Patents Examined by David J Makiya
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Patent number: 9707710Abstract: A scintillator stack includes a light-transportation layer and a scintillator layer. The scintillator stack can be included in a scintillator device. The scintillator stack can be made using a co-extrusion method.Type: GrantFiled: February 27, 2015Date of Patent: July 18, 2017Assignee: Saint-Gobain Ceramics and Plastics, Inc.Inventor: Peter R. Menge
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Patent number: 9709504Abstract: Optical sensor unit for infra red evanescence wave spectroscopy (IR-EWS) analysis of chemical and biological substances in an analyte, comprising a waveguide with a sensor surface to be put into contact with the analyte, wherein the sensor surface is provided with an affinity enhancing layer. There is further provided a method of producing an optical sensor unit.Type: GrantFiled: April 22, 2009Date of Patent: July 18, 2017Assignee: MOLECULAR FINGERPRINT SWEDEN ABInventors: Lars Österlund, Per Ola Andersson, Mikael Karlsson, Fredrik Nikolajeff
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Patent number: 9702983Abstract: Apparatus for detecting optical radiation emitted from an array of spots on an object. The apparatus includes a plurality of light guides having respective input ends and output ends, with the input ends ordered in a geometrical arrangement corresponding to the array of the spots. Relay optics collect and focus the optical radiation from the object onto the input ends such that each input end receives the optical radiation from a corresponding one of the spots. Multiple detectors and each coupled to receive the optical radiation from an output end of a respective one of the light guides.Type: GrantFiled: May 2, 2012Date of Patent: July 11, 2017Assignees: Applied Materials Israel, Ltd., Carl Zeiss Microscopy GMBHInventors: Haim Eder, Nissim Elmaliach, Igor Krayvitz (Krivts), Mario Mützel
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Patent number: 9702859Abstract: An egg identification system for determining viability of an avian egg is provided. Such a system includes an emitter assembly configured to emit electromagnetic radiation toward an egg. A detector assembly is axially aligned with the emitter assembly to detect electromagnetic radiation transmitted through the egg. The detector assembly is spaced-apart from the egg during operation thereof such that the detector assembly does not contact the egg. The detected electromagnetic radiation is used to generate an output signal. The output signal is processed to determine whether there exists a periodic variation or an aperiodic perturbation in an intensity of the electromagnetic radiation transmitted through the egg corresponding to action of a heart or embryo movement, wherein the existence of the periodic variation or aperiodic perturbation indicates that the egg is viable. An associated method is also provided.Type: GrantFiled: June 21, 2016Date of Patent: July 11, 2017Assignee: Zoetis Services LLCInventors: Joel James Walukas, Ramin Karimpour
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Patent number: 9702834Abstract: An inspection method for a bearing part includes the steps of: emitting X-rays onto a fatigued portion of a bearing part to be inspected; detecting annular diffracted X-rays (X-ray diffraction ring) diffracted by the fatigued portion; and estimating a use condition of the bearing part to be inspected, based on the detected annular diffracted X-rays (X-ray diffraction ring).Type: GrantFiled: July 2, 2013Date of Patent: July 11, 2017Assignee: NTN CORPORATIONInventors: Takumi Fujita, Kazuhiro Yagita, Toshihiko Sasaki, Youichi Maruyama
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Patent number: 9696266Abstract: A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42.Type: GrantFiled: August 22, 2012Date of Patent: July 4, 2017Assignee: HAMAMATSU PHOTONICS K.K.Inventor: Toshiyasu Suyama
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Patent number: 9696259Abstract: A system for obtaining a measurement of a species of interest. The system includes one or more reference regions, a sensor region, an exciter unit, a detector unit and a processing unit. The exciter unit exposes first and second chemical transducers in the reference and sensor regions, respectively, to an excitation light while they are exposed to reference environments and an analyte, respectively. The detector unit measures responses of the first and the second chemical transducers to the excitation light. The processing unit determines a compensation for aging of the first chemical transducer from a discrepancy between the measurements of the responses of the first chemical transducer and reference responses. The processing unit applies the compensation for aging to the measurement of the response of the second chemical transducer to obtain the measurement of the species of interest in the analyte.Type: GrantFiled: August 18, 2015Date of Patent: July 4, 2017Assignee: LumaSense Technologies Holdings, Inc.Inventors: Terry M. Stapleton, Gregor Hsiao, John Paul Jeffrey
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Patent number: 9698184Abstract: With an image sensor in which the amplifier circuit is disposed at each pixel, there is such an issue that the threshold voltage of the transistor fluctuates so that the signal voltage fluctuates because a voltage is continuously applied between the source and the gate of the transistor at all times when using the amorphous thin film semiconductor as the transistor that constitutes an amplifier circuit. The gate-source potential of the TFT that constitutes the amplifier circuit is controlled so that the gate terminal voltage becomes smaller than the source terminal voltage in an integrating period where the pixels accumulate the signals, and controlled so that the gate terminal voltage becomes larger than the source terminal voltage in a readout period where the pixels output the signals.Type: GrantFiled: July 23, 2015Date of Patent: July 4, 2017Assignee: NLT TECHNOLOGIES, LTD.Inventor: Hiroyuki Sekine
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Patent number: 9696440Abstract: A radiation detector assembly is provided including a semiconductor detector, pixelated anodes, and at least one processor. The pixelated anodes are disposed on a surface of the semiconductor detector, and configured to generate a primary signal responsive to reception of a photon and a secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode. The at least one processor is operably coupled to the pixelated anodes, and configured to define sub-pixels for each pixelated anode; acquire primary signals and secondary signals from the pixelated anodes; determine sub-pixel locations for acquisition events using the primary and secondary signals; generate a sub-pixel energy spectrum for each sub-pixel; apply at least one energy calibration parameter to adjust the sub-pixel energy spectra for each pixelated anode; and, for each pixelated anode, combine the adjusted sub-pixel energy spectra to provide a pixelated anode spectrum.Type: GrantFiled: February 20, 2015Date of Patent: July 4, 2017Assignee: General Electric CompanyInventors: Arie Shahar, Mark David Fries, Yaron Glazer, Jeffrey Michael Levy, Avishai Ofan, Rotem Har-Lavan
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Patent number: 9693437Abstract: Systems and methods for controlling an X-ray imaging system are described. The systems and methods typically include a support arm with a first end and a second end. The first end of the support arm connects to an articulating arm assembly and the second end of the support arm pivotally attaches to an X-ray imaging arm at a pivot joint so that the pivot joint functions as an axis of orbital rotation for the X-ray imaging arm. One or more controls for the X-ray imaging system are disposed on the support arm for the X-ray imaging arm. The controls can therefore remain stationary while the X-ray imaging arm rotates orbitally. The support arm can include a single member or a double member and one or more controls can be disposed on each member of the support arm. Other embodiments are also described.Type: GrantFiled: April 13, 2012Date of Patent: June 27, 2017Assignee: General Electric CompanyInventors: John Matthew Simmons, David Barker, Samuel Alder, Bret Nicholson, Robert Bruce Spratt, Jr.
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Patent number: 9689812Abstract: A method for generating a two-dimensional image of an object using a CT scanner is provided. The method includes selecting an imaging surface for the object, the imaging surface including a plurality of pixels, selecting a viewing direction that is non-parallel to the imaging surface, rotating an x-ray source of the CT scanner around the object through a plurality of views, wherein the x-ray source projects x-rays towards a detector array opposite the x-ray source. For each pixel of the plurality of pixels, the method includes acquiring using the detector array, from the plurality of views, data values for x-rays that pass through the pixel and are within a pre-determined angle from parallel to the viewing direction, and combining the data values acquired for the pixel to calculate a final value for the pixel. The method further includes generating the two-dimensional image of the object based on the calculated final values for each pixel.Type: GrantFiled: October 15, 2014Date of Patent: June 27, 2017Assignee: MORPHO DETECTION, LLCInventors: Walter Irving Garms, Sondre Skatter
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Patent number: 9689815Abstract: An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point. An XRF analyzer can include a rotatable source filter wheel between an x-ray source and a focal point and a rotatable detector filter wheel between an x-ray detector and the focal point. The source filter wheel can include multiple x-ray source modification regions. The detector filter wheel can include multiple x-ray detector modification regions. A gear wheel can mesh with a gear on the source filter wheel and with a gear on the detector filter wheel and can cause the source filter wheel and the detector filter wheel to rotate together.Type: GrantFiled: July 23, 2015Date of Patent: June 27, 2017Assignee: Moxtek, Inc.Inventor: Vincent Floyd Jones
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Patent number: 9693440Abstract: A method and apparatus for controlling a dose of extreme ultraviolet (EUV) radiation generated by a laser produced plasma (LPP) EUV light source. In one embodiment, a running total of the EUV energy generated over a predetermined number of laser pulses is measured; once that number of pulses is exceeded, the energy from the pulse immediately preceding the most recent predetermined number of pulses is dropped from the running total, so that the running total is from the most recent predetermined number of pulses. If the running total of the EUV energy exceeds a target dose, the next pulse is caused to not hit a droplet. This avoids the unwanted side effects of various prior art solutions, such as needing to miss many droplets in a row, or requiring the laser pulses to be shortened or reduced in power as in other prior art solutions.Type: GrantFiled: December 18, 2015Date of Patent: June 27, 2017Assignee: ASML Netherlands B.V.Inventor: Alexander Igorevich Ershov
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Patent number: 9689798Abstract: Disclosed herein is a protective film detecting method of detecting the formed condition of a protective film formed on the front side of a workpiece. The protective film detecting method includes a fluorescence intensity measuring step of forming a plurality of reference protective films having different thicknesses on the front sides of a plurality of reference workpieces, next applying excitation light absorbable by an absorbing agent contained in each reference protective film to each reference protective film, and next measuring the intensity of fluorescence emitted from the absorbing agent due to the absorption of the excitation light, and a threshold deciding step of deciding a threshold of the fluorescence intensity corresponding to a desired one of the different thicknesses of the reference protective films according to the fluorescence intensity measured above.Type: GrantFiled: December 9, 2016Date of Patent: June 27, 2017Assignee: Disco CorporationInventors: Senichi Ryo, Yukinobu Ohura
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Patent number: 9683889Abstract: A photodiode (2) and a further photodiode (3) are arranged in a substrate (1) at or near a main surface (10). The photodiodes are formed and arranged in such a manner that in case of incident ultraviolet radiation (26) the electric signal from the photodiode (2) is larger than the further electric signal from the further photodiode (3). In particular, the first photodiode may be more sensitive to ultraviolet radiation than the further photodiode. The electric signal from the photodiode is attenuated by the further electric signal and thus yields an electric signal primarily measuring the incident ultraviolet radiation. The attenuation of the electric signal from the first photodiode may be achieved internally using an integrated circuit (25) or externally using a separate device.Type: GrantFiled: March 7, 2014Date of Patent: June 20, 2017Assignee: AMS AGInventors: Eugene G. Dierschke, Todd Bishop, Mario Manninger
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Patent number: 9678002Abstract: A method of estimating the relative concentration of at least two components contained in a mixture of the components is disclosed. At least two mixtures are produced by combining the at least two components, each of the at least two mixtures having different concentrations of the at least two components. NIR mixture spectra are acquired from each of the at least two mixtures. The NIR component spectra and the NIR mixture spectra are input into a computer utilizing chemometrics software and the spectra are analyzed to produce a calibration model for each component and each of the mixture NIR spectra. NIR monitored spectra for a monitored mixture of the components having an unknown concentration of the components is acquired. The calibration models are applied to the NIR monitored spectra to thereby estimate the concentration of at least one of the components in the monitored mixture.Type: GrantFiled: October 29, 2014Date of Patent: June 13, 2017Assignee: Chevron U.S.A. Inc.Inventors: Toni Zhang Miao, Ajit Ramachandra Pradhan, Michael Edward Moir, Eddy Lee, Ian Phillip Benson
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Patent number: 9678219Abstract: A position determination system and method is provided that may be used for obtaining position and orientation information of a detector in a contaminated room. The system includes a detector, a sensor operably coupled to the detector, and a motor coupled to the sensor to move the sensor around the detector. A CPU controls the operation of the motor to move the sensor around the detector and determines distance and angle data from the sensor to an object. The method includes moving a sensor around the detector and measuring distance and angle data from the sensor to an object at incremental positions around the detector.Type: GrantFiled: August 11, 2015Date of Patent: June 13, 2017Assignee: Savannah River Nuclear Solutions, LLCInventors: Lawrence J. Harpring, Eduardo B. Farfan, John R. Gordon, Gerald T. Jannik, Trevor Q. Foley
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Patent number: 9671520Abstract: A dielectric loaded accelerator for accelerating charged particles, such as electrons, ions and/or protons, is described herein. The dielectric loaded accelerator accelerates charged particles along a longitudinal axis and towards an outlet of the accelerator. The dielectric loaded accelerator accelerates the charged particles using oscillating electromagnetic fields that propagate within the accelerator according to an electromagnetic mode. The dielectric loaded accelerator described herein includes an electromagnetic mode with a phase velocity that increases towards the outlet of the accelerator and matches a velocity of the charged particles being accelerated along the longitudinal axis of the accelerator. By matching the phase velocity of the oscillating electromagnetic fields to the velocity of the charged particles, the accelerator reduces phase slippage between the fields and the charged particles and, therefore, efficiently accelerates charged particle towards the outlet.Type: GrantFiled: February 7, 2014Date of Patent: June 6, 2017Assignees: Euclid Techlabs, LLC, Schlumberger Technology CorporationInventors: Tancredi Botto, Benjamin Levitt, Chunguang Jing, Sergey Antipov, Alexei Kanareykin
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Patent number: 9671505Abstract: In the present invention, a battery box is provided on the lower side of a survey meter body so as to protrude downwardly. Four primary batteries are accommodated inside the battery box with inclined postures. A stepped structure is formed between the front surface of the battery box and the lower surface of the body. The survey meter can be held by a hand while an index finger, or the like, is hooked on the stepped structure. It is also possible to remove the battery box and dispose a plate-like secondary battery in an accommodation space.Type: GrantFiled: August 20, 2014Date of Patent: June 6, 2017Assignee: Hitachi, Ltd.Inventors: Norio Yoshida, Toshikazu Tanino
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Patent number: 9664618Abstract: A particle detector that includes a flow cell that includes a through hole having a circular sectional shape and allowing a fluid containing a particle to flow therethrough, an inspection light source that irradiates the flow cell with inspection light in a direction perpendicular to an extending direction of the through hole, and an optical detector that detects reaction light generated by the particle and which exits the flow cell so as to be angled relative to a sector-shaped plane which has a vertex at an intersection point of the inspection light and the through hole of the flow cell, is parallel to an optical path of the inspection light, and is perpendicular to the extending direction of the through hole of the flow cell.Type: GrantFiled: February 18, 2016Date of Patent: May 30, 2017Assignee: AZBIL CORPORATIONInventors: Masashi Furuya, Daisuke Obara