Abstract: Error checking data used in offloaded operations is disclosed. A remote execution device receives a request from a host to store a data block in a memory region. The data block includes data and host-generated error checking information for the data. The remote execution device updates the data block by overwriting the host-generated error checking information with locally generated error checking information for the data. The data block is then stored in the memory region.

Abstract: Embodiments of the present disclosure relate to a method, an electronic device, and a computer program product for storage management. The method for storage management includes determining the data volume of corresponding failed data in a plurality of candidate sub-storage spaces of a disk, the plurality of candidate sub-storage spaces being formed by dividing the original storage space of the disk and having consecutive physical addresses, and the size of one candidate sub-storage space being associated with the size of the storage space of at least one block that constitutes the disk; and selecting a target sub-storage space to be released from the plurality of candidate sub-storage spaces based at least on the data volume of the corresponding failed data. As such, since the operation of moving valid data in an SSD block to a new SSD block is reduced, the WAF of a storage system, especially an SSD, can be effectively reduced, and the service life of the SSD can be prolonged.

Abstract: A method for the secured storing of a data element to be stored by a computer program in an external memory, which is connected to a microcontroller, the microcontroller including an interface module, which is configured to calculate error correction values for data elements including, when creating the computer program, during a determination of memory addresses of the computer program, determining a memory address in the external memory for the data element, a shared memory space requirement of data element and associated error correction value being taken into account; and during execution of the computer program, receiving the data element by the interface module; calculating an error correction value for the data element by the interface module; and writing, starting at the memory address, the data element and immediately thereafter the calculated error correction value within one addressing phase by the interface module.

Abstract: A method for monitoring the free space of a stack of a microcontroller during the execution of a process using spaces of the stack from a start address to an end address of the stack, in which the method includes: in a prior step, writing N keys in the stack at N addresses of the stack, the memory space between two consecutive keys decreasing in a direction from the start address to the end address of the stack; and, in a step of executing the process, saving the address of the current key, corresponding to the address of the existing key, among the N keys, that is closest to the stack start address.

Abstract: Exemplary methods, apparatuses, and systems include a media temperature manager receiving operating temperature measurements for a memory subsystem. The media temperature manager generates an average temperature using the operating temperature measurements. The media temperature manager determines that the average temperature satisfies a first value for a dynamic temperature threshold. The dynamic temperature threshold indicates a temperature at which the memory subsystem throttles media operations. The media temperature manager increases the dynamic temperature threshold to a second value in response to the average temperature satisfying the first value for the dynamic temperature threshold.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 64800 and a code rate of 4/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 1024-symbol mapping.

Abstract: A method and apparatus for enhancing reliability of a data storage device. The storage device controller is configured to convert a typical UBER-type event to an MTBF (FFR) event by converting a data error event into a drive functional failure. In this context, the converted error is not counted as an UBER type event for purposes of determining the reliability of the storage device.

Abstract: A memory system includes at least one semiconductor memory device including a plurality of memory blocks in which an original data stripe including a plurality of unit data and parity data is stored, and a controller configured to control an operation of the semiconductor memory device. The controller performs an error correction operation on one or more unit data received from the semiconductor memory device, and generates data for recovery based on remaining data except for first and second unit data among the plurality of unit data, in response to a first error correction failure for the first unit data among the plurality of unit data and a second error correction failure for the second unit data.

Abstract: A solid state drive having a drive aggregator and a plurality of component solid state drive, including a first component solid state drive and a second component solid state drive. The drive aggregator has at least one host interface, and a plurality of drive interfaces connected to the plurality of component solid state drives. The drive aggregator is configured to generate, in the second solid state drive, a copy of a dataset that is stored in the first component solid state drive. In response to a failure of the first component solid state drive, the drive aggregator is configured to substitute a function of the first component solid state drive with respect to the dataset with a corresponding function of the second component solid state drive, based on the copy of the dataset generated in the second component solid state drive.

Abstract: A failure bit count (FBC) circuit for memory array is provided. The memory array includes pages each having plural sectors and a redundancy column. The FBC circuit includes FBC units, in which each FBC unit is respectively coupled to each sector for providing a failure bit count current; a redundancy FBC unit coupled to the redundancy column and provides a redundancy current; a switch having a first end and a second end capable of being switched to couple to one of outputs of the FBC units to receive the failure bit count current from one of the FBC units; a comparator having a first input end that receives a reference current, and a second input end that receives a measurement current obtained by adding the failure measurement current and the redundancy current, and an output end outputting a judge signal to indicate a number of failure bits for each sector.

Abstract: A reading method for solid-state disk returns data and/or information depending on state information. A data unit stored in the solid-state disk comprises metadata and a plurality of sectors including at least two sectors of user data, the metadata comprising a sector state set indicating state information of each of the sectors in the data unit, and the state information comprising a valid state and an invalid state. In response to receiving a read command from a host to read at least one of the sectors in the data unit, the solid-state disk returns actual data to the host for one or more of the sectors in the valid state, and returns information indicating a read error to the host for one or more of the sectors in the invalid state, according to the sector state set stored in the metadata of the data unit.

Abstract: A memory component comprises a cyclic buffer partition portion and a snapshot partition portion. In response to receiving a signal that a trigger event has occurred, a processing device included in the memory component performs an error correction operation on a portion of data stored in the cyclic buffer partition portion, copies the data stored in the cyclic buffer partition portion to the snapshot partition portion in response to the error correction operation being successful, and sends the data stored in the cyclic buffer partition portion to a processing device operatively coupled to the memory component in response to the error correction operation not being successful.

Abstract: Exemplary methods, apparatuses, and systems include receiving read operations. The read operations are divided into a current set of a sequence of read operations and one or more other sets of sequences of read operations. An aggressor read operation is selected from the current set. An identifier of a memory location read by the aggressor read operation is stored and, in response to determining a data integrity scan of a victim location of the aggressor read operation will collide with a host operation, the data integrity scan is delayed. In response to a trigger condition being satisfied, the delayed data integrity scan of the victim location of the aggressor read operation is performed.

Abstract: The disclosure discloses a wafer acceptance test module for a static memory function test, reduced instruction built-in self-test circuit formed on a wafer includes: a ring oscillator, a frequency divider, a counter, a data latch and comparator. The counter is used for count, and the count is used as an input signal of each of an address decoder and a data input port at the same time. The data latch and comparator is connected to an output terminal of the address decoder and an output terminal of the sense amplifier and compare two output signals to obtain a test result. The disclosure also discloses a wafer acceptance test method for a static memory function test. The disclosure does not need to rely on a dedicated test machine for memory to perform a static memory function test, which can simplify a test procedure.

Abstract: A method of error correction for a quantum computer includes identifying each of a plurality of physical qubits arranged in a lattice pattern over a surface in a quantum processor of the quantum computer as a one of a data qubit, an ancilla qubit or a flag qubit to define a plurality of data qubits, ancilla qubits and flag qubits. Each pair of interacting data qubits interact with a flag qubit and adjacent flag qubits both interact with a common ancilla qubit. The method further includes performing measurements of weight-four stabilizers, weight-two stabilizers, or both of a surface code formed using at least a sub-plurality of the plurality of physical qubits, or performing measurements of weight-four Bacon-Shor type gauge operators; and correcting fault-tolerantly quantum errors in one or more of the at least sub-plurality of physical qubits based on a measurement from at least one flag qubit.

Abstract: Mitigating the effects of a real node failure in a doubly mapped redundant array of independent nodes, e.g., doubly mapped cluster is disclosed. In response to a change in an accessibility to data stored on an extent of a real storage device of a real node of a real cluster, wherein the extent of the real storage device corresponds to a portion of a mapped storage device of a mapped node of a doubly mapped cluster, substituting a reserved extent of a real storage device for the extent of the real storage device. The substituting the reserved extent of the real storage device can correspond to a change in a topology of the doubly mapped cluster, wherein the change in the topology comprises replacing the portion of the mapped storage device with a substitute portion of a mapped storage device that corresponds to the replacement extent of the real storage device.

Abstract: A communications device configured to receive data transmitted as encoded data packets from an infrastructure equipment of a wireless communications network. Each of the encoded data packets are transmitted as a control signal component and a data signal component. The control signal component carries control information for detecting and decoding the data signal component in which the encoded data carried by the encoded data packet is transmitted. As part of the ARQ-type protocol, at least the control signal component may be re-transmitted. By including with the control information carried by the retransmitted control signals an indication of at least a temporal location of the data signal component, which has already been transmitted and received in a buffer of a receiver, an improvement in a use of communications resource can be provided and also in some embodiments an improvement in a likelihood of correctly detecting and decoding an encoded data packet.

Abstract: A storage device includes a controller that can dynamically adjust the zone active limit (ZAL) for a zoned namespace (ZNS). Rather than assuming a worst-case scenario for the ZNS, the ZAL can be dynamically adjusted, even after providing the ZAL to a host device. In so doing, device behavior changes due to factors such as temperature, failed or flipped bit count, and device cycling can be considered as impacting the ZAL. The ZAL can then be adjusted over time, and the new ZAL can be communicated to the host device. As such, rather than a fixed, worst-case ZAL, the host device will receive updated ZAL values over time as the device performs.

Abstract: An electronic device is disclosed. The electronic device comprises a circuit board, a memory part comprising a plurality of first memory chips mounted on the circuit board, a socket part comprising a plurality of terminals electrically connected to a memory module which comprises a plurality of second memory chips, a memory controller for controlling the operation of the plurality of first memory chips and, when the memory module is connected to the socket part, controlling the operation of the plurality of first memory chips and the plurality of second memory chips, a conductive pattern comprising a control line which sequentially connects, from the memory controller, one or more of the plurality of terminals on the socket part and the plurality of first memory chips, and a capacitive element connected to the control line at a preset position between the one or more terminals on the socket part and the memory controller.

Abstract: Systems, apparatuses, and methods related to memory device protection are described. A quantity of errors within a memory device can be determined and the determined quantity can be used to further determine whether to utilize single or multiple memory devices for an error correction and/or detection operation. Multiple memory devices need not be utilized for the error correction and/or detection operation unless a quantity of errors within the memory device exceeds a threshold quantity.