Abstract: An integrated circuit is fabricated on a semiconductor substrate. An insulated gate bipolar transistor (IGBT) is formed upon the semiconductor substrate in which the IGBT has an anode terminal, a cathode terminal, and a gate terminal, and a drift region. A diode is also formed on the semiconductor substrate and has an anode terminal and a cathode terminal, in which the anode of the diode is coupled to the anode terminal of the IGBT and the cathode of the diode is coupled to the drift region of the IGBT.

Abstract: Embodiments of the present invention are directed to techniques for generating vertically stacked nanosheet CMOS (Complementary Metal Oxide Semiconductor) transistor architectures. In a non-limiting embodiment of the invention, a first rare earth oxide layer is formed over a substrate. An n-FET nanosheet stack is formed on the rare earth oxide layer. The n-FET nanosheet stack includes a first nanosheet. A second rare earth oxide layer is formed on the n-FET nanosheet stack. A p-FET nanosheet stack is formed on the second rare earth oxide layer. The p-FET nanosheet stack includes a second nanosheet.

Abstract: A method for producing a flexible lighting strip comprising multitude of functional elements, which are light-emitting diodes, comprise light-emitting diodes, or are interposers with light-emitting diodes. The functional elements are in at least two groups, each comprising at least two functional elements in electrical series connection. The groups are in an electrical circuit having at least an anode and a cathode track as outer lines. The functional elements are in an electrical parallel connection to the anode and cathode tracks. The groups are in a longitudinal arrangement so a first group's last functional element is next to a second group's first functional element. Each of the outer lines has a wire line having substantially circular wires that are bent building zones capable of receiving compressive and tensile stress. The electrical circuit provides a third wire line having a substantially circular wire as a center line arranged between the outer lines.

Abstract: A display device includes a substrate including a bent area, and a flat area including a plurality of pixels, a plurality of island-shaped inorganic insulating patterns arranged on the substrate in the bent area to be separate from each other, an organic insulating layer including a concavo-convex surface covering the inorganic insulating patterns in the bent area, and wiring lines arranged on the organic insulating layer and overlapping the inorganic insulating patterns.

Abstract: A method for forming a semiconductor device structure is provided. The method includes forming a first gate stack over a substrate. The substrate has a base and a first fin structure over the base, and the first gate stack wraps around a first upper portion of the first fin structure. The method includes partially removing the first fin structure, which is not covered by the first gate stack. The method includes forming a first mask layer over a first sidewall of the first fin structure. The method includes forming a first stressor over a second sidewall of the first fin structure while the first mask layer covers the first sidewall. The first sidewall is opposite to the second sidewall. The method includes removing the first mask layer. The method includes forming a dielectric layer over the base and the first stressor. The dielectric layer covers the first sidewall.

Abstract: A high electron mobility transistor for analog applications comprising: a substrate; an epitaxial III-N semiconductor layer stack on top of said substrate, said epitaxial III-N semiconductor layer stack comprising: a first active III-N layer; and a second active III-N layer comprising a recess; with a two dimensional Electron Gas in between III-N; a gate on top of said epitaxial III-N semiconductor layer stack; and a passivation stack between said epitaxial III-N semiconductor layer stack and said gate, wherein said passivation stack comprises an electron accepting dielectric layer adapted to deplete said two dimensional Electron Gas when said gate is not biased; wherein said electron accepting dielectric layer extends in said recess and comprises magnesium nitride doped with silicon and/or aluminum.

Abstract: A semiconductor device includes a first dielectric layer, a first conductive feature in the first dielectric layer, a second dielectric layer over the first dielectric layer, an ferroelectric random-access memory (FeRAM) cell in the second dielectric layer, a third dielectric layer over the second dielectric layer, and a second conductive feature in the third dielectric layer, the second conductive feature being electrically coupled to the top electrode. The FeRAM cell includes a bottom electrode contacting the first conductive feature, a ferroelectric material layer completely covering an upper surface of the bottom electrode, and a top electrode on the ferroelectric material layer.

Abstract: According to one embodiment, a semiconductor device includes a first electrode, a second electrode, a third electrode, a first nitride region, a second nitride region, and a first insulating film. The first nitride region includes Alx1Ga1-x1N. The first nitride region includes first and second partial regions, a third partial region between the first and second partial regions, a fourth partial region between the first and third partial regions, and a fifth partial region between the third and second partial regions. The second nitride region includes Alx2Ga1-x2N. The second nitride region includes sixth and seventh partial regions. The first insulating film includes a first insulating region and is between the third partial region and the third electrode. The third partial region has a first surface opposing the first insulating region. The fourth partial region has a second surface opposing the sixth partial region.

Abstract: A heterostructure semiconductor device includes first and second active areas, each electrically isolated from one another, and each including first and second active layers with an electrical charge disposed therebetween. A power transistor is formed in the first active area, and an integrated gate resistor is formed in the second active area. A gate array laterally extends over the first active area of the power transistor. First and second ohmic contacts are respectively disposed at first and second lateral ends of the integrated gate resistor, the first and second ohmic contacts are electrically connected to the second portion of the second active layer, the second ohmic contact also being electrically connected to the gate array. A gate bus is electrically connected to the first ohmic contact.

Abstract: According to one embodiment, semiconductor memory device includes a first conductive layer, a plurality of second conductive layers stacked over the first conductive layer in a first direction, a memory pillar extending in the plurality of second conductive layers in the first direction, and a first layer extending from the first conductive layer through a portion of the plurality of second conductive layers in the first direction in contact with a the plurality of second conductive layers, the first layer including a first portion having a first cross section in the plane of second and third directions that are perpendicular to each other and to the first direction, and a second portion having a second cross section, different from the first cross section, in the plane of the second and third directions.

Abstract: The present disclosure relates to a semiconductor device includes a substrate and first and second spacers on the substrate. The semiconductor device includes a gate stack between the first and second spacers. The gate stack includes a gate dielectric layer having a first portion formed on the substrate and a second portion formed on the first and second spacers. The first portion includes a crystalline material and the second portion comprises an amorphous material. The gate stack further includes a gate electrode on the first and second portions of the gate dielectric layer.

Abstract: Provided is a field effect transistor (FET) including a gradually varying composition channel. The FET includes: a drain region; a drift region on the drain region; a channel region on the drift region; a source region on the channel region; a gate penetrating the channel region and the source region in a vertical direction; and a gate oxide surrounding the gate. The channel region has a gradually varying composition along the vertical direction such that an intensity of a polarization in the channel region gradually varies.

Abstract: Various light emitting diode device embodiments that include emissive material elements, e.g., core-shell quantum dots, that are either (i) provided in nanoscale holes provided in an insulating layer positioned between an electron supply/transport layer and a hole supply/transport layer, or (ii) provided on a suspension layer positioned above and covering a nanoscale hole in such an insulating layer. Also, various methods of making such light emitting diode devices, including lithographic and non-lithographic methods.

Abstract: An integrated circuit package apparatus deployed with an antenna and a method for manufacturing an integrated circuit package apparatus, where the integrated circuit package apparatus includes a package substrate, an antenna, a chip, and a connection circuit. The package substrate includes at least one ground plane, the antenna is deployed on an external surface of one side of the package substrate and is located on one side of the at least one ground plane, the chip and the connection circuit are deployed on the other side of the at least one ground plane, where the antenna is isolated from the chip and the connection circuit using the at least one ground plane, and the antenna is coupled to the chip using the connection circuit and a first metal through hole in a thickness direction of the package substrate.

Abstract: In the present invention, lower electrodes (101, 102) are disposed at a period d1 in an X direction and at a period d2 in a Y direction. Upper electrodes (102) are disposed so as to be shifted by half the length of the period (d1) in the X direction with respect to the lower electrodes (101), and are disposed so as to be shifted by half the length of the period (d2) in the Y direction with respect to the lower electrodes (101). Each pair of a lower electrode (101) and an upper electrode (102), which face each other and capacitively couple with each other, form a capacitor cell (C). Cell terminals (103, 104) are disposed at the period (d1) in the X direction, disposed at the period (d2) in the Y direction, and respectively electrically connected to the lower electrodes (101) and the upper electrodes (102).

Abstract: Systems and methods of the disclosed embodiments include reducing defects in a semiconductor layer. The defects may be reduced by forming the semiconductor layer on a substrate, removing at least a portion the substrate from an underside of the semiconductor layer, and annealing the semiconductor layer to reduce the defects in the layer. The annealing includes focusing energy at the layer.

Abstract: An optoelectronic device, comprising a first semiconductor layer comprising four boundaries comprising two longer sides and two shorter sides; a second semiconductor layer formed on the first semiconductor layer; and a plurality of first conductive type electrodes formed on the first semiconductor layer, wherein one first part of the plurality of first conductive type electrodes is formed on a corner constituted by one of the two longer sides and one of the two shorter sides, and wherein one fourth part of the plurality of first conductive type electrodes is formed along the one of the two longer sides, the one fourth part of the plurality of first conductive type electrodes comprises a head portion and a tail portion, the head portion comprises a width larger than that of the tail portion.

Abstract: A light sensor includes first and second neighboring photodiodes that are separated from each other by a space. A light-absorbing material is positioned at a location which is vertically above the space between the neighboring photodiodes. A first multilayer interference filter includes a central portion located vertically above the first photodiode and a peripheral portion that at least partly extends to rest on top of and in contact with the light-absorbing material.

Abstract: An electronic device includes an electronic panel having an active area and a pad area, the electronic panel including a sensing unit responsive to external input, and a circuit board connected to the electronic panel in the pad area, in which the electronic panel includes a first conductive layer disposed on the active area, a second conductive layer disposed on the first conductive layer, an organic insulation layer disposed between the first conductive layer and the second conductive layer, and an inorganic insulation layer covering a first surface of the organic insulation layer and exposing a first surface of the second conductive layer.

Abstract: Described is a low power, high-density non-volatile differential memory bit-cell. The transistors of the differential memory bit-cell can be planar or non-planer and can be fabricated in the frontend or backend of a die. A bit-cell of the non-volatile differential memory bit-cell comprises first transistor first non-volatile structure that are controlled to store data of a first value. Another bit-cell of the non-volatile differential memory bit-cell comprises second transistor and second non-volatile structure that are controlled to store data of a second value, wherein the first value is an inverse of the second value. The first and second volatile structures comprise ferroelectric material (e.g., perovskite, hexagonal ferroelectric, improper ferroelectric).