Abstract: Proposed is an operation method of a first device (100) in a wireless communication system. The method may comprise the steps of: receiving sidelink (SL) data related to a first SL service from a second device (200) at a first time point within an active time of a second SL discontinuous reception (DRX) configuration related to a second SL service; and starting a first timer of a first SL DRX configuration related to the first SL service on the basis of reception of the SL data.

Abstract: A universal test chiplet for testing a plurality of chiplets to be tested is provided. The universal test chiplet includes a chiplet test control circuit module, a test data distribution circuit module, a memory test configuration circuit module, and a chiplet test interface circuit module. The chiplet test control circuit module is configured to provide test data and configure test modes for the chiplets to be tested. The test data distribution circuit module is configured to distribute the test data required by each of the chiplets to be tested from a test data bus. The memory test configuration circuit module is configured to provide test circuits for memories of the chiplets to be tested and automatically generate a test vector. The chiplet test interface circuit module is configured to transmit the test data to the chiplets to be tested in any direction through chiplet test interfaces.

Abstract: A data storage device initially stores incoming data from a host in single-level cell (SLC) blocks and later folds the data from those blocks into a multi-level cell (MLC) block. If an error is detected during the folding operation, the data storage device pauses the folding operation, programs data that failed to be program and other data from the initial SLC blocks into another SLC block, and then resumes the folding operation. This can be part of a dynamic runtime zoning process where the data storage device determines a set of wordlines that will fall under one zone at runtime during an enhanced post-write-read (EPWR) operation.

Abstract: Embodiments of the present disclosure include techniques for error correction. Multiple successive odd syndromes are generated from input data comprising parity bits. Coefficients are generated and applied to a finite element field to detect multiple bit errors. Error correction circuitry corrects detected error bits. A single bit error detector may detect single bit errors. The error correction circuit may select between a single bit error vector and a multibit error vector based on one of the coefficients. The circuitry may be implemented in combinational logic to perform detection and correction in a single clock cycle.

Abstract: A system and method for memory error detection and recovery in a decoding system in CXL components is presented. The method includes receiving, into a first decoder within the decoding system, a memory transfer block (MTB) having data and parity information, and having a vertical portion and a horizontal portion, performing error detection and correction on the vertical portion of the MTB using binary hamming code logic within the first decoder; and upon performing error detection and correction in the first decoder, then forwarding MTB to a second decoder, and performing error detection and correction, via the second decoder, on the horizontal portion of the MTB using a non-binary hamming code logic within the second decoder such that the first and second decoders perform the error detection and correction on the vertical and horizontal portions of the MTB in a serial manner.

Abstract: An example test system includes a test instrument configured to test a device under test (DUT). The test instrument is configured to interact with the DUT using first commands having a first syntax. The test system also includes one or more processing devices configured (i) to receive a definitions file, where the definitions file includes information defining a second syntax that is used by a third party to communicate with the DUT, (ii) to receive second commands having the second syntax, (iii) to convert the second commands into the first commands having the first syntax based on the definitions file, and (iv) to send the first commands to the test instrument to enable the test instrument to interact with the DUT.

Abstract: A channel width can depend on a quantity of memory units (e.g., memory dice) that forms a channel as well as a size of the memory units. A memory system can operate with memory units configured to exchange (e.g., transfer to and/or from) data at a rate of smaller granularity that can provide more various options for channel widths, which can further allow a fine-tuned optimization of the memory system in association with its bandwidth and latency in transferring data from and/or to the memory units. The channels whose channel width is fine-tuned with such memory units can be further used to provide a reliability, availability, and serviceability (RAS) protection, such as a redundant array of independent disks (RAID) protection.

Abstract: A memory subsystem includes memory devices with space dynamically allocated for improvement of reliability, availability, and serviceability (RAS) in the system. Error checking and correction (ECC) logic detects an error in all or a portion of a memory device. In response to error detection, the system can dynamically perform one or more of: allocate active memory device space for sparing to spare a failed memory segment; write a poison pattern into a failed cacheline to mark it as failed; perform permanent fault detection (PFD) and adjust application of ECC based on PFD detection; or, spare only a portion of a device and leave another portion active, including adjusting ECC based on the spared portion. The error detection can be based on bits of an ECC device, and error correction based on those bits and additional bits stored on the data devices.

Abstract: Techniques are provided to provide modified bit sequences generated by the Physical Coding Sublayer (PCS) functional block in a way that considers the subsequent bit-mux operation of the Physical Media Attachment (PMA) sublayer functional block, in order to create symbol sequences for transmission over the physical channels with properties that optimize the performance of the Forward Error Correction (FEC) decoder with error bursts.

Abstract: This application is directed to compressing check node data for an electronic device. The electronic device identifies a check node corresponding to a subset of codeword symbols in a block of data and determines check node data that indicates a likelihood of the subset of codeword symbols being erroneous. A set of data bits are determined based on a value combination of data items of the check node data to uniquely identify the value combination among a set of selected value combinations according to a predefined relationship. The electronic device stores, in a memory block, the set of data bits representing the data items of the check node data of the check node. Each data item requires more data bits to represent all possible values of the respective data item than data bits of the set of data bits.

Abstract: A programmable logic device (PLD) supports scan testing of configurable logical blocks using scannable word line (WL) shift register (WLSR) chains to enable writes to configurable memory bits while scan test data is input via a scan chain comprising scannable bit line (BL) shift registers (BLSRs). Input test data may be shifted onto BLs to write data into a configurable memory bit when a corresponding WL associated with the configurable memory bit is asserted. Logic blocks may comprise: latch-based configurable memory bits, scannable WLSRs forming a distinct WLSR chain in shift mode and driving corresponding WLs. Each WL, when asserted, enables writes to a corresponding configurable memory bit. A scannable BLSR receives serial scan test vector input in shift mode and drives a corresponding BL coupled to the configurable memory bit to write data to the configurable memory bit when the associated WL is asserted.

Abstract: Embodiments of the present invention can selectively enable 16 lane (×16) or 8 lane (×8) device testing using multiplexor circuitry disposed between a CXL1.1 CPU and the DUTs during testing. In this way, parallelism and testing efficiency are significantly improved compared to existing approaches that can only test devices using 8 lanes of the CXL 1.1 CPU.

Abstract: A quasi-cyclic LDPC coding and decoding method and apparatus, and an LDPC coder and decoder. The method includes: determining from a mother basis matrix set a basis matrix used for low density parity check (LDPC) coding (S202), wherein the basis matrix used for LDPC coding includes a first-type element and a second-type element, the first-type element corresponds to an all-zero square matrix, the second-type element corresponds to a matrix obtained by means of a cyclic shift of a unit matrix according to a value of the second-type element, and dimensions of the all-zero square matrix and the unit matrix are equal; and performing LDPC coding on an information sequence to be coded according to the basis matrix used for LDPC coding, and/or performing LDPC decoding on a data sequence to be decoded according to the basis matrix used for LDPC coding (S204).

Abstract: An aspect of the disclosed technology is a replay unit that enables replaying computations on unused or empty ALU slots. The replay unit may be added on a per lane basis or within a lane in a SIMD unit or device.

Abstract: A computer system, computer readable storage medium, and computer-implemented method for generating a test program for a device-under-test (DUT). The method includes transmitting a plurality of uncompiled snippets and a plurality of uncompiled micro-functions into a compiler. The method also includes selecting, randomly, a portion of uncompiled micro-functions from the plurality of uncompiled micro-functions. The method further includes compiling the uncompiled snippets and the portion of uncompiled micro-functions, thereby generating a plurality of compiled snippets and a compiled portion of micro-functions. The method also includes interweaving, randomly, the compiled portion of micro-functions with the plurality of compiled snippets, thereby at least partially generating a test program for the DUT. The method further includes executing one or more post-silicon validation tests for the DUT with the test program.

Abstract: Various arrangements for improving performance of code split communications are presented herein. A second portion of a first codeword and a third portion of a second codeword can be transmitted using symbols such that each transmitted symbol includes bits from the second portion of the first codeword and bits from the third portion of the second codeword. At a receiver, decoder inputs can be generated for the third portion of the second codeword based on an optimized constellation and the second portion of the first codeword. The second portion of the first codeword is used to identify a label group of the optimized constellation and eliminate all other label groups of the plurality of label groups. Within each label group, symbol labels are Gray labeled. However, at least a first symbol label is not Gray labeled with an adjacent second symbol label of a different label group.

Abstract: Methods, systems, and devices for metadata storage at a memory device are described to support storage of metadata information and error control information at a memory device. The metadata information and error control information may be received at the memory device via a sideband channel and corresponding pin. For example, a set of bits received via the pin may include a subset of error control bits and a subset of metadata bits. Circuitry at the memory device may receive the set of bits via the pin and may identify metadata information and error control information within the set of bits. The circuitry may route the metadata information to a corresponding subset of memory cells and the error control information to an error control circuit, where the error control circuit may route the error control information to a corresponding subset of memory cells.

Abstract: The present disclosure relates to protocols for efficiently retransmitting lost data in a communication network. To this end, the disclosure proposes a first network device including processing circuitry configured to transmit a sequence of data packets to a second network device, receive at least one notification message from the second network device, and retransmit missing data packets as a next step after receiving the at least one notification message. The at least one notification message is indicative of both (i) a largest sequence number L of a data packet received at the second network device and (ii) one or more data packets that are missing from the sequence up to L at the second network device. Each missing data packet is indicated as a missing data packet after its first transmission, and a sequence number X of each missing data packet is less than L?K.

Abstract: It is provided a method comprising: monitoring if a communication initiator receives a confirmation in response to an initial message from the communication initiator to a communication partner; supervising if the communication initiator successfully processes the confirmation; providing a non-successful information at a callback resource if the confirmation comprises the identifier of the callback resource and the communication initiator does not successfully process the confirmation; wherein the confirmation comprises an identifier of the callback resource; and the confirmation confirms that the initial message is successfully processed by the communication partner.

Abstract: A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of processing one or more firmware with or without operating system (i.e. bare-metal, embedded OS, RTOS (real time operating system)) to perform a series of task defined by firmware(s) for testing volatile and/or non-volatile memory devices connected into one or more DUT devices plus SCU has capability of having operating system and install and run host applications locally within each SCU units to mimic host applications environments along with performing regular memory testing.