Abstract: An identical object determination method of determining whether or not objects are detected by a plurality of sensors identical has a determining a relative position and speed thereof, a determining a position error thereof based on the determined positions and calculating a first probability that the detected objects are identical with respect to the position from the determined position error based on a normal distribution concerning the position error, a determining a speed error thereof based on the determined speed and calculating a second probability that the detected objects are identical with respect to the speed from the determined speed error based on a normal distribution concerning the speed error, a calculating a third probability that the detected objects are identical based on the calculated first probability and the calculated second probability, and a determining that the detected objects are identical if the third probability exceeds a first determination value.

Abstract: A method and related system for semiconductor equipment early warning management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording the quality of semiconductor products and corresponding testing parameters, and analyzing a relationship between the corresponding process parameters, the corresponding equipment parameters, and the quality of semiconductor products of each piece of equipment.

Abstract: The present invention provides a distributed sensing system in a networked environment for identifying an analyte, including a first sensor array connected to the network comprising sensors capable of producing a first response in the presence of a chemical stimulus; a second sensor array connected to the network comprising sensors capable of producing a second response in the presence of a physical stimulus; and a computer comprising a resident algorithm. The algorithm indicates or selects the most relevant sensor in the network to identify the analyte. The sensors can be separated over large spatial areas, wherein the sensor arrays are networked. Suitable networks include a computer local area network, an intranet or the Internet.

Abstract: An apparatus for measuring the water content of a water-containing liquid mixture contained in a tight chemistry tank includes a heating device for controlling the temperature of the liquid mixture to a temperature near the boiling point of the liquid mixture, a cooling medium system disposed at the top of the tight chemistry tank having a cooling medium inlet and a cooling medium outlet, a temperature measurement system for determining the temperature difference between the cooling medium inlet and outlet, and a computing device for calculating the water content of the liquid mixture from the temperature difference. Also provided is a tank for supplying water to the liquid mixture, and a control system for adjusting the amount of water supplied from the tank based upon the water content measured by the measuring apparatus. Also provided is a method for measure the water content.

Abstract: A system for automatic calibration of instruments (S) having varying cross-sectional dimensions within a predetermined range and having detectable elements (110, 112, 113, 114) thereon for computer-aided surgery, comprising a calibration base (C) having detectable elements (43, 44, 46, 48) secured thereto for detecting a position and an orientation thereof in space by sensors (204) connected to a position calculator (202). The calibration base is adapted to receive and to releasably secure a working shaft (100) of any of the instruments (S) and provides an abutting surface (14) for a tip (102) thereof in such a way that a position and orientation of the tip (102) of the instrument (S) secured therein is calculable when working shaft cross-section dimensions thereof are known. The position calculator (202) receives instrument data (214) and calibration data (218) from an operator through a user interface (206) and stores the instrument data (214) and calibration data (218) for subsequent calibrations.

Abstract: In the method, which is to be carried out on a computer system, firstly design data of a semiconductor substrate are read in and, on the basis thereof, a mask image is generated in the form of a data structure with contact holes and with auxiliary structures on the computer system. Afterwards, contact hole biases are determined by means of an optical proximity correction method and the relevant contact holes are corrected on the basis of these contact hole biases. By means of subsequent imaging simulation of the mask image on the semiconductor substrate, undesired imaging auxiliary structures and contact holes deviating from specified tolerances on the semiconductor substrate are detected and corrected. During the imaging simulation of the mask image, a mask bias is employed in order to compensate for three-dimensional mask effects. A real mask can be produced on the basis of the mask image thus determined.

Abstract: A method includes steps of: (a) receiving as input a waveform of a transient signal as a function of time for an aggressor net; (b) finding a peak value of the waveform and a corresponding peak time of the waveform propagated from the aggressor net to a victim net; (c) defining a selected time interval within the waveform at the victim net that includes the peak value and excludes features of the waveform not associated with the peak value wherein the selected time interval begins at a first time and ends at a second time; (d) calculating a weighted value of a function of the waveform at the first time and the second time; (e) calculating a local average value of the waveform as a function of the peak value and the weighted value; and (f) generating as output the local average value of the waveform.

Abstract: This invention presents a method for computing Instantaneous Frequency by applying Empirical Mode Decomposition to a signal and using Generalized Zero-Crossing (GZC) and Extrema Sifting. The GZC approach is the most direct, local, and also the most accurate in the mean. Furthermore, this approach will also give a statistical measure of the scattering of the frequency value. For most practical applications, this mean frequency localized down to quarter of a wave period is already a well-accepted result. As this method physically measures the period, or part of it, the values obtained can serve as the best local mean over the period to which it applies. Through Extrema Sifting, instead of the cubic spline fitting, this invention constructs the upper envelope and the lower envelope by connecting local maxima points and local minima points of the signal with straight lines, respectively, when extracting a collection of Intrinsic Mode Functions (IMFs) from a signal under consideration.

Abstract: A digital multimeter adapter for a portable electronic device includes a hardware interface connector and a computer program memory. The memory stores computer program instructions that direct the electronic device to collect data representative of a signal from an external source, analyzing the data to identify a characteristic such as voltage, current, or resistance, and displaying the data in digital format. The user may select one or more of the scales of the display. The adapter also may include a model value database, a collected value database, an application-specific database, and/or a language database.

Abstract: A system for field substitution of components of a RF metrology system. The system includes a sensor/cable combination and an analysis unit. Parameters of the RF metrology system are determined prior to placing the RF metrology system in the field. From these parameters, either component, the cable/sensor combination or the analysis module, may be substituted in the field by recalibrating the system for the substituted unit. Such recalibration is carried out utilizing the parameters determined prior to placing the RF metrology system in the field.

Abstract: A payment system automatically provides objective information and sets remuneration for objective information to high-rate. A payment system comprises multiple communication terminals and multiple information processing apparatuses. The information processing apparatus transmits remuneration expectation information indicating remuneration for transmission of objective information to a communication terminal. The communication terminal references remuneration expectation information, determines transmission destination of objective information according to a predetermined standard, and transmits objective information to the transmission destination, so that remuneration information is received.

Abstract: Estimates of spectral magnitude and phase are obtained by an estimation process using spectral information from analysis filter banks such as the Modified Discrete Cosine Transform. The estimation process may be implemented by convolution-like operations with impulse responses. Portions of the impulse responses may be selected for use in the convolution-like operations to trade off between computational complexity and estimation accuracy. Mathematical derivations of analytical expressions for filter structures and impulse responses are disclosed.

Abstract: A system for capturing and transmitting analyte data pertaining to an unknown analyte. The system includes a device manager (102) and a processor manager (202). The device manager (102) is coupled to a number of module including a data capture module (104), a data formatting module (106) and a first input/output (I/O) module (108). The data capture module (104) is coupled to the device manager (102) for capturing the data for the unknown analyte at a first geographic location. The first data formatting module (106) is coupled to the device manager (102) for formatting or encoding the captured analyte data into a transmissible format before the captured analyte data are transmitted. The first I/O module (106) is coupled to the device manager for transmitting the captured analyte data via a computer network to a processor at a second geographic location.

Abstract: A system for measuring network performance parameters includes multiple network nodes (125) and at least one collection agent (130). Each of the multiple network nodes (125) calculates signature values for received packets. Each of the signature values includes an identifier for a corresponding packet. The collection agent (130) collects the signature values from the multiple network nodes (125), and determines one or more network performance parameters based on the collected signature values and network topology information.

Abstract: A method and apparatus suitable for monitoring the quality and/or performance of a processing aid or a component during manufacture, storage, or use of electronics or electronic assemblies is provided. The apparatus incorporates a sampling device, a multivariate sensing system (e.g., a multi-sensor array or at least one sensor capable of measuring multiple variables) capable to process an analysis of low vapor pressure or vaporizable constituents in electronics by detecting some changes in the physico-chemical properties of the sensor and/or electronics and applying multivariate analysis. In one embodiment, the sensing system comprises an array of metal oxide sensors and a multivariate analysis algorithm for data processing. This method and apparatus can be employed for various quality control purposes such as contamination analysis or failure analysis of integrated circuits components.

Abstract: A medical system wherein multiple medical devices are connected to a system controller which controls the medical devices via communication lines is arranged such that in the event that trouble occurs, a user operates a maintenance button, which causes the system controller to display multiple trouble items relating to the actions of the medical devices on a display panel, and the user specifies a trouble item matching the currently-occurring trouble from the displayed multiple trouble items, whereby the system controller performs estimation processing for recovering from the specified trouble item and displays countermeasures information for recovering from the trouble item based on the estimation processing, and the user performs processing following the displayed countermeasures information, thereby enabling trouble to be efficiently recovered from.

Abstract: An observation apparatus according to one embodiment can include a timing generating unit (2) that generates a timing signal at a predetermined period. A sampling unit (3) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit (5). A data number adjusting unit (6) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit (4) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.

Abstract: A configurable semiconductor device having a plurality of predetermined configurations comprises a measurement circuit to measure an electrical characteristic of at least one external impedance and to determine a digital value corresponding to the measured electrical characteristic. A storage circuit includes memory locations having contents accessible as a function of the digital value. Each of the contents corresponds to a respective one of the predetermined configurations. A controller configures a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value.

Abstract: A plurality of lots of wafers, each lot of wafers having a lot number and each wafer of each lot having at least one test parameter generated by performing at least one wafer test item stored in a database, are divided into a high yield group and a low yield group. By analyzing the wafer test parameters of the wafers in the high yield group, a first standard value within a first range is obtained. A first comparison step is then performed to compare each wafer test parameter of each lot in the low yield group with the first standard value and delete lot numbers of lots with wafer test parameters within the first range. Finally, a first amount of residual lots in the low yield group is determined. In response to the first amount of residual lots in the low yield group not equaling to zero, a first searching step is performed to which item of sample test items, in-line QC items and process step items is related to the wafer test item of each residual lot in the low yield group in the database.

Abstract: A method and apparatus for performing continuous variance analysis (CVA) to characterize a data set. Data set values may be associated with any source, including measurements of a received signal and/or measurements of natural and/or man-made phenomena. CVA generates an output matrix that contains a measure of variation for a plurality of ranges (or windows) of data elements within a data set positioned at known locations within the data set. CVA output can be interpreted visually by a technician and/or using automatic numerical analysis. CVA is compatible with any apparatus/approach that uses numerical analysis to generate a predicted model based upon stored library models and/or linear/nonlinear components. CVA is compatible with any programming language and can be readily added to new and/or existing apparatus to compliment existing capabilities. CVA is less complex than conventional techniques, and requires less computer processing capacity, yet results in more readily interpretable results.