Patents Examined by David J Makiya
-
Patent number: 9952138Abstract: The present invention is thus directed to an automated system and method of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Such a methodology and system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.Type: GrantFiled: October 9, 2015Date of Patent: April 24, 2018Assignee: Thermo Electron Scientific Instruments LLCInventors: John Magie Coffin, Damian W. Ashmead, Todd C. Strother
-
Patent number: 9943272Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.Type: GrantFiled: September 23, 2017Date of Patent: April 17, 2018Inventors: Yiming Wang, Vincent Huang, Hanjie Zou, Eileen Guo, Ruibo Wu, Zhuotong Xian
-
Patent number: 9920243Abstract: The present invention aims at providing a scintillator for high temperature environments which has satisfactory light emission characteristics under high temperature environments; and a method for measuring radiation under high temperature environments. The scintillator for high temperature environments comprises a colquiriite-type crystal represented by the chemical formula LiM1M2X6 (where M1 is at least one alkaline earth metal element selected from Mg, Ca, Sr and Ba, M2 is at least one metal element selected from Al, Ga and Sc, and X is at least one halogen element selected from F, Cl, Br and I), for example, typified by LiCaAlF6, and the crystal optionally containing a lanthanoid element such as Ce or Eu. The method for measuring radiation under high temperature environments uses the scintillator.Type: GrantFiled: April 2, 2012Date of Patent: March 20, 2018Assignees: TOKUYAMA CORPORATION, TOHOKU UNIVERSITYInventors: Kentaro Fukuda, Noriaki Kawaguchi, Akira Yoshikawa, Takayuki Yanagida, Yui Yokota
-
Patent number: 9915567Abstract: An unreleased thermopile IR sensor and method of fabrication is provided which includes a new thermally isolating material and an ultra-thin material based sensor which, in combination, provide excellent sensitivity without requiring a released membrane structure. The sensor is fabricated using a wafer transfer technique in which a substrate assembly comprising the substrate and new thermally isolating material is bonded to a carrier substrate assembly comprising a carrier substrate and the ultra-thin material, followed by removal of the carrier substrate. As such, temperature restrictions of the various materials are overcome.Type: GrantFiled: June 28, 2016Date of Patent: March 13, 2018Assignee: Excelitas Technologies Singapore Pte. Ltd.Inventors: Piotr Kropelnicki, Radu M. Marinescu, Grigore D. Huminic, Hermann Karagoezoglu, Kai Liang Chuan
-
Patent number: 9915751Abstract: The present application discloses a detector module, which is arranged on a detector arm, comprising one or a plurality of detector units arranged in a scattered configuration, wherein each of the detector units in the detector module is installed aiming at a beam center of a ray source, thus improving imaging quality and reducing the size of a detector frame drastically.Type: GrantFiled: July 22, 2014Date of Patent: March 13, 2018Assignees: NUCTECH COMPANY LIMITED, TSINGHUA UNIVERSITYInventors: Kejun Kang, Jianmin Li, Yuanjing Li, Yulan Li, Jingyu Gu, Weizhen Wang, Quanwei Song, Qingjun Zhang, Shenjin Ming, Xuewu Wang, Hui Gong, Tao Xue
-
Patent number: 9888891Abstract: The application relates to an X-ray imaging unit for a medical imaging. The unit comprising a rotating part comprising a first X-ray source and an X-ray imaging detector unit configured to provide an image by means of at least a rotational movement (R) around a rotation axis of the rotating part, and an upper shelf for supporting the rotating part. The upper shelf is configured to enable the rotating part to move with respect to the upper shelf by means of a linear movement (L) and to be attached to a column with a pivoting joint for enabling a pivot movement (P) of the upper shelf around the column. The rotating part is configured to be positioned by the linear movement and the pivot movement during the imaging.Type: GrantFiled: March 6, 2015Date of Patent: February 13, 2018Assignee: PaloDEx Group OyInventors: Esa Suuronen, Sami Vartiainen
-
Patent number: 9885676Abstract: A method for measurement of the thickness of thin layers or determination of an element concentration of a measurement object. A primary beam is directed from an X-ray radiation source onto the measurement object. A secondary radiation emitted by the measurement object is detected by a detector and is relayed to an evaluation device. The primary beam is moved within a grid surface which is divided into grid partial surfaces as well as subdivided into at least one line and at least one column. For each grid partial surface a primary beam is directed onto the grid surface. A measuring spot of the primary beam fills at least the grid point. A lateral dimension of the measurement surface is detected and compared to the size of the measuring spot of the primary beam appearing on the measurement object, for size determination of the measurement surface of the measurement object.Type: GrantFiled: March 2, 2015Date of Patent: February 6, 2018Assignee: Helmut Fischer GmbH Institut für Elektronik und MesstechnikInventor: Volker Roessiger
-
Patent number: 9874530Abstract: Provided is an evaluation method that provides detailed information on the crosslink densities in sulfur-containing polymer composite materials. The present invention relates to a method of measuring crosslink densities in a sulfur-containing polymer composite material, the method including: a measurement step of irradiating the sulfur-containing polymer composite material with high intensity X-rays and measuring an X-ray absorption spectrum of the composite material while varying the energy of the X-rays; a visualization step of determining the three-dimensional structure of sulfur atoms in the sulfur-containing polymer composite material by the reverse Monte Carlo method from the X-ray absorption spectrum; and a calculation step of calculating, from the three-dimensional structure of sulfur atoms, a crosslink density for each number of sulfur atoms bonded.Type: GrantFiled: August 13, 2015Date of Patent: January 23, 2018Assignee: SUMITOMO RUBBER INDUSTRIES, LTD.Inventors: Fusae Kaneko, Hiroyuki Kishimoto
-
Patent number: 9859029Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.Type: GrantFiled: February 26, 2017Date of Patent: January 2, 2018Inventors: Allison Sihan Jia, Muzhi Liu, Yuhao Wang, Kevin Shaokang You, Jingyi Zhang, Zhuotong Xian
-
Patent number: 9851313Abstract: A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.Type: GrantFiled: March 3, 2015Date of Patent: December 26, 2017Assignee: PANALYTICAL B.V.Inventors: Waltherus Van Den Hoogenhof, Charalampos Zarkadas
-
Patent number: 9844351Abstract: A PET apparatus and a timing correction method of this invention select two target gamma-ray detectors which count coincidences, select a reference detector which is one detector out of the two selected gamma-ray detectors, select a gamma-ray detector different from the other, opposite detector, and when repeating the selection, make a time lag histogram concerning two gamma-ray detectors selected in the past a reference, and correct a time lag histogram concerning gamma-ray detectors selected this time based on the reference. By repeating an operation to make the corrected time lag histogram concerning the two gamma-ray detectors a new reference, an optimal time lag histogram can be obtained without repeating many measurements and computations.Type: GrantFiled: April 29, 2016Date of Patent: December 19, 2017Assignee: Shimadzu CorporationInventors: Tomoaki Tsuda, Masanobu Sato
-
Patent number: 9847206Abstract: The embodiments relate to a rotary anode arrangement with a rotary anode, a rotor for driving the rotary anode and a stator, which exerts a torque on the rotor. The stator includes at least one coil for generating a first magnetic field and at least one permanent magnet for generating a second magnetic field. The embodiments also relate to an X-ray tube with the rotary anode arrangement. The embodiments offer the advantage that a high electromagnetic utilization is possible with a synchronous motor that is excited by permanent magnets.Type: GrantFiled: April 24, 2013Date of Patent: December 19, 2017Assignee: Siemens AktiengesellschaftInventors: Zeljko Jajtic, Thomas Weidinger
-
Patent number: 9835738Abstract: In a method and control unit for activating an X-ray detector, having an X-ray sensitive sensor layer and an arrangement of pixel electrodes connected at the back to the sensor layer, an individually adjusted depletion voltage is applied to each of the pixel electrodes. The value of the depletion voltages applied to different pixel electrodes is chosen to be different such that the effective pixel sizes respectively associated with the pixel electrodes are aligned with each other.Type: GrantFiled: March 5, 2015Date of Patent: December 5, 2017Assignee: Siemens AktiengesellschaftInventors: Edgar Göderer, Björn Kreisler
-
Patent number: 9829447Abstract: An X-ray fluorescence analyzer includes a sample stage, a sample moving mechanism, an X-ray source, a detector detecting a fluorescent X-ray generated from the sample irradiated with a primary X-ray, an imaging device imaging the sample, a display device displaying the image on a screen, a pointing device designating a specific position on the screen for allowing an input at the specific position, an image processing device displaying a mark at the input position on the screen by the pointing device and a control device controlling the sample moving mechanism and the image processing device and, when the sample stage is moved, controlling the image processing device to display the mark on the screen with moving the mark in the same moving direction as that of the sample stage by the same moving distance.Type: GrantFiled: August 24, 2015Date of Patent: November 28, 2017Assignee: Hitachi High-Tech Science CorporationInventor: Isao Yagi
-
Patent number: 9825434Abstract: A spark gap including a capacitive energy store is provided. The spark gap is fed via a multiplicity of capacitors arranged in a form of a ring, wherein the capacitors are electrically connected to the anode and the cathode via ring-shaped and conical or funnel-shaped conductors. As a result, sudden changes in impedance can be avoided. At the same time, it is possible to realize as large a cross-sectional area of the conductor as possible within a very small space. Therefore, the spark gap has a switching response with a high rate of rise of the voltage pulse as soon as the spark gaps flash over. This results in an easily predictable switching response of the spark gap. The spark gap can be used, for example, to generate pulses of monochromatic X-ray radiation.Type: GrantFiled: July 11, 2012Date of Patent: November 21, 2017Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Oliver Heid, Timothy Hughes, Jennifer Sirtl
-
Patent number: 9784699Abstract: Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ?1 to the surface of the sample and measuring a measured intensity Id(?fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ?2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.Type: GrantFiled: March 3, 2015Date of Patent: October 10, 2017Assignee: PANALYTICAL B.V.Inventors: Charalampos Zarkadas, Milen Gateshki, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman, Dick Kuiper
-
Patent number: 9770220Abstract: An integrated microtomography and optical imaging system includes a rotating table that supports an imaging object, an optical stage, and separate optical and microtomography imaging systems. The table rotates the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process. The optical stage can be a trans-illumination, epi-illumination or bioluminescent stage. The optical imaging system includes a camera positioned vertically above the imaging object. The microtomography system includes an x-ray source positioned horizontally with respect to the imaging object. Optical and x-ray images are both obtained while the imaging object remains in place on the rotating table. The stage and table are included within an imaging chamber, and all components are included within a portable cabinet.Type: GrantFiled: April 14, 2016Date of Patent: September 26, 2017Assignee: Caliper Life Sciences, Inc.Inventors: Daniel G. Stearns, David G. Nilson, Bradley W. Rice
-
Patent number: 9772411Abstract: Embodiments relate to an advanced fast and thermal neutron detector material composition with the properties useful for Special Nuclear Material (SNM) detection. Specific embodiments of the material composition result in two excimer scintillation light production mechanisms that provide two corresponding independent techniques for gamma discrimination; namely Pulse Shape Discrimination and Pulse Height Discrimination. A dual discrimination method, Pulse Shape and Pulse Height Discrimination (PSHD), can be implemented relying on both pulse height discrimination and pulse shape discrimination, and can allow the operation of large area, fast and thermal neutron detectors.Type: GrantFiled: October 16, 2013Date of Patent: September 26, 2017Assignee: NANOPTICS, INCORPORATEDInventors: James K. Walker, Youngwook Noh, Richard T. Farley
-
Patent number: 9773190Abstract: The present invention mainly provides a precision calibration method for being applied in a high-precise rotary encoder system, wherein the primary technology feature of the precision calibration method is that: using a laser speckle image capturing module to capture N frames of laser speckle image from an optical position surface of a rotary encoding body, and then using image comparison libraries and particularly-designed mathematical equations to calculate N number of image displacements, so as to eventually calculate N number of primary variation angles and sub variation angles corresponding to the N frames of laser speckle image. Therefore, after the rotary encoding body is rotated by an arbitrary angle, an immediate angle coordinate can be precisely positioned according to the primary variation angles, the secondary variation angles and the N number of image displacements.Type: GrantFiled: December 28, 2015Date of Patent: September 26, 2017Assignee: NATIONAL CHUNG-SHAN INSTITUTE OF SCIENCE AND TECHNOLOGYInventors: Yi-Yuh Hwang, Guang-Sheen Liu, Chin-Der Hwang, Wei-Guo Chang, Chih-Ming Liao
-
Patent number: 9766130Abstract: A IDCA system combining thermo-electric cooler (TEC) and an internal nBn photo-detector having a photo absorbing layer comprising an n-doped semiconductor exhibiting a valence band energy level; and a contact layer comprising a doped semiconductor. A barrier layer is disposed between the photo absorbing layer and the contact layer, the barrier layer exhibiting a valence band energy level substantially equal to the valence band energy level of the doped semiconductor of the photo absorbing layer; the barrier layer exhibiting a thickness and a conductance band gap sufficient to prevent tunneling of majority carriers from the photo absorbing layer to the contact area and block the flow of thermalized majority carriers from the photo absorbing layer to the contact area. Alternatively, a p-doped semiconductor is utilized, and conductance band energy levels of the barrier and photo absorbing layers are equalized.Type: GrantFiled: August 10, 2015Date of Patent: September 19, 2017Inventor: Shimon Maimon