Patents Examined by Carol S. W. Tsai
  • Patent number: 7260490
    Abstract: In a method and device measuring a delay time of a section of a digital circuit, an output signal of the section is saved in different memory locations with a clock and earlier by a time interval with respect to the clock, different durations being assigned to the time interval. The delay time is determined as a function of the greatest of the different durations during which a test proceeds in a positive manner. The test proceeds in a positive manner if the value saved with the clock corresponds with the value saved so as to be earlier by the corresponding time interval.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: August 21, 2007
    Assignee: Infineon Technologies, Inc.
    Inventor: Stefan Linz
  • Patent number: 7257495
    Abstract: A flow meter filter system (200) according to an embodiment of the invention includes a noise pass filter (203) configured to receive a first version of a flow meter signal and filter out the flow meter data from the flow meter signal to leave a noise signal, a noise quantifier (204) configured to receive the noise signal from the noise pass filter (203) and measure noise characteristics of the noise signal, a damping adjuster (205) configured to receive the noise characteristics from the noise quantifier (204) and generate a damping value based on the noise characteristics, and a filter element (206) configured to receive a second version of the flow meter signal and receive the damping value from the damping adjuster (205), with the filter element (206) being further configured to damp the second version of the flow meter signal based on the damping value in order to produce a filtered flow meter signal.
    Type: Grant
    Filed: September 5, 2003
    Date of Patent: August 14, 2007
    Assignee: Micro Motion, Inc.
    Inventors: Andrew Timothy Patten, Denis M. Henrot, Craig B. McAnally, Paul J. Hays, Wayne R. Brinkman
  • Patent number: 7257516
    Abstract: A data processing system performs a multithreaded performance benchmark with a rampup interval and a rampdown interval. The master thread signals a start test event and begins the rampup interval. After the rampup interval, the master thread signals a start measurement event. In response to the start measurement event, the worker threads record the units of work they complete. After the measurement interval, the master signals the workers to stop measuring, but to continue running. This begins the rampdown interval. After the rampdown interval, the master thread signals a stop test event. The rampup and rampdown intervals are long enough to ensure that measurements are not recorded during skew intervals. Thus, thread skew does not impact the results.
    Type: Grant
    Filed: September 20, 2001
    Date of Patent: August 14, 2007
    Assignee: International Business Machines Corporation
    Inventors: Rajiv Arora, Jesse Mannes Gordon
  • Patent number: 7257497
    Abstract: An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift path to frequency shift the input signal and selectively couple the frequency-shifted input signal to the digitizer, the frequency shift path including a means for frequency shifting, an input switch to switch the input signal to one of the bypass path and the frequency shift path, and an output switch to provide the selected signal to the digitizer by selectively coupling an output of one of the frequency shift path and the bypass path to the digitizer.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: August 14, 2007
    Assignee: Tektronix, Inc.
    Inventor: John J. Pickerd
  • Patent number: 7254519
    Abstract: Provided are systems and methods for multi-channel non-destructive inspection which provide high data throughput, logarithmic amplification of large dynamic range, and simplicity of supporting electronics. More specifically, provided are systems and methods for inspecting a structure that may use an interface board, two pulser boards, each coupled to 16 transmit channels, and two receiver boards, each coupled to 16 receive channels, where the receiver boards are capable of processing data from the 32 receive channels by logarithmically amplifying at least 70 dB of dynamic range. A receiver board may include a serial connection of two layers of multiplexing switches to provide 70 dB isolation between channels, a logarithmic amplifier for logarithmically amplifying 70 dB of dynamic range, a linear amplifier, and an analog-to-digital converter.
    Type: Grant
    Filed: September 24, 2004
    Date of Patent: August 7, 2007
    Assignee: The Boeing Company
    Inventor: Barry A. Fetzer
  • Patent number: 7254518
    Abstract: In one embodiment, a pressure transmitter is provided which diagnoses the condition of a primary element and/or an impulse line which connects to a pressure sensor. A difference circuit coupled to the pressure sensor has a difference output which represents the sensed pressure minus a moving average. A calculate circuit receives the difference output and calculates a trained output of historical data obtained during an initial training time. The calculate circuit also calculates a monitor output of current data obtained during monitoring or normal operation of the transmitter. A diagnostic circuit receives the trained output and the monitor output and generates a diagnostic output indicating a current condition.
    Type: Grant
    Filed: March 15, 2004
    Date of Patent: August 7, 2007
    Assignee: Rosemount Inc.
    Inventors: Evren Eryurek, Kadir Kavaklioglu
  • Patent number: 7254505
    Abstract: A delay line (DL) circuit used to generate test pattern waveforms has a pulse generating circuit that is used during calibration to generate a pulse signal upon receiving a signal edge. A delay line of the DL circuit receives the pulse signal and delays the pulse signal by a selected time delay. A feedback loop of the DL circuit feeds the delayed pulse signal output from the delay line back to the input of the pulse generating circuit. Receipt of an edge of the fed back pulse signal at the input of the pulse generating circuit causes the pulse generating circuit to generate another pulse signal. The delayed pulse signal output from the delay line can be input to a counter that generates a counter value that is based on the period of oscillation of the delayed pulse signal.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: August 7, 2007
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Ronnie E. Owens, Theodore G. Rossin, Larry S. Metz
  • Patent number: 7251578
    Abstract: Data quality measurement is provided for use in a data processing stream, which comprises at least one upstream data processing system and at least one downstream data processing system. An input alert component can be used to provide a measurement of data prior to its input to a data processing system (e.g., a downstream data processing system or an upstream data processing system). An output alert component can be used to provide a measurement on data output by a data processing system. A self-consistency component can be used to measure consistency between items of input, or output data. An end-to-end component can be used to measure data quality using data items from both input data and output data. These components can be used in some combination, or independent of the other, and in any order. In addition, the data quality measurements can be performed separate from that processing performed by either the upstream or downstream processing system.
    Type: Grant
    Filed: March 10, 2006
    Date of Patent: July 31, 2007
    Assignee: Yahoo! Inc.
    Inventors: Peiji Chen, Long-Ji Lin, Jagannatha Narayanareddy
  • Patent number: 7248985
    Abstract: A method for testing a unit is described where the unit includes one or more of electrical, electronic, mechanical, and electromechanical components. The described method includes applying at least one stimulus to the unit, receiving sound emissions from the unit, converting the sound emissions into one or more acoustic signatures, comparing the acoustic signatures based on the received emissions to stored acoustic signatures expected as a result of the at least one stimulus, and determining a status for the unit based on the comparisons.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: July 24, 2007
    Assignee: Honeywell International Inc.
    Inventors: Michael D. Dwyer, Albert L. West, Dean R. Hellickson
  • Patent number: 7248992
    Abstract: A computerized method is disclosed for determining the size and location effects of simulated or manufactured features on an object, determining the transformation of a pattern of features, determining usable feature size within a pattern of features, and determining the remaining feature tolerances. The simulated or manufactured position of a pattern of features is used to determine how to translate a tolerance zone framework. Positional errors and remaining feature tolerances are determined relative to the translated design framework.
    Type: Grant
    Filed: October 13, 2005
    Date of Patent: July 24, 2007
    Assignee: The Boeing Company
    Inventor: Bruce A. Wilson
  • Patent number: 7248987
    Abstract: A signal processing system for a sensor for judging whether an event to be detected has occurred on the basis of a frequency of a sensor output includes a converting device for converting the sensor output into a square wave, a presuming device for presuming whether the frequency of the sensor output is lower than a predetermined frequency referred for judging whether the event to be detected has occurred on the basis of an output from the converting device, and a judging device for judging whether the event to be detected has occurred on the basis of an output from the presuming device.
    Type: Grant
    Filed: September 20, 2005
    Date of Patent: July 24, 2007
    Assignee: Aisin Seiki Kabushiki Kaisha
    Inventor: Takehiko Sugiura
  • Patent number: 7246016
    Abstract: Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: July 17, 2007
    Assignee: Linear Technology Corporation
    Inventor: Steven D Roach
  • Patent number: 7246013
    Abstract: A data processor for analyzing chromatograms in detail and collecting analysis-associated information necessary for verification of data validity throughout an analysis process. The data processor includes a first data collecting section which collects and records a detector output at every data sampling rate T1 for each sample injection, and a second data collecting section which collects and records the detector output and a monitor output indicating an analysis-associated condition at every data sampling rate T2 over a period from the start to the end of the chromatographic analysis; the data sampling rate T1 is shorter than the data sampling rate T2.
    Type: Grant
    Filed: January 23, 2006
    Date of Patent: July 17, 2007
    Assignee: Tosoh Corporation
    Inventors: Shunji Fukuya, Genichi Uematsu
  • Patent number: 7246037
    Abstract: A malfunction management unit (MMU) includes advanced diagnostic and set-up capabilities accessed through a display-based user interface. In general, the MMU is capable of displaying (1) monitor status information, wherein the monitor status information includes information relating to the status of at least a portion of the input signals; and (2) diagnostic information, wherein the diagnostic information includes an indication of fault type, and indication of faulty signals, and troubleshooting information associated with said fault type and relevant faulty signals. The diagnostic information includes a textual interpretation of the results of a field check analysis.
    Type: Grant
    Filed: July 19, 2005
    Date of Patent: July 17, 2007
    Assignee: Eberle Design, Inc.
    Inventor: Scott Evans
  • Patent number: 7243033
    Abstract: An inspection apparatus inspects an inspected object based on a waveform quality of a signal that the inspected object outputs. The inspection apparatus has a power supply section which outputs a control signal that controls an output of the inspected object, a waveform measuring section which measures the signal that the inspected object outputs to generate a waveform image, an analyzing section which derives a value indicating a waveform quality from the waveform image that the waveform measuring section measures, a deciding section which decides whether or not the value derived by the analyzing section satisfies a target value, and an optimizing section which changes a set value of the control signal that the power supply section outputs, based on a decision result of the deciding section.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: July 10, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Chie Sato, Yusuke Kishine, Tetsuya Ohtani, Minoru Akutsu, Hiroshi Sugawara, Akira Toyama, Hirotoshi Kodaka, Katsuya Ikezawa, Shinji Kobayashi, Akira Miura
  • Patent number: 7243045
    Abstract: A failure diagnosis method diagnoses failure occurring in an image forming apparatus. The failure causes defect in an image output from the image forming apparatus. The failure diagnosis method includes acquiring operation state signals indicating operation states during the image forming apparatus operating in different operation conditions, respectively; and analyzing the acquired operation state signals based on a failure probability model, which is obtained by modeling a cause of the failure occurring in the image forming apparatus with using probabilities, to execute failure diagnosis with respect to each of constituent members constituting the image forming apparatus.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: July 10, 2007
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Kouki Uwatoko, Kouji Adachi, Kaoru Yasukawa, Norikazu Yamada, Eigo Nakagawa, Tetsuichi Satonaga
  • Patent number: 7243037
    Abstract: A signal processing device is provided that includes a modulation unit that produces an amplitude element as well as a phase element from components that are applied thereto. A correction device is also provided, in which at least one of the components is supplied and is compared with an ideal nominal value. This is used to produce a correction factor, which is multiplied by the component which has been compared with the nominal value. The correction factor determined is used to correct any offset or distortion of the components produced by analog circuits.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: July 10, 2007
    Assignee: Infineon Technologies AG
    Inventors: Thorsten Tracht, Günter Märzinger, Timo Gossmann
  • Patent number: 7239973
    Abstract: For testing of the appliance, a test adapter is used as an interface, which is inserted into the smart card reader of the appliance. Advantageously, a contact of the smart card reader is used for testing of the appliance, which is not used by the appliance, when operating with a smart card. One of the contacts used for testing of the appliance is in particularly the contact for the programming voltage VPP according to the ISO/IEC 7816-3:1997(E) standard. In a preferred embodiment, the test adapter comprises a serial adapter interface to a RS232 plug, which is coupled to a computer for testing of the appliance. This allows to use the XON/XOFF protocol via two data lines for testing of the appliance. The electronics part of the test adapter is powered via the smart card reader interface, when the test adapter is inserted into the smart card reader of the appliance. The appliance is especially a set-top box or a digital satellite receiver.
    Type: Grant
    Filed: July 5, 2003
    Date of Patent: July 3, 2007
    Assignee: Thomson Licensing
    Inventors: Christian Schahl, Jean-Pierre Bertin, Claude Rambault, Jean-Michel Boulben
  • Patent number: 7239969
    Abstract: A system and related method for generating a test signal with controllable amounts of signal jitter includes a pattern generator, a programmable arbitrary waveform generator (AWG) and a phase modulator. The pattern generator is configured to generate a data signal characterized by a given data pattern, bit rate and pattern length. A trigger signal representative of initial timing information associated with the data signal is provided to the AWG which subsequently generates a modulation signal with a frequency equal to the bit rate divided by the pattern length of the data signal. This modulation signal is provided to the phase modulator, along with a reference clock signal, and the phase modulator generates a modulated clock signal controlled by a phase modulation means (e.g., a controllable delay line) fed by the modulation signal.
    Type: Grant
    Filed: November 9, 2004
    Date of Patent: July 3, 2007
    Assignee: Guide Technology, Inc.
    Inventors: Sassan Tabatabaei, Michael Lee, Mordechai Ben-Zeev
  • Patent number: 7239966
    Abstract: A system for automating experimentation is disclosed. The system comprises an automated experimentation platform (AEP) for automating research, development, and engineering experimentation processes and work and a generalized exchange module (GEM) for automating data exchanges between the AEP and external software applications, devices, or the instrument control programs (ICPs) controlling the devices; a generalization of the exchange module enables all automated data exchanges to be generic. Through the use of the automated experimentation platform (AEP) and the generalized exchange module (GEM), the automation can be adapted to any targeted external software application, device or a devices' controlling software program.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: July 3, 2007
    Assignee: S-Matrix
    Inventors: George A. Cooney, Jr., Richard P. Verseput