Patents Examined by Benjamin M Baldridge
  • Patent number: 9013206
    Abstract: A system for connecting an electric vehicle to a high voltage power source is disclosed. The system including an electric vehicle supply equipment (EVSE) having an electrical plug compatible with a high voltage power outlet, the plug connected to a power cord. The power cord is connected to a housing containing a number of electrical components configured to control the power flow to an electric vehicle to recharge the vehicle's batteries. The power cord extends from the housing and is connected to a standard electric vehicle connector compatible with battery electric vehicles (BEV) and plug-in hybrid electric vehicles (PHEV). The EVSE further includes safety measures, such as a relay that controls the flow of power to the vehicle connector, a ground fault interrupter, and a circuit tester to protect users from high voltage electric shocks.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: April 21, 2015
    Assignee: Bosch Automotive Service Solutions Inc.
    Inventors: Michael Muller, Charles K. Yankitis, David P. Futkos, Matthew C. Schuping
  • Patent number: 9013202
    Abstract: A metal-to-metal leakage and breakdown testing structure for semiconductor structures and method of using the testing structure is disclosed. The testing structure includes plurality of resistor bridges connected to respective two terminal devices. The testing structure further includes a plurality of switches each having a voltage node provided between resistors of a respective one of the plurality of resistor bridges. The voltage node is read at a circuit pad when a respective one of the plurality of switches is in an on state. The testing structure further includes a device turning on and off each of the plurality of switches, individually.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: April 21, 2015
    Assignee: International Business Machines Corporation
    Inventors: Fen Chen, Kai Di Feng, Pui Ling Yee
  • Patent number: 9007081
    Abstract: A jig for use in a semiconductor test of the present invention includes; a base on which a probe pin and an insulating material are provided such that the probe pin is surrounded by the insulating material in plan view; and a stage arranged to face a surface of the base on which the probe pin and the insulating material are provided. The stage is capable of receiving a test object placed on a surface facing the base. When the test object is placed on the stage and the base and the stage move in a direction in which they get closer to each other, the probe pin comes into contact with an electrode formed on the test object, and the insulating material comes into contact with both the test object and the stage.
    Type: Grant
    Filed: May 21, 2012
    Date of Patent: April 14, 2015
    Assignee: Mitsubishi Electric Corporation
    Inventor: Masaaki Ikegami
  • Patent number: 9007073
    Abstract: Provided are a method of measuring a degree of degradation of a lubricating oil and a measuring device therefor, in which (a) acidity is measured through use of an ISFET of hydrogen ion sensitive type and (b) dielectric constants or electrostatic capacitances at two or more different frequencies are obtained, to thereby determine a degradation state of the lubricating oil based on the acidity and a plurality of values of the dielectric constants or the electrostatic capacitances. Accordingly, the degree of degradation of the lubricating oil can be measured easily and precisely and a degradation mechanism of the lubricating oil can be predicted.
    Type: Grant
    Filed: November 22, 2010
    Date of Patent: April 14, 2015
    Assignee: Idemitsu Kosan Co., Ltd.
    Inventor: Tadashi Katafuchi
  • Patent number: 9000771
    Abstract: A vehicle having an electrical system including an electric power generator arranged to selectively provide electric power to an electrical load of the vehicle and to selectively charge a battery of the vehicle. A fault detection system is provided for detecting an open circuit or high resistance fault in a ground circuit. The fault detection system includes a controller that controls a voltage output of the generator so as to either restrict or suspend charging or increase or start charging of the battery by the generator for a designated test period. A determining means determines a current discharge from or charging current into the battery during the test period, wherein if the determined current discharge or charging current is less than a given threshold, then an open circuit or high resistance fault is deemed to be detected in the ground circuit.
    Type: Grant
    Filed: November 14, 2008
    Date of Patent: April 7, 2015
    Assignee: Honda Motor Co., Ltd.
    Inventors: Richard Owens, Makoto Murata, Tadashi Fujiwara
  • Patent number: 9000777
    Abstract: A rotor blade measurement system includes a microwave source and a probe. A directional coupler is attached to the source and the probe. A detector is attached to the directional coupler. The probe directs a microwave signal toward a rotor such that during rotation the rotor blade will pass through the path of the microwave signal. As the rotor blade passes the microwave signal is reflected back to the probe. The directional coupler separates the original microwave signal and the reflected signal. The detector then determines the energy level of the reflected signal. As each rotor blade passes the microwave signal it generates a reflected signal that can be analyzed over time. From the length and shape of the waveform of the reflected signal the amount of twisting and flutter in a rotor blade can be determined.
    Type: Grant
    Filed: December 14, 2005
    Date of Patent: April 7, 2015
    Assignee: Hamilton Sunstrand
    Inventors: Eric B. Holmquist, Peter L. Jalbert, Richard E. Versailles
  • Patent number: 9000794
    Abstract: An elastic micro high frequency probe includes a conductor, which includes a stationary body and a movable body. The stationary body has a conductive terminal, a contacting end, and a guider. The movable body has a conductive terminal, a spring mechanism, and a guider. The spring mechanism is connected to the stationary body and to one conductive terminal. The second guider connects to the spring mechanism in such a manner that the compression direction of the spring mechanism is confined by a guiding rail. Since the width of the spring mechanism is not limited by the first and second guiders, the width of the spring mechanism can be enlarged to maximize within limited space. Therefore, the HF probe as a whole can have shortest length while acquiring the predetermined total length of the elastic stroke, such that the transmission performance of the high frequency signals can be effectively enhanced.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: April 7, 2015
    Assignee: MPI Corporation
    Inventors: Yi-Lung Lee, Chih-Chung Chen, Tsung-Yi Chen, Horng-Kuang Fan
  • Patent number: 8981809
    Abstract: A compliant printed circuit semiconductor tester interface that provides a temporary interconnect between terminals on integrated circuit (IC) devices being tested. The compliant printed circuit semiconductor tester interface includes at least one dielectric layer printed with recesses corresponding to a target circuit geometry. A conductive material is deposited in at least a portion of the recesses comprising a circuit geometry and a plurality of first contact pads accessible along a first surface of the compliant printed circuit. At least one dielectric covering layer is preferably applied over the circuit geometry. A plurality of openings in the dielectric covering layer are provided to permit electrical coupling of terminals on the IC device and the first contact pads. Testing electronics that to test electrical functions of the IC device are electrically coupled to the circuit geometry.
    Type: Grant
    Filed: June 28, 2010
    Date of Patent: March 17, 2015
    Assignee: Hsio Technologies, LLC
    Inventor: James Rathburn
  • Patent number: 8970204
    Abstract: A wireless phasing voltmeter determines the phase difference between the voltage carried by a reference electrical conductor and a field conductor. The voltage signal from the reference conductor is detected by a first unit and compared to a precision 60 Hz wave form generated from a first 1 pps GPS signal. The phase difference between the wave form and the reference conductor, represented by nine data bits, is used to modulate a radio frequency carrier wave and transmitted via simplex transmission to a second unit near an electrical conductor in the field. The second unit receives the modulated carrier wave, decodes the phase angle difference and compares it to a second phase angle difference between the voltage on the field conductor and a second precision 60 Hz wave form generated from a second 1 pps GPS signal. The difference between the two phase differences determines the phase of the field conductor.
    Type: Grant
    Filed: January 15, 2013
    Date of Patent: March 3, 2015
    Inventor: Walter S. Bierer
  • Patent number: 8963565
    Abstract: Present invention concerns generally to a sensor or a sensor system for detecting spilling of aqueous liquids, for instance in confined spaces were such is critical such in an airplane. The system of present invention is an early warning system or sentinel for the prevention of corrosion by corrosive liquids. Corrosion caused by corrosive liquids can rapidly change the surface properties of components in engineering structures, and that will finally endanger the functionality of structural parts. However, if monitoring technologies are in place providing continuous information on the presence of corrosive liquids, corrosion treatment and even corrosion prevention can start at a very early stage. Present invention provides such by early detection of corrosive liquids by extended sensors based on the collapse of percolation conductivity (COPC).
    Type: Grant
    Filed: July 12, 2011
    Date of Patent: February 24, 2015
    Assignee: Katholieke Universiteit Leuven
    Inventors: Helge Pfeiffer, Martine Wevers
  • Patent number: 8957694
    Abstract: An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: February 17, 2015
    Assignee: Broadcom Corporation
    Inventors: Kunzhong Hu, Chonghua Zhong, Edward Law
  • Patent number: 8952677
    Abstract: A locator for locating a concealed conductor carrying an alternating current having at least first and second frequencies, the alternating current produced by at least one dedicated signal generator. The locator includes at least one magnetic field sensor operable to convert electromagnetic radiation from the conductor into a field strength signal; a digital analog converter configured to generate a digitized signal dependent upon the field strength signals from the magnetic field sensor; a digital signal processor configured to isolate components of the digitized signal resulting from the first frequency and the second frequency; and process the isolated components to generate one or more signals indicative of the proximity of the conductor to the detector; and an output configured to generate an audio and/or visual indication of the proximity of the conductor, wherein the isolated signal components resulting from the first frequency signal and the second frequency signal are contemporaneously processed.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: February 10, 2015
    Assignee: Radiodetection Ltd.
    Inventors: Richard David Pearson, Jeffrey Richard Thompson, Derek James Wong
  • Patent number: 8947101
    Abstract: Method and system for measuring the resistance of a resistive structure having at least three nodes. A first calibration signal is determined by measuring a voltage at an output of the resistance structure when no calibration current is injected into a third node between the first and second nodes of the structure. A calibration current is then injected into the third node and a second calibration signal is determined. The absolute value of the difference between the first calibration signal and the second calibration signal is determined, the absolute value being proportional to a product of the resistance of the resistive structure and the calibration current.
    Type: Grant
    Filed: January 4, 2013
    Date of Patent: February 3, 2015
    Assignee: Linear Technology Corporation
    Inventor: Bernhard Helmut Engl
  • Patent number: 8933704
    Abstract: A device for testing capacitive loads of a power supply includes a controller, a power supply switching circuit, a capacitive load switching circuit, and a current sampling circuit. The power supply switching circuit selects one of output voltages of the power supply to be electronically connected to the capacitive load switching circuit and the current sampling circuit. The current sampling circuit samples an output current of one output of the power supply selected by the controller. The controller turns on and off switches of the capacitive load switching circuit for matching an output current of the power supply with a reference current until the output current equals to the reference current. The controller outputs a total magnitude of the capacitive loads.
    Type: Grant
    Filed: January 9, 2013
    Date of Patent: January 13, 2015
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Yun Bai, Fu-Sen Yang, Song-Lin Tong
  • Patent number: 8933719
    Abstract: A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.
    Type: Grant
    Filed: July 25, 2011
    Date of Patent: January 13, 2015
    Assignee: MPI Corporation
    Inventors: Chao-Ching Huang, Wen-Chi Chen, Chiu-Chu Chang
  • Patent number: 8933712
    Abstract: Techniques and circuits are described for approximation of the differential capacitance of a capacitive sensor to, among other things, optimize device operation and power consumption. In particular, feedback techniques are utilized for measurement and approximation of the differential capacitance of the capacitive sensor. In accordance with the disclosure, the capacitance approximation value for a test cycle preceding a given test cycle is utilized to reduce the number of iterations to be performed in a continuous series of test cycles. The capacitance approximation value for the given test cycle is reported as being equivalent to that of the preceding test cycle if the variance between the selected capacitance and the unselected capacitance is less than or equal to a first predefined value.
    Type: Grant
    Filed: January 7, 2013
    Date of Patent: January 13, 2015
    Assignee: Medtronic, Inc.
    Inventors: Jin-Yong Wu, Larry Tyler
  • Patent number: 8928337
    Abstract: Disclosed herein are embodiments of devices for measuring electrical current and related systems and methods for forming and using such devices. According to certain embodiments, devices according to the present disclosure may comprise Rogowski coils. Also disclosed are systems and methods for forming a current measuring device using a bobbin that may allow for the use of a continuous length of wire for all windings associated with the current measuring device. Automated manufacturing techniques may be utilized to facilitate the manufacture of devices for measuring electrical current and/or may reduce the cost of such devices. Various embodiments disclosed herein include the use of a bobbin that may be selectively configured between a linear configuration and a closed configuration. One or more current sensors disclosed herein may be utilized in connection with a motor management relay or other type of intelligent electronic device.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: January 6, 2015
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: James R. Kesler, Veselin Skendzic
  • Patent number: 8928341
    Abstract: An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT, a malfunction type is detected from the DUT, and a control command is transmitted to the DUT to return a test mode of the DUT to a normal mode according to the detected malfunction type.
    Type: Grant
    Filed: January 9, 2013
    Date of Patent: January 6, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Han-Awl Lee, Jae-Kyu Lee, Woong-Hae Choi, Byoung-Hee Lee
  • Patent number: 8922227
    Abstract: Systems and methods are provided for detecting surface charge on a semiconductor substrate having a sensing arrangement formed thereon. An exemplary sensing system includes the semiconductor substrate having the sensing arrangement formed thereon, and a module coupled to the sensing arrangement. The module obtains a first voltage output from the sensing arrangement when a first voltage is applied to the semiconductor substrate, obtains a second voltage output from the sensing arrangement when a second voltage is applied to the semiconductor substrate, and detects electric charge on the surface of the semiconductor substrate based on a difference between the first voltage output and the second voltage output.
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: December 30, 2014
    Assignee: Freescale Semiconductor Inc.
    Inventors: Chad S. Dawson, Bernhard H. Grote, Woo Tae Park
  • Patent number: 8917101
    Abstract: A touch detection method for a touch control device including a touch panel includes examining whether a charging capacity for charging a measured capacitor of the touch panel and a discharging capacity for discharging the measured capacitor are determined; charging and discharging the measured capacitor by using the charging capacity and the discharging capacity when the charging capacity and the discharging capacity are determined and receiving a count value representing the capacitance of the measured capacitor, examining whether a base count value is set, calculating a difference between the count value and the base count value when the base count value is set, for determining whether the touch panel is touched, examining whether the count value is in a predetermined range, and performing a charging and discharging capacity setting process when the count value is out of the predetermined range, for adjusting the charging capacity and the discharging capacity.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: December 23, 2014
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: He-Wei Huang, Chun-Hung Chen, Chih-Yuan Chang