Abstract: A semiconductor device and its fabrication method are provided. The method includes forming a core layer on a first region of a base substrate layer; forming sidewall spacer layers on sidewalls of two sides of the core layer along a first direction; forming a filling layer on a second region between adjacent sidewall spacer layers which are arranged along the first direction; forming a first dividing trench in the filling layer on the second region to divide the filling layer along a second direction, where sidewalls of the first dividing trench, arranged along the first direction, expose corresponding sidewall spacer layers; forming a second dividing trench in the core layer to divide the core layer along the second direction; forming a second dividing layer in the second dividing trench when forming a first dividing layer in the first dividing trench; and removing the filling layer and the core layer.

Abstract: The present disclosure, in some embodiments, relates to a method of forming an integrated circuit. The method includes forming a first hard mask layer over a substrate and forming a second hard mask layer over the first hard mask layer. The second hard mask layer is patterned to define an island having a first width along a first direction. The island is patterned to form a patterned island having a second width along the first direction that is less than the first width. A sacrificial mask is formed over the first hard mask layer and the first hard mask layer is patterned according to the patterned island and the sacrificial mask.

Abstract: A method for repairing a display substrate includes detecting whether there is a fault point on signal lines. If a fault point is detected on a signal line, short-circuiting is performed of two sides of the at least one fault point through line portions of two drive power lines respectively located at two sides of the at least one fault point and perpendicular to the signal line where the at least one fault point is located and a line portion of a drive power line located at one side of the at least one fault point and parallel to the signal line where the at least one fault point is located.

Abstract: A method of manufacturing a plurality of electronic circuits is disclosed. Each electronic circuit comprises a respective first portion, comprising a respective group of contact pads, and a respective integrated circuit, IC, comprising a respective group of terminals and mounted on the respective group of contact pads with each terminal in electrical contact with a respective contact pad. The method comprises: providing a first structure comprising the plurality of first portions; providing a second structure comprising the plurality of ICs and a common support arranged to support the plurality of ICs; transferring said ICs from the common support onto a first roller having a removable surface portion; and transferring said ICs from the first roller onto the first structure such that each group of terminals is mounted on a respective group of contact pads.

Abstract: A microelectromechanical (MEMS) device may be coupled to a dielectric material at an upper planar surface or lower planar surface of the MEMS device. One or more temperature sensors may be attached to the dielectric material layer. Signals from the one or more temperature sensors may be used to determine a thermal gradient along on axis that is normal to the upper planar surface and the lower planar surface. The thermal gradient may be used to compensate for values measured by the MEMS device.

Abstract: Aspects of the disclosure provide a method including depositing an underlayer comprising silicon oxide over a substrate, depositing a polysilicon liner on the underlayer, and depositing an amorphous silicon layer on the polysilicon liner. Aspects of the disclosure provide a device intermediate including a substrate, an underlayer comprising silicon oxide formed over the substrate, a polysilicon liner disposed on the underlayer, and an amorphous silicon layer disposed on the polysilicon liner.

Abstract: A method of manufacturing a semiconductor device includes depositing a first insulation film in a via hole of a semiconductor substrate and above a first surface thereof, the semiconductor substrate having a circuit substrate on a second surface thereof, depositing a second insulation film having a covering property lower than the first insulation film in the via hole and above the first surface, and removing the first and second insulation films deposited at the bottom of the via hole by anisotropic etching.

Abstract: Systems, apparatus, and methods related to tamper-resistant integrated circuits are described. The tamper-resistant integrated circuits include tamper-resistant features including a tamper-resistant material formulated or configured to exhibit a change in at least one electrical property responsive to exposure to oxygen, electromagnetic radiation, or other environmental conditions. Data located within the integrated circuit may be erased, or at least a portion of the integrated circuit may be destroyed, responsive to a change in the at least one electrical property. In some examples, one or more electrical properties of a tamper-resistant feature may be measured. A change in an electrical property may be an indication that the associated integrated circuit has been tampered with.

Abstract: A semiconductor device includes: a stack structure including horizontal conductive patterns and interlayer insulating layers, which are alternately stacked; gate patterns overlapping with both ends of the stack structure under the stack structure, the gate patterns being spaced apart from each other; and a channel pattern including vertical parts penetrating the stack structure, and a connection part disposed under the stack structure, the connection part connecting the vertical parts.

Abstract: Methods of forming silicon nitride thin films on a substrate in a reaction space under high pressure are provided. The methods can include a plurality of plasma enhanced atomic layer deposition (PEALD) cycles, where at least one PEALD deposition cycle comprises contacting the substrate with a nitrogen plasma at a process pressure of 20 Torr to 500 Torr within the reaction space. In some embodiments the silicon precursor is a silyly halide, such as H2SiI2. In some embodiments the processes allow for the deposition of silicon nitride films having improved properties on three dimensional structures. For example, such silicon nitride films can have a ratio of wet etch rates on the top surfaces to the sidewall of about 1:1 in dilute HF.

Abstract: Semiconductor devices and methods of manufacturing semiconductor devices are provided. In embodiments a treatment process is utilized in order to introduce silicon into a p-metal work function layer. By introducing silicon into the p-metal work function layer, subsequently deposited layers which may comprise diffusable materials such as aluminum can be prevented from diffusing through the p-metal work function layer and affect the operation of the device.

Abstract: A method of making a Josephson junction for a superconducting qubit includes providing a substructure having a surface with first and second trenches perpendicular to each other defined therein. The method further includes evaporating a first superconducting material to deposit the first superconducting material and evaporating a second superconducting material to deposit the second superconducting material in the first trench to provide a first lead, and forming an oxidized layer on the first and second superconducting materials. The method includes evaporating a third superconducting material at an angle substantially perpendicular to the surface of the substructure to deposit the third superconducting material in the second trench without rotating the substructure to form a second lead. A vertical Josephson junction is formed at the intersection of the first and second trenches electrically connected through the first lead and through the second lead.

Abstract: A method of manufacturing a memory structure including the following steps is provided. A spacer layer is formed on sidewalls of gate stack structures. A protective material layer covering the spacer layer and the gate stack structures is formed. A mask material layer is formed on the protective material layer. There is a void located in the mask material layer between two adjacent gate stack structures. A first distance is between a top of the protective material layer and a top of the mask material layer. A second distance is between a top of the void and a top of the mask material layer above the void. A third distance is between a bottom of the void and a bottom of the mask material layer below the void. The first distance is greater than a sum of the second and third distances.

Abstract: An electronic device and associated methods are disclosed. In one example, the electronic device includes an article having a substrate, a semiconductor die thereon, a routing carrier attached to the substrate, and a transmission pathway electrically connected to the semiconductor die and the substrate, wherein the transmission pathway runs through the routing carrier. In selected examples, the article is made by manufacturing a substrate, attaching a semiconductor die to the substrate, fabricating a routing carrier comprising a transmission pathway, and integrating the routing carrier into the substrate.

Abstract: Embodiments of staircase and contact structures of a three-dimensional (3D) memory device and fabrication method thereof are disclosed. The 3D memory device includes a semiconductor substrate and a plurality of through-substrate-trenches penetrating the semiconductor substrate. The 3D memory device also includes a film stack disposed on a first surface of the semiconductor substrate extending through the through-substrate-trenches to a second surface of the semiconductor substrate, wherein the film stack includes alternating conductive and dielectric layers. The 3D memory device also includes a staircase structure formed at an edge of the film stack.

Abstract: A semiconductor device includes a first active pattern extending lengthwise along a first direction and a second active pattern extending lengthwise along the first direction and spaced apart from the first active pattern in the first direction. The device also includes a field insulating film between the first active pattern and the second active pattern. An upper surface of the field insulating film is lower than or coplanar with upper surfaces of the first and second active patterns. The device further includes an element isolation structure in an isolation trench in the first active pattern and the field insulating film. An upper surface of the element isolation structure is higher than the upper surfaces of the first and second active patterns.

Abstract: Example methods for fabricating a semiconductor device and example semiconductor devices are disclosed. An example method may include forming a sacrificial gate structure on a substrate, and the sacrificial gate structure may include a first portion and a second portion. The method may further include, removing the first portion of the sacrificial gate structure and forming an oxide film by oxidizing an upper surface of the second portion of the sacrificial gate structure after removing the first portion of the sacrificial gate structure. The method may additionally include, forming a trench on the substrate by removing the oxide film and the second portion of the sacrificial gate structure; and forming a gate electrode that fills the trench.

Abstract: The invention provides a lighting device configured to provide white lighting device light, the lighting device comprising (i) a light source, configured to provide blue light source light, and (ii) a luminescent material element, configured to absorb at least part of the blue light source light and to convert into luminescent material light, wherein the luminescent material element comprises a luminescent material which consists for at least 80 wt. % of a M2-2xEu2xSi5-yAlyOyN8-y phosphor, wherein M comprises one or more of Mg, Ca, Sr, Ba, with a molar ratio of (Mg+Ca+Sr)/(Ba)?0.1, wherein x is in the range of 0.001-0.02, wherein y is in the range of ?0.2, and wherein the white lighting device light comprises said blue light source light and said luminescent material light.

Abstract: Group III nitride based light emitting diode (LED) structures include multiple quantum wells with barrier-well units that include Ill nitride interface layers. Each interface layer may have a thickness of no greater than about 30% of an adjacent well layer, and a comparatively low concentration of indium or aluminum. One or more interface layers may be present in a barrier-well unit. Multiple barrier-well units having different properties may be provided in a single active region.

Abstract: An electronic device is provided, which includes a window including a transparent area and an opaque area; a panel disposed below the transparent area and including multiple pixels; a substrate disposed below the panel; an optical adhesive member disposed between the window and the panel; and a filler member disposed in at least a portion of a space formed between the opaque area and the substrate. The filler member transmits a light of a designated band, which is for curing the optical adhesive member, to a portion of the optical adhesive member disposed below the opaque area through a separation space between the filler member and the portion of the optical adhesive member.