Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

Abstract: A modular power supply including a voltage regulator configured to output a voltage, a first output configured to connect to a device under test and output the voltage from the regulator, a microcontroller connected to the voltage regulator, and an interface configured to connect to a test and measurement instrument. The interface includes an input configured to receive power from the test and measurement instrument and a second output configured to output a signal characteristic of the first output.

Abstract: A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.

Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.

Abstract: A test and measurement instrument including a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.

Abstract: A protocol designer for a test and measurement instrument, comprising an input to receive a signal, a memory configured to store the signal, an author configured to generate protocol definitions based on a user input, a debugger configured to output textual and visual decode results based on the protocol definitions and the signal, and a deployer configured to output a complied protocol definition file to the test and measurement instrument.

Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.

Abstract: A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument.

Abstract: A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.

Abstract: A test and measurement system including a plurality of channels and one or more processors. The one or more processors are configured to cause the test and measurement system to receive, via a first channel of the plurality of channels, a positive side of a reference differential signal pair, receive, via a second channel of the plurality of channels, a negative side of the reference differential signal pair, and produce a reference signal based the reference differential signal pair. A combined signal is received, from a combiner, that is a balanced signal produced from the reference differential signal pair. A de-embed filter is generated based on the reference signal and the combined signal and an additional signal is received from the combiner and an effect of the combiner is removed from the additional signal by applying the de-embed filter to the additional signal.

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.

Abstract: A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.

Abstract: A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.

Abstract: A method determines scattering parameters, S-parameters, for a device under test for a first frequency range. The method includes receiving S-parameters for the device under test for a second frequency range, the second frequency range greater than the first frequency range. Generally, the S-parameters for the device under test for the second frequency range can be determined using known methods. The method further includes measuring an actual response of the device under test, determining a desired signal of the device under test, and determining the S-parameters for the device under test for the first frequency range based the S-parameters for the second frequency range, actual response of the device under test and the desired signal of the device under test.

Abstract: An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

Abstract: An apparatus configured to acquire S-parameters of a communications channel includes a physical interface configured to transmit and receive signals through a communications channel under test, a processor, configured to execute instructions that, when executed cause the processor to: send a first data pattern from the transmitter through the communications channel at a first data rate; acquire a first waveform corresponding to the first data pattern and determine a first pulse response; calculate a first transfer function from the first pulse response; send a second data pattern from the transmitter through the communications channel at a second data rate; acquire a second waveform corresponding to the second data pattern and determine a second pulse response; calculate a second transfer function from the second pulse response; and combine the first and second transfer functions to determine an S-parameter of the communications channel.

Abstract: A method for electrically connecting a test and measurement instrument to a via of a printed circuit board, PCB, the method comprising: dispensing a UV-curable conductive adhesive into a back-drilled hole formed in the PCB, the back-drilled hole extending to the via, such that the dispensed adhesive contacts the via; curing the dispensed adhesive by applying a UV light source to the dispensed adhesive; and connecting a test and measurement instrument to the cured adhesive using a conductive member.

Abstract: An apparatus for coupling a test and measurement instrument to a device under test comprises a clip structured to be attached between two conductive portions of the device under test, and an insert structured to be removably installed in the clip. The insert is configured to provide a current path between the two conductive portions of the device under test. In embodiments, the insert comprises a resistive element, which may be a round rod resistor. Additional embodiments may be described and/or claimed herein.

Abstract: A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.