Abstract: Wire probes are described that resist rotation during assembly into a probe head of a die tester. One example includes probe wires with a protrusion at a pre-determined position along the length of the wire. A probe substrate with pads on one side each to attach to and electrically connect with a probe wire and a pads on the opposite side to connect to test equipment and a probe holder above the substrate with holes. Each hole holds a respective one of the probe wires against the probe substrate. Each hole also has a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire.

Abstract: Some embodiments relate to a method for semiconductor processing. In this method, a semiconductor wafer is provided. A surface region of the semiconductor wafer is probed to determine whether excess charge is present on the surface region. Based on whether excess charge is present, selectively inducing a corona discharge to reduce the excess charge. Other techniques are also provided.

Abstract: A system reads a desired circuit parameter from a pixel circuit that includes a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal. One embodiment of the extraction system turns off the drive device and supplies a predetermined voltage from an external source to the light emitting device, discharges the light emitting device until the light emitting device turns off, and then reads the voltage on the light emitting device while that device is turned off. The voltages on the light emitting devices in a plurality of pixel circuits may be read via the same external line, at different times. In-pixel, charge-based compensation schemes are also discussed, which can be used with the external parameter extraction implementations.

Abstract: A structure for TDDB measurement, a method determining TDDB at reduced spacings. The structure includes an upper dielectric layer on a top surface of a lower dielectric layer, a bottom surface of the upper dielectric layer and the top surface of the lower dielectric layer defining an interface; a first wire formed in the lower dielectric layer; a second wire formed in the upper dielectric layer; and wherein a distance between the first wire and the second wire measured in a direction parallel to the interface is below the lithographic resolution limit of the fabrication technology.

Abstract: Some embodiments relate to a controlled field alternator where the alternator is wired in a low wye configuration (coils wired in series or parallel). The first sensor measures the direct current flowing through the field within the alternator to detect an excitation level of a field within the alternator. As examples, the first sensor may measure field voltage, magnetic field intensity, magnetic flux density, current to the field of a rotating exciter, voltage to the field of a rotating exciter and the duty cycle of a pulse width modulated signal that controls an on-board rectifier for a permanent magnet exciter. Embodiments are also contemplated where the second sensor measures the RMS output voltage of the alternator to determine the output characteristic of the alternator.

Abstract: A test board includes a first chip mounting area, a first input area, a second input area, a first output area, and a second output area. The test board also includes a first conductive pattern, a second conductive pattern, a third conductive pattern, and a fourth conductive pattern. The first conductive pattern electrically connects a first pin of the first input area and a first pin of the first chip mounting area. The second conductive pattern electrically connects a first pin of the second input area and a second pin of the first chip mounting area. The third conductive pattern electrically connects a first pin of the first output area and a third pin of the first chip mounting area. The fourth conductive pattern electrically connects a first pin of the second output area and a fourth pin of the first chip mounting area.

Abstract: A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms configured to facilitate the disengagement of the DUT at the end of the test. One example of the ejection mechanisms is to provide the substrate pusher assembly with spring-loaded pins that can push the substrate of the DUT away from the pedestal at the end of the test. Another example of the ejection mechanisms is to use a pressurized fluid that can push the substrate of the DUT away from the pedestal at the end of the test.

Abstract: An inspection apparatus includes a first tester and a second tester each of which tests a substrate loaded therein, a first stage on which the first tester is mounted, the first stage being movable to a first loading and unloading position and a first test position, the first test position being provided above the first loading and unloading position, a second stage on which the second tester is mounted, the second stage being provided below the first stage and being movable to a second loading and unloading position and a second test position, the second test position being provided below the second loading and unloading position, and a lift mechanism that moves the first stage up and down to the first loading and unloading position and the first test position and moves the second stage up and down to the second loading and unloading position and the second test position.

Abstract: A slip ring includes an exterior, a plurality of brushes, a plurality of rings, a brush fixing member that causes the plurality of brushes to contact the plurality of rings and supports the plurality of brushes, and a rotating shaft inserted into the plurality of rings and supports the plurality of rings. The slip ring also includes a reference signal generation unit configured to generate a reference signal, and a detection unit configured to detect a signal, wherein a circuit is formed by the reference signal generation unit, a first brush, which is at least one of the plurality of brushes, a first ring that contacts the first brush, and the detection unit, and wherein a state of contact of the first brush and the first ring is detected based on the signal detected by the detection unit.

Abstract: Provided is a detection apparatus that detects process variation in a plurality of comparators that each output a comparison result obtained by comparing a signal level of an input signal to a reference level, the detection apparatus comprising a signal input section that inputs the input signal and the reference level in common to the comparators, and sequentially changes the signal level of the input signal; and a detecting section that detects, for each signal level, a number of comparison results that indicate a predetermined result, from among the comparison results of the comparators, and detects the process variation based on a distribution of the number of comparison results that indicate the predetermined result.

Abstract: An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.

Abstract: An active matrix electrowetting on dielectric (AM-EWOD) device includes a plurality of array elements configured to manipulate one or more droplets of fluid on an array, each of the array elements including a corresponding array element circuit. Each array element circuit includes write circuitry configured to write data to the corresponding array element for controlling the manipulation of the droplets of fluid, and sensor circuitry configured to sense an impedance present at the corresponding array element. The sensor circuitry is configured to operate in one of a normal mode of sensitivity for detection of a droplet, or a high mode of sensitivity to detect an electric property of an array element hydrophobic surface. The sensor circuitry includes an active element, such as an active capacitor or active transistor, and a capacitance across the active element is different in the normal sensitivity mode as compared to the high sensitivity mode.

Abstract: The present device relates to a sensor capable of detecting changes in the electromagnetic field it generates when in proximity to either conductive or nonconductive materials. This occurs by way of oscillating a transmit coil with an electro motive force at a resonant frequency thus creating an electromagnetic field. The magnetic field passes through a target of either conductive or nonconductive material and is then intercepted by a receive coil which likewise oscillates at a resonant frequency, which when in proximity to the transmit coil and transmit coils resonant frequency produces an enhanced signal by way of the interaction of the respective resonant frequencies and receive coil output.

Abstract: An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.

Abstract: A dielectric constant measurement circuit includes a dielectric constant sensor, an oscillator controlling circuit, a waveform converting circuit, and a counting readout circuit. The oscillator controlling circuit generates an oscillation waveform according to the response of the dielectric constant sensor to a dielectric material. The waveform converting circuit converts the oscillation waveform into frequency division square waves. The counting readout circuit includes a switching counter, a switching circuit, a reference current source, and a current integrator.

Abstract: A sensing device exhibits a tunneling magneto-resistive (TMR) effect, and changes electrical resistance in response to a magnetic field. A first current carrying conductor is positioned in proximity to the TMR sensing device, such that upon an application of a sufficient current, a magnetic field is generated. The magnetic field is sufficiently strong and properly oriented so as to cause a magnetization of a soft magnetic layer of the TMR sensing device, thereby causing a change of the TMR sensing device from one bi-stable state to another bi-stable state.

Abstract: A rotational position sensing device for sensing rotation of an axially adjustable shaft of a shaft and arm assembly of a door that does not require readjustment after the shaft and arm assembly are adjusted includes a fixed bracket supporting a post, a position sensor having an upper portion, a lower portion and an extended portion, and a rotating portion. The extended portion extends from the upper portion of the position sensor and constrains the post of the bracket such that the upper portion of the position sensor is unable to axially rotate relative to the bracket. The rotating section is adapted to be fixed to the shaft and engage with the lower portion of the position sensor, such that the rotating portion rotates relative to the upper portion of the position sensor.

Abstract: A method and apparatus are provided for off-line testing of a multi-phase alternating current machine. A method includes determining, at a first rotor position, a physical stator quantity of each stator winding by applying a test signal to each stator winding, and determining a first joint physical stator quantity by summing the determined physical stator quantities of the stator windings. A method includes determining, at a second rotor position, a physical stator quantity of each stator winding by applying a test signal to each stator winding, determining a second joint physical stator quantity by summing the determined physical stator quantities of the stator windings, comparing the second joint physical stator quantity with a previously determined first joint physical stator quantity, and determining a fault condition of said multi-phase alternating current machine if the first joint physical stator quantity differs from the second joint physical stator quantity.

Abstract: The present invention provides an absolute encoder device, including: a permanent magnet including a first magnetic pattern (bipolar) and a second magnetic pattern (multipolar); a first magnetic sensor for detecting a magnetic field of the first magnetic pattern; a second magnetic sensor for detecting a magnetic field of the second magnetic pattern; and a signal processing circuit for calculating an absolute rotation angle of a rotation shaft based on output signals of the first and second magnetic sensors. The first and second magnetic sensors and the signal processing circuit are fixed to a single substrate. The first magnetic pattern is formed on a plane extending in a direction crossing an axial direction inside the permanent magnet, and the second magnetic pattern is formed on an outer peripheral surface of the permanent magnet.

Abstract: A pair of light shining electrical test leads, the pair using L.E.D. or other lights. The lights are showing to the test point of the electrical leads. The lights receive power from a battery. The lights may be turned off when not needed and turned on when the user is in locations of little or no light. When in locations of little or no light, the user shall use the lights to help determine electrical current while seeing better to avoid injuries.