Abstract: A method for reconstructing a surface of an object includes the steps as follows. A light beam is modulated by a spatial light modulator (SLM) and is projected to form a pattern, wherein the pattern has a transmittance distribution in a cosine distribution such that the pattern is formed to become a fringe pattern with a periodic change. A first impulse and a second impulse present within a first period and a second period of the cosine distribution, wherein a position where the first impulse occurs within the first period and a position where the second impulse occurs within the second period are different. The light beam is guided to an object so as to form a scan pattern on the object. The scan pattern is read. According to the scan pattern, a surface profile of the object is calculated.

Abstract: A method of distinguishing whether a detected change in reflected power in an optical time domain reflectometer (OTDR) measurement carried out in a fiber optic transmission system (16) using an OTDR is caused by a an event causing actual attenuation or a change in a mode field diameter, comprising the steps of emitting a succession of first sampling light pulses of a first wavelength into the fiber optic transmission system (16) while a pumping signal with a second wavelength is emitted into the fiber optic transmission system (16), and measuring a first OTDR trace (34?) resulting from the reflection of the first sampling light pulses in the fiber optic transmission system (16), such that the first sampling light pulses and their reflections interact with the pumping signal via stimulated Raman scattering.

Abstract: A hemoglobin sensor capable of quickly detecting occult blood of excreta in a toilet and a detecting method thereof are disclosed. The hemoglobin sensor includes a handheld housing and a result presentation unit. The housing includes a light emitting unit, an operating interface, a light sensing unit, and a data processor disposed therein. The operating interface is connected to the light emitting unit for activating the light emitting unit to emit a plurality of incident light beams having wavelengths in a range between 350 nm and 800 nm. The incident light beams penetrate a solution in a container having excreta and hit a light reflector of the container to produce at least one detection light beam. The light sensing unit receives the detection light beam and output a detection signal, and the data processor generates a detection result data after receiving the detection signal and analyzing it.

Abstract: A component inspecting device inspects presence or absence of an abnormal state of two linear wires based on changes in the amount of received light of a first light ray and a second light ray received by a first light receiver and a second light receiver, respectively when a component is moved such that the two linear wires in the normal state block the first light ray and the second light ray in a posture wherein an arrangement direction of the two linear wires crosses optical axes of the first light ray of the first light projector and the second light ray of the second light projector. This device can detect an abnormality such as a bend or the like of linear wires by a simple configuration and a simple operation in a component having two linear wires which have axis directions parallel to each other and have different lengths.

Abstract: In the measurement of properties of a wafer substrate, such as Critical Dimension or overlay a sampling plan is produced 2506 defined for measuring a property of a substrate, wherein the sampling plan comprises a plurality of sub-sampling plans. The sampling plan may be constrained to a predetermined fixed number of measurement points and is used 2508 to control an inspection apparatus to perform a plurality of measurements of the property of a plurality of substrates using different sub-sampling plans for respective substrates, optionally, the results are stacked 2510 to at least partially recompose the measurement results according to the sample plan.

Abstract: A multi-core fiber includes multiple optical cores, and for each different core of a set of different cores of the multiple optical cores, a total change in optical length is detected. The total change in optical length represents an accumulation of all changes in optical length for multiple segments of that different core up to a point on the multi-core fiber. A difference is determined between the total changes in optical length for cores of the set of different cores. A twist parameter and/or a bend angle associated with the multi-core fiber at the point on the multi-core fiber is/are determined based on the difference.

Abstract: A system for measuring an absorption coefficient of a doped optical fiber may include: a laser source configured to transmit laser light at a selectable wavelength; a single-mode optical fiber including an end configured to splice to the doped optical fiber; two or more multimode fibers at a side of the doped optical fiber, spaced apart along the side of the doped optical fiber, configured to collect spontaneous emissions from the side of the doped optical fiber; and/or a photodiode or power meter connected to the two or more multimode fibers. A method for measuring an absorption coefficient of a doped optical fiber may include: collecting, from a side of the doped optical fiber, an emission spectrum using two or more multimode fibers; and/or calculating the absorption coefficient form using the emission spectrum and McCumber theory.

Abstract: A laser positioning system includes a laser scanner, a first positioning tag, a second positioning tag, and a processing unit. The laser scanner is disposed on a mobile carrier and is for emitting a light beam to a positioning board and receiving a plurality of reflected light spot signals generated by the light beam reflected from the positioning board. The first positioning tag and the second positioning tag are for reflecting the light beam to generate a first positioning signal and a second positioning signal to the laser scanner. The processing unit is for finding information of positions of the light beam projected on the first positioning tag and the second positioning tag, and filtering the reflected light spot signals to define a reference coordinate for the processing to calculate relative positions of the laser scanner and the positioning board according to the reference coordinate.

Abstract: A three-dimensional scanning device including: a projection unit for projecting a wide-area pattern and a local pattern on an object to be measured; an image acquisition unit for acquiring an image of the object on which the wide-area pattern and the local pattern are projected; a detection unit for detecting the locations of a plurality of first IDs that are identifiers formed in the shape that can be distinguished utilizing image information in a space within a certain range in the image of the object, on which the wide-area pattern is projected, acquired by the image acquisition unit; a collection unit for collecting data on a brightness value within a predetermined certain distance with respect to the center point of the detected first ID; and an operation unit for determining a first ID value of the first ID using information of the collection unit.

Abstract: Methods and systems for robust overlay error measurement based on a trained measurement model are described herein. The measurement model is trained from raw scatterometry data collected from Design of Experiments (DOE) wafers by a scatterometry based overlay metrology system. Each measurement site includes one or more metrology targets fabricated with programmed overlay variations and known process variations. Each measurement site is measured with known metrology system variations. In this manner, the measurement model is trained to separate actual overlay from process variations and metrology system variations which affect the overlay measurement. As a result, an estimate of actual overlay by the trained measurement model is robust to process variations and metrology system variations. The measurement model is trained based on scatterometry data collected from the same metrology system used to perform measurements. Thus, the measurement model is not sensitive to systematic errors, aysmmetries, etc.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: A 3D profile measurement method includes: forming structured light having a sinusoidal intensity pattern by forcing light to pass through a grating filter and an objective lens; acquiring a structured illumination image of a measurement object by photographing the measurement object with the structured light projected thereon at predetermined intervals in a height direction of the measurement object and a uniform illumination image of the measurement object is acquired by photographing the measurement object under illumination with general light rather than the structured light; generating a Hi-Lo image by using the structured illumination image and the uniform illumination image at each height of the measurement object; extracting height-specific intensity of respective pixels in the plural Hi-Lo images; and generating a 3D profile of the measurement object based on the obtained surface position.

Abstract: A laser angle measuring device has a concave detection surface with a plurality of light sensors and an opaque light shield. One or more multi-axis gravity sense potentiometers determine the orientation of the laser angle measuring device, and a GPS receiver determines the location of the laser angle measuring device. The laser angle measuring device is part of a system including one or more laser emitters, each with one or more selectable laser sources. Each laser emitter may also include location and orientation measuring mechanisms.

Abstract: Majorana photons are transmitted through a biological tissue sample to image the tissue. The Majorana photons have a circular polarization, a radial polarization or an azimuthal polarization. The transmitted photons are processed to produce a digital image of the biological tissue sample.

Abstract: A light-emitting module for use in a system for measuring whole-blood hemoglobin parameters or whole-blood bilirubin parameters. The light-emitting module includes an LED light source capable of emitting light wherein the light is directed thereby defining an optical path and a plurality of optical components. The plurality of optical components includes a collimating lens, a first optical diffuser, a circular polarizer, and a focusing lens wherein the plurality of optical components is disposed within the optical path of the light from the LED light source.

Abstract: This document describes a method of determining an overlay error during manufacturing of a multilayer semiconductor device. Manufacturing of the semiconductor device comprises forming a stack of material layers comprising depositing of at least two subsequent patterned layers of semiconductor material, the patterned layers comprising a first patterned layer having a first marker element and a second patterned layer having a second marker element. The determining of the overlay error comprises determining relative positions of the first and second marker element in relation to each other, such as to determine the overlay error between the first patterned layer and the second patterned layer. In addition an imaging step is performed on at least one of said first and second patterned layer, for determining relative positions of the respective first or second marker element and a pattern feature of a device pattern comprised by said respective first and second patterned layer.

Abstract: There is provided an imaging device including: an imaging section including pixels that generate pixel signals on the basis of incident light, the pixels including a polarization pixel having a predetermined polarization direction and a non-polarization pixel; and a polarization rotating section provided on an incidence plane side of the imaging section, and configured to rotate a polarization direction of the incident light.

Abstract: Methods of designing metrology targets are provided, which comprise distinguishing target elements from their background area by segmenting the background area and optionally segmenting the target elements. The provided metrology targets may maintain a required feature size when measured yet be finely segmented to achieve process and design rules compatibility which results in higher accuracy of the metrology measurements. Particularly, all transitions between target features and adjacent background features may be designed to maintain a feature size of the features below a certain threshold.

Abstract: Various embodiments provide an elongated part measuring apparatus including an elongated frame, an elongated transparent part supporter supported by the frame and configured to support an elongated part (such as a guide wire or mandrel), an elongated movable part straightener pivotally connected to and supported by the frame, and a movable optical measurer movably connected to and supported by the frame and configured to take multiple spaced apart outer dimensional measurements of the elongated part (whether uncoated or coated).

Abstract: A gas concentration-length quantification method may include: acquiring a multi-spectral image of detected radiance including a plurality of pixels using a multi-spectral optical gas imaging camera; estimating a background radiance for at least one of the pixels; calculating a gas concentration-length for the at least one of the pixels based on the detected radiance and the estimated background radiance; and triggering an alert when each alert condition in a list of alert conditions is satisfied. A multi-spectral configuration of the camera may include a reference band that is outside an absorption window of a target gas and an active band that includes at least a portion of the absorption window. Estimating the background radiance may include determining a model relating a detected radiance of the active band to a detected radiance of the reference band and using the model to estimate the background radiance for the active band.