Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.

Abstract: Methods and systems for FTMS-based analysis having an improved duty cycle relative to conventional FTMS techniques are provided herein. In various aspects, the methods and systems described herein operate on a continuous ion beam, thereby eliminating the relatively long duration trapping and cooling steps associated with Penning traps or orbitraps of conventional FTMS systems, as well as provide increased resolving power by sequentially interrogating the continuous ion beam under different radially-confining field conditions.

Abstract: A mass spectrometer includes an ion trap, which has an interior for storing ions, a signal generator, which is connected to an electrode of the ion trap, which delimits the interior, for coupling in a voltage signal, in particular a radiofrequency voltage signal, and an ionization device for ionizing a gas to be ionized and supplied to the interior. The ionization device is connected to the signal generator in order to use the voltage signal (URF, UStim1, Ustim2) of the signal generator, which is coupled into the electrode, for generating ions.

Abstract: A method of operating a mass spectrometer that allows for high-speed operation is disclosed. The method consists in separating the various steps needed to produce a mass spectrum into three or more conceptual stages in a pipeline, such that the instrument is performing steps to process more than two precursor-ion species simultaneously. In general, the number of stages in the pipeline should at least one more and, preferably, at least two more than the number of buffering storage devices in the instrument. The presently-taught methods and apparatus allow for nearly 100% duty cycle of ion accumulation for precursors of interest.

Abstract: In one embodiment, a multi-beam writing method is for irradiating each of pixels defined on a substrate, placed on a stage, with each beam of a multi-beam to form a pattern. The method includes obtaining a position correction amount of the pattern by each of a plurality of sub-arrays into which an array of the multi-beam is divided at least in a predetermined direction, based on the positional deviation amount of each beam of each of the sub-arrays, which obtained by dividing an array of the multi-beam at least in the predetermined direction, calculating an dose of the each beam irradiated to each pixel for shifting the position of the pattern drawn for each of the sub-arrays based on the position correction, and performing multi-writing using at least a portion of each two or more of the sub-arrays with the calculated dose.

Abstract: Examples include a method to position atoms. The method comprises considering a target Hamiltonian encoding a specific problem to resolve using an optical tweezer traps quantum computing system. The method also comprises considering a set of representative Hamiltonians function of a position configuration of atoms in the quantum computing system. The method further comprises determining a specific position configuration whereby a specific similarity measure between the target Hamiltonian and a specific Hamiltonian of the representative Hamiltonians function of the specific position configuration is improved compared to another similarity measure between the target Hamiltonian and at least one other representative Hamiltonian function of a position configuration differing from the specific position configuration.

Abstract: The invention generally relates to a sample dispenser including an internal standard and methods of use thereof.

Abstract: Embodiments herein describe an atomic sensor that includes a photonic die that outputs optical signals on a top surface. These optical signals can be directed and shaped as needed to satisfy a particular type of atomic sensor. In one embodiment, an atomic source (e.g., rubidium or cesium) is disposed on the photonic chip to emit atoms when heated. A collimator can then direct the emitted atoms along a path that intersects with the optical signals. This intersection can be used to detect motion (e.g., rotation and acceleration) of the atomic sensor.

Abstract: The present disclosure relates to methods of identifying components present in intact lipoprotein particles. Methods provided include single particle mass spectrometry, such as charge detection mass spectrometry (CDMS). Distinct subtypes and subpopulations that exist within lipoprotein density classes are determined based on simultaneously measured m/z and charge of ionized lipoprotein particles.

Abstract: After performing an analysis on a standard sample for a predetermined time, a plurality of ion optical elements such as an ion guide are sequentially selected one by one, and a direct-current voltage having a polarity different from that at the time of analysis is temporarily applied. Meanwhile, intensity data of ions having a specific m/z are continuously collected. After thus collecting the data, the ratio of the ion intensities before and after application of direct-current voltages having different polarities is calculated for each ion optical element, and it is determined whether or not the ratio is equal to or larger than a predetermined threshold value.

Abstract: An air cooled inductively coupled plasma mass spectrometer (ICP-MS) is disclosed. The interface structure has a configuration that it can rapidly transfer heat away from the front surface of the interface that is exposed to a high temperature plasma, while maintaining heat in the ion beam to avoid recombination and clustering. The air cooled interface of the present system comprises of a set of fins for rapid heat transfer, which may be placed along the sides of the ICP-MS systems in a variety of orientations. Open-cell metal foam is also used to increase heat transfer efficiency. The system may be cooled by natural convention or forced convection using one or more air fans.

Abstract: An analysis method includes: subjecting a sample to liquid chromatography; performing first mass spectrometry of the sample subjected to the liquid chromatography to detect a first ion corresponding to cholesteryl ester and a second ion corresponding to cholesteryl ester peroxide; and analyzing a degree of oxidation of the sample based on a ratio between an intensity of the detected first ion and an intensity of the detected second ion.

Abstract: An ion optical arrangement (1) for use in a mass spectrometer comprises a collision cell defining an ion optical axis along which ions may pass, electrodes comprising a set of parallel poles (11A, 11B, 11C) arranged in the collision cell, and a voltage source for providing voltages to the electrodes to produce electric fields. The ion optical arrangement is arranged for switching between a first operation mode in which the collision cell is pressurized and a second operation mode in which the collision cell is substantially evacuated. The ion optical arrangement is further arranged for producing a radio frequency electric focusing field in the first operation mode and a static electric focusing field in the second operation mode.

Abstract: An orthogonal acceleration time-of-flight mass spectrometer (1) includes: an ion ejector (123) which ejects measurement-target ions in a predetermined direction; an orthogonal accelerator (132) which accelerates ions in a direction orthogonal to the direction in which the ions are ejected; a ring electrode (131) located between the ion ejector and the orthogonal accelerator, the ring electrode having an opening for allowing ions to pass through and arranged so that the central axis (C2) of the opening is shifted from the central axis (C1) of the ion ejector in a direction along the axis of the acceleration of the ions by the orthogonal accelerator; a reflectron electrode (134) which creates a repelling electric field for reversing the direction of the ions accelerated by the orthogonal accelerator; and an ion detector (135) which detects ions after the direction of flight of the ions is reversed by the reflectron electrode.

Abstract: The present invention relates to the field of microscopy, preferably electron microscopy. Especially, the present invention concerns an embedding medium for imaging a biological sample by microscopy comprising: from 60% to 99% wt. of a glycol dimethacrylate selected from alkylene glycol dimethacrylate and/or oligo(alkylene glycol) dimethacrylate; from 0% to 38% wt. of a polyalkylene glycol diacrylate or of a polyalkylene glycol methacrylate; said polyalkylene glycol diacrylate or polyalkylene glycol methacrylate being optionally substituted by at least one hydrophilic group such as hydroxyl, amino, or an oxo group; at least one additive, preferably comprising at least one heavy metal salt or lanthanide salt; and from 0.1% to 2% wt. of a radical polymerization initiator.

Abstract: A CDMS may include an ion source to generate ions from a sample, a mass spectrometer to separate the generated ions as a function of ion mass-to-charge ratio, an electrostatic linear ion trap (ELIT) having a charge detection cylinder disposed between first and second ion mirrors, wherein ions exiting the mass spectrometer are supplied to the ELIT, a charge generator for generating free charges, a field free region between the charge generator and the charge detection cylinder, and a processor configured to control the charge generator, with no ions in the charge detection cylinder, to generate a target number of free charges and cause the target number of free charges to travel across the field-free region and into contact with the charge detection cylinder to deposit the target number of free charges thereon and thereby calibrate or reset the charge detection cylinder to a corresponding target charge level.

Abstract: Provided is an image processing system capable of estimating a three-dimensional shape of a semiconductor pattern or a particle by solving problems of measurement reduction in a height direction and taking an enormous amount of time at a time of acquiring learning data. The image processing system according to the disclosure stores a detectable range of a detector provided in a charged particle beam device in a storage device in advance, generates a simulated image of a three-dimensional shape pattern using the detectable range, and learns a relationship between the simulated image and the three-dimensional shape pattern in advance.

Abstract: Systems and methods of mitigating Coulomb effect in a multi-beam apparatus are disclosed. The multi-beam apparatus may include a charged-particle source configured to generate a primary charged-particle beam along a primary optical axis, a first aperture array comprising a first plurality of apertures having shapes and configured to generate a plurality of primary beamlets derived from the primary charged-particle beam, a condenser lens comprising a plane adjustable along the primary optical axis, and a second aperture array comprising a second plurality of apertures configured to generate probing beamlets corresponding to the plurality of beamlets, wherein each of the plurality of probing beamlets comprises a portion of charged particles of a corresponding primary beamlet based on at least a position of the plane of the condenser lens and a characteristic of the second aperture array.

Abstract: An inner source assembly for a mass spectrometer, the assembly comprising: a base; and a volume housing removably connectable to the base for retaining a repeller assembly therebetween, wherein one of the base and volume housing comprises at least two protrusions and the other of the volume housing and base comprises at least two corresponding slots to receive and retain said protrusions, wherein the protrusions are dissimilar to one another and/or the slots are dissimilar to one another.

Abstract: A method and system for sampling a solid sample material can include the step of mounting the sample material on a support. A sample surface is coated with a surface treatment composition in a dry deposition process. A solvent supply conduit for supplying solvent to the sample surface and a solvent exhaust conduit for withdrawing solvent from the sample surface can be provided. Solvent is flowed from the solvent supply conduit to the surface treatment composition and the sample surface such that the solvent contacts the surface treatment composition. A laser beam is directed from a laser source to the sample and the surface treatment composition. The laser beam will ablate the sample and the surface treatment composition in portions intersected by the laser beam. Ablated sample material enters the solvent liquid and will be transported with the solvent away from the sample surface through the solvent exhaust conduit.