Abstract: A first capacitor and a second capacitor are charged until voltage at the second capacitor settles to a settling voltage. While charging, the first capacitor is alternately switched between a current source and ground. When the settling voltage is reached, charging of the first capacitor is halted. The second capacitor continues to be charged until voltage at the second capacitor reaches a reference voltage. The amount of time it takes for the settling voltage to reach the reference voltage corresponds to a measure of capacitance on the first capacitor.

Abstract: A module that incorporates a chassis for enabling use of at least one smaller functional module in at least one slot of a chassis designed to mate with a larger functional module having a different standard than the smaller functional module. The module has a housing having electrical connections adapted to mate with electrical connections provided by the chassis for the larger functional module and dimensions that fit within at least one slot provided by the chassis for housing the larger functional module. The module includes at least one set of electrical connections adapted to mate with the electrical connections of the smaller functional module(s) and at least one air passage for conveying air from an opening of the chassis that provides air flow to cool the larger functional module to an area in which the smaller functional module(s) is/are situated when mated with the housing.

Abstract: Provided is a detection apparatus that detects process variation in a plurality of comparators that each output a comparison result obtained by comparing a signal level of an input signal to a reference level, the detection apparatus comprising a signal input section that inputs the input signal and the reference level in common to the comparators, and sequentially changes the signal level of the input signal; and a detecting section that detects, for each signal level, a number of comparison results that indicate a predetermined result, from among the comparison results of the comparators, and detects the process variation based on a distribution of the number of comparison results that indicate the predetermined result.

Abstract: According to example embodiments, a method for controlling a gate voltage applied to a gate electrode of a high electron mobility transistor (HEMT) may include measuring a voltage between a drain electrode and a source electrode of the HEMT, and adjusting a level of the gate voltage applied to the gate electrode of the HEMT according to the measured voltage. The level of the gate electrode may be adjusted if the voltage between the drain electrode and the source electrode is different than a set value.

Abstract: Provided is an electrical contact member which is capable of maintaining stable conductivity over a long period of time, while achieving low adhesion to a test subject, in particular, an electrical contact member which is capable of maintaining stable electrical contact over a long period of time by suppressing increase in the contact resistance, while achieving low adhesion to a test subject even after repeated contact at high temperatures around 85° C. or after being left in the atmosphere for a long period of time. The present invention relates to an electrical contact member, which repeatedly comes into contact with a test subject, and wherein the surface of the electrical contact member, said surface coming into contact with the test subject, is configured of a carbon coating film that contains Pd.

Abstract: An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.

Abstract: The general field of the invention is that of touchscreen devices with projected capacitive detection comprising a matrix touchpad comprising a plurality of conducting rows and of conducting columns, the matrix touchpad linked to an emission voltages electronic control system and a reception voltages electronic system. The emission voltages electronic control system generates two periodic emission voltages emitted at two different frequencies. The analysis of the reception voltages, by the reception voltages electronic system, makes it possible to determine the positions of two simultaneous presses on the touchpad, including when the two presses are done on rows or columns that are close. The determination of the presses is performed essentially by calculating the barycenters of the troughs of the reception voltages.

Abstract: A method includes applying a signal to a primary coil of an external charging device. The signal causes the primary coil to inductively couple to a secondary coil of an implantable medical device that is implanted within tissue of a patient. The method also includes measuring a current at the primary coil. The method further includes estimating a depth of the implantable medical device within the tissue of the patient based on the measured current.

Abstract: A load simulator includes a passive element, two electrode plates that are connected to the passive element, and a bias applier. The bias applier is a coil spring, for example, and is provided between the two electrode plates. The bias applier biases at least one of the two electrode plates in a predetermined direction. The two electrode plates are disposed so as to be substantially parallel with each other, for example, and the bias applier biases the two electrode plates in the direction of separation from each other.

Abstract: A wireless power transfer foreign object detector having, at least one secondary receiver coil, an adjustable load electrically coupled to the at least one secondary receiver coil, and at least one temperature sensor providing at least one temperature detection signal, wherein the at least one temperature sensor is responsive to at least one thermal state of the at least one secondary receiver coil, and wherein foreign object detection is based at least in part upon the at least one temperature detection signal.

Abstract: A system and method for determining loading of a filter having a first dielectric constant with a material having a different dielectric constant, is disclosed. The filter is contained within a metallic container forming a microwave cavity, and microwave or RF energy is created within the cavity and changes in the cavity microwave response are monitored. The changes in cavity microwave response are related to filter loading. In a preferred embodiment, the microwave energy includes multiple cavity modes thereby allowing determination of spatial distribution of the contaminant material loading. In one embodiment, the microwave cavity response includes a shift in frequency of a resonant mode. Alternatively, the microwave cavity response includes a shift in quality factor Q of a resonant mode. The microwave cavity response may include a shift in amplitude or peak width of the microwave's signal at resonance.

Abstract: A particulate filter control system and method for controlling the same is disclosed. The particulate filter load monitoring system may transmit radio frequency signals through the resonant cavity and filter medium across a frequency range sufficient to generate more than one resonant mode. The system may contain additional sensors for monitoring additional exhaust characteristics and parameters. Further, a control unit may be configured to determine the amount of material accumulated in the particulate filter, detect failures and malfunctions of the exhaust after-treatment system and its associated components, and initiate an action based on the amount of material accumulated in the particulate filter, the determination of a system failure or malfunction, or input from one or more exhaust sensors.

Abstract: A method for determining a set of control parameters of a control sequence for a magnetic resonance device is provided. The set of control parameters is chosen from a plurality of sets of basic parameters. The method includes determining a mean flip angle for each set of basic parameters in an imaging region where an object exists using the set of basic parameters with a first measuring method. For each set of basic parameters, a signal strength of a magnetic resonance signal generated in the case of a reference flip angle of a second measuring method distinguished by a signal maximum or a signal minimum is determined, and the set of basic parameters having a signal strength that is extremal in accordance with the choice of reference flip angle is chosen as the set of control parameters.

Abstract: An aspect of the present invention relates to a method of evaluating metal contamination in a semiconductor sample by DLTS method, which includes obtaining a first DLTS spectrum by measuring a DLTS signal while varying a temperature, the DLTS signal being generated by alternatively and cyclically applying to a semiconductor junction on a semiconductor sample a reverse voltage VR to form a depletion layer and a weak voltage V1 to trap carriers in the depletion layer; obtaining a second DLTS spectrum by measuring a DLTS signal while varying a temperature, the DLTS signal is being generated by cyclically applying the VR to the semiconductor junction; obtaining a differential spectrum of the first DLTS spectrum with a correction-use spectrum in the form of the second DLTS spectrum or a spectrum that is obtained by approximating the second DLTS spectrum as a straight line or as a curve.

Abstract: A method is provided of processing substrate holder material for a substrate holder on which on a first side of said substrate holder a semiconductor substrate is to be placed for layered deposition of various semiconductor materials on the semiconductor substrate using induction heating. The method includes the operations of determining a first electrical resistivity at at least one measuring position on said substrate holder material, comparing said first electrical resistivity with a second reference electrical resistivity and adapting said substrate holder material in correspondence with said comparison. Also a substrate holder is provided which is processes by such a method.

Abstract: An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and communicate force and sense signals to a tester, allowing a measure of the chip's actual resistance.

Abstract: A method includes acquiring a signal intensity from a spin system after applying the radio frequency preparation pulses prior to the imaging readout or spectroscopic localization, and acquiring signal intensity starting with magnetization initially rotated to a certain angle by applying an initial pulse before the preparation scheme, and processing the data to generate an image or spectra corresponding to the spin system. The imaging or spectroscopy sequence is configured to provide data based on magnetization transfer or an off-resonance effect.

Abstract: Apparatus (10) for transmission testing of a telecommunications jack (100) having a plurality of insulation displacement contacts (IDCs) (103), the apparatus (10) including: a base (30); a plurality of transmission test probes (31) associated with the base (30); and a jack holder (20) for removably coupling the jack (100) to the base (30) such that IDCs (103) of the jack (100) are in electrical communication with corresponding test probes (31); wherein the jack holder (20) is fixed relative to the base (30) during testing, such that the jack (100) remains stationary with respect to the probes (31).

Abstract: In one embodiment, a sample is tested by an eddy current sensor at two distances separated by a known incremental distance. In one aspect, at least one of an unknown distance of the sensor from the test sample and the film thickness of the test sample may be determined as a function of a comparison of sensor output levels of a single parameter and the known incremental distance to calibration data. In yet another aspect, the distance between the sensor and the test sample may oscillated to produce an oscillating sensor output signal having an amplitude and mean which may be measured and compared to calibration data to identify at least one of the unknown film thickness of a conductive film on a test sample, and the unknown distance of the test sample from the sensor. Other aspects and features are also described.

Abstract: Methods and systems for determining a standoff between a downhole tool and a geological formation are provided. The standoff may be determined using a standoff measurement system that includes an electrode component, one or more electronics components, one or more transformers, and one or more processor units. When the standoff is expected to be no more than a first distance, a first measurement can be made where both originating and resulting electrical signals are induced at the electrode component. When the standoff is expected to be no less than a second distance, a second measurement can be made where an originating electrical signal is induced at one of the transformers while a resulting electrical signal is induced at the electrode component.