Patents Assigned to Tektronix, Inc.
  • Patent number: 7495688
    Abstract: A method of generating an MPEG sequence for multiple component analog video measurements modifies a general purpose encoder and provides an MPEG encoded signal to test a device under test (DUT) component analog output that is valid in both RGB and YPbPr in both pulse and bar and that solves digital RGB cross-talk due to aliasing of Cb and Cr in 4:0:0 and 4:4:4 formats. The general purpose encoder is modified by removing vertical pre-filtering and post-filtering, altering quantization tables alternate scanning for vertical redundancy, and turning off motion estimation. The input to the MPEG encoder is pre-aliased to provide minimum digital cross-talk after MPEG compression by repeating every other sample.
    Type: Grant
    Filed: April 5, 2005
    Date of Patent: February 24, 2009
    Assignee: Tektronix, Inc.
    Inventor: Kevin M. Ferguson
  • Patent number: 7496814
    Abstract: A load testing apparatus and method has a display unit for the presentation of data that relate to a load test of a telecommunication network. The display includes a graphical user interface with the load test being divided into several test phases and on the graphical user interface functionalities being assigned to these test phases. The load testing apparatus further has a storage device into which user identifiers are enterable, and the functionalities are pooled into groups so that for each identifier there one or more groups of functionalities may be enabled.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: February 24, 2009
    Assignee: Tektronix, Inc.
    Inventors: Ute Wagner, Mike Wiedemann, Christian Schoenfeld, Christian Zander, Michael Bluemche, Heinz-Joachim Laake, Christian Hain, Kristian Martens, Karsten Kiehlmann, Elisabeth A. Muncher
  • Patent number: 7493223
    Abstract: A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.
    Type: Grant
    Filed: August 2, 2005
    Date of Patent: February 17, 2009
    Assignee: Tektronix, Inc.
    Inventors: Saumitra Kayal, Manisha Ajgaonkar
  • Publication number: 20090043803
    Abstract: A test and measurement instrument and method of operating for presenting data in a data presentation, receiving a data selection indicating a portion of the data presented in the data presentation, generating a data object in response to the data selection, presenting the data object in an analysis sandbox, and generating an analysis construct in response to analysis objects in the analysis sandbox.
    Type: Application
    Filed: September 27, 2007
    Publication date: February 12, 2009
    Applicant: TEKTRONIX, INC.
    Inventors: Leo David Frishberg, Eric Gould Bear
  • Publication number: 20090027250
    Abstract: While combining AD converters that one is wide band but narrow dynamic range and the other is narrow band but wide dynamic range, it allows settings to provide a common intermediate frequency signal to the AD converters. A first BPF 50 provides a first AD converter 54 with the output signal obtained by getting an intermediate frequency signal Sif through a first band in the second Nyquist zone of the first AD converter 54. A second BPF 52 provides a second AD converter 56 with the output signal obtained by getting the intermediate frequency signal Sif through a second band in the third Nyquist zone of the second AD converter 56. At this time, the second band is set in the center portion of the second Nyquist zone band, and the first band is set in the center portion of the band of the intermediate frequency signal.
    Type: Application
    Filed: July 25, 2008
    Publication date: January 29, 2009
    Applicant: TEKTRONIX, INC.
    Inventor: Akira Nara
  • Patent number: 7480839
    Abstract: A circuit and method of qualified anomaly detection provides detection and triggering on specific analog anomalies and/or digital data within a qualified area of a serial data stream. A start pattern within the serial data stream, such as a packet header, is detected to generate an enable signal. A stop event, such as a packet trailer, a specified digital event, a time interval or the like, is identified to generate a disable signal. The enable and disable signals are combined to produce a qualification signal that allows a trigger circuit to trigger on a specified anomaly within the portion of the serial data stream defined by the qualification signal.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: January 20, 2009
    Assignee: Tektronix, Inc.
    Inventors: Patrick A. Smith, Roland E. Wanzenried
  • Patent number: 7477286
    Abstract: A system for providing an easily usable composite legality and component gamut display translates a video input signal into a plurality of component and composite format signals. A user selects from the plurality of component and composite format signals a pair of signals for input to the y-axis and x-axis of a rectangular plot. The resulting rectangular plot includes every pixel within a video frame of the video input signal and, together with prescribed limits, is displayed to provide a visual indication of composite legality and/or component gamut.
    Type: Grant
    Filed: February 2, 2005
    Date of Patent: January 13, 2009
    Assignee: Tektronix, Inc.
    Inventor: Kathryn A. Engholm
  • Publication number: 20090011754
    Abstract: A system and method for detecting channels in a network using messages passing through the network is provided. An embodiment comprises detecting AAL2 channels communicating between a Node B and an radio network controller and also between two radio network controllers. In the case of communication between a NodeB and a radio network controller, the AAL2 channels are detected by matching pairs of Random Access Channel (RACH) and Forward Access Channel (FACH) associated with a user equipment identity along with a Dedicated Channel (DCH) until the AAL2 channels present between the Node B and the RNC are determined to a desired level of confidence. In the case of communication between two radio network controllers, only the DCH channels need to be detected to completely detect the AAL2 channels.
    Type: Application
    Filed: March 26, 2008
    Publication date: January 8, 2009
    Applicant: TEKTRONIX, INC.
    Inventors: Srikanth Chinnapareddy, Sirish Davuluri, Balaji Ratakonda
  • Patent number: 7474972
    Abstract: An acquisition apparatus for a test and measurement instrument including a splitter configured to split an input signal into a plurality of split signals, a plurality of oscillators, each oscillator configured to generate a periodic signal, a plurality of combiners, each combiner configured to combine an associated plurality of the periodic signals into an associated signal combination where at least one of the signal combinations is substantially non-periodic. The apparatus also includes a plurality of mixers, each mixer configured to mix an associated split signal and an associated signal combination into an associated mixed signal, a first digitizer configured to digitize an associated split signal, and a plurality of second digitizers, each second digitizer configured to digitize an associated mixed signal.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: January 6, 2009
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Thomas C. Hill, III
  • Patent number: 7471652
    Abstract: An RF/IF signature trigger for acquiring received RF signal data is generated by correlating the received RF signal data in the form of a time domain RF/IF signal, a detected RF/IF signal and/or a frequency domain RF/IF signal with a reference signal defined by a signal signature record representing desired/undesired RF/IF signal patterns, detected RF pulse shapes, special RF markers used specifically for triggering signal acquisitions, particular signal patterns of interest and the like. The resulting correlation factor continuously calculated in real time is compared with a variable correlation threshold such that when the correlation factor reaches the variable correlation threshold, either positive or negative, the RF/IF signature trigger is generated to acquire the received RF signal data for analysis.
    Type: Grant
    Filed: December 16, 2004
    Date of Patent: December 30, 2008
    Assignee: Tektronix, Inc.
    Inventors: Kyle L. Bernard, Koichi Sega
  • Publication number: 20080309357
    Abstract: A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system secured to each of the outer shielding conductors of the probing tips. In a further embodiment, the probing tips move both vertically and horizontally and the ground clip system has a spring wire member that is secured to the probe. The spring wire member is formed with various sections having various angles to each other that allows one section to slidably engage one of the outer shielding conductors on one of the probing tips and another section to slidably engage the outer shielding conductor of the other probing tip.
    Type: Application
    Filed: August 21, 2008
    Publication date: December 18, 2008
    Applicant: Tektronix, Inc.
    Inventors: Kei-Wean C. Yang, Mark W. Nightingale, Paul G. Chastain
  • Publication number: 20080309356
    Abstract: A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system secured to each of the outer shielding conductors of the probing tips. In a further embodiment, the probing tips move both vertically and horizontally and the ground clip system has a spring wire member that is secured to the probe. The spring wire member is formed with various sections having various angles to each other that allows one section to slidably engage one of the outer shielding conductors on one of the probing tips and another section to slidably engage the outer shielding conductor of the other probing tip.
    Type: Application
    Filed: August 21, 2008
    Publication date: December 18, 2008
    Applicant: Tektronix, Inc.
    Inventors: Kei-Wean C. Yang, Mark W. Nightingale, Paul G. Chastain
  • Patent number: 7466718
    Abstract: A decoding device for analyzing communication protocols has a generic decoder into which at least one protocol description of a communication protocol is loaded, the at least one protocol description being capable of being interpreted by the generic decoder. The decoding device also has a specific decoder designed for a certain protocol description. The generic and specific decoders are reversibly connected.
    Type: Grant
    Filed: April 10, 2001
    Date of Patent: December 16, 2008
    Assignee: Tektronix, Inc.
    Inventor: Wolfgang Bartsch
  • Patent number: 7466724
    Abstract: A method and apparatus for processing packetized data spanning multiple clock cycles includes at least one comparator, for comparing a present clock cycle count to a reference clock cycle count, wherein the reference clock cycle values may be anywhere within the packet and may be non-contiguous with other reference clock cycle values. At least one word recognizer, compares a presently clocked word to a reference word, and an output circuit provides an indication of a favorable word comparison that occurred in response to a favorable clock cycle count comparison.
    Type: Grant
    Filed: October 14, 2004
    Date of Patent: December 16, 2008
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Geoffrey D. Cheren
  • Publication number: 20080303443
    Abstract: Position Lock Trigger apparatus employs oscilloscope circuitry and accompanying control software to provide to a user the capability to trigger an oscilloscope on a selected bit position in a received serial bit stream having a fixed pattern length, using either a synthesized, recovered, or external clock source. The selected trigger position can be moved forward and backward along the serial bit stream by one or more serial bit positions at a time in order to examine the entirety of the fixed pattern length serial bit stream, with or without regard to the actual bit sequences occurring in the serial stream.
    Type: Application
    Filed: June 6, 2008
    Publication date: December 11, 2008
    Applicant: TEKTRONIX, INC.
    Inventors: Que Thuy Tran, David L. Kelly, David G. Hite, Patrick A. Smith, Thomas F. Lenihan
  • Patent number: 7463015
    Abstract: A time shifting signal acquisition probe system has a signal acquisition probe having a memory containing a time delay constant representative of the propagation time delay of an electrical signal passing through the signal acquisition probe. A measurement test instrument receives the electrical signal from the signal acquisition probe and generating digital samples of the electrical signal in an acquisition system in response to a trigger signal and producing a waveform record. A communications bus coupled between the signal acquisition probe and the measurement test instrument couples the signal acquisition probe time delay constant from the signal acquisition probe to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the waveform record of the electrical signal relative to the trigger signal by the amount of the signal acquisition probe time delay constant.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: December 9, 2008
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, John B. Rettig
  • Patent number: 7463180
    Abstract: An up-converter 124 frequency-up-converts an analog signal Sm. A down-converter 121 frequency-down-converts analog signal Sm. A signal selection block 125 selects one of the frequency-up-converted signal Sfu and frequency-down-converted signal Sfd. The signal Se selected by the signal selection block 125 is provided to the primary winding of a transformer 127. A signal induced in the secondary winding of the transformer 127 is provided to an A/D converter 128 to produce a digital signal Dm. For example, if the analog signal Sm has DC or a low frequency close to DC, the signal Sfu is selected as the signal Se. If the analog signal Sm does no have DC nor a low frequency close to DC, the signal Sfd is selected as the signal Se.
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: December 9, 2008
    Assignee: Tektronix, Inc.
    Inventor: Akira Nara
  • Publication number: 20080297170
    Abstract: A system, apparatus, and method for dynamic measurement of inductance trend of a motor are disclosed. In one of the embodiment herein the system is configured to acquire inputs from the DUT using a Trigger system, a horizontal subsystem and the programming unit. The system is also configured to process such information for dynamic analysis and representation on an interface provided in the system based on different step sizes.
    Type: Application
    Filed: May 21, 2008
    Publication date: December 4, 2008
    Applicant: TEKTRONIX, INC.
    Inventors: Krishna N. H. Sri, Mukesh Soni, Narasimha Murthy K.
  • Patent number: 7460983
    Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: December 2, 2008
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, William A. Hagerup, Rolf P. Anderson, Sharon M. Mc Masters
  • Publication number: 20080281560
    Abstract: Embodiments of the present invention comprise systems and methods for determining measurement apparatus acquisition parameters and related processing.
    Type: Application
    Filed: November 3, 2006
    Publication date: November 13, 2008
    Applicant: TEKTRONIX, INC.
    Inventors: Kathryn A. Engholm, Craig D. Bryant, Yi He