Abstract: The invention relates to a system for sensor protection in electron imaging applications comprising a beam control device configured to provide a beam signal based on an incoming beam signal, wherein the beam signal comprises an altered beam intensity, wherein the beam control device is further configured to receive a control signal and to activate based on the control signal. The system further comprises a sensor configured to capture the beam signal and to provide a capture signal based on the beam signal, and a control module configured to provide the control signal to the beam control device, to generate an exposure value based on the capture signal and to modify the control signal based on the exposure value.

Abstract: A plurality of partial mass-to-charge-ratio ranges are defined so that neighboring partial mass-to-charge-ratio ranges overlap each other at a mass-to-charge ratio of a reference ion (Step 2). Mass spectrometry data of a known compound is acquired in each partial mass-to-charge-ratio range (Steps 3 and 4). A normalization coefficient is determined based on a measured intensity of the reference ion in the mass spectrometry data acquired in each of the neighboring partial mass-to-charge-ratio ranges (Steps 6 and 9). Mass spectrometry data of a measurement-target sample is acquired in each partial mass-to-charge-ratio range (Step 12). The mass spectrometry data of the measurement-target sample acquired in each partial mass-to-charge-ratio range is normalized by being multiplied by the corresponding normalization coefficient (Step 14). The normalized mass spectrometry data of the plurality of partial mass-to-charge-ratio ranges is integrated into one set of mass spectrometry data (Step 15).

Abstract: An illumination system includes a gas containment vessel configured to contain a gas. The illumination system also includes one or more pump sources configured to generate one or more pump beams. The illumination system includes an ozone generation unit including one or more illumination sources. The one or more illumination sources are configured to generate a beam of illumination of an energy sufficient for converting a portion of diatomic oxygen (O2) contained within the gas containment vessel to triatomic oxygen (O3). One or more energy sources are configured to ignite the plasma within the gas contained within the gas containment vessel via absorption of energy of the one or more energy sources by a portion of the triatomic oxygen, wherein the plasma emits broadband radiation.

Abstract: The disclosure provides systems and methods for introducing a sample into an open port interface of an analytical device. More particularly, the disclosure relates to a sampling system that includes a dispenser, a hollow tip that releasably couples to the dispenser, and a gantry for receiving the tip. The gantry can be mounted to the open port interface of an analytical device.

Abstract: A light source that emits pulse excitation light includes a laser light source, an optical splitter that splits a pulse laser beam into a plurality of pulse laser beams, phase adjusters and optical amplifiers provided for the pulse laser beams, and an optical combiner that combines the plurality of pulse laser beams whose phases are adjusted and that are amplified, and outputs combined light as the pulse excitation light. An optical phase controller controls phase delay amounts of the phase adjusters, and an optical monitor detects an inclination of the pulse excitation light relative to an optical axis of a focusing lens. The optical phase controller stores phase delay amount data indicating phase delay amounts of the plurality of phase adjusters in which the inclination is a predetermined value, and sets the phase delay amounts of the plurality of phase adjusters based on the phase delay amount data.

Abstract: Systems, devices, and methods for in-source ion separation are provided. An ion separator includes an ion transfer conduit fluidically upstream of and coupled with one or more components of an analytical instrument. The ion separator includes a gas conduit, fluidically upstream of and coupled with the ion transfer conduit, the gas conduit defining an internal volume. The ion separator also includes electronic circuitry defining an active surface exposed to the internal volume, the electronic circuitry being configured to energize the active surface. Embodiments of the present disclosure provide improved analysis of material samples based at least in part on in-source separation of relatively light ions from relatively heavy ions entrained in a gas flow.

Abstract: The present invention concerns an energy dispersion calibration method for calibrating an electron spectrometer of an electron spectrometer system including at least one electron emission source, electron optics and the electron spectrometer. The method comprising: obtaining, providing or receiving at least one electron energy loss spectrum produced by electrons of the electron spectrometer system exchanging energy with at least one resonant optical mode of an optical resonator into which light at a resonant wavelength is coupled; calculating or providing a Fourier transform of the at least one electron energy loss spectrum or a part of the at least one electron energy loss spectrum; determining or providing an energy dispersion (?E) of the electron spectrometer according to the equation ? ? E = f E ? hc ? ? N ? or ? ? ? E = f E ? E p N .

Abstract: An orthogonal acceleration electrode (242) deflects the flight direction of ions incident from an ion source (201). A flight-path-defining electrode (244, 246, 247) defines a flight path of the deflected ions. An ion detection section (245) detects an ion after the flight of the ion through the flight path. A voltage application section (3) applies voltages to the orthogonal acceleration electrode and flight-path-defining electrode. A measurement control section (43) acquires mass spectrum data by conducting a measurement of a known ion generated from a predetermined amount of known sample, under a plurality of measurement conditions which differ from each other in the value of the voltage applied to the orthogonal acceleration electrode. A score-value calculation section (44) calculates a score value based on a predetermined calculation formula, using the intensity of a mass peak and the mass-resolving power in the mass spectrum data acquired under each of the measurement conditions.

Abstract: Apparatus, systems, and methods for identifying and quantifying chemical components in a high-melting-point liquid. One such method includes: receiving, into a nebulizer assembly, a high-melting-point liquid from a molten liquid conduit; aerosolizing, using the nebulizer assembly, at least a portion of the received high-melting-point liquid; delivering, into one or more instruments, the aerosolized high-melting-point liquid from the nebulizer; and chemically analyzing, using the one or more instruments, the aerosolized high-melting-point liquid.

Abstract: In order to improve the processing reproducibility, an ion milling device 100 includes a sample chamber 107, a sample stage 102 that is disposed in the sample chamber on which a sample is placed, an ion source 101 that emits an unfocused ion beam toward the sample, a control unit 112 that controls an output of the ion beam, an oscillator 104 that is disposed in the sample chamber, and an oscillation circuit 111 that oscillates the oscillator and outputs an oscillation signal to the control unit, in which the control unit controls the output of the ion beam such that a vibrational frequency change amount of the oscillator per unit time due to deposition of sputtered particles generated by irradiating the sample with the ion beam on the oscillator is kept within a predetermined range.

Abstract: Systems and methods are disclosed for ion injection into an electrostatic trap. Various aspects of this disclosure provide a mass spectrometer system including a primary ion path including a plurality of quadrupoles; and a secondary ion path coupled to the primary ion path utilizing turning elements. The secondary ion path may include an electrostatic linear ion trap (ELIT), the ELIT being operable to analyze ions diverted from the primary ion path and return them to the primary ion path. The primary ion path may include a time-of-flight mass analyzer. The secondary ion path may be bi-directional. Ions may travel in a first direction when coupled into the secondary ion path using a first turning element in the primary ion path and may travel in a second direction when coupled into the secondary ion path utilizing a second turning element in the primary ion path. The secondary ion path may include a collision quadrupole.

Abstract: An ion molecule reactor for generating analyte ions from analytes comprises: a) a reaction volume in which reagent ions can interact with the analytes in order to form analyte ions; b) at least one analyte inlet for introducing the analytes along an inlet path into the reaction volume whereby, preferably, the inlet path runs essentially along at least a first section of the predefined transit path in the reaction volume; c) at least one reagent ion source and/or at least one reagent ion inlet for providing reagent ions into the reaction volume; d) optionally, at least one ion guide comprising an electrode arrangement which is configured for producing an alternating electrical, magnetic and/or electromagnetic field, that allows for guiding the reagent ions and/or the analyte ions at least along a section of the predefined transit path, preferably along the whole transit path, through the reaction volume.

Abstract: The specification describes a method of reconfiguring particles in a grid of particle traps from an initial configuration to a target configuration, the grid of particle traps having target particle traps and surplus particle traps, the particles being movable along rows of the grid, or along columns of the grid, the rows being transversal to the columns.

Abstract: Various embodiments provide methods, apparatuses, systems, or computer program products for performing quantum object loss detection. The method performed by a controller of a quantum computer includes controlling one or more voltage sources to cause a quantum object confinement apparatus to confine a quantum object crystal, where the quantum object crystal (i) includes at least one of (a) a first species quantum object or (b) a second species quantum object and (ii) defines a crystal axis that is aligned along the RF null axis of the quantum object confinement apparatus; causing at least one first control signal to be provided to at least one control electrode of the plurality of control electrodes, where the at least one first control signal causes the at least one control electrode to generate a push field configured to cause the quantum object crystal axis to rotate with respect to the RF null axis.

Abstract: A method and apparatus for curing a substrate are described. The apparatus includes a curing apparatus with a casing and an ultraviolet (UV) radiation assembly coupled to the casing. The ultraviolet radiation assembly further includes a line UV radiation source. The casing includes an opening on one end. A substrate passes by the opening and is exposed to the UV radiation of the line UV radiation source. The curing apparatus further includes a purge assembly configured to continuously purge the process volume and the volume directly above the exposed portion of the substrate. The curing apparatus is configured to only cure a portion of the substrate at any one point in time, such that the curing apparatus is a scanning curing apparatus and includes a small process volume.

Abstract: A method of calibrating a mass spectrometer comprises generating calibration ions from an ion source that are transported from the ion source to a mass analyser of the mass spectrometer via an ion optics device. A characteristic voltage is applied to the ion optics device to control the transit of ions into or out of the ion optics device. The applied characteristic voltage results in an amount of unintentional dissociation of the calibration ions. An MS1 analysis of the calibration ions is performed using the mass analyser to obtain an MS1 spectrum. The amount of unintentional dissociation of the calibration ions in the MS1 spectrum is determined. The characteristic voltage is calibrated based on the amount of unintentional dissociation of the calibration ions to provide a target amount of unintentional dissociation during an MS1 analysis.

Abstract: Methods and systems for delivering a liquid sample to an ion source for the generation of ions and subsequent analysis by mass spectrometry are provided herein. In accordance with various aspects of the present teachings, MS-based systems and methods are provided in which an open port of a sampling probe for receiving a specimen may be exposed to washing solvent to wash the sampling probe while fluid within the sampling probe remains continuously flowing.

Abstract: A charged particle beam device 1 includes analysis means performed by a controller when a sample holder HL holding a sample SAM is installed on a stage 23. The analysis means includes a step (a) of raising a degree of vacuum of each of an observation chamber 10 and a preprocessing chamber 20 by opening a gate valve VL5, opening a valve VL1, closing a valve VL2, and driving a vacuum pump 40, a step (b) of closing the gate valve VL5 and opening the valve VL2 after the step (a), and a step (c) of processing the sample SAM by radiating an ion beam from an ion source 22 to the sample SAM while performing vacuum exhaust of the preprocessing chamber 20 by the vacuum pump 40 after the step (b). The analysis means can process the sample SAM quickly after performing the vacuum exhaust of the preprocessing chamber 20 in a short time.

Abstract: An uncertainty weighted average of the equalized amounts of two or more quantifier ions is calculated from a quantitation experiment itself. n known i ions of a compound are mass analyzed over time in each of m different samples, producing n XIC peaks for each of the m samples. A reference ion j is selected that is a j ion of the n i ions or a hypothetical ion j. A ratio r(j,i) of a peak area of the j ion to a peak area of each ion of the n i ions is calculated for each of the m samples, producing m r(j,i) ratios for each of the n i ions. An expected ratio rq(j,i) is calculated for each ion of the n i ions from the m r(j,i) ratios for each of the n i ions. For each sample, the uncertainty weighted average is calculated using rq(j,i).

Abstract: Aspects of the present disclosure relate to efficiently trapping ions for QIP systems. A system may include an ablation laser beam source and an ion trapping structure including: an enclosure with an orifice, a source material that is arranged in the enclosure and receives an ablation laser pulse to provide a plume of atoms. A system may include at least one LED that is arranged in the enclosure and onto which at least a portion of the plume of atoms is deposited, wherein the at least one LED is configured to emit light that desorbs at least one deposited atom through the orifice. A system may include an ion trap with a gap through which the at least one deposited atom desorbed travels from the orifice, and a laser beam source configured to generate a laser beam towards the at least one deposited atom creating a trapped ion.