Patents Assigned to X-Ray Optical Systems, Inc.
  • Patent number: 9057685
    Abstract: An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.
    Type: Grant
    Filed: August 14, 2012
    Date of Patent: June 16, 2015
    Assignee: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: George Allen, Stuart Shakshober, Sony Cheriyan
  • Patent number: 9048001
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Grant
    Filed: October 11, 2013
    Date of Patent: June 2, 2015
    Assignee: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett, Jr.
  • Publication number: 20150043713
    Abstract: An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.
    Type: Application
    Filed: February 27, 2013
    Publication date: February 12, 2015
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventor: Zewu Chen
  • Publication number: 20150036804
    Abstract: A handheld x-ray analyzer, having an outer shell forming an inner cavity, the outer shell having at least one aperture; an x-ray engine positioned within the cavity; and a generally planar heat sink rigidly and thermally attached to the x-ray engine, and positioned in the aperture of the outer shell thereby substantially filling the aperture while providing thermal conduction between the engine and surrounding air. An outer face of the heat sink may be substantially conformal with the outer shell along one or both sides of the analyzer, and form a substantial portion of one or both sides of the analyzer. Longitudinal fins may be placed on an outer face of the heat sink to aid in thermal conduction from the engine to the surrounding air. Thermal handling, shock/vibration isolation, and moisture barriers are provided.
    Type: Application
    Filed: February 27, 2013
    Publication date: February 5, 2015
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Daniel Dunham, Rory D. Delaney
  • Patent number: 8908827
    Abstract: This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: December 9, 2014
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: James Carnahan, Zewu Chen, Leslie Johnson
  • Publication number: 20140294157
    Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.
    Type: Application
    Filed: October 25, 2012
    Publication date: October 2, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, Rory D. Delaney, John H. Burdett, Kai Xin
  • Publication number: 20140270063
    Abstract: A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.
    Type: Application
    Filed: March 13, 2014
    Publication date: September 18, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: George ALLEN, John H. BURDETT, JR., Zewu CHEN, Leslie JOHNSON
  • Publication number: 20140198898
    Abstract: A technique, including associated method and system, for on-line measurement of a trace element in a crude or heavy fuel stream for a refinery, including in one embodiment: providing at least one x-ray fluorescence (“XRF”) analyzer at a point for the refinery; analyzing the petroleum stream for chlorine using the analyzer; and providing results from the analyzer to refinery operators, to improve refinery operations. The analyzer may be a monochromatic wavelength XRF analyzer, wherein the analyzer focuses energy to/from the stream using an x-ray engine having at least one focusing, monochromating x-ray optic. The analyzer may be an MWDXRF or ME-EDXRF analyzer; and the trace element may be one or more of the following elements: S, Cl, P, K, Ca, V, Mn, Fe, Co, Ni, Cu, Zn, Hg, As, Pb, and Se; and in one embodiment the stream is crude, and the trace element is chlorine.
    Type: Application
    Filed: June 14, 2012
    Publication date: July 17, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Albertus Beumer, Zewu Chen
  • Publication number: 20140105363
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Application
    Filed: October 11, 2013
    Publication date: April 17, 2014
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, JR.
  • Patent number: 8625737
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Grant
    Filed: February 8, 2011
    Date of Patent: January 7, 2014
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Sony Cheriyan, Kai Xin, Jay Burdett
  • Patent number: 8559597
    Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
    Type: Grant
    Filed: March 3, 2009
    Date of Patent: October 15, 2013
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
  • Patent number: 8553841
    Abstract: A shielded, low-noise, high-voltage power supply having a plurality of voltage multipliers, each having a toroidal transformer, and collectively producing a high DC output voltage from an AC voltage. A main conductor carries the AC voltage, and is positioned proximate each toroidal transformer of the plurality of voltage multipliers. A conductive shell is conductively connected to the main conductor, and substantially encloses the plurality of voltage multipliers and the main conductor, the conductive shell providing a return path for the AC voltage in the main conductor and providing EMI shielding of the voltage multipliers and the main conductor. Other features are provided, including an intermediate transformer for conditioning/isolating the AC voltages.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: October 8, 2013
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Ernest Cooley, Sony Cheriyan, Daniel Dunham, Igor Ponomarev, Paul Quantock, Robert C. Tatar
  • Publication number: 20130044858
    Abstract: An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.
    Type: Application
    Filed: August 14, 2012
    Publication date: February 21, 2013
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: George ALLEN, Stuart SHAKSHOBER, Sony CHERIYAN
  • Publication number: 20120321045
    Abstract: This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions.
    Type: Application
    Filed: June 14, 2012
    Publication date: December 20, 2012
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: James CARNAHAN, Zewu CHEN, Leslie JOHNSON
  • Patent number: 8130908
    Abstract: An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.
    Type: Grant
    Filed: February 23, 2010
    Date of Patent: March 6, 2012
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Huapeng Huang, Alexei Vershinin
  • Publication number: 20120020463
    Abstract: A shielded, low-noise, high-voltage power supply having a plurality of voltage multipliers, each having a toroidal transformer, and collectively producing a high DC output voltage from an AC voltage. A main conductor carries the AC voltage, and is positioned proximate each toroidal transformer of the plurality of voltage multipliers. A conductive shell is conductively connected to the main conductor, and substantially encloses the plurality of voltage multipliers and the main conductor, the conductive shell providing a return path for the AC voltage in the main conductor and providing EMI shielding of the voltage multipliers and the main conductor. Other features are provided, including an intermediate transformer for conditioning/isolating the AC voltages.
    Type: Application
    Filed: July 26, 2011
    Publication date: January 26, 2012
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Ernest COOLEY, Sony CHERIYAN, Daniel DUNHAM, Igor PONOMAREV, Paul QUANTOCK, Robert C. TATAR
  • Patent number: 8050382
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Grant
    Filed: February 24, 2009
    Date of Patent: November 1, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Rory Delaney, Kai Xin
  • Publication number: 20110194671
    Abstract: An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
    Type: Application
    Filed: February 8, 2011
    Publication date: August 11, 2011
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu CHEN, Sony CHERIYAN, Kai XIN, Jay BURDETT
  • Patent number: 7991116
    Abstract: An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.
    Type: Grant
    Filed: July 26, 2006
    Date of Patent: August 2, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Ning Gao, Walter Gibson
  • Patent number: D697210
    Type: Grant
    Filed: February 28, 2012
    Date of Patent: January 7, 2014
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Rory D. Delaney, Daniel Dunham