Patents Examined by Glenn W. Brown
  • Patent number: 6369588
    Abstract: A system for electrically measuring variations over a flexible web has a capacitive sensor including spaced electrically conductive, transmit and receive electrodes mounted on a flexible substrate. The sensor is held against a flexible web with sufficient force to deflect the path of the web, which moves relative to the sensor.
    Type: Grant
    Filed: November 9, 1999
    Date of Patent: April 9, 2002
    Inventors: Gerard E. Sleefe, Thomas J. Rudnick, James L. Novak
  • Patent number: 6366098
    Abstract: A test structure includes a single current-measuring means for measuring current between a supply terminal and ground, and first and second branches for measuring capacitance between first and second metal lines. The first branch includes a first switch coupled between the current-measuring means and the first line, and a second switch coupled between the first line and ground. Similarly, the second branch includes a third switch coupled between the current-measuring means and the second line, and a fourth switch coupled between the second line and ground. A method for testing a circuit is also provided.
    Type: Grant
    Filed: June 18, 1999
    Date of Patent: April 2, 2002
    Assignee: STMicroelectronics S.A.
    Inventor: BenoƮt Froment
  • Patent number: 6366076
    Abstract: The current to be measured (I) passes in a conductor (1) enclosed with a Rogowski coil (4) and in the proximity thereof are arranged several magnetic field detectors (3). The sum of the signals from these detectors, formed in the device (2), and the signal supplied by the Rogowski coil are applied to a signal processor (7). The processor (7) comprises, for example, a first order delay device connected to the Rogowski coil output and means for amplifying/reducing the signals followed by adding means, the delay time constant and the amplifying/reducing factors being selected so that the device output (8) signal is proportional to the intensity of the current to be measured in a very wide frequency range, i.e. from 0 to more than 10 MHz.
    Type: Grant
    Filed: October 20, 1999
    Date of Patent: April 2, 2002
    Assignee: Liaisons Electroniques-Mecaniques LEM SA
    Inventors: Nicolas Karrer, Patrick Hofer-Noser
  • Patent number: 6366074
    Abstract: A method for creating signal unidirectionality in electronic circuits is disclosed. This invention describes a method for achieving unidirectionality in an electronic circuit with an input side having a signal source and an output side with a load comprising detecting the current passing through the load on the output side, bypassing a portion of the current passing through the load on the output side, and feeding the bypassed portion of the current on the output side to the input side to achieve unidirectionality. Specifically, unidirectionality in an electronic circuit is accomplished by applying feedback such that the impedance looking into the input of the amplifier is increased. These methods are particularly applicable to negative resistance amplifier circuits.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: April 2, 2002
    Assignee: Agere Systems Guardian Corp
    Inventor: Masakazu Shoji
  • Patent number: 6362642
    Abstract: The present invention relates to methods of testing a chip package wherein contact to chip leads is made by a configuration of testing probes in such a manner so as to allow for shorter, tighter-pitch, and more robust chip leads that will not short out into neighboring adjacent chip leads. The present invention also relates to methods of testing a chip package wherein the terminal ends of the chip leads are constrained in a dielectric medium such that package testing may be carried out before final sizing of chip lead lengths.
    Type: Grant
    Filed: February 8, 2000
    Date of Patent: March 26, 2002
    Assignee: Micron Technology, Inc.
    Inventor: Warren M. Farnworth
  • Patent number: 6362627
    Abstract: The voltage measuring apparatus of the present invention comprises: a capacitor configured of a plurality of capacitor elements and divided at a connection point into two sections of the same capacitance; a first switching device for connecting a voltage source to be measured to both terminals of the capacitor; a differential amplifier; a second switching device for connecting both terminals of the capacitor to inputs of the differential amplifier; and a third switch for connecting the connection point in the capacitor to signal reference potential of the differential amplifier in time synchronization with the second switching device.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: March 26, 2002
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Takeshi Shimamoto, Nobuyoshi Nagagata
  • Patent number: 6362639
    Abstract: A compliant contactor interfaces a semiconductor device under test with a tester. The compliant contactor accepts a variety of different sized semiconductor devices along with a variety of different pinouts of the semiconductor devices. The compliant contactor includes an upper alignment block and a lower alignment block which receives the contact pins of the tester. The upper alignment block may move within a predefined distance with respect to the lower alignment block to account for any tester movement, thermal expansion or contraction, or other factors. In an alternative embodiment, the compliant contactor may move in three directions with respect to the test board. In this embodiment, a contact pad provides electrical connection between a daughter card and the test board. The contact pad may be a compressible elastomeric connector.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: March 26, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Justin L. Lawrence, Steven L. Hamren
  • Patent number: 6362643
    Abstract: A driving circuit testing method that can quickly perform a test of a driving circuit in a liquid crystal display and repair defects thereof applies a test signal in parallel to a plurality of gate lines and a start signal to a first gate driving cell. The start signal and the test signal on the plurality of gate lines are latched into the plurality of gate driving cells. Then, the test signal is removed from the gate lines and the latched test signals latched into the plurality of gate driving cells are applied to the plurality of gate. Finally, an enable state in each gate line is detected to determine if one or more of the gate driving cells is defective.
    Type: Grant
    Filed: December 13, 1999
    Date of Patent: March 26, 2002
    Assignee: LG. Philips LCD Co., LTD
    Inventor: Seong Gyun Kim
  • Patent number: 6362628
    Abstract: An arc fault detecting circuit using a pulse width modulation, or PWM, technique is used to sense series or parallel arc faults. When arc faults occur, typically an arc step in current is followed by broad band arc noise which is caused by the random fluctuations in arc column resistance. In this invention, a logic signal is created which has a duration or width that corresponds to the time interval during which the broad band arc noise generated by the arc is present. Typically an arc fault randomly starts, generates broad band arc noise, and then extinguishes as the next current zero cross of the AC load current is approached. The random start causes PWM of the logic pulse whenever the start of the arc randomly moves with respect to the current zero cross. An arc fault that randomly starts, and then randomly stops, will also cause PWM with respect to the zero cross.
    Type: Grant
    Filed: April 21, 1999
    Date of Patent: March 26, 2002
    Assignee: Pass & Seymour, Inc.
    Inventors: Bruce F. Macbeth, Thomas N. Packard
  • Patent number: 6359444
    Abstract: A resonant sensing apparatus for operative arrangement within a test environment to sense an analyte. A sensing structure is included having an antenna in electrical communication with a resonant circuit and a structural element made of a material that selectively responds to the analyte. This sensing structure will resonate at a particular characteristic resonant frequency in the presence of an applied interrogation electromagnetic field and the analyte upon the occurrence of the selective response. A receiver is used for remotely identifying a value for the characteristic resonant frequency by measuring a plurality of values for electromagnetic emission intensity of the sensing structure taken over an operating range of frequencies. A length of a conductive segment of any component of the resonant circuit may also function as the antenna.
    Type: Grant
    Filed: May 28, 1999
    Date of Patent: March 19, 2002
    Assignee: University of Kentucky Research Foundation
    Inventor: Craig A. Grimes
  • Patent number: 6359453
    Abstract: A vertical probe card assembly containing a plurality of vertical probe cards is mounted within a central corridor or opening within a magnetic field generator. Each of the vertical probe cards has a multiplicity of probe needles extending downwardly therefrom for electrically contacting test pads of a device under test that is positioned below the magnetic field generator.
    Type: Grant
    Filed: February 23, 1999
    Date of Patent: March 19, 2002
    Assignee: Veeco Instruments Inc.
    Inventors: James M. Forbis, Dennis J. Cahalan
  • Patent number: 6359445
    Abstract: The microwave sensor produces an electrical output signal according to a position or displacement of a movable mechanical part (2), especially a valve needle in an injector valve for injecting fuel into an internal combustion engine. This position or displacement sensor includes a cavity resonator (40,70) provided with walls bounding a cavity (4,7) dimensioned for microwaves of a predetermined frequency and an antenna (8,14) for reception of the microwaves in the cavity. The end (3) of the movable mechanical part (2) protrudes into the cavity. A hybrid evaluating circuit (9) is connected with the antenna, which detects changes in the microwave radiation fed into and coupled out of the cavity, e.g. phase relationships, which depend on the position of the mechanical part (2), so that small position changes in very tight spaces are accurately determined.
    Type: Grant
    Filed: May 17, 1999
    Date of Patent: March 19, 2002
    Assignee: Robert Bosch GmbH
    Inventors: Heinz Pfizenmaier, Klaus Voigtlaender
  • Patent number: 6359450
    Abstract: An arrangement that can be implemented with a simple circuit includes a measuring resistance that can either be connected in addition to a load or connected in place of the load. Furthermore, elements are provided that record the change in resistance resulting from the connection of the measuring resistance and signal when the change in resistance differs from a predefined value.
    Type: Grant
    Filed: February 19, 1998
    Date of Patent: March 19, 2002
    Assignee: Robert Bosch GmbH
    Inventors: Erich Zabler, Anton Dukart, Thomas Herrmann
  • Patent number: 6356097
    Abstract: A method and apparatus for estimating voltage on a wafer located in a process chamber. A probe, embedded in a wall of the process chamber, detects voltage levels generated by a plasma within the process chamber. A relationship between the detected plasma voltage level and the wafer voltage is determined.
    Type: Grant
    Filed: July 27, 1999
    Date of Patent: March 12, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Peter K. Loewenhardt, Arthur Sato, Valentin Todorov
  • Patent number: 6356067
    Abstract: A wide band signal analyzer includes a frequency converter for converting a signal under test to an intermediate frequency signal. A narrow band signal processor receives the intermediate frequency signal and produces a first digital signal representing a first frequency band of the intermediate frequency signal and a wide band signal processor receives the intermediate frequency signal and produces a second digital signal representing a second frequency band of the intermediate frequency signal. A transfer rate decelerator decelerates the transfer rate of the second digital signal, and a digital processor processes selectively the first digital signal or the output signal of the transfer rate decelerator. A memory stores the processed output of the digital processor.
    Type: Grant
    Filed: August 5, 1999
    Date of Patent: March 12, 2002
    Assignee: Sony/Tektronix Corporation
    Inventor: Akira Nara
  • Patent number: 6356094
    Abstract: An automated method of handling multi-chip modules (MCMs) in conjunction with automated module testing. The method includes providing a plurality of MCMs in a magazine at an input location and positively displacing the magazine through an indexing device. At the indexing device, the MCMs are each positively retreived and guided to a test site, tested, and positively ejected for sorting according to the results of the testing. Depending on the testing results, the MCMs may be placed in a shipping tray or in a discard bin. The emptied magazine is further displaced to an output location where it may be stacked with similar emptied magazines.
    Type: Grant
    Filed: November 29, 2000
    Date of Patent: March 12, 2002
    Assignee: Micron Technology, Inc.
    Inventors: Mark A. Tverdy, William C. Layer, Lothar R. Kress, Eric M. Matthews
  • Patent number: 6353321
    Abstract: A resistivity tool and associated method include measuring the phase shift of an electromagnetic signal at different locations. Preferably, this is accomplished by a resistivity tool having three receivers. The difference of the phase shifts at the different locations indicates with precision the depth in a borehole of a bed boundary. The preferred resistivity tool also yields improved radial resolution.
    Type: Grant
    Filed: January 27, 2000
    Date of Patent: March 5, 2002
    Assignee: Halliburton Energy Services, Inc.
    Inventor: Michael Bittar
  • Patent number: 6353324
    Abstract: The present invention relates to an electronic circuit and an array of such circuits for precisely measuring small amounts or small changes in the amount of charge, voltage, or electrical currents. One embodiment of the present invention provides an electronic circuit for measuring current or charge that can be used with a variety of sensing media (including high impedance sensing media) that produce a signal by either charge or current production or induction in response to physical phenomena occurring within the sensing media. In another embodiment, the voltage level (bias) of either the sensing or reference electrode can be switched relative to the other upon receipt of a triggering pulse. This changes the polarity of the electric field to cause charge of the opposite polarity to be driven to the sensing electrode, thereby eliminating the need to electrically connect a discharge path to the sensing electrode to clear the charge accumulated at the sensing electrode.
    Type: Grant
    Filed: November 5, 1999
    Date of Patent: March 5, 2002
    Assignee: Bridge Semiconductor Corporation
    Inventors: Arthur E. Uber, III, Joshua J. Ziff, Robert E. Uber
  • Patent number: 6348795
    Abstract: A method for determining a resonant frequency of a mechanical device having a first mass and at least one second mass mechanically coupled to the first mass comprises the steps of: providing a control signal to a voltage-controlled oscillator (VCO) to control the frequency of an output thereof; translating a phase shifted output of the VCO into an oscillatory force which is applied to one of the first and second masses to cause the mechanical device to respond; measuring the response of the mechanical device and generating a response signal representative thereof in frequency and amplitude; generating an error signal proportional to the phase difference between a signal representative of the output of the VCO and the measured response signal; adjusting the control signal to cause the oscillatory force applied to the one mass to sweep within a calculated frequency range rendering the amplitude of the response signal to approach and exceed a calculated threshold value; and when the calculated threshold is excee
    Type: Grant
    Filed: July 12, 2001
    Date of Patent: February 19, 2002
    Assignee: The B. F. Goodrich Co.
    Inventors: Ralph Pringle, Jr., Felix E. Morgan
  • Patent number: 6348801
    Abstract: A method and a communications device are described, comprising a radio telephone (5) with connected antenna path (1) which can be used to locate precisely a defective area (F) in the antenna path (1) in order to be able to repair the antenna path (1) in a selective fashion. For this purpose, initially a wave with a starting frequency (f0) is coupled into the antenna path (1), and the amplitude of the standing wave at an angular position is measured. Then, the frequency of the wave is increased until a corresponding amplitude is detected at the same angular position. From the frequencies present then and from a reading (n) which indicates how often the corresponding amplitude has been obtained, the fault interval (Ed) between the detector (18) and defective area (F) is then calculated.
    Type: Grant
    Filed: March 23, 2000
    Date of Patent: February 19, 2002
    Assignee: Nokia Mobile Phones Ltd.
    Inventor: Andreas Pietsch