Patents Examined by Alvaro Fortich
-
Patent number: 10060862Abstract: A microwave impedance microscope including a tuning fork having a high-aspect ratio etched metal tip electrode extending transversely to one tine of the fork and having a high aspect ratio to thereby reduce parasitic capacitance. The metal tip may be electrochemically etched from a wire, then bonded to the tine. The fork is slightly inclined from the surface of the sample and the tip electrode projects transversely to the fork. A microwave signal is impressed on the tip. Microwave circuitry receives microwave signals reflected from the sample back into the tip and demodulates the reflected signal according to the impressed signal. Further circuitry further demodulates the reflected signal according to the lower-frequency signal causing the fork to oscillate at its mechanically resonant frequency. A multi-wavelength matching circuit interposed between the microwave circuitry and the probe includes a coaxial cable of length half a fundamental microwave wavelength.Type: GrantFiled: April 5, 2017Date of Patent: August 28, 2018Assignee: Board of Trustees of the Leland Stanford Junior UniversInventors: Yongtao Cui, Yue Ma, Zhixun Shen
-
Patent number: 10060869Abstract: The present invention relates to a system for measuring electrical characteristics of a fluid flowing through a section of a pipe, the system comprising a coaxial resonator, formed by an essentially coaxial insert in said pipe defining an annular volume between a chosen part of said insert and the pipe wall, said insert and pipe wall being made from an electrically conductive material, the system further comprising at least one antenna adapted to emit electromagnetic signals into and receive electromagnetic signals from said coaxial resonator, and means to measure the frequency response of said coaxial resonator within a frequency range including the waveguide mode TE11 of said coaxial resonator, The coaxial insert is mounted to the pipe wall through at least one support leg being positioned outside said annular volume, and one electrically conductive fin is positioned at least partially in the annular volume, said fin being positioned in a radial plane, said plane being different from the plane of said at leType: GrantFiled: April 15, 2016Date of Patent: August 28, 2018Assignee: Roxar Flow Measurement ASInventor: Ebbe Gustaf Nyfors
-
Patent number: 10054619Abstract: Systems and methods are provided to measure a voltage across a two-state dipole. The systems and methods measure voltages across two measurement paths of operational circuitry at first and second sensor terminals. The operational circuitry is configured to decouple the first and second sensor terminal based on a dipole voltage. The systems and methods further estimate the dipole voltage based on the voltages of the two measurement paths.Type: GrantFiled: January 3, 2017Date of Patent: August 21, 2018Assignee: General Electric CompanyInventors: Miguel Garcia Clemente, Philipp Leuner, Thomas Alois Zoels, Bertrand Bastien, Alvaro Jorge Mari Curbelo
-
Patent number: 10054367Abstract: Disclosed is a system to evaluate and monitor the status of a material forming part of an asset, such as a refractory furnace. The system is operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials of an industrial furnace, using radiofrequency signals. The system is designed to integrate software with a plurality of sensors and additional hardware to collect data during an inspection of the furnace, even in regions of difficult access. Furthermore, the system comprises a software management subsystem configured to implement signal processing techniques to process the data collected and generate reports to visualize the status, estimate the remaining operational life, and determine the level of penetration of molten material into the surrounding layers of the furnace. Moreover, the system's software enables a user to monitor the status of the furnace both locally and remotely.Type: GrantFiled: October 28, 2016Date of Patent: August 21, 2018Assignee: PANERATECH, INC.Inventors: Yakup Bayram, Alexander Ruege, Justin Knowles
-
Patent number: 10054632Abstract: A semiconductor apparatus may include a unit chip and a characteristic measurement circuit configured to include a plurality of unit elements for test and to output electrical characteristic information of the plurality of unit elements for test.Type: GrantFiled: August 2, 2016Date of Patent: August 21, 2018Assignee: SK hynix Inc.Inventor: Jin Yong Seong
-
Patent number: 10048340Abstract: A system and method for creating magnetic resonance images are provided. The system applies an RF irradiation during a saturation time period at a reference frequency that saturates a range of selected labile spin species of the subject. The system encodes frequency offsets by applying a gradient G1 at least during the saturation time period. The system applies a plurality of slice selection gradients accompanied by a train of RF pulses during a voxel selection time period and a gradient G3 during an acquisition time period. One or more spin/gradient echo signals having information pertaining to at least one of metabolites and metabolite byproducts is acquired to form a CEST medical imaging data set and the CEST medical imaging data set is reconstructed to form a CEST image of the subject including information about the at least one of metabolites and metabolite byproducts within the subject.Type: GrantFiled: June 3, 2016Date of Patent: August 14, 2018Assignee: The General Hospital CorporationInventors: Phillip Z. Sun, Iris Y. Zhou
-
Patent number: 10048292Abstract: A logic signal analyzer for analyzing logic signals has a positive measurement input providing a positive measurement input voltage value, a negative measurement input providing a negative measurement input voltage value, a third input providing a third input voltage value, and a comparison unit. The comparison unit being configured to provide a first and a second comparison output voltage value each based on one of at least four comparison modes. The first and second comparison output values are based on different comparison modes.Type: GrantFiled: April 28, 2017Date of Patent: August 14, 2018Assignee: Rohde & Schwarz GmbH & Co. KGInventor: Martin Peschke
-
Patent number: 10041813Abstract: A capacitive sensor to determine instantaneous angular position of a rotatable element in a timepiece, such as a setting stem of a wristwatch. Static electrodes are configured to form, in conjunction with rotor electrodes of the rotatable element, a first differential capacitance pair and a second differential capacitance pair. A sensor calculation unit is configured to sense difference values from the differential capacitances pairs and to evaluate the angular position of the rotatable element from the difference values using predetermined information relating the differential capacitance values to angular position values.Type: GrantFiled: September 23, 2015Date of Patent: August 7, 2018Assignee: The Swatch Group Research and Development LtdInventors: Yvan Ferri, Raphael Haenni, Damien Schmutz, Pascal Lagorgette, Raphael Balmer
-
Patent number: 10036772Abstract: A signal testing apparatus for a printed circuit board is disclosed which includes a plurality of input terminals for receiving an external testing signal, a plurality of output terminals for supplying the printed circuit board with the external testing signal, a plurality of switches arranged between the plurality of input terminals and the plurality of output terminals for controllably coupling the plurality of input terminals to the plurality of output terminals, an ammeter for measuring a magnitude of a current on a first path provided by the coupling of the plurality of switches, and a voltmeter for measuring a magnitude of a voltage on a second path provided by the coupling of the plurality of switches.Type: GrantFiled: July 6, 2016Date of Patent: July 31, 2018Assignees: BOE TECHNOLOGY GROUP CO., LTD., BEIJING BOE DISPLAY TECHNOLOGY CO., LTD.Inventors: Chunxi Hai, Runcong Ge, Lingxiao Hou
-
Patent number: 10018668Abstract: A method of testing semiconductor devices includes contacting bond pads coupled to integrated circuitry on a first die of a plurality of interconnected die on a substrate using a probe system having probes and probe tests including parametric tests, continuity tests, and a kill die subroutine. Probe tests using the probe program are performed. Die are binned into a first bin (Bin 1 die) for being a good die for all probe tests, or a second bin (Bin 2 die) for failing at least one of continuity tests and parametric tests. The Bin 2 die are divided into a first sub-group that failed the continuity tests and a second sub-group that do not fail the continuity tests. A kill die subroutine is triggered including applying power sufficient to selectively cause damage to the second sub-group of Bin 2 die to generate a continuity failure and thus generate kill die.Type: GrantFiled: September 22, 2017Date of Patent: July 10, 2018Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Hoi Hin Loo, Soh Ying Seah
-
Patent number: 10018684Abstract: A sensor device for suppressing a magnetic stray field, having a semiconductor body with a surface, formed in an x-y plane, and a back surface. Each circle half of a disk-shaped magnet has two magnetic poles and the magnet is rotatable relative to the IC housing around a z-direction. An imaginary lengthening of the axis penetrates the magnet in the center of gravity of the main extension surface of the magnet. A first pixel cell and a second pixel cell are integrated into the surface of the semiconductor body together with a circuit arrangement, and each pixel cell has a first magnetic field sensor and a second magnetic field sensor. The first pixel cell is spaced apart from the second pixel cell along a connecting line, and the first pixel cell in a projection along an imaginary lengthening of the axis is arranged within the two inner circle segments.Type: GrantFiled: April 10, 2015Date of Patent: July 10, 2018Assignee: TDK-Micronas GmbHInventors: Timo Kaufmann, Joerg Franke
-
Patent number: 10018747Abstract: A measurement while drilling (MWD) system for use in a drilling string, the MWD system comprises: a resistivity module that is configured to generate resistivity information about a resistivity of a formation that is drilled by the drilling string; a near bit sub that is configured to generate inclination information about an inclination of a drill bit of the drilling string; a MWD module; a first wireless communication module that is configured to wirelessly send the resistivity information from the resistivity module to the MWD module; a second wireless communication module that is configured to wirelessly send inclination information from the near bit sub module to the MWD module; and wherein the MWD module is configured to participate in a transmission of the inclination information and the resistivity information towards an upper surface of the formation.Type: GrantFiled: December 14, 2016Date of Patent: July 10, 2018Assignee: R & B Industrial Supply Co.Inventors: Vlad Rozenblit, Vadim Buryakovsky, Michael Lev
-
Patent number: 10012717Abstract: A method for performing a magnetic resonance image reconstruction with spatially varying coil compression includes using a non-Cartesian acquisition scheme to acquire a multi-coil k-space dataset fully sampled along a fully sampled direction and decoupling the multi-coil k-space dataset along the fully sampled direction to yield a plurality of uncompressed coil data matrices. The plurality of uncompressed coil data matrices are compressed to yield a plurality of virtual coil data matrices which are aligned along the fully sampled direction to yield a plurality of aligned virtual coil data matrices. The aligned virtual coil data matrices are coupled along the fully sampled direction to yield a compressed multi-coil k-space dataset. Intensity values in the plurality of aligned virtual coil data matrices are normalized based on the plurality of uncompressed coil data matrices and an image is reconstructed using the compressed multi-coil k-space dataset.Type: GrantFiled: April 14, 2015Date of Patent: July 3, 2018Assignee: Siemens Healthcare GmbHInventors: Qiu Wang, Marcel Dominik Nickel, Boris Mailhe, Mariappan S. Nadar
-
Patent number: 10006954Abstract: A monitor system for monitoring the reliability of at least one piece of electronic equipment installed in an aircraft. In order to monitor each piece of electronic equipment, such a monitor system comprises: monitor means for measuring variations of at least one state parameter P as a function of time t; concatenation means for generating data groups (ti, Pi, Sj); transmission means for transmitting the data groups (ti, Pi, Sj) to a centralized unit; first computation means for determining an observed reliability Robs of the or each piece of electronic equipment; second computation means for determining an expected reliability Rexp of the or each piece of electronic equipment; comparator means for comparing the observed reliability Robs with the expected reliability Rexp of the or each piece of electronic equipment; and warning means.Type: GrantFiled: December 13, 2016Date of Patent: June 26, 2018Assignee: AIRBUS HELICOPTERSInventors: Stephane Bailly, Vincent Schmidt
-
Patent number: 10006969Abstract: A sensor device is provided for suppressing a magnetic stray field, having a semiconductor body with a surface formed in an x-y plane, the x-direction and the y-direction are formed orthogonal to one another, and the sensor device has a first pixel cell and a second pixel cell integrated into the surface of the semiconductor body. A first magnetic field sensor detects a magnetic field in the x-direction and a second magnetic field sensor detects a magnetic field in the y-direction. The two pixel cells in a projection along an imaginary lengthening of the axis are arranged at an edge or next to an extension of the magnet in the x-y plane.Type: GrantFiled: April 10, 2015Date of Patent: June 26, 2018Assignee: TDK-Micronas GmbHInventors: Timo Kaufmann, Joerg Franke
-
Patent number: 10006945Abstract: An electric current sensor includes a primary conductor through which an electric current to be measured flows, and at least one magnetic sensor. The magnetic sensor includes a first magnetic sensor area, the output sensitivity of which is decreased when a magnetic field is applied to include a magnetic field component in a first direction along a sensitivity variation axis, and a second magnetic sensor area, the output sensitivity of which is increased when the magnetic field is applied to include a magnetic field component in a second direction that is opposite to the first direction.Type: GrantFiled: October 27, 2017Date of Patent: June 26, 2018Assignee: Murata Manufacturing Co., Ltd.Inventor: Takashi Kawanami
-
Patent number: 10001532Abstract: A magnetic sensor device includes: a magnet, extending in a longitudinal direction, that has different magnetic poles in a direction perpendicular to a conveyance direction of a detected object having a magnetic material, the longitudinal direction being orthogonal to the conveyance direction; and anisotropic magnetoresistive elements arranged linearly in the longitudinal direction on a detected object-side magnetic pole of the magnet, wherein the magnet is provided with a magnetic material yoke between the anisotropic magnetoresistive elements and the magnet, and the end of the magnet in the longitudinal direction has a greater length in the direction perpendicular to the conveyance direction than the center in the longitudinal direction.Type: GrantFiled: May 12, 2015Date of Patent: June 19, 2018Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Tomokazu Ogomi, Kenji Shimohata
-
Patent number: 9999124Abstract: Tamper-respondent assemblies with regions of increased susceptibility to a tamper event are provided, which include one or more tamper-detect sensors, one or more conductive traces, and an adhesive. The tamper-detect sensor(s) facilitates defining a secure volume about one or more electronic components to be protected, and the conductive trace(s) forms, at least in part, a tamper-detect network of the tamper-respondent assembly. The conductive trace(s) is disposed, at least in part, on the tamper-detect sensor(s). The adhesive contacts the conductive trace(s) on the tamper-detect sensor(s), and is disposed, at least in part, between and couples a surface of the tamper-detect sensor(s) to another surface of the assembly. Together, the tamper-detect sensor(s), conductive trace(s), and adhesive are a subassembly, with the subassembly being configured with multiple regions of increased susceptibility to breaking of the conductive trace(s) with a tamper event through the subassembly.Type: GrantFiled: November 2, 2016Date of Patent: June 12, 2018Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: James A. Busby, Michael J. Fisher, Michael A. Gaynes, David C. Long, Thomas Weiss
-
Patent number: 9996722Abstract: A biometric feature identification device includes a substrate, an electrode layer, and a switch and trace layer. The electrode layer is arranged at one side of the substrate and has a plurality of electrodes. The switch and trace layer has a plurality of switches and a plurality of traces. The switches are provided to divide the plurality of electrodes sequentially or dynamically into at least one sensing electrode group and a plurality of deflection electrode groups corresponding thereto. Each sensing electrode group corresponds to at least two deflection electrode groups. Each sensing electrode group has at least one electrode for sensing. Each deflection electrode group has a plurality of electrodes for deflection.Type: GrantFiled: April 22, 2016Date of Patent: June 12, 2018Assignee: SUPERC-TOUCH CORPORATIONInventors: Hsiang-Yu Lee, Shang Chin, Ping-Tsun Lin
-
Patent number: 9983167Abstract: The present disclosure outlines a device having a multi-channel potentiostat circuit and a microcontroller for controlling the multi-channel potentiostat circuit. The multi-channel potentiostat circuit includes a counter electrode, a reference electrode, and a first switch between the counter electrode and the reference electrode. The multi-channel potentiostat circuit also includes a plurality of measurement circuits coupled to respective second switches. The microcontroller can configured to provide a first signal to the multi-channel potentiostat circuit to control the first switch, wherein a state of the first switch changes an operating mode of the multi-channel potentiostat circuit. The microcontroller is also configured to provide a second signal to the multi-channel potentiostat circuit to control at least one of the second switches to couple at least one of the plurality of measurement circuits to a working electrode.Type: GrantFiled: October 30, 2015Date of Patent: May 29, 2018Assignee: Zansors, LLCInventor: Baichen Li