Patents Examined by Carol S. W. Tsai
  • Method and system of dynamic learning through a regression-based library generation process
    Patent number: 6961679
    Abstract: The present invention relates to a method and system for efficiently determining grating profiles using dynamic learning in a library generation process. The present invention also relates to a method and system for searching and matching trial grating profiles to determine shape, profile, and spectrum data information associated with an actual grating profile.
    Type: Grant
    Filed: May 27, 2004
    Date of Patent: November 1, 2005
    Assignee: Timbre Technologies, Inc.
    Inventors: Xinhui Niu, Nickhil Jakatdar
  • System and method for analysis of cache array test data
    Patent number: 6961674
    Abstract: One embodiment of a method for analysis of cache array test data comprises retrieving test results for a current period of time for a first plurality of storage elements and for a historical period of time for a second plurality of storage elements; determining a plurality of attributes for each of the first storage elements and the second storage elements based upon the test results, the attributes comprising one of a good condition, a defective condition, a repairable condition and a repaired condition; determining a plurality of attribute statistics corresponding to the attributes of the first storage elements and the second storage elements; and generating an output report indicating at least two of the attribute statistics of the first storage elements and the second storage elements.
    Type: Grant
    Filed: August 11, 2003
    Date of Patent: November 1, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Elias Gedamu, Denise Man
  • Digital protection and control device
    Patent number: 6954704
    Abstract: A digital protection and control device is so configured that at least parts of a digital data merging unit coupled to sensor units by a transmission medium, a protection and control unit, a communication unit for component control devices coupled to component control devices by a transmission medium, and a process bus communication unit are coupled by a parallel transmission medium, and at least a part of data exchange is based on a multimaster mode. Transmission based on the multimaster mode enables each unit to transmit/receive data independently and enables the reduction in unbalanced communication load. As a result, such a risk can be reduced that time responsiveness of operation is lowered as the entire digital protection and control device due to unbalanced concentration of data bus processing in a particular unit.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: October 11, 2005
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yuuji Minami, Noriyoshi Suga, Hiromi Nagasaki, Masayuki Kosakada
  • Device for determining and/or monitoring a process variable
    Patent number: 6954717
    Abstract: The invention relates to a device for determining and/or monitoring a process variable. The aim of the invention is to provide a cost-effective, user-friendly device for determining and/or monitoring a process variable. The inventive device comprises the following elements: a sensor, a measuring/regulating/control unit which pre-defines at least one event to be determined or monitored, and at least one memory unit which stores data according to the at least one pre-defined event. The sensor, the measuring/regulating/control unit and the memory unit form a compact unit or an independent field appliance.
    Type: Grant
    Filed: October 20, 2001
    Date of Patent: October 11, 2005
    Assignee: Endress + Hauser GmbH + Co. KG
    Inventors: Matthias Boldt, Frank Erdmann, Klaus Pankratz, Bert Von Stein, Dietmar Spanke
  • Method for measuring integrated circuit processor power demand and associated system
    Patent number: 6954706
    Abstract: A system and method for measuring integrated circuit processor power demand comprises calibrating one or more voltage controlled oscillators for use as ammeters, calibrating a calibration current source, wherein the calibration current source draws current through a inherent resistance, calibrating the inherent resistance, and interleaving said calibrations in time with calculating the processor power demand using a voltage that is measured across the inherent resistance.
    Type: Grant
    Filed: August 20, 2003
    Date of Patent: October 11, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Christopher A. Poirier, Samuel D. Naffziger, Christopher J. Bostak
  • Gas monitoring system and sidestream gas measurement system adapted to communicate with a mainstream gas measurement system
    Patent number: 6954702
    Abstract: A method and apparatus for interfacing a plurality of gas measurement systems, including a mainstream and a sidestream gas measurement system, to a host system via an interface unit. The present invention also pertains to a sidestream gas measurement system that output signals emulating the signals output by a mainstream gas measurement system or portion thereof, so that the sidestream gas measurement system can seamlessly communicate with a host system configured to communicate only a mainstream gas measurement system or a portion thereof.
    Type: Grant
    Filed: February 18, 2004
    Date of Patent: October 11, 2005
    Assignee: RIC Investments, Inc.
    Inventors: Anthony T. Pierry, David R. Rich
  • User defined processing function
    Patent number: 6952655
    Abstract: A method and apparatus for defining, configuring and performing a custom processing function in a digital oscilloscope. The custom processing function is programmed by the operator using a programming language. The custom function may be linked/chained with other processing functions using a graphical editor. Although the custom processing function may process data offline as in related art systems, the present invention's custom processing function may be inserted/embedded directly into the data processing stream of the digital oscilloscope, thereby processing the data on-line.
    Type: Grant
    Filed: December 9, 2002
    Date of Patent: October 4, 2005
    Assignee: Lecroy Corporation
    Inventors: Anthony R. Cake, Thierry Campiche
  • Database interpolation method for optical measurement of diffractive microstructures
    Patent number: 6950780
    Abstract: A database interpolation method is used to rapidly calculate a predicted optical response characteristic of a diffractive microstructure as part of a real-time optical measurement process. The interpolated optical response is a continuous and (in a preferred embodiment) smooth function of measurement parameters, and it matches the theoretically-calculated optical response at the database-stored interpolation points.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: September 27, 2005
    Assignee: Tokyo Electron Limited
    Inventors: Kenneth C. Johnson, Fred E. Stanke
  • Method and related system for semiconductor equipment prevention maintenance management
    Patent number: 6950783
    Abstract: A method and related system for semiconductor equipment prevention maintenance management. The method includes recording process parameters of each piece of equipment, recording equipment parameters when each piece of equipment is processing, evaluating and recording time and cost of prevention maintenance after each piece of equipment runs prevention maintenance, evaluating the quality of semiconductor products, and analyzing a relationship between the corresponding process parameter, the corresponding equipment parameters, prevention maintenance cost, and semiconductor products of each piece of equipment.
    Type: Grant
    Filed: March 11, 2004
    Date of Patent: September 27, 2005
    Assignee: Powerchip Semiconductor Corp.
    Inventors: Hung-En Tai, Chien-Chung Chen, Sheng-Jen Wang
  • Method and apparatus for calibration of a delay element
    Patent number: 6950770
    Abstract: Various methods, systems and apparatuses having an integrated circuit that contains a calibration circuit having a series of delay elements to receive a reference signal. The reference signal establishes a standard unit of time. The calibration circuit also generates one or more calibrated delay signals derived from the reference signal. The one or more calibrated delay signals are precise to a known fraction of the standard unit of time.
    Type: Grant
    Filed: September 25, 2002
    Date of Patent: September 27, 2005
    Assignee: Intel Corporation
    Inventors: Gregory C. Parrish, Subrata Mandal
  • Neural network model for electric submersible pump system
    Patent number: 6947870
    Abstract: An apparatus and method is disclosed for modeling an electric submersible pump using a neural network, data from a deterministic model, and, optionally, data obtained from a real world electric submersible pump. It is emphasized that this abstract is provided to comply with the rules requiring an abstract which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
    Type: Grant
    Filed: August 18, 2003
    Date of Patent: September 20, 2005
    Assignee: Baker Hughes Incorporated
    Inventors: Dehao Zhu, Alex Crossley
  • Method and device for detecting a signal
    Patent number: 6947856
    Abstract: Method for detecting a signal, particularly a voltage, for example a battery voltage, having the following steps: measuring the signal and/or the battery voltage at a predefined sampling rate, storing the measured measurement values in a buffer memory, and forming a median value of the stored measurement values in a time-slot pattern slower than the sampling rate to obtain an averaged value.
    Type: Grant
    Filed: February 12, 2002
    Date of Patent: September 20, 2005
    Assignee: Robert Bosch GmbH
    Inventors: Christof Hammel, Juergen Biester
  • Circuits and methods for current measurements referred to a precision impedance
    Patent number: 6944556
    Abstract: Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.
    Type: Grant
    Filed: November 1, 2001
    Date of Patent: September 13, 2005
    Assignee: Linear Technology Corporation
    Inventor: Steven D. Roach
  • Methods and apparatus for optimizing the masking of waveforms to reduce the number of waveforms in a list of waveforms
    Patent number: 6944558
    Abstract: A list of waveforms is received (the list being one that is to be driven to or received from a pin of a device under test, and each waveform in the list being associated with a weight). For each of at least two waveforms in the list, a number of test sample points lost by masking the waveform with a particular parent waveform in a child-parent waveform map is calculated. The number of lost test sample points is determined by 1) a difference in the number of test sample points in the waveform and the number of test sample points in the particular parent waveform, and 2) the weight associated with the waveform. In response to the calculations, a waveform masking is implemented such that the implemented waveform masking results in fewer lost test sample points than another waveform masking.
    Type: Grant
    Filed: October 14, 2003
    Date of Patent: September 13, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Andrew Steven Hildebrant
  • Query based electronic battery tester
    Patent number: 6941234
    Abstract: An electronic battery tester for testing a storage battery provides a test output indicative of a condition of the battery. Electronic measurement circuitry provides a measurement output related to a condition of the battery. The battery condition is determined based upon one or more responses to one or more queries provided to an operator. The responses are used to determine battery type.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: September 6, 2005
    Assignee: Midtronics, Inc.
    Inventors: Kevin I. Bertness, Stephen J. McShane, Wilhelmus H. J. Koster
  • System for operating and observing making use of mobile equipment
    Patent number: 6941248
    Abstract: The invention relates to an operating and observation system, especially for an automation system, which is formed by at least one first operating and observation system having extensive functionality and a multiplicity of further operating and observation tools having limited functionality. The first operating and observation system having the extensive functionality is designed to be mobile, thereby doing away with mobility restrictions.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: September 6, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Wolfgang Friedrich, Wolfgang Wohlgemuth
  • Noise signal analysis apparatus, noise signal synthesis apparatus, noise signal analysis method and noise signal synthesis method
    Patent number: 6934650
    Abstract: FFT section 102 transforms a windowed input noise signal into a frequency spectrum. Spectral model storing section 103 stores model information on spectral models. Spectral model series calculating section 104 calculates spectral model number series corresponding to amplitude spectral series of the input noise signal, using the model information stored in spectral model storing section 103. Duration model/transition probability calculating section 105 outputs model parameters using the spectral model number series calculated in spectral model series calculating section 104. It is thereby possible to synthesize a background noise with perceptual high quality.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: August 23, 2005
    Assignee: Panasonic Mobile Communications Co., Ltd.
    Inventors: Koji Yoshida, Fumitada Itakura
  • Method and apparatus for analyzing multi-channel chromatogram
    Patent number: 6934638
    Abstract: A method for analyzing a multichannel chromatogram is realized for accurately resolving overlapping peaks on a multichannel chromatogram to permit analysis of the composition of a sample.
    Type: Grant
    Filed: April 4, 2002
    Date of Patent: August 23, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Masahito Ito, Kisaburo Deguchi
  • Human interface method and apparatus
    Patent number: 6931359
    Abstract: A method and apparatus for measuring one or more physical conditions of a computer operator and for automatically inputting signals corresponding to the physical conditions into a computer (12) for control and monitoring purposes.
    Type: Grant
    Filed: August 5, 2001
    Date of Patent: August 16, 2005
    Inventor: Ken Tamada
  • Method and apparatus for reduced pin count package connection verification
    Patent number: 6931346
    Abstract: A method and apparatus for testing the chip-to-package connectivity of a common I/O of a semiconductor chip is disclosed which uses reduced pin count testing methods. The method includes driving a test signal transition onto a control pad of a semiconductor chip with a weak driver and comparing the transition rise time with a threshold value. For an I/O with a faulty chip-to-package connection, the rise time is much faster than for an I/O with a completed chip-to-package connection. Additional impedances may also be added to the tester fixturing to increase the sensitivity of the test equipment to the capacitance of the I/O connections.
    Type: Grant
    Filed: December 30, 2003
    Date of Patent: August 16, 2005
    Assignee: International Business Machines Corporation
    Inventors: Michael L. Combs, Donald L. Wheater