Abstract: A phase calculation unit (12) calculates, as a first phase, a deflection angle of a first similarity vector having a first similarity and a second similarity calculated by a similarity calculation unit (11) as elements. The phase calculation unit (12) calculates, as a second phase, a deflection angle of a second similarity vector having a third similarity and a fourth similarity calculated by the similarity calculation unit (11) as elements. A period calculation unit (13) calculates a period of a pattern formed on a long body on the basis of the first phase and the second phase calculated by the phase calculation unit (12). An abnormality detection unit (14) detects an abnormality in the long body on the basis of the period calculated by the period calculation unit (13).

Abstract: According to one embodiment, an image acquisition apparatus includes a light source, a stage on which an object to be observed is placed, a reflection mirror reflecting light from the light source and supplying reflected light to a surface of the object placed on the stage, an imaging optical system receiving an optical image from the surface of the object illuminated by the reflected light from the reflection mirror, and a detector detecting the optical image acquired by the imaging optical system. The reflection mirror includes a first portion reflecting light from the light source, and a second portion provided at a position opposite to the first portion with respect to a center of the reflection mirror and through which light from the surface of the object passes.

Abstract: A device for measuring the optical effect of an ophthalmic lens, in particular a spectacle lens, includes a display system, an image acquisition system, and a computer unit. During measurement, the lens is arranged in a measurement volume of the device. The display system displays a test structure and the image acquisition system acquires image data of the test structure from multiple viewpoints using imaging optical paths which pass through the lens. The computer unit determines the three-dimensional shape of the lens on the basis of the image data and calculates an optical effect of the lens on the basis of its three-dimensional shape. A corresponding method and computer program are also disclosed.

Abstract: A method for measure the layer thickness of soil coverings, in particular in the case of gas and oil pipelines laid underground, wherein the device to be covered is measured and the coordinates thereof in relation to a specified coordinate system are recorded, where the course of the terrain over the device is measured and a terrain model is determined therefrom and recorded in the specified coordinate system after the soil covering has been applied, and where the layer thickness of the soil covering is determined from the coordinates of the device and from the terrain model.

Abstract: There is disclosed a security device, including a substrate; a first color-shifting pigment on a first region of the substrate; and a second pigment, including at least three dielectric layers, on a second region of the substrate; wherein the first color-shifting pigment and the second pigment color match at a first viewing angle. Methods of making and using the security device are also disclosed.

Abstract: The methods and configurations herein provide for analysis of microplate based assays. Certain aspects include: an optical illumination panel; a plurality of sample wells configured to receive light from the optical illumination panel, and wherein the plurality of sample wells is configured with a first field of view; at least one aperture array configured to isolate directed light therethrough the plurality of sample wells; at least one optical array configured to receive optical information from the plurality of sample platforms, wherein the at least optical array comprises an array of individual microprisms configured with equal apex angles at distal equidistances along a row, wherein the individual microprism apex angles decrease toward the center of the row culminating in at least one flat surface along a center portion of the row; and a detector configured to capture the optical information with a second field of view as provided by the at least one optical array.

Abstract: A system for producing a high contrast image of an ophthalmic lens under inspection, comprising: top camera to view ophthalmic lens through lens module; motorized mechanism for positioning top camera at two pre-programmed positions; three illumination modules; said illumination modules focusing light through ophthalmic lens under inspection, thereby producing a high contrast image of features of ophthalmic lens; wherein ophthalmic lens is contained within cuvette with optical power of positive of ten; said cuvette mounted with two optical windows, one of them being vertical and other at an angle; said cuvette having transparent bottom glass suitably designed to position ophthalmic lens under inspection; said cuvette designed to be filled with saline solution; accurately calibrated test object positioned to achieve image of ophthalmic lens overlaid with image of pattern present on test object; additional illumination source comprising laser diode; and second camera to view ophthalmic lens through slanted optic

Abstract: Sensor and Measurement Method A turbidity sensor and method of measuring turbidity is provided. The turbidity sensor (100) comprises first and second optical detectors for detecting a respective optical response of each optical signal. The first optical detector (20) may be arranged in direct view of the emitter (10) and the second optical detector (30) may be arranged in indirect view of the emitter (10). The two detectors collect light emitted from the emitter (10) when directed through a fluid sample during two optical tests run in very close succession. Firstly, a control sample is illuminated to determine a calibration factor for the control sample with known turbidity. Then, the calibration factor is used to determine the turbidity of a fluid sample with unknown turbidity. Advantageously, background radiation during the data collection process is ignored because the transient behaviour during each optical test is negligible.

Abstract: An analysis system features a confinement device, an optical measurement device, a flow device, a collecting conduit, and an actuation device. The confinement device comprises a measurement chamber, optically transparent first and second measurement surfaces that face each other across a distance that defines a thickness of the measurement chamber, and a flexible membrane that forms a seal with the measurement surfaces to laterally delimit the measurement chamber. When the collecting is sealed with a container, a connection is established that permits a liquid sample to be collected from the container. The optical measurement device emits light towards the chamber and detects light that has been transmitted through it, wherein the flow device causes liquid to flow through the collecting conduit between the container and the measurement chamber. The actuation device varies the thickness.

Abstract: A catheter procedure system includes a base and a robotic mechanism having a longitudinal axis and being movable relative to the base along the longitudinal axis. The robotic mechanism includes a robotic drive base including at least one drive mechanism, a cassette operatively secured to the robotic drive base, a rigid guide coupled to the cassette and fixed relative to the robotic mechanism and a flexible track having a distal end, a proximal end and a plurality of reflective sections. At least a portion of the flexible track is disposed within the rigid guide. The robotic mechanism also includes a position detector mounted to the robotic drive base and positioned beneath the flexible track. The position detector is configured to detect light reflected off of the reflective sections of the flexible track and to determine the position of the distal end of the flexible track based on the detected reflected light.

Abstract: A method to simultaneously detect emission intensity or images at multiple distinct emission wavelengths in the analysis of parallel sample streams in a flow-based analysis system and apparatus for performing the described method.

Abstract: A system for detection and monitoring includes one or more light sources configured to emit light into a monitored space. At least one of the light sources is configured to emit a respective emission cone having a respective emission cone axis. One or more light sensing devices are configured to receive scattered light. At least one of the one or more light sensing devices defines a respective acceptance cone having a respective acceptance cone axis. The emission cone axis of the emission cone, and/or the acceptance cone axis of the light sensing device is angled toward the other. A processor is operatively connected to the at least one light sensing devices to evaluate the scattered light for the presence of particulates in the monitored space.

Abstract: A system for particulate detection and monitoring includes one or more light sources configured to emit light into a monitored space. The system includes at least two light sensing devices configured to receive scattered light. Respective sensing portions of the three two sensing devices share a common centerline axis. A processor is operatively connected to the two light sensing devices and is configured to evaluate the scattered light for presence of particulates in the monitored space.

Abstract: A film-thickness measuring apparatus includes: a light source; an illuminating fiber coupled to the light source and having a distal end disposed at a predetermined position in a wafer supporting structure; a spectrometer configured to decompose reflected light from a wafer in accordance with wavelength and measure an intensity of the reflected light at each of wavelengths; a first light-receiving fiber having a distal end disposed at the predetermined position; a second light-receiving fiber having a distal end which is disposed at the predetermined position and is adjacent to the distal end of the first light-receiving fiber; a processor configured to determine a film thickness of the wafer based on a spectral waveform indicating a relationship between the intensity of the reflected light and the wavelength; and an optical-path selecting mechanism configured to optically connect and disconnect the second light-receiving fiber and the spectrometer.

Abstract: The present invention is one that makes it possible to facilitate the assembly of an optical measurement cell, as well as shorten optical path length without taking account of handling of a spacer, and an optical measurement cell 2 including a pair of light transmitting plates 21 and 22 respectively having opposite surfaces 21a and 22a facing each other and containing test liquid X between the pair of opposite surfaces 21a and 22a of the pair of light transmitting plates 21 and 22. In addition, one 21a of the opposite surfaces 21a and 22a is formed with a spacer film 25 that contacts with the other opposite surface 22a to define the distance between the pair of opposite surfaces 21a and 22a.

Abstract: A flow cell assembly (16) for a fluid analyzer (14) that analyzes a sample (12) includes (i) a base (350) that includes a base window (350B); (ii) a cap (352) having a cap window (352B) that is spaced apart from the base window (350B); and (iii) a gasket (360) that is secured to and positioned between the base (350) and the cap (352), the gasket (360) having a gasket body (360A) that includes a gasket opening (360B). The gasket body (360A), the base (350) and the cap (352) cooperate to define a flow cell chamber (362). Moreover, an inlet passageway (366) extends into the flow cell chamber (362) to direct the sample (12) into the flow cell chamber (362); and an outlet passageway (368) extends into the flow cell chamber (362) to allow the sample (12) to exit the flow cell chamber (362).

Abstract: A system for biological sample analysis includes a plurality of modular subassemblies and a precision mounting plate, wherein each modular subassembly includes an enclosure and a plurality of optical components pre-aligned to the enclosure, and the enclosure includes a plurality of precision mounting structures, and each modular subassembly is mechanically coupled to the precision mounting plate, such that each precision mounting structure from a modular subassembly attaches directly to a corresponding precision mounting structure located on the precision mounting plate or an adjacent modular subassembly to optimize optomechanical tolerance.

Abstract: A method of evaluating characteristics of a work piece includes forming a photosensitive layer on the work piece. Then an ion implantation is performed on the work piece. The work piece is radiated, and an optical intensity of the photosensitive material on the work piece is calculated. The ion implantation pattern is evaluated according to the optical intensity. A chemical structure of the photosensitive material is changed upon the ion implantation. The work piece is recovered by reversing the chemical structure of the photosensitive material or removing the ion interrupted photosensitive material by chemicals.

Abstract: An illumination unit emits a light parallel to a first direction to a measurement space. A light receiving unit outputs a signal indicating a two-dimensional distribution of a light incident on a light receiving surface. An optical system guides the light passing through the measurement space to the light receiving surface. A control unit detects a position of the measurement object in the first direction based on the signal. The light receiving surface is tilted by a predetermined angle around a second direction with respect to a transmission direction of the light. The control unit detects a position where light intensity is changed by a predetermined value in the second direction in the two-dimensional distribution, detects a position where the detected position is located in a third direction, and detects a position where the measurement object is placed in the first direction in the measurement space.

Abstract: Systems and methods for detecting programmed defects on a water during inspection of the wafer are provided. One method includes selecting a mode of an inspection subsystem for detecting programmed defects on a wafer that generates output for the wafer having the lowest non-defect signal and at least a minimum signal for the programmed defects. The method also includes selecting a training care area that is mutually exclusive of care area(s) used for detecting the programmed defects during inspection of the wafer. The training care area generates less of the non-defect signal than the care area(s). The method further includes training a programmed defect detection method using the output generated with the selected mode in the training care area and detecting the programmed defects during the inspection of the wafer by applying the trained programmed defect detection method to the output generated in the care area(s) with the selected mode.