spectrums based on the samples of the time-varying signal. A frequency domain bitmap for the time-varying signal is repeatedly updated via application of the digital frequency domain spectrums. The method further includes selecting a portion of the frequency domain bitmap, determining a signal occupancy in the selected portion, and triggering a capture of the time-varying signal based on and in response to the occupancy determination for the selected portion of the bitmap.

Abstract: A mechanism is included for jointly determining filter coefficients for Finite Impulse Response (FIR) filters in a Linear, Memory-less Non-linear (LNL), Linear compensator. Calibration signals are applied to a signal converter input in a test and measurement system. Non-linear signal components are determined in signal output from the signal converter. Non-linear filter components are determined at the LNL compensator based on the calibration signals. The non-linear signal components are then compared to the non-linear filter components. The comparison is then resolved to determine filter coefficients for first stage Finite Impulse Response (FIR) filters and second stage FIR filters in the LNL.

Abstract: Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or more channels may include an amplifier to independently boost the signal band assigned to that channel prior to a noise source within the assigned channel. This results in boosting the signal band relative to noise introduced by the noise source. In some embodiments, a filter may also be implemented in one or more of the channels to remove noise from the channel that is outside the bandwidth of the signal band assigned to that channel. Additional embodiments may be described and/or claimed herein.

Abstract: A test and measurement management device, including a request queue to receive a request from a request module, the request including an identification of a device under test and a requested measurement and one or more processors. The one or more processors are configured to receive the request from the request queue, generate a command to instruct an optical switch to select a port associated with the device under test based on the identification of the device under test, determine the requested measurement from the request, and based on the requested measurement and the identification of the device under test, generate instructions to configure a test and measurement instrument to perform the requested measurement.

Abstract: A device has a digital-to-analog converter to convert waveform data into analog waveforms, a waveform memory to store stored waveform data, an external waveform interface to receive real-time waveform data from an external device, a waveform multiplexer connected to the digital-to-analog converter to select between the first memory and the external waveform interface, a sequencer to receive and execute instructions to identify and access waveform data to drive the digital-to-analog converter, a sequencer instruction memory to provide stored instructions to the sequencer, an external instruction interface to receive real-time instructions for the sequencer, and a sequencer multiplexer to select between the sequencer instruction memory and the external instruction interface connected to the sequencer.