Patents Examined by F. L. Evans
  • Patent number: 7719685
    Abstract: An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result of subwavelength dimensions and near-field effect, resolution can break the diffraction limit and even reach nanoscale. The microscope has a fast speed, works with soft sample and sample in solution, and is capable of dynamic observations. In addition, the array surface doubles as a platform for molecule manipulation.
    Type: Grant
    Filed: November 29, 2007
    Date of Patent: May 18, 2010
    Inventor: Chian Chiu Li
  • Patent number: 7719678
    Abstract: Various aspects of the present invention are directed to a nanowire configured to couple electromagnetic radiation to a selected guided wave and devices incorporating such nanowires. In one aspect of the present invention, a nanowire structure includes a substrate and at least one nanowire attached to the substrate. A diameter, composition, or both may vary generally periodically along a length of the at least one nanowire. A coating may cover at least part of a circumferential surface of the at least one nanowire. The nanowire structure may be incorporated in a device including at least one optical-to-electrical converter operable to convert a guided wave propagating along the length of the at least one nanowire, at least in part responsive to irradiation, to an electrical signal. Other aspects of the present invention are directed to methods of fabricating nanowires structured to support guided waves.
    Type: Grant
    Filed: April 25, 2007
    Date of Patent: May 18, 2010
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Theodore I. Kamins, Alexandre M. Bratkovski
  • Patent number: 7719675
    Abstract: Methods for evaluating an optically variable device (“OVD”) or optically variable media (“OVM”) are disclosed. The methods include the steps of applying light of a single wavelength from a calibrated light source to the OVD or OVM; measuring the light diffracted by the OVD or OVM with an integrating sphere; measuring the total incident light on the OVD or OVM; and calculating a diffraction efficiency for the OVD or OVM at the single wavelength based on the measurement of light diffracted and the measurement of total incident light.
    Type: Grant
    Filed: February 26, 2007
    Date of Patent: May 18, 2010
    Assignee: Applied Extrusion Technologies, Inc.
    Inventors: Robert K. Grygier, Kelan Wieloch
  • Patent number: 7719680
    Abstract: A spectroscope designed to utilize an adaptive optical element such as a micro mirror array (MMA) and two distinct light channels and detectors. The devices can provide for real-time and near real-time scaling and normalization of signals.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: May 18, 2010
    Assignee: Custom Sensors and Technology
    Inventors: Sean M. Christian, Jess V. Ford, Mike Ponstingl, Sven Kruger, Margaret C. Waid, Bryan W. Kasperski, Entique Prati
  • Patent number: 7715002
    Abstract: A method is provided for characterizing a scientific material, such as a silicate material, a polymer material and/or nanomaterial. The method can include the steps of irradiating a measuring light of a predetermined wavelength range into material specimens, recording the measuring light reflected and/or reemitted by the material specimens, determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and numerical-mathematical processing of spectral data of single material specimens for determining the characteristic features of the material specimens.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: May 11, 2010
    Assignee: Bionorica AG
    Inventors: Michael A. Popp, Guenther Bonn, Christian W. Huck
  • Patent number: 7710562
    Abstract: An atomic analyzer includes a plasma generator, in which a discharge gas is fed in a micro gap between a pair of electrodes to generate nonequilibrium atmospheric pressure plasma, a bias voltage controller that includes a plasma-leading electrode for leading the nonequilibrium atmospheric pressure plasma generated by the plasma generator to an object to be irradiated, the object to be irradiated with the nonequilibrium atmospheric pressure plasma is placed on the plasma-leading electrode, a bias voltage is applied between the plasma-leading electrode and the electrodes of the plasma generator to irradiate the object with the nonequilibrium atmospheric pressure plasma, and a spectrometer that analyzes atoms spectroscopically from light emitted from atomized generated by atomizing a substance composing the object to be irradiated by the nonequilibrium atmospheric pressure plasma irradiation or from light absorbed by the atomized atoms.
    Type: Grant
    Filed: February 22, 2008
    Date of Patent: May 4, 2010
    Assignee: NU Eco Engineering Co., Ltd.
    Inventors: Masaru Hori, Masafumi Ito
  • Patent number: 7705980
    Abstract: A spectral image is corrected for optical aberrations. Tissue is exposed to a high-intensity, narrow band of light. The narrow band of light is scattered by at least one analyte in the tissue. Raman signals are optically collected from the scattered light. The Raman signals are directed to a wavelength-separating device. The Raman signals are detected as a function of intensity and wavelength to create the spectral image. The spectral image is corrected for optical aberrations using a software algorithm to spatially reassign intensity. The software may be adapted to use a reference image to make dynamic corrections. Fluorescence signals may also be collected.
    Type: Grant
    Filed: August 21, 2007
    Date of Patent: April 27, 2010
    Assignee: Bayer Healthcare LLC
    Inventors: James E. Smous, Mihailo V. Rebec, Michael P. Houlne
  • Patent number: 7705973
    Abstract: Provided are methods and systems for monitoring a state of a plasma chamber. In the method, an optical characteristic of plasma generated in a plasma chamber including a window is measured in a predetermined measurement wavelength band. A process status index (PSI) is extracted from the measured optical characteristic. A state of the plasma chamber is evaluated by analyzing the extracted PSI. The optical characteristic of the plasma is measured in the predetermined measurement wavelength band in which a transmittance of light passing through the window is substantially independent of a wavelength of the light.
    Type: Grant
    Filed: May 7, 2008
    Date of Patent: April 27, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Keun-Hee Bai, Yong-Jin Kim
  • Patent number: 7701572
    Abstract: The disclosure relates to systems and method for chemical imaging of microarrays. In one embodiment, the disclosure relates to a system for simultaneous spectral imaging of a plurality of samples arranged on an array. The system includes an illumination source for providing illuminating photons to said plurality of samples, the illuminating photons interacting with each of the plurality of samples to emit interacted photons; an array for receiving said plurality of samples, the array having an external dimension such that the samples are within a simultaneous field of view of the optical device; an optical device for collecting the interacted photons and directing the photons to an imaging device, the imaging device simultaneously forming a plurality of images corresponding to each of the plurality of samples.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: April 20, 2010
    Assignee: ChemImage Corporation
    Inventors: David Tuschel, Thomas C. Voigt
  • Patent number: 7701571
    Abstract: A Raman spectrometry assembly includes a Raman spectrometer having a laser light source and a Raman signal analyzer, an interface module comprising a housing which is connectable to and disconnectable from the spectrometer, and a fiber optic assembly which is connectable to and disconnectable from the interface module, the fiber optic assembly including optical fibers and a probe head at a distal end thereof for disposition adjacent a specimen to be tested, the optical fibers extending from the probe head and adapted to extend to the interface module.
    Type: Grant
    Filed: August 22, 2007
    Date of Patent: April 20, 2010
    Assignee: Ahura Scientific Inc.
    Inventors: Masud Azimi, Kevin J. Knopp, Steve McLaughlin
  • Patent number: 7697136
    Abstract: In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21. An optimum standard spectral characteristic or an optimum calibration data is selected from the multiple standard spectral characteristics or the multiple calibration data obtained. A spectral reflection characteristic of a sample is calculated using the selected standard spectral characteristic or the selected calibration data.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: April 13, 2010
    Assignee: Konica Minolta Sensing, Inc.
    Inventor: Kenji Imura
  • Patent number: 7697133
    Abstract: One aspect of the invention relates to methods for analysis of phenotypic parameters or a trait in a plant comprising using a digital analyzing device, comparing phenotypic parameters or traits between plants in a population, and selecting plants with a selected parameter or trait. The invention also relates to an apparatus suitable for use in conjunction with a container in which one or more plants is growing and having associated with it a device which comprises a unique identifier. The apparatus may comprise a transporter system for moving the containers, and may comprise a workstation at which an operation, such as imaging, is performed on plants in the containers. The operation may be performed automatically, and/or at a high throughput rate. The unique identifier of each container and the information derived from each plant may be linked to this identifier via a computer, and may be stored in a digital database.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: April 13, 2010
    Assignee: CropDesign N.V.
    Inventors: Frederik Leyns, Willy Dillen
  • Patent number: 7692786
    Abstract: Raman measurement apparatus optimized for gaseous and other low-concentration samples includes a focusing objective that uses only first-surface mirrors instead of lenses, thereby dramatically reducing background noise. In the preferred embodiment, the focusing and collimation functions performed by the objective section are performed by an off-axis parabolic mirror. A spherical first-surface mirror opposing the parabolic mirror re-images the counter-propagating beam back through the same focus for re-collimation by the parabolic mirror. A probe-head section operative to generate the counter-propagating beam has substrates and surfaces arranged such that the excitation beam does not pass through any substrates after it is filtered by the bandpass coating, thereby further decreasing background signals.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: April 6, 2010
    Assignee: Kaiser Optical Systems
    Inventors: James M. Tedesco, Joseph B. Slater
  • Patent number: 7692793
    Abstract: The specification describes an optical wavelength monitor/analyzer that uses a cost effective wavelength reference source. The wavelength reference source is a nominally fixed wavelength laser with inherent tunability over a very limited wavelength range, i.e. a few nanometers. Tuning is effected by changing the temperature of the laser. The limited range is useful for making multiple wavelength measurements in the context of analyzing wavelength drift in tunable optical filters.
    Type: Grant
    Filed: November 29, 2007
    Date of Patent: April 6, 2010
    Assignee: Oclaro North America Inc.
    Inventors: Christopher Lin, Deepak Devicharan
  • Patent number: 7692788
    Abstract: The invention relates to a method for testing the slightest quality differences or quality features of any objects and agents interacting therewith based on measuring the percentage scatter of “ultraweak” photon emissions (“biophotons” in biological systems) and the delayed luminescence in a scatter chamber (darkroom). These scatter percentages can vary to such an extent as to enable the sufficiently sensitive registration of slightest quality differences (quality features).
    Type: Grant
    Filed: March 23, 2004
    Date of Patent: April 6, 2010
    Assignee: Bipho Patentverwertung GmbH
    Inventors: Fritz-Albert Popp, Jürgen Mehlhase, Zhongchen Yan
  • Patent number: 7692787
    Abstract: The present invention aims to provide a chip applied to a molecular sensing device which carries out Raman spectroscopic analysis utilizing Raman scattering enhancement due to plasmons, and that achieves higher sensitivity and stability of its sensing sensitivity and miniaturization, and to provide a molecular sensing device including the chip. As the chip for Raman scattering enhancement applied to the molecular sensing device using the Raman spectroscopic analysis, which has an excitation light source for Raman scattering, a chip for Raman scattering enhancement and a photodetector for observing the Raman scattering, the present invention employs a chip having a molecular detecting element in which a transparent protection material thin film 32 composed of a dielectric material thin film or semiconducting material thin film is formed on a thin film 31 containing the noble metal oxide, and utilizes the Raman scattering enhancement by the thin film containing the noble metal oxide.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: April 6, 2010
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventors: Makoto Fujimaki, Junji Tominaga, Yasuhiko Iwanabe
  • Patent number: 7688442
    Abstract: A method using fluorescence microscopy for image evaluation using a laser scanning microscope in which an at least partially spectrally resolved detection of the fluorescence spectrum occurs. Reference spectra are used for spectral demixing. Temporally and/or spectrally variable dyes and/or dye combinations are employed for recording of the reference spectra. Finally, the recorded reference spectra are inspected for image evaluation.
    Type: Grant
    Filed: June 9, 2004
    Date of Patent: March 30, 2010
    Assignee: Carl Zeiss Microimaging GmbH
    Inventors: Ralf Wolleschensky, Bernhard Zimmermann, Richard Ankerhold
  • Patent number: 7684036
    Abstract: A method is disclosed for monitoring the curing status of a dental resin through the inherent fluorescence of the dental resin under a curing light. The method requires no sample preparation and is fast enough for real time cure monitoring.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: March 23, 2010
    Assignee: BWT Property, Inc.
    Inventors: Qun Li, Sean Xiaolu Wang
  • Patent number: 7684041
    Abstract: A color inspection system capable of making a determination on pass or failure with accuracy equivalent to that for the case of a visual inspection even in the case of inspecting various textile products as measurement targets, such as raised cloth, cloth with printed patterns such as a marbled pattern, moire pattern and detailed pattern is provided. With the color inspection system, an illuminant is set to shine a light on the surface of a textile product placed on the top surface of a measuring platform to thereby make measurements from a direction at an angle of 45 degrees from the surface of a measuring region of the textile product by use of a spectroradiometer of a measuring unit. The spectroradiometer is provided with a wide range lens attached thereto to thereby expand a measuring region. The results of measurement by the spectroradiometer are inputted to an information processor of a determination unit.
    Type: Grant
    Filed: March 29, 2006
    Date of Patent: March 23, 2010
    Assignee: Seiren Co., Ltd.
    Inventors: Takao Ebita, Norihiro Ogata, Masahiro Matsumura, Keiichirou Tabata
  • Patent number: 7679752
    Abstract: Methods are provided for detecting compression wood, blue stain, or pitch in lumber. A light beam is projected towards the wood sample. Line or area cameras acquire images of light that is reflected from the wood sample. Based on the intensity of the reflected light at one or more locations on the wood sample, compression wood, blue stain, or pitch may be detected.
    Type: Grant
    Filed: September 27, 2006
    Date of Patent: March 16, 2010
    Assignee: Weyerhaeuser NR Company
    Inventor: Thomas J. Taylor