Patents Examined by Carol S. W. Tsai
  • Patent number: 7020571
    Abstract: An automated test method for performing a hi-pot test procedure for an electrical device through the use of a test program installed in a factory information system (FIS) and a test instrument connected to the FIS. The test program sends a control command to the test instrument that in turn executes the hi-pot test for the electrical device. Test results are obtained by the test program from the test instrument and sent to the FIS. The test results are stored in the FIS for future reference.
    Type: Grant
    Filed: November 25, 2003
    Date of Patent: March 28, 2006
    Assignee: Inventec Corporation
    Inventor: Yung-Chien Lee
  • Patent number: 7020567
    Abstract: The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to measure a signal propagation delay through an object connected to an optoelectronic device. The present invention includes determining for how long after a specific bit or bit group is transmitted by an optical transceiver the bit or bit group is received at the other end of the object connected to the optical transceiver.
    Type: Grant
    Filed: October 28, 2003
    Date of Patent: March 28, 2006
    Assignee: Finisar Corporation
    Inventors: Alex Fishman, Serguei Dorofeev, Dmitri Bannikov, Robert Lee Fennelly, Andreas Weber, Subra Nagarajan
  • Patent number: 7020578
    Abstract: A method of evaluating novel stroke treatments includes generating a risk map indicative of the probability of tissue infarction on voxel-by-voxel basis and selecting a probability range for evaluating the therapeutic effect of the novel treatment. In one particular embodiment, tissue having a fifty percent probability of tissue infarction is selected. A novel treatment that has a reduced level of overall actual infarction as compared to the predicted value is indicative of therapeutic effect.
    Type: Grant
    Filed: February 2, 2001
    Date of Patent: March 28, 2006
    Assignee: The General Hospital Corporation
    Inventors: Gregory A. Sorensen, Ona Wu
  • Patent number: 7016790
    Abstract: An in-line hot-wire sensor for monitoring the mixing and the flow rate of slurry is disclosed. The hot-wire sensor may include a number of resistors organized into a Wheatstone bridge, as well as a frequency-domain transform mechanism. The resistors include a hot-wire resistor that is placed in-line with the slurry after substances have been mixed to become the slurry. The Wheatstone bridge thus yields a signal that is transformed to the frequency domain by the frequency-domain transform mechanism, such as by performing a Fast Fourier Transform (FFT) of the signal. The frequency-domain transform is used to monitor the mixing of the substances into the slurry, and the flow rate of the slurry. The signal may be amplified prior to transformation to the frequency domain.
    Type: Grant
    Filed: October 23, 2002
    Date of Patent: March 21, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Tung-Ching Tseng, Li-Jia Yang
  • Patent number: 7016812
    Abstract: An intelligent sensor device and a method for controlling an intelligent sensor device are provided. In one example, the sensor device includes a memory; a radio frequency communicator configured to receive signals from and transmit signals to an external device having an external application; a radio frequency controller configured to control the radio frequency communicator; a processor; a process controller configured to instruct the processor to load one or more scripts into the memory; one or more sensors; and a sensor driver controller configured to activate one or more appropriate sensors based on a request received from the external application, wherein the process controller is further configured to instruct the processor to execute an appropriate script based on the request received from the external application.
    Type: Grant
    Filed: November 7, 2003
    Date of Patent: March 21, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Toshiyuki Aritsuka, Kei Suzuki
  • Patent number: 7016805
    Abstract: A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.
    Type: Grant
    Filed: December 14, 2001
    Date of Patent: March 21, 2006
    Assignee: Wavecrest Corporation
    Inventors: Jie Sun, Peng Li, Jan Brian Wilstrup
  • Patent number: 7013243
    Abstract: Since a multiplexed signal quality display system according to the present invention is provided with a memory means which stores measurement results obtained by measuring electric powers of signals present in all of channels within a band used and a display means which specifies a channel where the presence of a signal is predicted and which reads and displays the measured value of the specified channel, it is possible to display the waveform quality of a channel which is determined by desired Walsh code and Walsh code length.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: March 14, 2006
    Assignee: Advantest Corporation
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Patent number: 7013241
    Abstract: In an electronic control unit having two computers, the first computer, which is an engine control microcomputer, performs multiple diagnoses and sends data regarding the diagnoses to the second computer, which is a throttle control microcomputer. The data includes a transmission ID, a calculated value and a reference value. The throttle control microcomputer directly monitors completion of the diagnoses based on the data.
    Type: Grant
    Filed: January 22, 2004
    Date of Patent: March 14, 2006
    Assignee: DENSO Corporation
    Inventor: Fujiki Yamada
  • Patent number: 7010442
    Abstract: Systems and methods for implementing user input are provided. One such method includes: receiving a first user input provided via a first component of a pointing device, moving a cursor displayed on a display device responsive to the first user input, receiving a second user input provided by rotating a second component of the pointing device, and modifying an item corresponding to a current location of the cursor.
    Type: Grant
    Filed: August 7, 2003
    Date of Patent: March 7, 2006
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael R. Fender
  • Patent number: 7010437
    Abstract: Electric utility storm outage management is performed by determining an interconnection model of an electric utility power circuit, the power circuit comprising power circuit components, determining information indicative of weather susceptibility of the power circuit components, determining a weather prediction, and determining a predicted maintenance parameter based on the interconnection model, the weather susceptibility information, and the weather prediction.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: March 7, 2006
    Assignee: ABB Research Ltd.
    Inventors: David Lubkeman, Danny E. Julian, Martin Bass, J. Rafael Ochoa
  • Patent number: 7010464
    Abstract: A mobile testing apparatus, method, and computer product that performs high speed testing of mobile pressure devices using high speed totalization, where testing of multiple devices may be done concurrently. Test results are communicated to a central console using a variety of communication methods, including wireless, and the testing apparatus and method is robust and reliable despite the occurrence of transient communication failures, because the test apparatus and method may operate independently of central control.
    Type: Grant
    Filed: July 11, 2002
    Date of Patent: March 7, 2006
    Assignee: Schneider Automation Inc.
    Inventors: John L. Kuzala, Mark E. Wertham, Robert J. Bell, Paul G. Horvath
  • Patent number: 7006928
    Abstract: The invention relates to a novel device for determining the physical and chemical stability of substances and formulations by means of samples. Said device is provided with a vibration spectrometer, a container (1) for storing the samples in controlled conditions, a robot (10) for transporting the samples between the vibration spectrometer (12) and the container, and a computer (13) for controlling the processes and for automatically storing and evaluating the spectra of the samples received by the vibration spectrometer.
    Type: Grant
    Filed: June 8, 2002
    Date of Patent: February 28, 2006
    Assignee: RPD Tool AG
    Inventors: Beat Federer, Markus Roggli, Martin Roth
  • Patent number: 7006935
    Abstract: A synchronous vector measuring device can measure an absolute phase angle of a synchronous vector excellent in continuous numerical stability at high speed and with high accuracy in a noisy electric power system. A voltage measuring part measures the voltage of the electric power system at a period equal to 1/4N (N being a positive integer) of one period of a reference wave. A voltage root-mean-square value calculation part calculates, at each voltage measuring timing, a voltage root-mean-square value at a specific timing from the voltages measured at past 4N timings including the specific timing. An absolute phase angle calculation part makes, at each voltage measuring timing, an inverse cosine of a value obtained by dividing the voltage measured at the specific timing by the product of the voltage root-mean-square value and the square root of 2, as the absolute phase angle of the synchronous vector at the specific timing.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: February 28, 2006
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Kempei Seki
  • Patent number: 7006948
    Abstract: A method for use in a system for diagnosing the causes of manufacturing defects involves process characterization. A set of forms is identified for a workpiece and for a piece of manufacturing equipment that acts upon the workpiece. The forms for the workpiece are preferably a hierarchic set of geometric forms. Each such geometric form corresponds to an aspect of the action of the manufacturing equipment upon the workpiece. A plurality of measurements is made on a defective workpiece following the hierarchical order of forms. The measurements are compared to a reference datum, and a deviation from the datum is computed. If the deviation exceeds a preselected threshold, an alert condition results, attributable to the action of the manufacturing equipment. Targeted adjustment corresponding to the action that caused the defect can then be made to the equipment.
    Type: Grant
    Filed: November 23, 2004
    Date of Patent: February 28, 2006
    Assignee: Red X Holdings LLC
    Inventor: John R. Allen
  • Patent number: 7006940
    Abstract: A method and system are provided for testing a first integrated circuit chip which is packaged along with at least a second integrated circuit chip in a semiconductor device, wherein at least some external terminals for the semiconductor device are shared by the first and second integrated circuit chips. The method and system include: powering down the second integrated circuit chip; tri-stating a plurality of input/output (I/O) drivers of the second integrated circuit chip so that the plurality of I/O drivers do not drive any signals onto any connections for the shared external terminals; and performing testing of the first integrated circuit chip according to one or more regular testing routines.
    Type: Grant
    Filed: October 3, 2003
    Date of Patent: February 28, 2006
    Assignee: Inapac Technology, Inc.
    Inventor: Adrian E. Ong
  • Patent number: 7003430
    Abstract: A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, and obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices. Additionally, the method includes performing a first statistical analysis, determining a first statistical distribution, performing a second statistical analysis, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.
    Type: Grant
    Filed: June 29, 2004
    Date of Patent: February 21, 2006
    Assignee: Semiconductor Manufacturing International (Shanghai) Corporation
    Inventors: Eugene Wang, Jinghua Ni
  • Patent number: 7003402
    Abstract: A method of processing data sequences obtained at substantially the same time at locations spatially separated from one another is disclosed. A sequence indicative of a measure of spread of the data sequences or of selected data sequences is determined. A common signal data sequence may also be determined from the (selected) data sequences. The measure of spread of the data sequences is preferably normalized, for example relative to the absolute value of the common signal data sequence. The measure of spread is a measure of the noise to signal ratio in the initially-obtained data sequences. It may be used to control the parameters of other processing steps performed on the data sequences. Alternatively or additionally, the measure of spread may be output, for example for monitoring by an observer. The method can be applied to the processing of seismic data obtained using a single sensor seismic data acquisition system.
    Type: Grant
    Filed: June 17, 2002
    Date of Patent: February 21, 2006
    Assignee: WesternGeco, L.L.C.
    Inventors: Philip Christie, Anthony D. Curtis
  • Patent number: 7003410
    Abstract: An electronic battery tester for testing a storage battery determines a condition of the battery. The condition is a relative condition and is a function of a dynamic parameter of the battery and an empirical input variable.
    Type: Grant
    Filed: June 17, 2004
    Date of Patent: February 21, 2006
    Assignee: Midtronics, Inc.
    Inventors: Kevin I. Bertness, J. David Vonderhaar
  • Patent number: 6999888
    Abstract: An apparatus and method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1–4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: February 14, 2006
    Assignee: Intel Corporation
    Inventors: Thomas A. Repko, Frank W. Joyce, Teik Sean Toh, Douglas P. Kreager
  • Patent number: 6999904
    Abstract: A variable indication estimator which determines an output value representative of a set of input data. For example, the estimator can reduce input data to estimates of a desired signal, select a time, and determine an output value from the estimates and the time. In one embodiment, the time is selected using one or more adjustable signal confidence parameters determine where along the estimates the output value will be computed. By varying the parameters, the characteristics of the output value are variable. For example, when input signal confidence is low, the parameters are adjusted so that the output value is a smoothed representation of the input signal. When input signal confidence is high, the parameters are adjusted so that the output value has a faster and more accurate response to the input signal.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: February 14, 2006
    Assignee: Masimo Corporation
    Inventors: Walter M. Weber, Ammar Al-Ali, Lorenzo Cazzoll