Abstract: An integrated circuit includes an array of memory cells that is arranged into rows, main columns, and redundant columns that perform repairs in the array. The main columns and the redundant columns are divided into row blocks. Bit lines couple the main columns to status memory indicating repair statuses of the repairs by the redundant columns. The integrated circuit receives a command, and performs an update on the status memory with the repair statuses specific to particular ones of the row blocks in a portion of the memory accessed by the command. Alternatively or in combination, the status memory has insufficient size to store the repair statuses of multiple ones of the row blocks of the main columns.

Abstract: A method includes programming a group of analog memory cells by writing respective analog values into the memory cells in the group. After programming the group, the analog values are read from the memory cells in the group using a set of read thresholds so as to produce readout results. Respective optimal positions for the read thresholds in the set are identified based on the readout results. A noise level in the readout results is estimated based on the identified optimal positions of the read thresholds.

Abstract: A nonvolatile memory device includes a memory array having multiple nonvolatile memory cells, a first read circuit and a second read circuit. The first read circuit is configured to read first data from the memory array during a first read operation and to provide one or more protection signals indicating a victim period during the first read operation. The second read circuit is configured to read second data from the memory array during a second read operation and to provide one or more check signals indicating an aggressor period during the second read operation.

Abstract: A semiconductor memory apparatus is capable of improving the alignment margin for a bank and sufficiently ensuring a space for forming a global input/output line. The semiconductor memory apparatus includes a stack bank structure having at least two sub-banks continuously stacked without disconnection of data signal lines, and a control block arranged at one side of the stack bank structure to simultaneously control column-related signals of the sub-banks.

Abstract: A semiconductor memory device includes a clock signal generation unit suitable for dividing an external clock signal to generate a first internal clock signal corresponding to odd number periods of the external clock signal and a second internal clock corresponding to even number periods, a first input unit suitable for receiving an external command signal and an external address signal in response to the first internal clock signal, a second input unit suitable for receiving the external command signal and the external address signal in response to the second internal clock signal, and an operation control unit suitable for enabling one of the first input unit and the second input unit and disabling the other of the first input unit and the second input unit, during a gear-down mode.

Abstract: An electronic device of the present technique includes a controller part for controlling operations of a non-volatile memory and a volatile memory, a power supply controller for controlling power to the controller part and the volatile memory, and a register for retaining running information about a program read from the non-volatile memory. When power is supplied to the controller part from the power supply controller and the running information about the program is not retained in the register, the controller part reads the program from the non-volatile memory and stores it in the volatile memory so as to execute the program, and retains the running information about the program in the register. When the running information about the program is retained in the register, the program is read from the volatile memory so as to be executed.

Abstract: A semiconductor memory device, including a plurality of word lines, a plurality of pairs of bit lines, a plurality of memory cells coupled to the plurality of word lines and the plurality of pairs of bit lines, a plurality of sense amplifiers each coupled between a corresponding pair of bit lines, a plurality of first driver transistors coupled between the plurality of sense amplifiers and a first power supply line, a plurality of second driver transistors coupled between the plurality of sense amplifiers and a second power supply line, a pair of common data lines, and a plurality of column selection gates each coupled between the corresponding pair of bit lines and the pair of common data lines, wherein the number of the first driver transistors is more than the number of the second driver transistor.

Abstract: An electronic device according to the present technique includes a non-volatile memory in which a program is stored, a volatile memory in which the program read from the non-volatile memory is stored, a controller part for controlling operations of the non-volatile memory and the volatile memory, and a power supply controller for controlling power to the controller part and the volatile memory. The controller part includes a power supply part and a signal fixing part. The power supply part is separated from another power supply line, and power for an interface signal of the volatile memory is supplied from the power supply part thereto. A voltage is supplied from the power supply part to the signal fixing part, and the signal fixing part fixes an output logic of the signal supplied to the volatile memory according to the signal from the power supply controller.

Abstract: A semiconductor memory device is provided with a plurality of memory cells connected to a plurality of word lines, a word-line leakage detector configured to detect a leakage current generated on at least one of the plurality of word lines, and a controller configured, when a leakage current is detected by the word-line leakage detector, to determine that a block including a memory cell connected to a word line through which the leakage current is flowing is defective. The word-line leakage detector has a detection voltage generator configured to generate a detection voltage in accordance with the leakage current, a comparator configured to generate a flag signal having output logic that is inverted depending on whether the detection voltage exceeds a predetermined threshold voltage, and an adjuster configured to adjust a current amount by diverting part of the leakage current in accordance with an ambient temperature.

Abstract: A nonvolatile memory device comprises a memory core comprising a plurality of variable resistance memory cells, an input/output (I/O) circuit configured to receive a first packet signal and a second packet signal in sequence, the first and second packet signals collectively comprising information for a memory access operation, and further configured to initiate a core access operation upon decoding the first packet signal and to selectively continue or discontinue the core access operation upon decoding the second packet signal, and a read circuit configured to perform part of the core access operation in response to the first packet signal before the second packet signal is decoded.

Abstract: Provided is a refresh method of a volatile memory device. The method includes: detecting a number of disturbances that affect a second memory area as the number of accesses to a first memory area is increased; outputting an alert signal from the volatile memory device to an outside of the volatile memory device when the detected number of disturbances reach a reference value; and performing a refresh operation on the second memory area in response to the alert signal.

Abstract: An SRAM includes a first SRAM column having first SRAM cells and a first local evaluation logic coupled to a global bit line and a second SRAM column having second SRAM cells and a second local evaluation logic coupled to the same global bit line. The first SRAM column is selected with a first write line and the second SRAM column is selected with a second write line.

Abstract: Memory blocks in an integrated circuit (IC) chip can be repaired by employing automated test equipment external to the IC chip to aid in burning fuses on the IC chip by encoding the fuses with binary-encoded numbers. Each binary-encoded number represents a bit position of each “1” bit of a repair control word corresponding to a defective memory location. During a repair sequence preceding operation of the IC chip, the binary-encoded numbers are read out of the fuses and used to form a serial stream of repair chain information.

Abstract: A system for determining the logic state of a resistive memory cell element, for example an MRAM resistive cell element. The system includes a controlled voltage supply, an electronic charge reservoir, a current source, and a pulse counter. The controlled voltage supply is connected to the resistive memory cell element to maintain a constant voltage across the resistive element. The charge reservoir is connected to the voltage supply to provide a current through the resistive element. The current source is connected to the charge reservoir to repeatedly supply a pulse of current to recharge the reservoir upon depletion of electronic charge from the reservoir, and the pulse counter provides a count of the number of pulses supplied by the current source over a predetermined time. The count represents a logic state of the memory cell element.

Abstract: A method for triggering an adjustment operation in a dynamic random access memory device, the method including receiving a refresh command, generating an execute signal, counting the execute signal to provide a count value, refreshing a memory array based on the count value and triggering the adjustment operation when the count value reaches a predetermined value.

Abstract: A semiconductor memory device according to an embodiment is provided with a plurality of first latch circuits that latch setting-data at different timings, a plurality of hold circuits provided corresponding to the respective plurality of first latch circuits, each holding data latched by the corresponding first latch circuit, and an address decoder that decodes an address that specifies a destination to hold data. Each of the plurality of hold circuits has one or more holding parts that hold data latched by the corresponding first latch circuit based on a decode signal decoded by the address decoder.

Abstract: A first read threshold associated with a first page in a block and a second read threshold associated with a second page in the block are received, where the first page has a first page number and the second page has a second page number. A slope and a y intercept are determined based at least in part on the first read threshold, the second read threshold, the first page number, and the second page number. The slope and the y intercept are stored with a block identifier associated with the block.

Abstract: A non-volatile register includes register logic connected with first and second ends of a memory element. The register logic is positioned below the memory element. The memory element may be a two-terminal memory element configured to store data as a plurality of conductivity profiles that can be non-destructively determined by applying a read voltage across the two terminals. New data can be written to the two-terminal memory element by applying a write voltage of a predetermined magnitude and/or polarity across the two terminals. The two-terminal memory element retains stored data in the absence of power. A reference element including a structure that is identical or substantially identical to the two-terminal memory element may be used to generate a reference signal for comparisons during read operations.

Abstract: The present disclosure includes apparatuses and methods related to memory cell state in a valley between adjacent data states. A number of methods can include determining whether a state of a memory cell is in a valley between adjacent distributions of states associated with respective data states. The method can also include transmitting a signal indicative of a data state of the memory cell and whether the state of the memory cell is in the valley.

Abstract: A memory device may be provided which includes a memory cell array including a plurality of sub arrays each sub array having a plurality of memory cells connected to bit lines; an address buffer configured to receive a row address and a column address; and a column decoder configured to receive the column address from the address buffer and, for each of the sub arrays, to select a column selection line corresponding to the column address, from among a plurality of column selection lines, based on different offset values applied to the sub arrays, respectively. The selected column selection lines correspond to bit lines having different physical locations, respectively, according to the different offset values.