Patents Examined by David J Makiya
  • Patent number: 9952138
    Abstract: The present invention is thus directed to an automated system and method of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Such a methodology and system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
    Type: Grant
    Filed: October 9, 2015
    Date of Patent: April 24, 2018
    Assignee: Thermo Electron Scientific Instruments LLC
    Inventors: John Magie Coffin, Damian W. Ashmead, Todd C. Strother
  • Patent number: 9943272
    Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.
    Type: Grant
    Filed: September 23, 2017
    Date of Patent: April 17, 2018
    Inventors: Yiming Wang, Vincent Huang, Hanjie Zou, Eileen Guo, Ruibo Wu, Zhuotong Xian
  • Patent number: 9920243
    Abstract: The present invention aims at providing a scintillator for high temperature environments which has satisfactory light emission characteristics under high temperature environments; and a method for measuring radiation under high temperature environments. The scintillator for high temperature environments comprises a colquiriite-type crystal represented by the chemical formula LiM1M2X6 (where M1 is at least one alkaline earth metal element selected from Mg, Ca, Sr and Ba, M2 is at least one metal element selected from Al, Ga and Sc, and X is at least one halogen element selected from F, Cl, Br and I), for example, typified by LiCaAlF6, and the crystal optionally containing a lanthanoid element such as Ce or Eu. The method for measuring radiation under high temperature environments uses the scintillator.
    Type: Grant
    Filed: April 2, 2012
    Date of Patent: March 20, 2018
    Assignees: TOKUYAMA CORPORATION, TOHOKU UNIVERSITY
    Inventors: Kentaro Fukuda, Noriaki Kawaguchi, Akira Yoshikawa, Takayuki Yanagida, Yui Yokota
  • Patent number: 9915567
    Abstract: An unreleased thermopile IR sensor and method of fabrication is provided which includes a new thermally isolating material and an ultra-thin material based sensor which, in combination, provide excellent sensitivity without requiring a released membrane structure. The sensor is fabricated using a wafer transfer technique in which a substrate assembly comprising the substrate and new thermally isolating material is bonded to a carrier substrate assembly comprising a carrier substrate and the ultra-thin material, followed by removal of the carrier substrate. As such, temperature restrictions of the various materials are overcome.
    Type: Grant
    Filed: June 28, 2016
    Date of Patent: March 13, 2018
    Assignee: Excelitas Technologies Singapore Pte. Ltd.
    Inventors: Piotr Kropelnicki, Radu M. Marinescu, Grigore D. Huminic, Hermann Karagoezoglu, Kai Liang Chuan
  • Patent number: 9915751
    Abstract: The present application discloses a detector module, which is arranged on a detector arm, comprising one or a plurality of detector units arranged in a scattered configuration, wherein each of the detector units in the detector module is installed aiming at a beam center of a ray source, thus improving imaging quality and reducing the size of a detector frame drastically.
    Type: Grant
    Filed: July 22, 2014
    Date of Patent: March 13, 2018
    Assignees: NUCTECH COMPANY LIMITED, TSINGHUA UNIVERSITY
    Inventors: Kejun Kang, Jianmin Li, Yuanjing Li, Yulan Li, Jingyu Gu, Weizhen Wang, Quanwei Song, Qingjun Zhang, Shenjin Ming, Xuewu Wang, Hui Gong, Tao Xue
  • Patent number: 9888891
    Abstract: The application relates to an X-ray imaging unit for a medical imaging. The unit comprising a rotating part comprising a first X-ray source and an X-ray imaging detector unit configured to provide an image by means of at least a rotational movement (R) around a rotation axis of the rotating part, and an upper shelf for supporting the rotating part. The upper shelf is configured to enable the rotating part to move with respect to the upper shelf by means of a linear movement (L) and to be attached to a column with a pivoting joint for enabling a pivot movement (P) of the upper shelf around the column. The rotating part is configured to be positioned by the linear movement and the pivot movement during the imaging.
    Type: Grant
    Filed: March 6, 2015
    Date of Patent: February 13, 2018
    Assignee: PaloDEx Group Oy
    Inventors: Esa Suuronen, Sami Vartiainen
  • Patent number: 9885676
    Abstract: A method for measurement of the thickness of thin layers or determination of an element concentration of a measurement object. A primary beam is directed from an X-ray radiation source onto the measurement object. A secondary radiation emitted by the measurement object is detected by a detector and is relayed to an evaluation device. The primary beam is moved within a grid surface which is divided into grid partial surfaces as well as subdivided into at least one line and at least one column. For each grid partial surface a primary beam is directed onto the grid surface. A measuring spot of the primary beam fills at least the grid point. A lateral dimension of the measurement surface is detected and compared to the size of the measuring spot of the primary beam appearing on the measurement object, for size determination of the measurement surface of the measurement object.
    Type: Grant
    Filed: March 2, 2015
    Date of Patent: February 6, 2018
    Assignee: Helmut Fischer GmbH Institut für Elektronik und Messtechnik
    Inventor: Volker Roessiger
  • Patent number: 9874530
    Abstract: Provided is an evaluation method that provides detailed information on the crosslink densities in sulfur-containing polymer composite materials. The present invention relates to a method of measuring crosslink densities in a sulfur-containing polymer composite material, the method including: a measurement step of irradiating the sulfur-containing polymer composite material with high intensity X-rays and measuring an X-ray absorption spectrum of the composite material while varying the energy of the X-rays; a visualization step of determining the three-dimensional structure of sulfur atoms in the sulfur-containing polymer composite material by the reverse Monte Carlo method from the X-ray absorption spectrum; and a calculation step of calculating, from the three-dimensional structure of sulfur atoms, a crosslink density for each number of sulfur atoms bonded.
    Type: Grant
    Filed: August 13, 2015
    Date of Patent: January 23, 2018
    Assignee: SUMITOMO RUBBER INDUSTRIES, LTD.
    Inventors: Fusae Kaneko, Hiroyuki Kishimoto
  • Patent number: 9859029
    Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.
    Type: Grant
    Filed: February 26, 2017
    Date of Patent: January 2, 2018
    Inventors: Allison Sihan Jia, Muzhi Liu, Yuhao Wang, Kevin Shaokang You, Jingyi Zhang, Zhuotong Xian
  • Patent number: 9851313
    Abstract: A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: December 26, 2017
    Assignee: PANALYTICAL B.V.
    Inventors: Waltherus Van Den Hoogenhof, Charalampos Zarkadas
  • Patent number: 9844351
    Abstract: A PET apparatus and a timing correction method of this invention select two target gamma-ray detectors which count coincidences, select a reference detector which is one detector out of the two selected gamma-ray detectors, select a gamma-ray detector different from the other, opposite detector, and when repeating the selection, make a time lag histogram concerning two gamma-ray detectors selected in the past a reference, and correct a time lag histogram concerning gamma-ray detectors selected this time based on the reference. By repeating an operation to make the corrected time lag histogram concerning the two gamma-ray detectors a new reference, an optimal time lag histogram can be obtained without repeating many measurements and computations.
    Type: Grant
    Filed: April 29, 2016
    Date of Patent: December 19, 2017
    Assignee: Shimadzu Corporation
    Inventors: Tomoaki Tsuda, Masanobu Sato
  • Patent number: 9847206
    Abstract: The embodiments relate to a rotary anode arrangement with a rotary anode, a rotor for driving the rotary anode and a stator, which exerts a torque on the rotor. The stator includes at least one coil for generating a first magnetic field and at least one permanent magnet for generating a second magnetic field. The embodiments also relate to an X-ray tube with the rotary anode arrangement. The embodiments offer the advantage that a high electromagnetic utilization is possible with a synchronous motor that is excited by permanent magnets.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: December 19, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Zeljko Jajtic, Thomas Weidinger
  • Patent number: 9835738
    Abstract: In a method and control unit for activating an X-ray detector, having an X-ray sensitive sensor layer and an arrangement of pixel electrodes connected at the back to the sensor layer, an individually adjusted depletion voltage is applied to each of the pixel electrodes. The value of the depletion voltages applied to different pixel electrodes is chosen to be different such that the effective pixel sizes respectively associated with the pixel electrodes are aligned with each other.
    Type: Grant
    Filed: March 5, 2015
    Date of Patent: December 5, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Edgar Göderer, Björn Kreisler
  • Patent number: 9829447
    Abstract: An X-ray fluorescence analyzer includes a sample stage, a sample moving mechanism, an X-ray source, a detector detecting a fluorescent X-ray generated from the sample irradiated with a primary X-ray, an imaging device imaging the sample, a display device displaying the image on a screen, a pointing device designating a specific position on the screen for allowing an input at the specific position, an image processing device displaying a mark at the input position on the screen by the pointing device and a control device controlling the sample moving mechanism and the image processing device and, when the sample stage is moved, controlling the image processing device to display the mark on the screen with moving the mark in the same moving direction as that of the sample stage by the same moving distance.
    Type: Grant
    Filed: August 24, 2015
    Date of Patent: November 28, 2017
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Isao Yagi
  • Patent number: 9825434
    Abstract: A spark gap including a capacitive energy store is provided. The spark gap is fed via a multiplicity of capacitors arranged in a form of a ring, wherein the capacitors are electrically connected to the anode and the cathode via ring-shaped and conical or funnel-shaped conductors. As a result, sudden changes in impedance can be avoided. At the same time, it is possible to realize as large a cross-sectional area of the conductor as possible within a very small space. Therefore, the spark gap has a switching response with a high rate of rise of the voltage pulse as soon as the spark gaps flash over. This results in an easily predictable switching response of the spark gap. The spark gap can be used, for example, to generate pulses of monochromatic X-ray radiation.
    Type: Grant
    Filed: July 11, 2012
    Date of Patent: November 21, 2017
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Oliver Heid, Timothy Hughes, Jennifer Sirtl
  • Patent number: 9784699
    Abstract: Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ?1 to the surface of the sample and measuring a measured intensity Id(?fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ?2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: October 10, 2017
    Assignee: PANALYTICAL B.V.
    Inventors: Charalampos Zarkadas, Milen Gateshki, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman, Dick Kuiper
  • Patent number: 9770220
    Abstract: An integrated microtomography and optical imaging system includes a rotating table that supports an imaging object, an optical stage, and separate optical and microtomography imaging systems. The table rotates the imaging object about a vertical axis running therethrough to a plurality of different rotational positions during a combined microtomography and optical imaging process. The optical stage can be a trans-illumination, epi-illumination or bioluminescent stage. The optical imaging system includes a camera positioned vertically above the imaging object. The microtomography system includes an x-ray source positioned horizontally with respect to the imaging object. Optical and x-ray images are both obtained while the imaging object remains in place on the rotating table. The stage and table are included within an imaging chamber, and all components are included within a portable cabinet.
    Type: Grant
    Filed: April 14, 2016
    Date of Patent: September 26, 2017
    Assignee: Caliper Life Sciences, Inc.
    Inventors: Daniel G. Stearns, David G. Nilson, Bradley W. Rice
  • Patent number: 9772411
    Abstract: Embodiments relate to an advanced fast and thermal neutron detector material composition with the properties useful for Special Nuclear Material (SNM) detection. Specific embodiments of the material composition result in two excimer scintillation light production mechanisms that provide two corresponding independent techniques for gamma discrimination; namely Pulse Shape Discrimination and Pulse Height Discrimination. A dual discrimination method, Pulse Shape and Pulse Height Discrimination (PSHD), can be implemented relying on both pulse height discrimination and pulse shape discrimination, and can allow the operation of large area, fast and thermal neutron detectors.
    Type: Grant
    Filed: October 16, 2013
    Date of Patent: September 26, 2017
    Assignee: NANOPTICS, INCORPORATED
    Inventors: James K. Walker, Youngwook Noh, Richard T. Farley
  • Patent number: 9773190
    Abstract: The present invention mainly provides a precision calibration method for being applied in a high-precise rotary encoder system, wherein the primary technology feature of the precision calibration method is that: using a laser speckle image capturing module to capture N frames of laser speckle image from an optical position surface of a rotary encoding body, and then using image comparison libraries and particularly-designed mathematical equations to calculate N number of image displacements, so as to eventually calculate N number of primary variation angles and sub variation angles corresponding to the N frames of laser speckle image. Therefore, after the rotary encoding body is rotated by an arbitrary angle, an immediate angle coordinate can be precisely positioned according to the primary variation angles, the secondary variation angles and the N number of image displacements.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: September 26, 2017
    Assignee: NATIONAL CHUNG-SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Yi-Yuh Hwang, Guang-Sheen Liu, Chin-Der Hwang, Wei-Guo Chang, Chih-Ming Liao
  • Patent number: 9766130
    Abstract: A IDCA system combining thermo-electric cooler (TEC) and an internal nBn photo-detector having a photo absorbing layer comprising an n-doped semiconductor exhibiting a valence band energy level; and a contact layer comprising a doped semiconductor. A barrier layer is disposed between the photo absorbing layer and the contact layer, the barrier layer exhibiting a valence band energy level substantially equal to the valence band energy level of the doped semiconductor of the photo absorbing layer; the barrier layer exhibiting a thickness and a conductance band gap sufficient to prevent tunneling of majority carriers from the photo absorbing layer to the contact area and block the flow of thermalized majority carriers from the photo absorbing layer to the contact area. Alternatively, a p-doped semiconductor is utilized, and conductance band energy levels of the barrier and photo absorbing layers are equalized.
    Type: Grant
    Filed: August 10, 2015
    Date of Patent: September 19, 2017
    Inventor: Shimon Maimon