Abstract: A glass inspection equipment includes a first transfer rail extending in a first direction, where a glass including first sides and second sides extending in a direction intersecting the first sides reciprocates in the first direction, a rotation part on the first transfer rail to rotate the glass, an edge inspection part on the first transfer rail to inspect the first and second sides of the glass, and a surface inspection part which inspects a surface of the glass, the edge inspection part inspects the first sides when the glass with the first sides arranged parallel to the first direction is transferred under the edge inspection part, and the edge inspection part inspects the second sides when the glass transferred through the edge inspection part is rotated by the rotation part and the glass with the second sides parallel to the first direction is transferred under the edge inspection part.

Abstract: Systems and methods here may be used for capturing images of sample gemstones under structured, filtered illumination for later comparison and image matching for authentication using networked computer systems.

Abstract: This invention relates to the process of correcting misalignment and filling voids after a microdevice transfer process. The process involves transfer heads, measurement of offset and misalignment in horizontal, vertical, and rotational errors. An execution of the new offset vector for the next transfer corrects the alignment.

Abstract: A multi-column metrology tool may include two or more measurement columns distributed along a column direction, where the two or more measurement columns simultaneously probe two or more measurement regions on a sample including metrology targets. A measurement column may include an illumination sub-system to direct illumination to the sample, a collection sub-system including a collection lens to collect measurement signals from the sample and direct it to one or more detectors, and a column-positioning sub-system to adjust a position of the collection lens. A measurement region of a measurement column may be defined by a field of view of the collection lens and a range of the positioning system in the lateral plane. The tool may further include a sample-positioning sub-system to scan the sample along a scan path different than the column direction to position metrology targets within the measurement regions of the measurement columns for measurements.

Abstract: Systems and methods here may be used for capturing and analyzing reflectance images of facets on a gemstone under particular lighting and camera setups to automatically generate a clarity grade and/or surface polish grade for the gemstone.

Abstract: An optical displacement sensor comprises a reflective surface and one or more diffraction gratings which, together with the reflective surface, each define a respective interferometric arrangement. The reflective surface is moveable relative to the diffraction grating(s) or vice versa. Light from a light source propagates via the interferometric arrangement(s) to produce an interference pattern at a respective set of photo detectors. Each interference pattern depends on the separation between the reflective surface and the respective grating. A collimating optical arrangement at least partially collimates the light between the light source and the diffraction grating(s).

Abstract: An optical distance measuring device includes: a light source unit that irradiates a measurement region with irradiation light; a light receiving unit that has a light receiving surface including a plurality of light receiving elements capable of receiving reflected light from a range including the measurement region corresponding to irradiation with the irradiation light and outputs a signal corresponding to a light receiving state of the reflected light for each of the light receiving elements; and a measurement unit that measures a distance to an object in the measurement region by using the signal outputted from the light receiving unit. The light receiving unit has a function of selecting a light receiving element that outputs the signal so that a light receiving position at which the reflected light is received is variable, and the light receiving unit changes the light receiving position to a plurality of positions with respect to a position of the reflected light.

Abstract: System for simultaneous measurement Raman and mid-infrared absorption signals from a sample, the system comprising an ATR crystal adapted for holding a sample thereon, at least one Raman excitation light source for Raman excitation, at least one FTIR excitation light source for FTIR excitation, at least one photodetector configured for collecting signals with a wavelength comprised at least in one of the IR spectrum or the Raman spectrum, a wavelength-dispersive device, such as a spectrometer, for collecting Raman signals, an excitation lens, and collection optics comprising a first collection lens.

Abstract: An apparatus for sensing particulate matter in a fluid includes a fluid flow conduit fluidically connected to an interaction chamber; a light source positioned to illuminate the interaction chamber; and a light detector assembly positioned to receive light scattered by particulate matter present in the interaction chamber. The light detector assembly includes a light detector; and an optical element, the optical element configured to provide light to the light detector based on an incidence angle of the scattered light.

Abstract: An apparatus includes an element to transmit a partial amount of first light guided through the M cores of a target object and second light guided through M optical waveguides, and to reflect remaining amount thereof, a first modulator to individually modulate the first light, a first detector to output a first signal based on the first light reflected by the element and the second light passing through the element, a second detector to output a second signal based on the first light passing through the element and the second light reflected by the element, an optical system configured such that the first light and the second light overlap in pairs on the first and second detectors, and a processing unit configured to output information about mode-dependent loss of the target object based on the first signal, the second signal, and information about modulation given by the first modulator.

Abstract: An apparatus and method for radiation measurement are used to determine clearance of a rotating gas turbine component. The apparatus includes a probe body on a stationary component outward of the rotating component and a pair of sensor assemblies coupled to the probe body. Each sensor assembly includes a plurality of prisms coupled to the probe body Each prism of the plurality of prisms has a distinct angular orientation to direct radiation from the focusing lens to the rotating component surface off-axis with respect to an axis of the respective radiation source of the pair of radiation sources and with less directional variation than radiation from the respective radiation source.

Abstract: An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.

Abstract: A coherent Raman spectro-microscopy system is configured for generating a spectro-microscopic image of a sample and includes a light source, a supercontinuum spectrum generator, a color filter assembly, and a spectro-microscopic assembly. The light source is for emitting at least one pulsed laser beam. The supercontinuum spectrum generator is for broadening the bandwidth of at least one pulsed laser beam. The color filter assembly is for filtering the bandwidth of at least one pulsed laser beam according to a predetermined bandwidth and converting at least one pulsed laser beam into a coherent spectro-microscopic laser beam. The sample is disposed in the spectro-microscopic assembly, and the spectro-microscopic assembly receives the coherent spectro-microscopic laser beam so that the coherent spectro-microscopic laser beam passes through the sample to generate the spectro-microscopic image of the sample.

Abstract: The present invention relates to a system for detecting and predicting the presence of pathogens in a predetermined area of a field comprising a network of measurement stations, each measurement station comprising a first type of sensor adapted to measure environmental data, and a second type of sensor adapted to detect airborne pathogens, the system further comprising a computer processing unit adapted to collect the data to the two types of sensors and treat them by artificial intelligence to provide real-time spatially and temporally resolved data about the early detection of the pathogens as well as environmental data that are correlated to the spread and development of the pathogens and the plant disease and identify specific patterns representative of situations where treatment is required and a communication device able to send a signal to said field user indicating in which area treatment is required.

Abstract: A dark field metrology device includes an objective lens arrangement and a zeroth order block to block zeroth order radiation. The objective lens arrangement directs illumination onto a specimen to be measured and collects scattered radiation from the specimen, the scattered radiation including zeroth order radiation and higher order diffracted radiation. The dark field metrology device is operable to perform an illumination scan to scan illumination over at least two different subsets of the maximum range of illumination angles; and simultaneously perform a detection scan which scans the zeroth order block and/or the scattered radiation with respect to each other over a corresponding subset of the maximum range of detection angles during at least part of the illumination scan.

Abstract: A system for providing advanced characterization of an optical fiber span is based upon the use of a pair of optical time domain reflectometers (OTDRs), located at opposing end terminations of the span being characterized. Each OTDR performs standard reflectometry measurements and transmits the resulting OTDR trace to monitoring equipment in a typical manner. The pair of OTDR traces is thereafter combined in a particular manner (“stitched together”) to create an OTDR trace of the entire fiber span (essentially doubling the operational range of prior art OTDR measurement capabilities). The transmit portion of one OTDR may be paired with the receive portion of the other OTDR, with time-of-light measurements (or signal loss measurements) used to determine optical path length and/or optical signal loss of the span. Using a multi-wavelength light source in the paired transmit/receive arrangement allows for a characterization of chromatic dispersion of the span.

Abstract: A detecting device of the present disclosure includes a light emitting portion that emits light and a light receiving portion including an angle limiting member that limits an angle of incidence of light from the light emitting portion, wherein the light receiving portion has a first light receiving region and a second light receiving region that is spaced further from the light emitting portion than the first light receiving region is, the angle limiting member includes a first limiting region corresponding to the first light receiving region and a second limiting region corresponding to the second light receiving region, and the degree of angle limitation of the second limiting region is smaller than the degree of angle limitation of the first limiting region.

Abstract: In an analysis method and an analysis system for detecting fluorescences from each of a plurality of light-emitting points in a plurality of wavelength bands in order to identify fluorescence emissions of a plurality of types of fluorophores from the plurality of light-emitting points, spatial crosstalk and spectral crosstalk are present between the plurality of light-emitting points and between the plurality of wavelength bands, and then performance of the identification is reduced. The spatial crosstalk and the spectral crosstalk are eliminated and concentrations of each of the plurality of types of fluorophores at each of the plurality of light-emitting points are derived by inputting all detection signals in the plurality of wavelength bands for the plurality of light-emitting points to a predetermined arithmetic operation expression.

Abstract: An apparatus includes a control unit configured to control an illumination unit such that two or more light sources from among the plurality of light sources of the illumination unit are turned on when an image of an object is captured, and a derivation unit configured to derive a reflection characteristic of the object based on image data obtained by capturing the image of the object, wherein the control unit turns on the two or more light sources such that a distance between the two or more light sources is greater than a predetermined threshold value.

Abstract: A method is disclosed for selecting an optimal value for an adjustable parameter of a structured light metrology (SLM) system, for scanning an object. The SLM system performs test scans of the object to acquire a plurality of sets of measurements of the object, wherein a different value is used for the parameter for each test scan. For each test scan, a value of a quality metric is calculated, based on the set of measurements of the object associated with the test scan and simulation data representing a simulated scan of the object by the SLM system. A test scan is then identified that has a quality metric value that satisfies a specified optimization criterion; and a value of the adjustable parameter that was used for the identified test scan is selected as the optimal value of the adjustable parameter, for scanning the object.