Abstract: The systems and methods disclosed herein are used to estimate the insertion loss of an anticipated optical connection between a first optical connector having least one first optical fiber and a second optical connector having at least one second optical fiber. The method includes extracting first connector information stored on the first optical connector to obtain extracted first connector information and extracting second connector information stored on the second optical connector to obtain extracted second connector information. The estimated insertion loss of the anticipated optical connection between the first optical connector and the second optical connector is calculated using the extracted first connector information and the extracted second connector information. The total estimated insertion loss of a fiber link that includes one or more such optical connections can be used to qualify the fiber link without having to directly measure the fiber link insertion loss.

Abstract: The 3D information generating device includes a light source unit configured to irradiate light onto a target object, a coordinate mechanism unit disposed between the target object and the light source unit and including a plurality of inclined projections reflecting the light, a camera unit configured to output an image obtained by simultaneously photographing the coordinate mechanism unit and the target object, and an information processing unit configured to check a projection plane formed by the light of the light source unit and, by using the projection plane, generate 3D information about the target object while calibrating an error. Accordingly, an unskilled user may easily perform a 3D scan operation by using the coordinate mechanism unit, and moreover, since a coordinate mechanism is not installed in the outside, the 3D information generating device may easily move and may be easily maintained and managed.

Abstract: The invention includes a pulse oscillated light source, an illumination unit that guides light output from the light source to a sample, a scanning unit that controls a position at which the sample is scanned by the illumination unit, a light converging unit that converges light reflected from the sample, a first photoelectric conversion unit that outputs an electric signal corresponding to the light converged by the light converging unit, an AD conversion unit that converts the electric signal output from the first photoelectric conversion unit into a digital signal in synchronization with pulse oscillation of the light source, a linear restoration unit that processes a digital signal converted by the AD conversion unit in synchronization with a pulse oscillation output by the AD conversion unit and corrects nonlinearity of the first photoelectric conversion unit, a defect detection unit that detects a defect of the sample based on an output of the linear restoration unit, and a processing unit that obtains

Abstract: A test structure for use in metrology measurements of a sample pattern formed by periodicity of unit cells, each formed of pattern features arranged in a spaced-apart relationship along a pattern axis, the test structure comprising a test pattern, which is formed by a main pattern which includes main pattern features of one or more of the unit cells and has a symmetry plane, and a predetermined auxiliary pattern including at least two spaced apart auxiliary features located within at least some of those features of the main pattern, parameters of which are to be controlled during metrology measurements.

Abstract: The invention relates to a method for positioning measurement points (15, 18) with respect to a feature (8) locationally fixed on an object (5), wherein the object (5) is moved along an adjustment track. A first and a second optical detection region (10, 11) are formed, by means of which the current actual position of the feature (8) is detected. The two detection regions (10, 11) are arranged overlapping each other thus forming an overlapping section (13). The measurement points (15, 18) are each arranged at a predefined fixed distance (16, 19) from the feature (8). If the feature (8) is within the first detection region (10), the measurement occurs at the first positioned measurement point (15). If the feature (8) is within the overlapping section (13), the first measurement point (15) is deactivated and the second measurement point (18) is activated and the measurement is performed.

Abstract: An apparatus and associated a method are described for performing gas analysis on a gas sample. The method comprising exciting the gas sample with one or more electromagnetic energy sources and obtaining optical absorption signals associated with the gas sample prior to application of a catalytic process to the gas sample as well as during and/or after application of the catalytic process to the gas sample. The obtained optical absorption signals may then be processed using differential calculation approaches to derive information associated with the gas sample, which may include for example information conveying concentrations of certain specific gases in the gas sample. In some implementations, the optical absorption measurement system is configured to use the one or more electromagnetic energy sources to excite the gas sample to produce first optical absorption signals.

Abstract: There is provided a method, system and computer program for detecting duplicate OTDR measurements performed on a same fiber. It is determined whether OTDR traces are likely to have been acquired over the same optical fiber link by comparing the backscattering pattern associated with a given fiber span along the OTDR traces, which corresponds to a continuous optical fiber section.

Abstract: A method of analysing a component formed from a metal alloy to identify a possible defect, wherein the metal alloy comprises a first crystal grain region and the possible defect comprises a second crystal grain region aligned to a different axis to the first crystal grain region, the method comprising the steps of: obtaining a first image of the component illuminated using a first polarisation state of light, the first image comprising first polarisation data; obtaining a second image of the component illuminated using a second polarisation state of light different to the first polarisation state, the second image comprising second polarisation data; determining a difference in polarisation data for plural pixels of the first image between each pixel of the first image and a corresponding pixel of the second image; and identifying pixels corresponding to the second crystal grain region based on the difference in polarisation data.

Abstract: An object of the present disclosure is to provide an optical fiber cable monitoring method and an optical fiber cable monitoring system capable of linking information obtained from a measurement result with information stored in a DB and accurately specifying a loss occurrence location on an optical fiber cable. The optical fiber cable monitoring method according to the present disclosure uses two types of optical fiber measurement techniques having different sensitivities. Each of closure locations on the optical fiber cable is acquired with a high-sensitivity measurement technique, and geographical location information and the closure locations on the optical fiber are linked in an arrangement order of the closures. Thus, an operator can recognize an actual location (geographical location information) of a closure that is linked to a location of a point of abnormality on the optical fiber cable when an abnormality in the closure is detected with a low-sensitivity measurement technique.

Abstract: Provided is a shape measurement sensor including a light-receiving unit and a calculation unit. The light-receiving unit includes a plurality of pixel pairs. Each of the pixel pairs includes a first pixel and a second pixel that is disposed side by side with the first pixel along a first direction. In the first pixel, as an incident position is closer to one end of the light-receiving unit in a second direction, an intensity of a first electric signals decreases. In the second pixel, as the incident position is closer to the one end, an intensity of a second electric signal increases. The calculation unit calculates the incident position in the second direction for each of the pixel pairs on the basis of the intensity of the first electric signal and the intensity of the acquired second electric signal.

Abstract: There are included: a light source (11) that outputs pulsed light; an optical splitter (12) that splits the pulsed light output from the light source (11) and outputs the split pulsed light from each of a plurality of second ports; a plurality of VOAs (13) that is each connected to a corresponding one of the second ports of the optical splitter (12), and attenuates and outputs the pulsed light input from the optical splitter (12); a plurality of optical couplers (14) each of whose first port is connected to output of a corresponding one of the VOAs (13) and each of whose second port is connected to one end of a corresponding one of a plurality of transmission lines (2) to be measured; a light receiving element (15) that receives backscattered light from the one end of each of the transmission lines (2); a power adjustment unit (16) that individually controls each of the VOAs (13); and a data processing unit (17) that performs abnormality detection on each of the transmission lines (2) from a result of light r

Abstract: A measurement apparatus comprises optical components arranged to provide parallel measurements of a biological sample. The parallel sample measurements provide improved accuracy with lower detection limit thresholds. The parallel measurements may comprise one or more of Raman spectroscopy measurements or infrared spectroscopy measurements. The parallel measurements can be combined with a light source. In many embodiments, the light source comprises one or more wavelengths corresponding to resonance frequencies of one or more molecules of the sample, such as wavelengths of ultraviolet light. The wavelengths of light corresponding to resonance frequencies can provide an increased signal to noise ratio. The parallel array optical configuration can be combined with wavelengths of light corresponding to resonance frequencies in order to provide increased measurement accuracy and detection of metabolites.

Abstract: Grating-coupled surface plasmon resonance response of a calibration grating is used to calibrate the azimuth angle offset between a sample on the stage and the plane of incidence (POI) of the optical system of an optical metrology device. The calibration grating is configured to produce grating-coupled surface plasmon resonance in response to the optical characteristics of the optical metrology device. The calibration grating is coupled to the stage and positioned at a known azimuth angle with respect to the optical channel of the optical metrology device while the grating-coupled surface plasmon resonance response of the calibration grating is measured. The azimuth angle between an orientation of the calibration grating and the POI of the optical system is determined based on the grating-coupled surface plasmon resonance response. The determined azimuth angle may then be used to correct for an azimuth angle offset between the sample and the POI.

Abstract: In order to provide a small detection device capable of detecting an accurate absolute position with a single head, there is provided a detection device including a head including a light source and a detecting unit configured to receive multiplexed light (interference light) of diffracted light obtained by causing light from the light source to enter first two points residing on ax diffraction grating and being separated from each other by a known distance and diffracted light obtained by causing the light from the light source to enter second two points residing on the diffraction grating, being separated from each other by a known distance, and including at least one point being different from the first two points, wherein the diffraction grating includes a first region between the first two points separated from each other by the known distance and a second region between the second two points separated from each other by the known distance, the first and second regions having at least partially different

Abstract: A measurement apparatus that measures a position of a mark formed between first and surfaces of a substrate is provided. The apparatus includes a stage that holds and moves the substrate, a first detector that detects an image of the mark, a second detector that detects a height position of the first surface, and a processor that determines, based on the detected height position, an offset amount used to set the focus of the first detector to the mark. The processor includes a first mode in which the offset amount is determined based on a first distance set as a distance from the first surface to the mark, and a second mode in which the offset amount is determined based on a second distance set as a distance from the second surface to the mark.

Abstract: The present disclosure relates to a food preparation device. The device comprises a food preparation space, a heating element for heating a food in the food preparation space, and/or a tool for blending and/or chopping a food in the food preparation space. The device further comprises a spectrometer for analyzing a food associated with the device. The present disclosure further relates to a method for analyzing a food. In this way, a reproducible cooking result as well as an output of the nutritional values and the actual energy content of prepared food can be made possible.

Abstract: Various embodiments provide an elongated part measuring apparatus including an elongated frame, an elongated transparent part supporter supported by the frame and configured to support an elongated part (such as a guide wire or mandrel), an elongated movable part straightener pivotally connected to and supported by the frame, and a movable optical measurer movably connected to and supported by the frame and configured to take multiple spaced apart outer dimensional measurements of the elongated part (whether uncoated or coated).

Abstract: Fabric validation using spectral measurement is provided. In various embodiments, a near-infrared absorption spectrum of a fabric sample is received from a near-infrared spectrometer. A plurality of features is extracted from the spectrum. The plurality of features is provided to a trained classifier. The trained classifier provides a similarity score indicative of the similarity of the fabric sample to a reference fabric sample.

Abstract: Systems and methods for measuring a critical dimension of a photoresist are described. Measuring a critical dimension of a photoresist may include obtaining intensity data, setting a plurality of unit areas, extracting the intensity data, calculating corrected intensity data, and calculating critical dimension data. Obtaining the intensity data by scanning the target substrate may include setting a first scan area and a second scan area, obtaining first intensity data, and obtaining second intensity data, and comparing the first intensity data and the second intensity data.

Abstract: A device includes a storage 52 for storing a reference pattern corresponding to a part of a workpiece outer peripheral part, an imager 27 for imaging the outer peripheral part at least for one turn of a workpiece by such imaging at a fixed point as to include at least a part of the outer peripheral part in an imaging field of view, an image processor 55 for detecting a region corresponding to the reference pattern by performing a pattern matching process, and a misalignment detector 51 for detecting the misalignment based on information on a position of each of a plurality of the detected regions. The reference pattern corresponds in shape to a plurality of characteristic parts that present on the outer peripheral part, have shapes congruent to each other and have a mutually symmetrical positional relationship with respect to rotation about the center axis.