Abstract: Exemplary methods, apparatuses, and systems include a media temperature manager receiving operating temperature measurements for a memory subsystem. The media temperature manager generates an average temperature using the operating temperature measurements. The media temperature manager determines that the average temperature satisfies a first value for a dynamic temperature threshold. The dynamic temperature threshold indicates a temperature at which the memory subsystem throttles media operations. The media temperature manager increases the dynamic temperature threshold to a second value in response to the average temperature satisfying the first value for the dynamic temperature threshold.

Abstract: Mechanisms are provided to receive encoded header information stored on a tape of a tape drive, wherein the encoded header information has been generated by: generating, for a plurality of tracks of the tape of the tape drive, a header information in a plurality of symbols, wherein the plurality of symbols is comprised of a first set of symbols and a second set of symbols, wherein the first set of symbols include identical information across all tracks of the plurality of tracks, and wherein the second set of symbols are configurable to include different information across all tracks of the plurality of tracks; and modifying, for writing to the tape of the tape drive, the first set of symbols of the plurality of tracks to include parity information corresponding to information included in the second set of symbols of the plurality of tracks. The received encoded header information is decoded.

Abstract: A memory device includes a data array, a parity array and an ECC circuit. The ECC circuit is coupled to the data array and the parity array. In a first test mode, the ECC function of the ECC circuit is disabled, and in a second test mode, the ECC circuit directly accesses the parity array to read or write parity information through the parity array.

Abstract: Techniques for device modification analysis are disclosed. For example, a method comprises collecting operational data from one or more devices, and receiving one or more modifications to at least one of firmware and software for the one or more devices. In the method, one or more virtual instances of respective ones of the one or more devices are generated, and the one or more modifications are tested on the one or more virtual instances to determine if there are one or more issues with the one or more modifications.

Abstract: The embodiments herein provide a system and method for generating a catalog of graphs that acts as a source for creating error correcting codes. A D3 chord index notation is used to describe the graphs. A list of (3, g) Hamiltonian graphs for even girth g is created to satisfy the condition 6?g?16. Each of the lists is infinite and is used for creating LDPC codes of high quality.

Abstract: Systems and methods that enable hardware memory error tolerant software systems. For instance, the system may comprise a host device that instantiates a kernel agent in response to one or more requests to access hardware memory, determines, by the kernel agent based on the received information, whether the request to access memory will cause access to a corrupt memory location, and skip an operation associated with the corrupt memory location in response to determining that the request will access a corrupt memory location. The systems may also include a system that detects software vulnerabilities to hardware memory errors.

Abstract: An operation method of a storage device includes: receiving a write request including an object identifier and data from an external device; performing a hash operation on the data to generate a hash value; determining whether an entry associated with the hash value is empty in a table; storing the data in an area of the storage device corresponding to a physical address and updating the entry to include the physical address and a reference count, when it is determined that the entry is empty; and increasing the reference count included in the entry without performing a store operation associated with the data, when it is determined that the entry is not empty, and an error message is returned to the external device when the entry associated with the hash value is not present in the table.

Abstract: A method for operating a memory includes: reading data and an error correction code from a memory core; correcting an error of the read data based on the read error correction code to produce error-corrected data; generating new data by replacing a portion of the error-corrected data with write data, the portion becoming a write data portion; generating a new error correction code based on the new data; and writing the write data portion of the new data and the new error correction code into the memory core.

Abstract: A read-disturb-based read temperature determination system includes a storage device that is coupled to a read temperature adjustment subsystem. The storage device receives data from the read temperature adjustment subsystem, stores the data in a block in the storage device, identifies read disturb information for a row in the block at a plurality of different times, processes the read disturb information to generate a read temperature for the row, provides the read temperature in a local logical storage element read temperature map and, based on instructions from the read temperature adjustment subsystem, adjusts the read temperature provided in the local logical storage element read temperature map.

Abstract: Systems, apparatuses, and methods related to memory device protection are described. A quantity of errors within a memory device can be determined and the determined quantity can be used to further determine whether to utilize single or multiple memory devices for an error correction and/or detection operation. Multiple memory devices need not be utilized for the error correction and/or detection operation unless a quantity of errors within the memory device exceeds a threshold quantity.

Abstract: Examples of check codes, methods of creating check codes, and communication systems utilizing check codes, such as low-density parity-check codes (LDPC codes) are described herein. In some examples, check codes described herein utilize a larger number of check operations than check bits.

Abstract: Disclosed is a system including a memory device having a plurality of physical memory segments and a processing device to perform operations that include, responsive to detecting a failure of a memory operation associated with a physical memory segment of the plurality of physical memory segments, quarantining the physical memory segment, responsive to quarantining the physical memory segment, performing one or more scanning operations on the physical memory segment, and determining, based on results of the one or more scanning operations, a viability status of the physical memory segment, wherein the viability status indicates an ability of the physical memory segment to store data.

Abstract: A multicycle path circuit capable of operating at a functional mode and an at-speed test mode. The multicycle path circuit includes an on-chip controller configured to receive an on-chip clock signal and modulate the on-chip clock signal to provide a first clock signal to a first circuit and a second clock signal to a second circuit. The first clock signal and the second clock signal are in a multicycle phase relationship. The on-chip controller is configured to ensure the clock paths to and from the second circuit to be the same for the functional mode and the at-speed test mode and therefore to avoid hold and setup timing conflict between these modes.

Abstract: Implementations described herein relate to memory section selection for a memory built-in self-test. A memory device may read a first set of bits stored in a test control mode register. The memory device may identify a test mode, for performing a memory built-in self-test, based on the first set of bits. The memory device may read a second set of bits stored in a section identifier mode register. The memory device may identify one or more memory sections of the memory device, for which the memory built-in self-test is to be performed, based on the second set of bits. The one or more memory sections may be a subset of a plurality of memory sections into which the memory device is divided. The memory device may perform the memory built-in self-test for the one or more memory sections of the memory device based on the test mode.

Abstract: A solid state drive having a drive aggregator and a plurality of component solid state drive, including a first component solid state drive and a second component solid state drive. The drive aggregator has at least one host interface, and a plurality of drive interfaces connected to the plurality of component solid state drives. The drive aggregator is configured to generate, in the second solid state drive, a copy of a dataset that is stored in the first component solid state drive. In response to a failure of the first component solid state drive, the drive aggregator is configured to substitute a function of the first component solid state drive with respect to the dataset with a corresponding function of the second component solid state drive, based on the copy of the dataset generated in the second component solid state drive.

Abstract: Generating data checksum for a data object including multiple data units comprises, for each data unit, obtaining a corresponding address of the data unit, and rotating the data unit based on said corresponding address of the data unit to generate a rotated data unit. A checksum value for the data object is determined based on said rotated data units.

Abstract: Apparatuses and methods can be related to implementing age-based network training. An artificial neural network (ANN) can be trained by introducing errors into the ANN. The errors and the quantity of errors introduced into the ANN can be based on age-based characteristics of the memory device.

Abstract: A method for operating a memory includes: performing an error check operation on first memory cells; performing an error check operation on second memory cells; detecting an error which is equal to or greater than a threshold value in a region including the first memory cells and the second memory cells; classifying the region as a bad region in response to the detection of an error which is equal to or greater than the threshold value; and performing an error check operation on the first memory cells and the second memory cells again in response to the classification of the bad region.

Abstract: Embodiments herein relate to a method performed by a network node for handling a received signal in a communication network. The network node distributes a first number of inputs of a demodulated signal to a first processing core of at least two processing cores and a second number of inputs of the demodulated signal to a second processing core of the at least two processing cores. The network node further decodes the first number of inputs of the demodulated signal by a first message passing within the first processing core, and decodes the second number of inputs of the demodulated signal by a second message passing within the second processing core. The network node further decodes the demodulated signal by performing a third message passing between the different processing cores over a bus that is performed according to a set schedule.

Abstract: A method of producing a set of coded bits from a set of information bits for transmission between a first node and a second node in a wireless communications system, the method comprises generating a codeword vector by encoding the set of information bits with a low-density parity-check code, wherein the codeword vector is composed of systematic bits and parity bits. The method comprises performing circular buffer-based rate matching on the generated codeword vector to produce the coded bits for transmission, wherein the circular buffer-based rate matching comprises puncturing a first plurality of systematic bits.