Abstract: An apparatus that includes a memory cell array, an I/O terminal supplied with an original write data in a normal operation, a compression logic circuit configured to generate a compressed test data in a test operation based on a test read data read from the memory cell array, and a syndrome generator configured to generate a first syndrome based on the original write data in the normal operation and generate a second syndrome based on the compressed test data in the test operation.

Abstract: A memory component comprises a cyclic buffer partition portion and a snapshot partition portion. In response to receiving a signal that a trigger event has occurred, a processing device included in the memory component performs an error correction operation on a portion of data stored in the cyclic buffer partition portion, copies the data stored in the cyclic buffer partition portion to the snapshot partition portion in response to the error correction operation being successful, and sends the data stored in the cyclic buffer partition portion to a processing device operatively coupled to the memory component in response to the error correction operation not being successful.

Abstract: Methods, systems, and devices for associative computing for error correction are described. A device may receive first data representative of a first codeword of a size for error correction. The device may identify a set of content-addressable memory cells that stores data representative of a set of codewords each of which is the size of the first codeword. The device may identify second data representative of the first codeword in the set of content-addressable memory cells. Based on identifying the second data, the device may transmit an indication of a valid codeword that is mapped to the second data.

Abstract: The present description concerns a method comprising: the loading, from a non-volatile memory of a circuit to a computation circuit, of a first security parameter of the circuit and of a first error-correcting code stored in association with the first security parameter; the verification, by the computation circuit, of the first security parameter and of the first error-correcting code to determine whether one or a plurality of the bits of the security parameter are erroneous; and if it is determined that two bits of the security parameter are erroneous, the loading of a default value of the first parameter into a register.

Abstract: A memory transparent in-system built-in self-test may include performing in-system testing on subsets of memory cells over one or more test intervals of one or more test sessions. A test interval may include copying contents of a subset of memory cells to a register(s), writing test data (e.g., a segment of a pattern) to the subset of memory cells, reading back contents of the subset of memory cells, and restoring the content from the register(s) to the subset of memory cells. In-system testing may be performed on overlapping sets of memory cells. In-system testing may be performed on successive subsets of memory cells within a row (i.e., fast column addressing) and/or within a column (fast column addressing). In-system testing may be performed on sets of m blocks of memory cells during respective test intervals. The number of m blocks tested per interval may be configurable/selectable.

Abstract: A processing-in-memory (PIM) device includes an ECC logic circuit configured to generate first write data, first write parity, second write data, and second write parity from first write input data and second write input data when a write operation in an operation mode is performed, and generate first converted data and second converted data from first read data, first read parity, second read data, and second read parity when a read operation in the operation mode is performed; and a MAC operator configured to perform a MAC arithmetic operation for the first converted data and the second converted data to generate MAC operation result data.

Abstract: A method for execution by one or more modules of one or more processors of a storage network includes receiving a data object for storage, segmenting the data object into a plurality of data segments and determining a level of security and a level of performance for the plurality of data segments. The method continues by determining whether one or more data segments of the plurality of data segments is to be transformed using an all-or-nothing transformation and in response to a determination to transform one or more data segments of the plurality of data segments, transforming a data segment of the plurality of data segments to produce a transformed data segment. The method continues by dispersed error encoding the transformed data segment to produce a set of encoded data slices and transmitting the set of encoded data slices to a set of storage units of the storage network.

Abstract: A read-disturb-based read temperature time-based attenuation system includes a storage device that is coupled to a global read temperature identification subsystem. The storage device determines current read disturb information for data stored in a block in the storage device during a current time period, processes the current read disturb information and previous read disturb information that was determined during at least one previous time period that was prior to the current time period in order to generate a read temperature for the data stored in the block, generates a local logical storage element read temperature map that includes the read temperature, and provides the local logical storage element map to the global read temperature identification subsystem.

Abstract: Exemplary methods, apparatuses, and systems include a media temperature manager receiving operating temperature measurements for a memory subsystem. The media temperature manager generates an average temperature using the operating temperature measurements. The media temperature manager determines that the average temperature satisfies a first value for a dynamic temperature threshold. The dynamic temperature threshold indicates a temperature at which the memory subsystem throttles media operations. The media temperature manager increases the dynamic temperature threshold to a second value in response to the average temperature satisfying the first value for the dynamic temperature threshold.

Abstract: Mechanisms are provided to receive encoded header information stored on a tape of a tape drive, wherein the encoded header information has been generated by: generating, for a plurality of tracks of the tape of the tape drive, a header information in a plurality of symbols, wherein the plurality of symbols is comprised of a first set of symbols and a second set of symbols, wherein the first set of symbols include identical information across all tracks of the plurality of tracks, and wherein the second set of symbols are configurable to include different information across all tracks of the plurality of tracks; and modifying, for writing to the tape of the tape drive, the first set of symbols of the plurality of tracks to include parity information corresponding to information included in the second set of symbols of the plurality of tracks. The received encoded header information is decoded.

Abstract: A memory device includes a data array, a parity array and an ECC circuit. The ECC circuit is coupled to the data array and the parity array. In a first test mode, the ECC function of the ECC circuit is disabled, and in a second test mode, the ECC circuit directly accesses the parity array to read or write parity information through the parity array.

Abstract: Techniques for device modification analysis are disclosed. For example, a method comprises collecting operational data from one or more devices, and receiving one or more modifications to at least one of firmware and software for the one or more devices. In the method, one or more virtual instances of respective ones of the one or more devices are generated, and the one or more modifications are tested on the one or more virtual instances to determine if there are one or more issues with the one or more modifications.

Abstract: The embodiments herein provide a system and method for generating a catalog of graphs that acts as a source for creating error correcting codes. A D3 chord index notation is used to describe the graphs. A list of (3, g) Hamiltonian graphs for even girth g is created to satisfy the condition 6?g?16. Each of the lists is infinite and is used for creating LDPC codes of high quality.

Abstract: An operation method of a storage device includes: receiving a write request including an object identifier and data from an external device; performing a hash operation on the data to generate a hash value; determining whether an entry associated with the hash value is empty in a table; storing the data in an area of the storage device corresponding to a physical address and updating the entry to include the physical address and a reference count, when it is determined that the entry is empty; and increasing the reference count included in the entry without performing a store operation associated with the data, when it is determined that the entry is not empty, and an error message is returned to the external device when the entry associated with the hash value is not present in the table.

Abstract: Systems and methods that enable hardware memory error tolerant software systems. For instance, the system may comprise a host device that instantiates a kernel agent in response to one or more requests to access hardware memory, determines, by the kernel agent based on the received information, whether the request to access memory will cause access to a corrupt memory location, and skip an operation associated with the corrupt memory location in response to determining that the request will access a corrupt memory location. The systems may also include a system that detects software vulnerabilities to hardware memory errors.

Abstract: Systems, apparatuses, and methods related to memory device protection are described. A quantity of errors within a memory device can be determined and the determined quantity can be used to further determine whether to utilize single or multiple memory devices for an error correction and/or detection operation. Multiple memory devices need not be utilized for the error correction and/or detection operation unless a quantity of errors within the memory device exceeds a threshold quantity.

Abstract: A method for operating a memory includes: reading data and an error correction code from a memory core; correcting an error of the read data based on the read error correction code to produce error-corrected data; generating new data by replacing a portion of the error-corrected data with write data, the portion becoming a write data portion; generating a new error correction code based on the new data; and writing the write data portion of the new data and the new error correction code into the memory core.

Abstract: A read-disturb-based read temperature determination system includes a storage device that is coupled to a read temperature adjustment subsystem. The storage device receives data from the read temperature adjustment subsystem, stores the data in a block in the storage device, identifies read disturb information for a row in the block at a plurality of different times, processes the read disturb information to generate a read temperature for the row, provides the read temperature in a local logical storage element read temperature map and, based on instructions from the read temperature adjustment subsystem, adjusts the read temperature provided in the local logical storage element read temperature map.

Abstract: Examples of check codes, methods of creating check codes, and communication systems utilizing check codes, such as low-density parity-check codes (LDPC codes) are described herein. In some examples, check codes described herein utilize a larger number of check operations than check bits.

Abstract: Disclosed is a system including a memory device having a plurality of physical memory segments and a processing device to perform operations that include, responsive to detecting a failure of a memory operation associated with a physical memory segment of the plurality of physical memory segments, quarantining the physical memory segment, responsive to quarantining the physical memory segment, performing one or more scanning operations on the physical memory segment, and determining, based on results of the one or more scanning operations, a viability status of the physical memory segment, wherein the viability status indicates an ability of the physical memory segment to store data.