Abstract: A clock template includes digital programming information for programming clock frames of a programmable gate array (PGA). The digital programming information represents a number of different clock configurations that correspond to various designs in the PGA. In one embodiment, the digital programming information includes a bit stream for partially reconfiguring the PGA. In another embodiment, the digital programming information is embedded in digital programming information of at least one of the designs. Methods of configuring a PGA with different designs having different clocking configurations by utilizing the clock template are also disclosed.

Abstract: A new method to test short faults in a programmable logic device is described. The line segments under test are connected together to form a conducting chain. All the line segments neighboring to the conducting chain are tied to a known state. A test vector is applied to the programmable logic device. The state of the line under test is measured. If it is the same as the known state, the programmable logic device is likely to have faults.

Abstract: Routing algorithms can be modified to increase the number of programmable interconnect points (PIPs) used in a routing pattern. A file is set up to store information on whether a PIP has been covered. The cost of a node can be decreased by a predetermined value if two nodes are connected by an uncovered PIP. In another embodiment, a file is set up to store a count for each PIP. The count is increased each time the PIP is used in a routing. The cost of a node can be increased by multiplying a predetermined value and the count of a PIP associated with the node.

Abstract: The location of short and open faults in a programmable logic device can be precisely located. The programmable logic device contains a plurality of nets, and each net contains a plurality of PIPs and connected line segments. A faulty net is first identified using conventional methods. A new design is constructed from a faulty net by replacing one of the plurality of line segments or PIPs with an alternative line segment/PIP. The mew design is tested to determine if the fault has been removed as a result of the replacement. If the fault is not removed, another line segment/PIP is replaced. This process is repeated until a design without fault is found. The location of the faulty line segment/PIP can be easily deduced.

Abstract: A method of estimating a capacitance of each resource in a programmable logic device (PLD) is described. The current drawn by a reference circuit implemented in the PLD is measured at a given frequency and operating voltage. The capacitance of the reference circuit is calculated using the current drawn, the frequency, and the operating voltage. The current drawn by a resource load coupled to the reference circuit is measured at the given frequency and operating voltage. The capacitance of the resource load coupled to the reference circuit is calculated using the current drawn, the frequency, and the operating voltage. The capacitance of the resource load may be calculated by subtracting the capacitance of the reference circuit from the capacitance of the resource load coupled to the reference circuit.

Abstract: An apparatus and method for adding input voltage signals. First and second input voltage signals are respectively sampled onto first and second capacitors during a first clock phase. In response to a second clock phase, the first sampled input voltage that is held on the first capacitor is coupled to the negative input terminal of an amplifier, and the second sampled voltage held on the second capacitor is coupled to the positive terminal of the amplifier. A feedback voltage is provided from the amplifier output to the negative amplifier input via the first capacitor during the second clock phase. The first and second input voltage signals are added at the amplifier during the second clock phase to output the sum in response to the sampled input voltage signals and the output feedback, whereby the resulting transfer function is independent of capacitor mismatch and non-linearity.

Abstract: A test circuit is included in an IC wafer for testing the reliability of ICs under high current stress. The test circuit includes two sensing transistors, a select transistor, and a resistor. The two ends of the resistor are coupled to two sense terminals through the two sensing transistors. One end of the resistor is also coupled to a first stress input terminal; the other end of the resistor is coupled to a second stress input terminal through the select transistor. When the test circuit is selected, the sensing and select transistors are turned on. A current path is formed between the two stress input terminals, and a voltage differential can be measured across the resistor using the two sense terminals. Row and column select circuits enable the rapid testing of many resistor sizes and configurations in an array of such test circuits.

Abstract: A method and apparatus for generating a configuration bitstream for a programmable logic device using logic ports associated with logic cores. Logic ports are associated with respective ones of a plurality of logic cores, and logical connections are made between selected ones of the ports of the logic cores. Source pins, wherein a pin represents an output resource of a programmable element of the programmable logic device, are associated with selected ones of the ports. A sink pin represents an input resource of a programmable element of the programmable logic device, and sink pins are associated with selected ones of the ports. In response to a route programming interface call that references a source port and a sink port, bits for the configuration bitstream are generated for routing resources to connect selected ones of the source pins to selected ones of the sink pins. Usage of logic ports assists in runtime reconfiguration of logic.

Abstract: A programmable integrated circuit can be designed to emulate, on demand, one of several commonly used microprocessors. It contains a configurable instruction processing unit and a superset datapath unit. The instruction processing unit further contains a configurable microcode unit and a non-configurable sequencing unit. The programmable integrated circuit can be programmed so that a microcode compatible with a target microprocessor is installed in the configurable microcode unit. The superset datapath unit is a superset of the datapath elements of all the target microprocessors.

Abstract: A correlation circuit arrangement for de-spreading spread spectrum signals. In various embodiments, the correlation circuit arrangement includes an adder-subtractor and a shift register arrangement. The adder-subtractor adds an input sample value to or subtracts the sample value from an accumulated correlation value, responsive to an input PN code. The adder-subtractor is time-multiplexed between one or more PN code generators and correlation values are accumulated in the shift register arrangement. In another embodiment, transmission path delay can be analyzed by using the shift register arrangement to store correlation values that result from delaying the PN code across multiple chip periods.

Abstract: Described are mask-alignment detection structures that measure both the direction and extent of misalignment between layers of an integrated circuit using resistive elements for which resistance varies with misalignment in one dimension. Measurements in accordance with the invention are relatively insensitive to process variations, and the structures using to take these measurements can be formed along with other features on an integrated circuit using standard processes. One embodiment of the invention may be used to measure misalignment between two conductive layers. Other embodiments measure misalignment between diffusion regions and conductors and between diffusion regions and windows through which other diffusion regions are to be formed. A circuit in accordance with one embodiment includes row and column decoders for independently selecting mask-alignment detection structures to reduce the number of test terminals required to implement the detection structures.

Abstract: Structures and methods for generating high reliability designs for PLDs on which single event upsets have minimal impact. When standard triple modular redundancy (TMR) methods are used in PLDS, a single event upset can short together two module output signals and render two of the three voting circuit input signals invalid. The invention addresses this issue by providing quintuple modular redundancy (QMR) for high-reliability circuits implemented in PLDs. Thus, a single event upset that inadvertently shorts together two PLD interconnect lines can render invalid only two out of five module output signals. The majority of the five modules still provide the correct value, and the voting circuit is able to correctly resolve the error. In some embodiments, a user selects a high-reliability circuit implementation option and/or a PLD particularly suited to a QMR implementation, and the PLD implementation software automatically implements the QMR structure for the user circuit.

Abstract: A clock distribution circuit and method in which the incoming clock frequency is divided by two to create a reduced-frequency global clock signal. A dual-edge-correcting clock synchronization circuit aligns both the rising and falling edges of the global clock signal to separately to nullify the clock-distribution errors associated with rising and falling clock edges.

Abstract: An electrical alignment test structure enables monitoring and measuring misalignment between layers (or associated masks) of an IC. The alignment test structure comprises a target region and an alignment feature in different layers. The target region and the alignment feature may be formed in diffusion and polysilicon layers, respectively or in well and diffusion layers, respectively. In both embodiments, the alignment feature controls the size of a conductive channel in the target region. Misalignment can be checked by comparing channel resistance with a baseline (no misalignment) resistance. In another embodiment, the target region and alignment feature are formed in the diffusion and polysilicon layers, respectively, wherein the alignment feature controls the relative widths of the source and drain regions. Misalignment can be checked by comparing current flow with a baseline current.

Abstract: Described are circuits and methods for automatically measuring the program threshold voltage VTP and the erase threshold voltage VTE of EEPROM cells. The measured threshold voltages are employed to measure tunnel-oxide thickness and to determine optimal program and erase voltage levels for EEPROM circuits. One embodiment automatically sets the program and erase voltages based on the measured threshold voltages.

Abstract: A method for reconfiguring a complex programmable logic device (CPLD) that includes an EEPROM array and a shadow SRAM array comprises reprogramming the EEPROM array with new configuration data while the CPLD is operating in a first configuration. This relatively time-consuming operation has no effect on CPLD operation since only the SRAM array controls the configuration of the CPLD. At a desired point in time, the new configuration data from the EEPROM array can be loaded into the SRAM array to reconfigure the CPLD. Because this loading of configuration data into the SRAM array takes only microseconds to perform, normal system operation effectively proceeds without interruption. A CPLD can include multiple EEPROM arrays, each storing a different set of configuration data, thereby allowing the CPLD to rapidly switch between various configurations by loading the configuration data from different EEPROM arrays into the SRAM array.

Abstract: A method for programming a series of in-system programmable devices that uses Boundary-Scan techniques to read device identification codes from each device of a system, and to automatically generate a board/device information file including a record for each device arranged in the order in which the devices are chained in the system. The device identification codes are then used to automatically retrieve device specifications from a central database. When no identification code is provided from the device, or the database fails to include specifications for a particular device, the user is prompted to enter minimum information or specifications necessary to carry out communications with the device. After device specifications are entered for each device, the user is prompted to enter configuration data, which is automatically matched to its associated device, and compared for consistency with the device specifications.

Abstract: A digital frequency synthesizer (DFS) circuit adds little additional delay on the clock path. True and complement versions of an input clock signal are provided to a first and second passgates, respectively. Under the direction of a control circuit, the passgates pass selected rising edges of the true clock signal, and selected falling edges of the complement clock signal, to an output clock terminal of the DFS circuit. When neither the true nor the complement clock signal is passed, a keeper circuit retains the value already present at the output clock terminal. In some embodiments, both passgates can be disabled and a ground or power high signal can be applied to the output terminal. Other embodiments include PLDs in which the DFS circuits are employed to allow individual clock control for each programmable logic block.

Abstract: A method is provided for watermarking FPGA configuration data. Specifically, if an end user desires to use a macro from a macro vendor, the end user creates a design file containing a marked macro received from the macro vendor, rather than the actual macro. The end user then uses an FPGA programming tool to convert the design file into configuration data. Specifically, the FPGA programming tool processes the design file to detect marked macros. If a marked macro is detected, the FPGA programming tool embeds a watermark corresponding to the macro within the configuration data.

Abstract: An EEPROM memory cell array architecture (50) that substantially eliminates leakage current to allow for reading memory cells (20) in a memory cell array of, for example, a CPLD at lower voltages than are possible with prior art architectures, thereby facilitating development of low voltage applications. This is accomplished by associating each wordline of the memory cell array with a ground transistor (26). On one embodiment, the ground transistor (26) can be a high voltage transistor, in which case the same high voltage control signal can control both the ground transistor (26) and the memory cell=s read transistor (32). In another embodiment, the ground transistor (26) is a low voltage transistor controlled by a separate low voltage control signal.