Abstract: Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.

Abstract: A magnetic measurement device which measures coercivity and coercivity distribution in a microregion of a thin plate magnetic sample with high coercivity. A magnetic sample is applied with a magnetic field in a first direction and magnetized, a second magnetic field is applied in a direction opposite to the first, a measuring part scans the sample, measuring magnetic flux leakage due to remnant magnetization in the sample. The intensity of the second magnetic field is gradually increased while the measuring part repeats the measurement to obtain the second magnetic field wherein the magnitude of the leakage from the sample reaches the maximum level, and when a magnetic field equivalent to the coercivity is applied to the sample and about half of the magnetization is reversed, the sample's coercivity is obtained based on the determination that the demagnetizing field Hd reaches the minimum level and the leakage reaches the maximum level.

Abstract: An ionization vacuum gauge includes a cathode, an anode and an ion collector. The ion collector component is located at one side of the anode component and spaced from the anode component. The cathode component is located at another side of the anode component and includes an electron emitter, which extends toward the anode component from the cathode component. The electron emitter includes at least one carbon nanotube wire.

Abstract: A component for conducting or receiving a fluid, in particular a component of a fluid-conducting line system of an industrial plant, especially of a line system of a tertiary cooling circuit of a nuclear power plant, includes a wall having a supporting structure made of a glass-fiber-reinforced plastic. Electrically insulating inner and outer protective layers are disposed on respective inner and outer surfaces of the supporting structure. An electrically conductive inner intermediate layer lies between the inner protective layer and the supporting structure and is provided with an electrical terminal. An electrically conductive outer intermediate layer lies between the outer protective layer and the supporting structure, is provided with an electrical terminal and is electrically insulated from the inner intermediate layer. A method for testing the component is also provided.

Abstract: A device for detecting a phase boundary in a liquid tank a sensor that can be advanced in the direction of the phase boundary in the liquid tank. A circuit processes an output signal of the sensor to detect a change in capacitance and has a first channel with a first filter module to filter out a first signal having a short pulse width from the output signal and a second channel having a second filter module to filter out a second signal having a greater pulse width from the output signal. A controller module with comparator module determines whether the first signal reaches a first threshold value and a processing module determines whether the second signal meets predefined second signal criteria.

Abstract: A method and structure are provided for implementing low temperature wafer testing of a completed wafer. A coolant gel is applied to the completed wafer, the gel coated wafer is cooled and one or more electrical test probes are applied through the gel to electrical contacts of the cooled wafer, and testing is performed.

Abstract: In one embodiment, a sample is tested by an eddy current sensor at two distances separated by a known incremental distance. In one aspect, at least one of an unknown distance of the sensor from the test sample and the film thickness of the test sample may be determined as a function of a comparison of sensor output levels of a single parameter and the known incremental distance to calibration data. In yet another aspect, the distance between the sensor and the test sample may oscillated to produce an oscillating sensor output signal having an amplitude and mean which may be measured and compared to calibration data to identify at least one of the unknown film thickness of a conductive film on a test sample, and the unknown distance of the test sample from the sensor. Other aspects and features are also described.

Abstract: Apparatus (10) for transmission testing of a telecommunications jack (100) having a plurality of insulation displacement contacts (IDCs) (103), the apparatus (10) including: a base (30); a plurality of transmission test probes (31) associated with the base (30); and a jack holder (20) for removably coupling the jack (100) to the base (30) such that IDCs (103) of the jack (100) are in electrical communication with corresponding test probes (31); wherein the jack holder (20) is fixed relative to the base (30) during testing, such that the jack (100) remains stationary with respect to the probes (31).

Abstract: A method for determining a circuit element parameter in a ground fault circuit interrupter circuit. An electrical signal provided to a first node is used to generate another electrical signal at a second node. The electrical signal at the second node is multiplexed with a modulation signal to generate a modulated signal that is then filtered and converted into a digital representation of a portion of the circuit element parameter. The electrical signal at the second node is multiplexed with the modulation signal after it has been phase shifted to produce a modulated signal that is filter and converted into a digital representation of another portion of the circuit element parameter. In another aspect, a slope based solenoid self-test method is used for self-testing in a GFCI circuit. Alternatively, a method for determining a wiring fault is provided using a digital filter.

Abstract: A method of measuring direction of rotation of a tappet of an engine valve train. Two opposing notches are machined or otherwise formed in the outer surface of the tappet. Two sensors proximate the outer surface of the tappet are operable to detect the change in distance resulting from the notches as the tappet rotates. There is a predetermined difference angle of separation between the arc distance between the notches and the arc distance between the sensors. Each sensor outputs a square wave output having pulses whose width represents detection of the notches by the sensor. The location of the pulses of the two square wave outputs is compared to determine direction of rotation of the tappet.

Abstract: An electric power meter collar with external electrical connection points enables expedited connection of distributed energy resources to the customer premises or the electric power grid. The meter collar is installed between an electric meter and the meter socket box that the meter would otherwise plug into at the site of a customer who receives two-phase service from an electrical utility company, and has electrical connection points that are electrically upstream and downstream of the meter. It enables “plug and play” connection of on-site power generation resources since the collar includes both a receptacle for a “plug” from on site power generation and overcurrent protection.

Abstract: An example embodiment includes a continuity testing method of a pixel in a liquid crystal on silicon integrated circuit. The method includes writing a first voltage to a pixel. The pixel is isolated and a wire that is selectively coupled to the pixel is discharged. The method also includes enabling a sensing amplifier configured to sense voltage on the wire. The pixel is electrically coupled to the wire and a resultant voltage on the wire is sensed.

Abstract: An apparatus for obtaining information enabling a characteristic like determination of maximum power point of a power source, the apparatus including at least an inductor and a capacitor, the information enabling the determination of the characteristic of the power source being obtained by monitoring the voltage charge of the capacitor, and a mechanism discharging the capacitor through the inductor prior to the monitoring of the charge of the capacitor.

Abstract: A comparison circuit includes: an offset removal unit configured to store offset information of a comparator in response to a reference voltage, and compare a pad voltage with the reference voltage based on the offset information to drive a first node; and a comparison signal output unit configured to buffer a signal of the first node and output a comparison signal.

Abstract: An electronic trip device is described that includes a test current generator and a leakage current detection circuit. The test current generator is coupled to a conductor and configured to provide a test current having a magnitude to the conductor in response to a selection to test the electronic trip device. The conductor is a line conductor or a neutral conductor. The leakage current detection circuit is configured to detect a current difference between the neutral conductor and the line conductor. The leakage current detection circuit is configured to provide, in response to the selection to test the electronic trip device, a tripless error indication if the detected current difference is less than a first threshold value.

Abstract: A test system and method for selecting a derating factor to be applied to a ratio of transistors having disparate electrical characteristics in a wafer fabrication process. In one embodiment, the test system includes: (1) structural at-speed automated test equipment (ATE) operable to iterate structural at-speed tests at multiple clock frequencies over integrated circuit (IC) samples fabricated under different process conditions and (2) derating factor selection circuitry coupled to the structural at-speed ATE and configured to employ results of the structural at-speed tests to identify performance deterioration in the samples, the performance deterioration indicating the derating factor to be employed in a subsequent wafer fabrication process.

Abstract: A display apparatus is disclosed. The apparatus includes a plurality of unit pixels each comprising a plurality of sub pixels, a plurality of scan wires, and a plurality of scan lines branching off from each of the scan wires and extending in a first direction. The number of scan lines from each scan wire equals the number of sub pixels for each pixel, and each scan line connects one of the scan wires with one of the sub pixels of each of a plurality of unit pixels. The apparatus also includes a plurality of data lines extending in a second direction orthogonal to the first direction and which are connected to the plurality of sub pixels. The apparatus also includes a first power supply line extending in the second direction and connected to the sub pixels, and a plurality of test pads, each connected to the scan lines of one of the scan wires.

Abstract: Disclosed herein are an apparatus and a method for detecting a crack. The apparatus includes a power supply unit, a sensor module, and a signal reception module. The power supply unit supplies power. The sensor module receives the input power from the power supply unit, and outputs sensing power corresponding to the magnetic field of an object to be measured. The signal reception unit converts the sensing power output from the sensor module into a quantitative value, and computes the distribution of the magnetic field. The sensor module includes a first sensor array configured to detect magnetic field vectors in a direction vertical to a sensor surface, and a second sensor array placed on the first sensor array in an overlapping manner and configured to detect magnetic field vectors in a direction lateral with respect to the sensor surface.

Abstract: Power generating component connectivity resistance monitoring techniques are disclosed. In an array of power generating components that are connected in parallel to a power bus, a power generating component measures an output current that it supplies to the power bus. Respective first and second power generating components measure a first voltage at an output of the first power generating component and a second voltage at an output of the second power generating component. A resistance in the array between first and second connection points in the array through which the output current flows is determined based on the measurements of the output current, the first voltage, and the second voltage.

Abstract: Foreign metal inspection equipment is provided with: a conveying device for conveying a sample to be subjected to inspection; electrodes positioned so as to face the surface of the sample; a measurement device for measuring the capacitance between the electrodes and the sample being conveyed by the conveying device; and a processing unit that inspects for foreign metal mixed in the sample on the basis of the change in capacitance measured by the measurement device.