Patents Examined by Bernard Souw
-
Patent number: 9870891Abstract: The present invention provides a technique for constructing compact, high gradient magnetic lenses for charged particle beam focusing. Methods for adjusting the focusing strength of the lenses are provided, based on thermal control, mechanical motion of the magnetic chips within the yoke. The present invention is a method for designing and fabricating permanent magnet focusing elements that are compact, simple to construct, and having a large, adjustable focusing strength. Applications include beamlines for THz radiation sources, free electron lasers, wakefield accelerators and any other charged particle devices that require a compact beamline.Type: GrantFiled: February 15, 2017Date of Patent: January 16, 2018Assignee: EUCLID TECHLABS LLCInventors: Sergey Antipov, Yingje Li, Chunuang Jing, Roman Kostin, Jiaqu Qiu, Dan Wang, Paul Schoessow
-
Patent number: 9870895Abstract: Perforating graphene and other two-dimensional materials with holes inclusively having a desired size range, a narrow size distribution, and a high hole density can be difficult to achieve. A layer in continuous contact with graphene, graphene-based materials and other two-dimensional materials can help promote hole formation. Processes for perforating a two-dimensional material can include exposing to an ion source a two-dimensional material in continuous contact with at least one layer, and interacting a plurality of ions from the ion source with the two-dimensional material and with the at least one layer. The ion source may be a broad ion beam.Type: GrantFiled: January 30, 2015Date of Patent: January 16, 2018Assignee: Lockheed Martin CorporationInventor: Peter V. Bedworth
-
Patent number: 9865444Abstract: Ions ejected substantially simultaneously from a collision cell after being temporarily held inside the collision cell arrive at an orthogonal acceleration unit through an ion transport optical system. When the ions enter the orthogonal acceleration unit, voltages having a predetermined potential difference are applied to an entrance-side electrode and an exit-side auxiliary electrode, and as a result an electric field having a rising potential gradient along an axis is created in the orthogonal acceleration unit. As ions having low an m/z values and entering the orthogonal acceleration unit first is significantly decelerate, the packet of ions spread in the X-axis direction in accordance with the m/z values are compressed in the X-axis direction after entering the orthogonal acceleration unit. Thus, a mass-to-charge ratio range of ions that are accelerated in the orthogonal acceleration unit is broadened, and a mass spectrum of a broad range of mass-to-charge ratios can be obtained.Type: GrantFiled: August 19, 2015Date of Patent: January 9, 2018Assignee: SHIMADZU CORPORATIONInventor: Daisuke Okumura
-
Patent number: 9861715Abstract: Method for sterilizing a body fluid drainage system for handling a body fluid ex vivo. The body fluid drainage system comprises a chamber. The method comprises the steps providing a container containing a surface protective fluid to be released into the chamber of the body fluid drainage system, subjecting the container to radiation sterilization, inserting the container into the chamber of the body fluid drainage system, and subjecting the chamber containing the container to gas sterilization. A body fluid drainage system for handling a body fluid ex vivo. The body fluid drainage system comprises a chamber. The body fluid drainage system further comprises a container containing a surface protective fluid. The container is arranged to release the surface protective fluid into the chamber. The surface protective fluid is sterilized by radiation sterilization. An outer surface of the container and at least the chamber of the body fluid drainage system is sterilized by gas sterilization.Type: GrantFiled: September 15, 2015Date of Patent: January 9, 2018Assignee: OBSERVE MEDICAL APSInventors: Mikael Charlez, Mikael Lofgren
-
Patent number: 9859096Abstract: An inspection apparatus according to an embodiment includes an irradiation part configured to irradiate an inspection target substrate with multiple beams including energy beams, a detector, on which a plurality of charged particle beams of charged particles released from the inspection target substrate are imaged, configured to detect each of the charged particle beams as an electrical signal, and a comparing unit configured to compare reference image data and image data that is reproduced based on the detected electrical signals and that represents patterns formed on the inspection target substrate to inspect the patterns. The detector includes a plurality of detecting elements corresponding one-to-one to the charged particle beams. The detecting elements each have a size greater than a size that covers a beam blur of each charged particle beam imaged on the detector.Type: GrantFiled: November 22, 2016Date of Patent: January 2, 2018Assignee: NuFlare Technology, Inc.Inventor: Munehiro Ogasawara
-
Patent number: 9852881Abstract: In order to allow detecting backscattered electrons (BSEs) generated from the bottom of a hole for determining whether a hole with a super high aspect ratio is opened or for inspecting and measuring the ratio of the top diameter to the bottom diameter of a hole, which are typified in 3D-NAND processes of opening a hole, a primary electron beam accelerated at a high accelerating voltage is applied to a sample. Backscattered electrons (BSEs) at a low angle (e.g. a zenith angle of five degrees or more) are detected. Thus, the bottom of a hole is observed using “penetrating BSEs” having been emitted from the bottom of the hole and penetrated the side wall. Using the characteristics in which a penetrating distance is relatively prolonged through a deep hole and the amount of penetrating BSEs is decreased to cause a dark image, a calibration curve expressing the relationship between a hole depth and the brightness is given to measure the hole depth.Type: GrantFiled: November 19, 2014Date of Patent: December 26, 2017Assignee: Hitachi High-Technologies CorporationInventors: Chie Shishido, Takuma Yamamoto, Shinya Yamada, Maki Tanaka
-
Patent number: 9849305Abstract: A scanning candidate route extracting unit which extracts plural candidates of scanning routes in which each of the scanning routes connects all spot positions in one layer is provided, in an evaluation function using necessary scanning time Tk and weight coefficient wk for a kth partial route among partial routes which are routes between the spot positions which are adjacent on one of the plural candidates of scanning routes, and number n of spot in the layer, wk with respect to a partial route which passes through affected tissue is set to be 1, wk with respect to a partial route which passes through normal tissue is set to be bigger than 1, and wk with respect to a partial route which passes through an important internal organ is set to be bigger than wk with respect to a partial route which passes through normal tissue.Type: GrantFiled: April 7, 2016Date of Patent: December 26, 2017Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Takaaki Iwata
-
Patent number: 9844109Abstract: An infrared circuit for a single battery and a remote controller using the same are provided. The single battery outputs a battery voltage. The infrared circuit comprises an IR LED circuit, an inductor and a microcontroller. The IR LED circuit is coupled between the battery voltage and a common voltage. The inductor is coupled between the battery voltage and the common voltage. The microcontroller has an I/O port coupled to the inductor and the IR LED circuit. When infrared rays are emitted, the microcontroller controls the battery voltage to charge the inductor through the I/O port, and a continuous current of the inductor forces the IR LED circuit to turn on.Type: GrantFiled: November 21, 2016Date of Patent: December 12, 2017Assignee: Generalplus Technology Inc.Inventors: Hsin Chou Lee, Ming-Hung Tsai
-
Patent number: 9842975Abstract: A light emitting device package including a package body including a first cavity and a second cavity, a pad disposed on a bottom surface of the first cavity, a light emitting device disposed on the second cavity electrically connected to the pad, a heat dissipation member inserted into the package body, the heat dissipation member including a body and expanded portions disposed at a partial edge region of the body and electrode patterns disposed at the package body, wherein the package body has an upper portion and a lower portion disposed under the upper portion, wherein the first cavity including side surfaces and a bottom surface, wherein the second cavity provided in the bottom surface of the first cavity.Type: GrantFiled: March 28, 2016Date of Patent: December 12, 2017Assignee: LG INNOTEK CO., LTD.Inventors: Byung Mok Kim, Bo Hee Kang, Ha Na Kim, Hiroshi Kodaira, Yuichiro Tanda, Satoshi Ozeki
-
Patent number: 9841172Abstract: The light irradiating device which irradiates linear light includes: a substrate which is parallel to first and second directions; a plurality of LED light sources which emits light in a third direction intersecting a surface of the substrate; a heat transporting unit which extends in a direction opposite to the third direction from the substrate; a cooling unit which has a heat radiating pin radiating the heat of the heat transporting unit into the air, an LED driver circuit which drives the LED light source; a housing which has an opening sucking and exhausting external air on one surface of the second direction, accommodates the cooling unit and the LED driver circuit, and forms a wind tunnel in an area where the cooling unit and the LED driver circuit are disposed; and a fan which is provided at a side opposite to the third direction of the cooling unit.Type: GrantFiled: January 12, 2017Date of Patent: December 12, 2017Assignee: HOYA CANDEO OPTRONICS CORPORATIONInventor: Hiroaki Watanabe
-
Patent number: 9839110Abstract: A plasma light source apparatus includes a first laser generator configured to generate a first laser. A second laser generator is configured to generate a second laser. A chamber is configured to accommodate and seal a medium material for plasma ignition and to allow plasma to be ignited by the first laser and to be maintained by the second laser. An inner surface of the chamber includes two curved mirrors that face each other.Type: GrantFiled: July 28, 2016Date of Patent: December 5, 2017Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Wook-Rae Kim, Won-Don Joo, Byeong-Hwan Jeon, Sung-Hwi Cho, Young-Kyu Park, Jung-Chul Lee, Jin-Woo Ahn
-
Patent number: 9837246Abstract: A lamella for observation on a transmission electron microscope and other analytical instruments includes multiple thin regions separated by thicker regions or ribs. In some embodiments, the lamella can be wider than 50 ?m with more than 10 multiple thin regions, with each thin region may being as thin as 10 nm or even thinner. The process for making such lamellae lends itself to automation. The process is fault tolerant in that not all of the multiple thin regions need to be useable as long as one region provides a useful image. Redeposition is reduced because ion beam imaging is reduced in the automated process and because the ribs reduce redeposition between regions.Type: GrantFiled: July 22, 2016Date of Patent: December 5, 2017Assignee: FEI CompanyInventors: Remco Theodorus Johannes Petrus Geurts, Tomas Vystavel
-
Patent number: 9829467Abstract: A trace component in a sample is quickly and accurately analyzed using a small sample quantity without performing preprocessing such as concentration. Trace components in a sample can be analyzed quickly and accurately using a small sample quantity and without preprocessing such as concentration, by a method for analyzing a component in a sample, the method including a step for irradiating a thermoplastic resin film internally containing the sample with ionizing laser light of a mass spectrometer.Type: GrantFiled: May 12, 2015Date of Patent: November 28, 2017Assignee: National University Corporation Nagoya UniversityInventor: Makoto Sawada
-
Patent number: 9823228Abstract: A technician is forced to determine the measurement time to be used in a selected ion monitoring (SIM) measurement while observing mass spectral data. Thus, mass spectral data and one or a plurality of mass chromatogram data items is generated on the basis of the detection results of an ion detection unit, and, for each corresponding ion component, the measurement time to be used in SIM is determined on the basis of the elution time range represented by each peak waveform of the one or plurality of mass chromatogram data items that have been generated.Type: GrantFiled: July 29, 2015Date of Patent: November 21, 2017Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Shinji Yoshioka, Hiromichi Yamashita, Akira Maekawa
-
Patent number: 9812285Abstract: Presented is a holder assembly for cooperating with a nanoreactor and an electron microscope. The holder assembly has a distal end for holding the nanoreactor. The volume has a fluid inlet and outlet. The holder assembly has fluid supply and outlet tubes which in working are connected to the fluid inlet and outlet of the nanoreactor. In working, the connection between the fluid inlet and outlet and the respective supply and outlet tubes are sealed by sealing elements. The holder assembly has a recess which, when the nanoreactor is attached and the holder is inserted into the evacuated portion of an electron microscope, forms a sealed pre-vacuum volume between the holder and the nanoreactor, with the pre-vacuum volume being evacuated via a pre-vacuum channel such that any fluid leakage is pumped away and does not enter the evacuated part of the electron microscope.Type: GrantFiled: July 25, 2016Date of Patent: November 7, 2017Assignee: FEI CompanyInventors: Pleun Dona, Luigi Mele
-
Patent number: 9805908Abstract: A signal charged particle deflection device for a charged particle beam device is provided. The signal charged particle deflection device includes a beam bender configured for deflecting the signal charged particle beam, wherein the beam bender includes a first electrode and a second electrode providing an optical path for the signal charged particle beam therebetween, wherein the first electrode has a first cross section in a plane perpendicular to the optical path, and the second electrode has a second cross section in the plane perpendicular to the optical path, and wherein a first part of the first cross section and a second part of the second cross section provide the optical path therebetween, and wherein the first part and the second part are different in shape.Type: GrantFiled: February 16, 2016Date of Patent: October 31, 2017Assignee: Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbHInventors: Matthias Firnkes, Stefan Lanio
-
Patent number: 9795700Abstract: The present invention disinfects countertop surfaces using high intensity ultraviolet energy causing photolysis. The light is directed to the working area of an office countertop or the countertop used in food preparation such as in a residential or commercial kitchen. A motion detector provides a mechanism for disabling the light should a pet or individual enter an area during the disinfection process. The device further includes at least one light-emitting diode (LED) or multiple LEDs allowing dual functionality wherein the device can provide conventional countertop lighting or disinfection lighting.Type: GrantFiled: March 31, 2016Date of Patent: October 24, 2017Inventor: Mathew Inskeep
-
Patent number: 9799483Abstract: In the present invention, a charged particle beam device has a charged particle source (1), a first condenser lens (4) arranged downstream from the charged particle source (1), an aperture (5) arranged downstream from the first condenser lens (4), and a second condenser lens (6) arranged downstream from the aperture (5), wherein, when a sample (12) is to be irradiated at a second charged particle beam amount which is greater than a first charged particle beam amount, the first and second condenser lenses are controlled such that a charged particle beam is formed downstream from the aperture (5), and such that the focal point of the second condenser lens does not vary between the first charged particle beam amount and the second charged particle beam amount.Type: GrantFiled: April 21, 2015Date of Patent: October 24, 2017Assignee: Hitachi High-Technologies CorporationInventors: Tomoyasu Shojo, Hajime Kawano, Yasunari Sohda
-
Patent number: 9799489Abstract: The invention provides an exposure apparatus (100) including a formation module (122) which forms charged particle beams with different irradiation positions on a specimen.Type: GrantFiled: January 10, 2017Date of Patent: October 24, 2017Assignee: Advantest Corp.Inventors: Shinichi Hamaguchi, Hitoshi Tanaka, Atsushi Tokuno, Shinichi Kojima, Akio Yamada
-
Patent number: 9789342Abstract: To overcome the difficulties inherent in conventional proton therapy systems, new techniques are described herein for synchronizing the application of proton radiation with the periodic movement of a target area. In an embodiment, a method is provided that combines multiple rescans of a spot scanning proton beam while monitoring the periodic motion of the target area, and aligning the applications of the proton beam with parameters of the periodic motion.Type: GrantFiled: March 31, 2016Date of Patent: October 17, 2017Assignees: Varian Medical Systems, Inc., Varian Medical Systems Particle Therapy GmbHInventors: Markus Bach, Isabel Huth, Juergen Heese, Franko Piskulich, Lei Dong