Abstract: A semiconductor power device includes a plurality of power transistor cells each having a trenched gate disposed in a gate trench opened in a semiconductor substrate wherein a plurality of the trenched gates further include a shielded bottom electrode disposed in a bottom portion of the gate trench electrically insulated from a top gate electrode disposed at a top portion of the gate trench by an inter-electrode insulation layer. At least one of the shielded bottom electrode is connected a source metal and at least one of the top electrodes in the gate trench is connected to a source metal of the power device.

Abstract: A variable resistance memory device includes a word line extending in a first direction, a bit line on the word line and extending in a second direction intersecting the first direction, a switching pattern between the bit line and the word line, a phase change pattern between the switching pattern and the word line, and a bottom electrode between the phase change pattern and the word line, wherein the phase change pattern has a bottom area greater than a top area of the bottom electrode, a thickness of the phase change pattern being greater than a thickness of the bottom electrode, and wherein the bottom and top areas are defined in the first and second directions, and the thicknesses are defined in a third direction intersecting the first and second directions.

Abstract: The semiconductor memory device of the embodiment includes a stacked body including interlayer insulating layers and gate electrode layers alternately stacked in a first direction; a semiconductor layer provided in the stacked body and extending in the first direction; a first insulating layer provided between the semiconductor layer and the gate electrode layers; conductive layers provided between the first insulating layer and the gate electrode layers; and second insulating layers provided between the conductive layers and the gate electrode layers and the second insulating layers containing ferroelectrics. Two of the conductive layers adjacent to each other in the first direction are separated by one of the interlayer insulating layers interposed between the two of the conductive layers, and a first thickness of one of the gate electrode layers in the first direction is smaller than a second thickness of one of the conductive layers in the first direction.

Abstract: According to one embodiment, a display device comprises a flexible substrate, a first insulating film disposed on the flexible substrate, a switching element disposed on the first insulating film, a signal wiring electrically connected with the switching element, a first organic film disposed on the signal wiring, a connection wiring disposed on the first organic film, a second organic film disposed on the connection wiring and a pad electrode disposed on the second organic film. The connection wiring is located between the first organic film and the second organic film and is in contact with the first organic film and the second organic film.

Abstract: Techniques are disclosed for forming dual-strain fins for co-integrated n-MOS and p-MOS devices. The techniques can be used to monolithically form tensile-strained fins to be used for n-MOS devices and compressive-strained fins to be used for p-MOS devices utilizing the same substrate, such that a single integrated circuit (IC) can include both of the devices. In some instances, the oppositely stressed fins may be achieved by employing a relaxed SiGe (rSiGe) layer from which the tensile and compressive-strained material can be formed. In some instances, the techniques include the formation of tensile-stressed Si and/or SiGe fins and compressive-stressed SiGe and/or Ge fins using a single relaxed SiGe layer to enable the co-integration of n-MOS and p-MOS devices, where each set of devices includes preferred materials and preferred stress/strain to enhance their respective performance. In some cases, improvements of at least 25% in drive current can be obtained.

Abstract: An example image sensor structure includes an image layer. The image layer includes an array of light detectors disposed therein. A device stack is disposed over the image layer. An array of light guides is disposed in the device stack. Each light guide is associated with at least one light detector of the array of light detectors. A passivation stack is disposed over the device stack. The passivation stack includes a bottom surface in direct contact with a top surface of the light guides. An array of nanowells is disposed in a top layer of the passivation stack. Each nanowell is associated with a light guide of the array of light guides. A crosstalk blocking metal structure is disposed in the passivation stack. The crosstalk blocking metal structure reduces crosstalk within the passivation stack.

Abstract: The present disclosure provides an integrated circuit (IC) structure. The IC structure includes first and second fins formed on a semiconductor substrate and laterally separated from each other by an isolation feature, the isolation feature formed of a dielectric material that physically contacts the semiconductor substrate; and a contact feature between the first and second fins and extending into the isolation feature thereby defining an air gap vertically between the isolation feature and the contact feature, the dielectric material of the isolation feature extending from the semiconductor substrate to the contact feature.

Abstract: A display device is disclosed, which includes a display area including a central region and a peripheral region. The display device includes: a first conductive line, a second conductive line, a first shielding portion and a second shielding portion. The first conductive line is disposed in the central region and extends along a first direction. The second conductive line is disposed in the peripheral region and extends along the first direction. The first shielding portion overlaps the first conductive line and comprises a first edge extending along the first direction and adjacent to the second conductive line. The second shielding portion overlaps the second conductive line and comprises a second edge extending along the first direction and away from the central region. A distance between the first conductive line and the first edge is different from a distance between the second conductive line and the second edge.

Abstract: A semiconductor device includes a substrate, a semiconductor fin, first and second source/drains, a gate electrode, and a gate contact. The semiconductor fin is disposed on the substrate. The first and second source/drains is disposed on the semiconductor fin. The gate electrode is across the semiconductor fin and exposes the first and second source/drains. The gate contact is disposed on the gate electrode and has an elliptical profile with a major axis extending along a lengthwise direction of the gate electrode when viewed from above the gate contact.

Abstract: An electronic component includes a substrate which has a first major surface on one side and a second major surface on the other side, a chip which has a mounting surface on one side and a non-mounting surface on the other side and is disposed on the first major surface of the substrate in a posture that the mounting surface faces the first major surface of the substrate, a sealing insulation layer which seals the chip so as to expose the non-mounting surface above the first major surface of the substrate, and a cover layer which covers the non-mounting surface of the chip.

Abstract: Provided is an organic electroluminescence display device including a substrate, a first electrode disposed on the substrate, a pixel defining layer disposed on the first electrode and having an opening defined therein for exposing at least a part of the first electrode, an organic layer disposed on the first electrode exposed by the opening and including a light emitting layer, and a second electrode disposed on the organic layer, wherein the pixel defining layer includes a base resin and a hindered amine light stabilizer (HALS).

Abstract: The present disclosure provides a top-gate thin film transistor, a manufacturing method thereof, and an array substrate and a display panel each comprising the top-gate thin film transistor. The top-gate thin film transistor comprises a light-shielding layer formed between the base substrate and the active layer and made of a non-metallic material. The non-metallic material may be a silicone material, such as a polyhedral oligomeric silsesquioxane or a linear silicone resin.

Abstract: A system and method for manufacturing semiconductor devices is provided. An embodiment comprises using an etchant to remove a portion of a substrate to form an opening with a 45° angle with a major surface of the substrate. The etchant comprises a base, a surfactant, and an oxidant. The oxidant may be hydrogen peroxide.

Abstract: A finFET device and methods of forming a finFET device are provided. The method includes forming a capping layer over a fin of a fin field effect transistor (finFET), where the fin is formed of a material comprising germanium. The method also includes forming a dummy dielectric layer over the capping layer. The method also includes forming a dummy gate over the dummy dielectric layer. The method also includes removing the dummy gate.

Abstract: The present disclosure relates to a CMOS image sensor having a multiple deep trench isolation (MDTI) structure, and an associated method of formation. In some embodiments, a plurality of photodiodes is formed from a front-side of a substrate. A plurality of boundary deep trench isolation (BDTI) trenches having a first depth and a plurality of multiple deep trench isolation (MDTI) trenches having a second depth are formed from a back-side of the substrate. A stack of dielectric layers is formed in the BDTI trenches and the MDTI trenches. A plurality of color filters is formed overlying the stack of dielectric layers corresponding to the plurality of photodiodes.

Abstract: A semiconductor device includes a drift zone formed in a semiconductor portion. In a transition section of the semiconductor portion a vertical extension of the semiconductor portion decreases from a first vertical extension to a second vertical extension. A junction termination zone of a conductivity type complementary to a conductivity type of the drift zone is formed between a first surface of the semiconductor portion and the drift zone and includes a tapering portion in the transition section. In the tapering portion a vertical extension of the junction termination zone decreases from a maximum vertical extension to zero within a lateral width of at least twice the maximum vertical extension.

Abstract: A semiconductor device includes a substrate includes a first layer and a second layer over the first layer, a bump disposed over the second layer, a molding disposed over the second layer and surrounding the bump, and a retainer disposed over the second layer, wherein the retainer is disposed between the molding and a periphery of the substrate. Further, a method of manufacturing a semiconductor device includes providing a substrate, disposing several bumps on the substrate, disposing a retainer on the substrate and surrounding the bumps, and disposing a molding between the bumps and the retainer.

Abstract: Disclosed is an electroluminescent display device that may include a plurality of pixels arranged in first and second directions, first, second, and third sub pixels provided in each of the plurality of pixels and arranged in the first direction, a first emission layer provided to correspond to at least two of the first sub pixels arranged in the second direction, a second emission layer provided to correspond to at least two of the second sub pixels arranged in the second direction, and a third emission layer provided to correspond to at least two of the third sub pixels arranged in the second direction, wherein the first emission layer, the second emission layer, and the third emission layer are spaced from one another and provided to emit different types of light.

Abstract: A light emitting device includes: a first electrode and a second electrode facing each other, an emissive layer disposed between the first electrode and the second electrode and including a quantum dot, an electron auxiliary layer disposed between the emissive layer and the second electrode and including a plurality of nanoparticles, and a polymer layer between a portion of the second electrode and the electron auxiliary layer, wherein the nanoparticles include a metal oxide including zinc, wherein the second electrode has a first surface facing a surface of the electron auxiliary layer and a second surface opposite to the first surface, and the polymer layer is disposed on a portion of the second surface and a portion of the surface of the electron auxiliary layer, and wherein the polymer layer includes a polymerization product of a thiol compound and an unsaturated compound having at least two carbon-carbon unsaturated bonds.

Abstract: A display device is described that has reduced resistance in one or more of the gate, common, data electrical lines that control the operation of the pixels of the display device. Reduced resistance is achieved by forming additional metal and/or metal-alloy layers on the gate, common, and/or data lines in such a manner so that the cross-sectional area of those lines is increased. As a consequence, each such line is formed so as to be thicker than could otherwise be achieving without causing defects in the rubbing process of an alignment layer. Additionally, no widening of these lines is needed, thus preserving the aspect ratio of the device. The gate insulating and semiconducting layers that in part make up the thin film transistors that help control the operation of the pixels of the device may also be designed to take into account the increased thickness of the lines.