Abstract: A method of generating assertions for verification of a hardware design expressed at a register transfer level (RTL) includes running simulation traces through the design to generate simulation data; extract domain-specific information about the design for variables of interest; execute a data mining algorithm with the simulation data and the domain-specific information, to generate a set of candidate assertions for variable(s) of interest through machine learning with respect to the domain-specific information, the candidate assertions being likely invariants; conduct formal verification on the design with respect to each candidate assertion by outputting as invariants the candidate assertions that pass verification; iteratively feed back into the algorithm a counterexample trace generated by each failed candidate assertion, each counterexample trace including at least one additional variable in the design not previously input into the data mining algorithm, to thus increase coverage of a state space of the

Abstract: A method of detailed placement for ICs is provided. The method receives an initial placement and iteratively builds sets of constraints for placement of different groups of cells in the IC design and uses a satisfiability solver to resolve placement violations. In some embodiments, the constraints include mathematical expressions that express timing requirements. The method in some embodiments converts the mathematical expressions into Boolean clauses and sends the clauses to a satisfiability solver that is only capable of solving Boolean clauses. In some embodiments, the method groups several cells in the user design and several sites on the IC fabric and uses the satisfiability solver to resolve all placement issues in the group. The satisfiability solver informs placer after each cell is moved to a different site. The method then dynamically builds more constraints based on the new cell placement and sends the constraints to the satisfiability solver.

Abstract: Effective timing and power characterization flows are described for asynchronous circuits. Verification can be provided for both relative-timing constraints as well as performance (e.g., throughput) targets using commercially-standard STA tools. Fully-automated scripts are developed that verify all relative timing assumptions (e.g., isochronic forks) as well as the gate-level performance of any circuit designed with these templates. Library characterization can be utilized and asynchronous logic cells not found in standard-cell libraries, such as dual-rail domino logic and dynamic C-elements with staticizers, can be characterized in terms of both their timing and power. These values are a function of both input slew and output load and are preferably captured in an industry standard format, such as the Liberty™ file format, before being compatible with commercial STA tools.

Abstract: A method of preparing a programmable integrated circuit device for configuration using a high-level language includes compiling a plurality of virtual programmable devices from descriptions in said high-level language. The compiling includes compiling configurations of configurable routing resources from programmable resources of said programmable integrated circuit device, and compiling configurations of a plurality of complex function blocks from programmable resources of said programmable integrated circuit device. A machine-readable data storage medium may be encoded with a library of such compiled configurations. A virtual programmable device may include a stall signal network and routing switches of the virtual programmable device may include stall signal inputs and outputs.

Abstract: A method of checking an integrated circuit design database includes providing the integrated circuit design stored in a storage media; providing application rules; and providing an instance abstract of instances of libraries and IP(s). Instance-level information is extracted from the integrated circuit design database. An application-rule check is performed against the instance-level information using the information provided in an abstract file.

Abstract: A method is for designing an accelerator for digital signal processing including defining a software programmable fully pre-laid out macro by pre-laying out with a fixed topology a control logic of the DSP accelerator to obtain a fully pre-laid out control logic. The method further includes defining a hardware programmable partially pre-laid out macro by customizing a configurable layout area, thereby mapping a computational logic based on computation kernels related to an application of the DSP accelerator. A partially pre-laid out computational logic is therefore obtained.

Abstract: Aspects of the invention relate to techniques of layout decomposition for triple patterning lithography. Data of a coloring graph are derived from layout data for a layout design. The coloring graph is simplified through graph reduction and graph partitioning processes. The graph partitioning process comprises separating biconnected components. The graph partitioning process may further comprise separating subgraphs connected by one or two edges. Based on the simplified coloring graph, the layout design is decomposed to generate decomposition information. The decomposition process may comprise applying a heuristic method for coloring if needed. The decomposition information may comprise information of one or more layout regions that cannot be decomposed.

Abstract: A method includes preferentially placing fill regions adjacent to transistors of a particular conductivity type, such as p-channel transistors, for a plurality of standard cell instances of a device design. The method also includes evaluating all transistors of the first conductivity type prior to evaluating any transistors of a second conductivity type. The second conductivity type is opposite the first conductivity type. For each transistor being evaluated, it is determined whether a criterion is me. A fill region is placed within a field isolation region adjacent to the transistor if the criterion is met.

Abstract: A method for forming a mask layout is described. A plurality of phase shapes are formed on either side of a critical feature of a design layout of an intergrated circuit chip having a plurality of critical features. A plurality of transition edges are identified from the edges of each phase shape. Each transition edge is parallel to critical feature. A transition space is identified as defined by one of the group including two transition edges and one transition edge. A transition polygon is formed by closing each transition space with at least one closing edge. Each transition polygon is transformed into a printing assist feature. A mask layout is formed from the printing assist features and critical features.

Abstract: A method for generating a layout for a cell of an integrated circuit (IC) guided by design rule checking (DRC) is disclosed. In the method, a model is defined, wherein the model comprises a plurality of parameters for generating a layout of the cell. Next an initial layout for the cell can be generated according to an initial set of values for the plurality of parameters. Then design rule checking (DRC) is performed for the initial layout based on a set of design rules. If any violations are found, the corresponding violation reports will be associated with the model. Therefore, a new set of values for the plurality of parameters can be generated by analyzing the violation reports collectively based on the model. With the new set of values for the plurality of parameters and above steps repeated, until no violation is found, a “DRC clean” layout can be generated.

Abstract: An approach for methodology enabling a verification of IC designs that compensates for degraded performance due to a physical placement, particularly a stacked physical placement is disclosed. A set of stacked devices from a plurality of devices in an IC design is determined. One or more instance parameters indicating a physical placement of a device in the set is determined. A compensation metric indicating one or more electrical characteristics of a device in the set is determined based on the one or more instance parameters.

Abstract: A circuit board design aid is achieved by generating a shield pattern for a wiring pattern including a pattern element in a circuit board by increasing a width of a geometry of the pattern element by an amount corresponding to a shield pattern spacing set as a preset pattern generation condition. A prohibition region is generated based on a geometry of an element for which a clearance check is to be performed located around the wiring pattern and a clearance condition between the element for performing a clearance check and the wiring pattern. Then, the shield pattern is generated by excluding the geometry of the prohibition region from the geometry of the basic shield pattern element.

Abstract: A computer-implemented method of estimating signal congestion in routing resources of a programmable logic device (PLD), wherein the routing resources include configurable interface blocks (CIBs) and wires of different types supported by the CIBs. The method includes identifying, from a representation of a PLD stored within a computer system, components of the PLD to be connected in a configuration of the PLD. A CIB associated with an identified PLD component is then selected. A wire type supported by the selected CIB is also selected. The number of wires of the selected type needed at the selected CIB to implement the PLD configuration and the number of wires of the selected type provided by the CIB are calculated. Signal congestion at the selected CIB is estimated from at least the needed number of wires and the provided number of wires.

Abstract: The present disclosure relates to an apparatus and method to generate a device library, along with layout versus schematic (LVS) and parasitic extraction set-up files for connecting with official tools of a design window supported by a process design kit (PDK). The device library comprises passive devices which can be utilized at any point in an end-to-end design flow from pre-layout verification to post-layout verification of an integrated circuit design. The device library allows for a single schematic view for pre-layout verification but also post-layout verification, thus allowing for pole or pin comparison, and prevents double-counting of parasitic effects from passive design elements by directly instantiating a device from the device library for a verification step. An LVS and parasitic extraction graphical user interface (GUI) allows for incorporation of the generated device library into a pre-existing PDK without any modification to the PDK. Other devices and methods are also disclosed.

Abstract: A computer-implemented method of invariant-guided abstraction includes a processor of a computing device generating one or more invariants corresponding to a design under verification by executing a proof algorithm with an input comprising at least a portion of the design and a specified resource limit. The method further includes deterministically assigning priority information to the one or more invariants generated and to components of the design referenced by said invariants. Finally, the method includes performing invariant-guided localization abstraction on the design model to generate an abstracted design model utilizing the assigned priority information as a localization hint that results in abstractions that are at least one of (a) smaller abstractions and (b) easier to verify abstractions.

Abstract: A method for making a mask for an integrated circuit (IC) design includes receiving an IC design layout having a plurality IC features and performing a targeted-feature-surrounding (TFS) checking operation to identify a targeted-feature-surrounding-location (TFSL) in the IC design layout. The method also includes inserting a phase-bar (PB) to the TFSL, performing an optical proximity correction (OPC) to the IC design layout having the PB to form a modified IC design layout and providing the modified IC design layout for fabrication of the mask.

Abstract: An analysis apparatus for a printed circuit board. The analysis apparatus includes a processor that executes a process of rewriting physical property data of a wiring layer of a printed circuit board to a value. The value is based on physical property data of an electronic part having a heat-generating attribute. The electronic part is mounted on the portion of the wiring layer. The analysis apparatus converts the physical property data of the portion of the wiring layer that has the electronic part to physical property data of an insulating layer of the printed circuit board.

Abstract: Methods and apparatuses for designing logic are described. In one embodiment, a directive which specifies a numeric format for data in a data processing operation in a logic design is determined. The directive is used as a minimum format, rather than an exact or required format to create or change at least a portion of a representation of logic in the logic design to perform the data processing operation. Other methods are disclosed, and systems and machine readable media are also disclosed.

Abstract: A method includes establishing an initial shot layout in which a number of shots are arranged in vertically aligned columns and horizontally aligned rows to cover a semiconductor wafer. At least one of a row of shots or a column of shots is shifted relative to an adjacent row or column of shots to establish at least one additional shot layout that differs from the initial shot layout in that shots in the at least one shifted row or column of shots are not aligned with the shots in the adjacent row or column of shots with which they were aligned in the initial shot layout. One of the initial shot layout and the at least one additional shot layout is selected as a final shot layout. The wafer is exposed to light using the final shot layout.

Abstract: Systems and techniques are described for optimizing a circuit design by using a numerical solver. Some embodiments construct a set of lower bound expressions for a parameter that is used in an approximation of an objective function. Next, the embodiments evaluate the set of lower bound expressions to obtain a set of lower bound values. The embodiments then determine a maximum lower bound value from the set of lower bound values. Next, while solving a gate sizing problem using the numerical solver, the embodiments evaluate the approximate objective function and the partial derivatives of the approximate objective function by using the maximum lower bound value of the parameter. The maximum lower bound value of this parameter determines the accuracy of the approximation of the objective function.