Patents Examined by Bernard Souw
  • Patent number: 10308500
    Abstract: The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic modulus different to that of the first material, a third layer comprising a third material having an elastic modulus different to that of the first material, where the first layer is sandwiched between the second layer and the third layer.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: June 4, 2019
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Nahid Hosseini
  • Patent number: 10256072
    Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.
    Type: Grant
    Filed: August 1, 2017
    Date of Patent: April 9, 2019
    Assignee: Battelle Memorial Institute
    Inventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
  • Patent number: 10256068
    Abstract: A charged particle beam apparatus includes a charged particle source, a separator, a charged particle beam irradiation switch, and a control device. The separator is inserted into a charged particle optical system and deflects a traveling direction of a charged particle beam out of an optical axis of the charged particle optical system or deflects the traveling direction in the optical axis of the charged particle optical system. The charged particle beam irradiation switch absorbs the charged particle beam deflected out of the optical axis of the charged particle optical system or reflects the charged particle beam toward the separator. The control device controls a charged particle beam irradiation switch.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: April 9, 2019
    Assignee: HITACHI, LTD.
    Inventors: Momoyo Enyama, Yasuhiro Shirasaki, Natsuki Tsuno
  • Patent number: 10238763
    Abstract: Various devices for sterilizing a surface and an object in contact with the surface are disclosed. For example, a first device includes an ultraviolet light source, a touch sensor, a processing system, and a computer-readable medium. The computer-readable medium stores instructions which, when executed by the processing system, cause the processing system to perform operations that include detecting, via the touch sensor, a tactile state of the device, detecting a tactile state of at least one additional device, determining, based upon the tactile states, that the device is on an edge of a pattern of contact between an object and a surface comprising the device and the at least one additional device, and implementing an action associated with the ultraviolet light source in response to determining that the device is on the edge of the pattern of contact.
    Type: Grant
    Filed: August 7, 2017
    Date of Patent: March 26, 2019
    Assignee: AT&T Intellectual Property I, L.P.
    Inventors: Barrett M. Kreiner, Ryan Schaub, Timothy Knezevich
  • Patent number: 10211023
    Abstract: In one embodiment, an aperture set for a multi-beam includes a shaping aperture array in which a plurality of first openings are formed, a region including the plurality of first openings is irradiated with a charged particle beam discharged from a discharge unit, and portions of the charged particle beam pass through the plurality of respective first openings to form a multi-beam, a first shield plate in which a plurality of second openings is formed, through which a corresponding beam in the multi-beam, which passes through the plurality of first openings, passes, and a blanking aperture array in which a plurality of third openings is formed, through which a corresponding beam in the multi-beam, which passes through the plurality of first openings and the plurality of second openings, passes. The second openings are wider than the first openings.
    Type: Grant
    Filed: December 26, 2017
    Date of Patent: February 19, 2019
    Assignee: NuFlare Technology, Inc.
    Inventors: Hiroshi Matsumoto, Hiroshi Yamashita, Kenichi Kataoka
  • Patent number: 10201626
    Abstract: The Portable Ultra Violet C Sanitizer is a self-contained, portable, self-shut-off, preprogrammed/programmable UVC light irradiation microorganism inactivation device that more effectively, efficiently and safely sanitizes surfaces than comparable products presently on the market. Advantageously, the device provides a faster alternative for UVC sterilization of a surface, while protecting the operator from potentially dangerous exposure to the UVC radiation.
    Type: Grant
    Filed: February 19, 2017
    Date of Patent: February 12, 2019
    Inventor: Luke Edward Rapp
  • Patent number: 10192710
    Abstract: An object of the present invention is to provide an ion milling apparatus capable of processing deposits attached to an ion gun and an ion milling method capable of processing deposits attached to an ion gun. The ion milling apparatus includes gas injection means for injecting a gas toward the ion gun, and the gas injection means included in the ion milling apparatus moves the deposits attached to the ion gun by injecting the gas toward the inside of the ion gun.
    Type: Grant
    Filed: May 25, 2015
    Date of Patent: January 29, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuki Tani, Hisayuki Takasu, Shuichi Takeuchi
  • Patent number: 10176976
    Abstract: The invention relates to an ion source (50) for generating elemental ions and/or ionized metal oxides from aerosol particles, comprising: a reduced pressure chamber (61) having an inside; an inlet (56) and a flow restricting device (60) for inserting the aerosol particles in a dispersion comprising the aerosol particles dispersed in a gas, in particular in air, into the inside of the reduced pressure chamber (61), the inlet (60) fluidly coupling an outside of the reduced pressure chamber (61) via the flow restricting device (60) with the inside of the reduced pressure chamber (60); a laser (62) for inducing in a plasma region (63) in the inside of the reduced pressure chamber (61) a plasma in the dispersion for atomizing and ionizing the aerosol particles to elemental ions and/or ionized metal oxides; wherein the reduced pressure chamber (61) is adapted for achieving and maintaining in the inside of the reduced pressure chamber (61) a pressure in a range from 0.01 mbar to 100 mbar.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: January 8, 2019
    Assignee: TOFWERK AG
    Inventor: Urs Rohner
  • Patent number: 10170270
    Abstract: An ion source device for producing an ion beam may include a housing having an opening, a first electrode, and a second electrode. A portion of the first electrode and the second electrode may be located within the housing. The first electrode may have a first side facing the opening and may be configured to provide an electric field toward the opening. The second electrode may be configured to provide an electron presence between the first electrode and the opening at least at times when the first electrode is not providing the first electric field. The ion source device may include a magnet and may produce a magnetic field generally perpendicular to the electric field provided by the first electrode. The ion source device may provide an ion beam with low turn on delay, which may be on the order of one microsecond or less, and low turn on jitter.
    Type: Grant
    Filed: August 4, 2017
    Date of Patent: January 1, 2019
    Assignee: WISCONSIN ALUMNI RESEARCH FOUNDATION
    Inventor: Andrew Seltzman
  • Patent number: 10168353
    Abstract: An apparatus for investigating a sample surface is disclosed. The apparatus comprises: a probe array comprising a substrate and a plurality of probe tips extending from the substrate, the probe tips comprising a transparent and deformable material and configured to contact the sample surface; an actuator configured to move the probe array towards the sample surface; a light source configured to illuminate the probe tips with an illumination through the substrate; and an image capture device arranged to detect a change in intensity of the illumination reflected from the probe tips.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: January 1, 2019
    Assignee: NANYANG TECHNOLOGICAL UNIVERSITY
    Inventors: Fengwei Huo, Jin Wu
  • Patent number: 10162062
    Abstract: A method of imaging analyte elements in an organic sample includes providing the sample as a layer on a substrate and reacting the sample on the substrate to produce one or more volatile products that leave the sample while the one or more elements remain in the sample. A majority of the sample layer by weight is removed from the substrate by the reaction and the remaining sample layer is enriched in the one or more elements which are not spatially disturbed by the reaction. The method including subsequently detecting the one or more elements in the concentrated sample layer using an imaging elemental analyzer.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: December 25, 2018
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Alexander A. Makarov, Johannes Schwieters
  • Patent number: 10163601
    Abstract: A probe assembly for analyzing a test device that includes a housing with an electron source disposed therein for emitting primary electrons. A photon source is positioned to emit photons that strike the electron source such that when the photons strike the electron source, the electron source emits the primary electrons. Detection circuitry is provided that is configured to detect secondary electrons emitted from a test device of a test assembly and to form an excitation waveform.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: December 25, 2018
    Assignee: Intel Corporation
    Inventors: Amir Raveh, Travis Eiles, Evgeny Gregory Nisenboim, Patrick Pardy
  • Patent number: 10161961
    Abstract: A microfabricated optical probe includes: a cantilever; an optical waveguide disposed at a periphery of the cantilever and including an optical loop, the optical loop being disposed coplanar with the cantilever; a mechanical support interposed between and interconnecting the cantilever and the optical waveguide with the mechanical support such that the cantilever and optical waveguide move together; and a substrate on which the cantilever is disposed and from which the cantilever and the optical loop protrude, wherein the cantilever and the optical waveguide flex independently of the substrate.
    Type: Grant
    Filed: November 9, 2017
    Date of Patent: December 25, 2018
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventors: Vladimir A. Aksyuk, Kartik Srinivasan, Thomas Michels
  • Patent number: 10157723
    Abstract: In one embodiment, a multi charged particle beam writing apparatus includes an emitter that emits a charged particle beam, an aperture plate in which a plurality of openings are formed and that forms multiple beams by allowing the charged particle beam to pass through the plurality of openings, a blanking plate provided with a plurality of blankers that each perform blanking deflection on a corresponding beam included in the multiple beams, a stage on which a substrate irradiated with the multiple beams, a detector that detects a reflection charged particle from the substrate, feature amount calculation circuitry that calculates a feature amount of an aperture image based on a detection value of the detector, and aberration correction circuitry that corrects aberration of the charged particle beam based on the feature amount.
    Type: Grant
    Filed: August 1, 2017
    Date of Patent: December 18, 2018
    Assignee: NuFlare Technology, Inc.
    Inventors: Tsubasa Nanao, Yukitaka Shimizu
  • Patent number: 10157693
    Abstract: A neutron moderation material for use in a BNCT beam shaping assembly. The neutron moderation material comprises three elements, i.e., Mg, Al, and F, wherein the mass fraction of the Mg element is 3.5%-37.1%, the mass fraction of the Al element is 5%-90.4%, and the mass fraction of the F element is 5.8%-67.2%; the sum of the weights of the Mg, Al, and F elements is 100% of the total weight of the neutron moderation material. The neutron moderation material may be doped with a small amount of 6Li-containing substances, and the addition of the 6Li-containing substances effectively decreases the content of ?-rays in epithermal neutron beams.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: December 18, 2018
    Assignee: NEUBORON MEDTECH LTD.
    Inventors: Yuan-Hao Liu, Wei-Lin Chen
  • Patent number: 10157692
    Abstract: Improvements to atom interferometers. An improved atom interferometer has a single polarization-preserving fiber, coupled for propagation of beams of two Raman frequencies, and a parallel displacement beamsplitter for separating the laser beams into respective free-space-propagating parallel beams traversing at least one ensemble of atoms. A reflector generates one or more beams counterpropagating through the ensemble of atoms. Other improvements include interposing a beam-splitting surface common to a plurality of parallel pairs of beams counterpropagating through the ensemble of atoms, generating interference fringes between reflections of the beams to generate a detector signal; and processing the detector signal to derive at least one of relative phase and relative alignment between respective pairs of the counterpropagating beams.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: December 18, 2018
    Assignee: The Charles Stark Draper Laboratory, Inc.
    Inventors: Alexander Gill, Steven J. Byrnes, Jennifer Choy, Christine Y. Wang, Matthew A. Sinclair, Adam Kelsey, David Johnson
  • Patent number: 10153128
    Abstract: To realize a sample lifting and lowering device capable of easily responding to increase of a diameter of a sample with light weight and high rigidity as well as with less directional dependence of rigidity as the sample lifting lowering device arranged above a horizontal movement mechanism.
    Type: Grant
    Filed: April 22, 2016
    Date of Patent: December 11, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masakazu Sugaya, Yusuke Moriwaki, Koichi Terada, Nobuo Shibata, Hironori Ogawa, Hiroyuki Kitsunai, Toshihiko Shimizu, Shuichi Nakagawa
  • Patent number: 10147584
    Abstract: An ion implantation system may include an ion source to generate an ion beam, a substrate stage disposed downstream of the ion source; and a deceleration stage including a component to deflect the ion beam, where the deceleration stage is disposed between the ion source and substrate stage. The ion implantation system may further include a hydrogen source to provide hydrogen gas to the deceleration stage, wherein energetic neutrals generated from the ion beam are not scattered to the substrate stage.
    Type: Grant
    Filed: March 20, 2017
    Date of Patent: December 4, 2018
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Frank Sinclair, Daniel Tieger, Klaus Becker
  • Patent number: 10134575
    Abstract: The present invention is directed to a method and device to desorb an analyte using heat to allow desorption of the analyte molecules, where the desorbed analyte molecules are ionized with ambient temperature ionizing species. In various embodiments of the invention a current is passed through a mesh upon which the analyte molecules are present. The current heats the mesh and results in desorption of the analyte molecules which then interact with gas phase metastable neutral molecules or atoms to form analyte ions characteristic of the analyte molecules.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: November 20, 2018
    Assignee: IONSENSE, INC
    Inventors: Jordan Krechmer, Brian D. Musselman
  • Patent number: 10132832
    Abstract: A method for manufacturing a microcantilever having a cantilever and a functional probe provided on the cantilever may include steps of: providing a probe mold which accommodates a liquid probe solution in which quantum dots for the functional probe are mixed, and has a groove corresponding to the shape of the functional probe; bringing a cantilever into contact with the probe mold on which the groove is formed to correspond to the location of the functional probe; forming the functional probe on the cantilever by curing the probe solution accommodated in the groove in a state where the cantilever contacts the probe mold; and separating the cantilever from the probe mold.
    Type: Grant
    Filed: April 1, 2016
    Date of Patent: November 20, 2018
    Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SOGANG UNIVERSITY
    Inventors: Jung Chul Lee, Seok Beom Kim, Jae Seol Lee